Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2001
04/04/2001EP1089204A2 Method for integrated circuit layout
04/04/2001EP1089146A2 Method and apparatus for monitoring a process by employing principal component analysis
04/04/2001EP1089129A1 Positive type photosensitive resin composition, process for producing pattern and electronic parts
04/04/2001EP1089128A2 Exposure mask, exposure mask manufacturing method, and semiconductor device manufacturing method using exposure mask
04/04/2001EP1089084A1 On-line testing of the programmable interconnect network in field programmable gate arrays
04/04/2001EP1089001A1 Static pressure gas bearing, stage device using it, and optical device using it
04/04/2001EP1088915A1 Silicon epitaxial wafer and its manufacturing method
04/04/2001EP1088914A1 Method of growing single crystal GaN, method of making single crystal GaN substrate and single crystal GaN substrate
04/04/2001EP1088913A2 Liquid-phase growth method, liquid-phase growth apparatus, and solar cell
04/04/2001EP1088869A1 Aqueous dispersion for chemical mechanical polishing
04/04/2001EP1088868A2 Composition for film formation, method of film formation, and insulating film
04/04/2001EP1088848A1 Porous materials
04/04/2001EP1088801A1 Aluminum nitride sintered bodies and semiconductor-producing members including same
04/04/2001EP1088785A1 Fabrication process for a three- dimensional suspended microstructure, an integrated microstructure obtained by this process and an adjustable integrated micro-optical element
04/04/2001EP1088622A2 Platen with web release apparatus
04/04/2001EP1088603A1 Method of removing contamination adhered to surfaces and apparatus used therefor
04/04/2001EP1088348A1 Semiconductor device comprising a non-volatile memory cell
04/04/2001EP1088346A1 Quantum wire field-effect transistor and method of making the same
04/04/2001EP1088343A1 Scaleable integrated data processing device
04/04/2001EP1088342A1 Method for determining parameter distributions of object properties
04/04/2001EP1088341A2 Method of producing a structured surface
04/04/2001EP1088340A1 Fabrication of gallium nitride semiconductor layers by lateral growth from trench sidewalls
04/04/2001EP1088339A1 A method of planarizing a semiconductor device using a high density plasma system
04/04/2001EP1088338A1 ARRANGEMENT FOR STORING OBJECTS, PARTICULARLY FOR STORING DISKLIKE OBJECTS SUCH AS WAFERS, FLAT PANELS OR CDs
04/04/2001EP1088337A1 Semiconductor wafer cleaning apparatus and method
04/04/2001EP1088332A2 Focus ring arrangement for substantially eliminating unconfined plasma in a plasma processing chamber
04/04/2001EP1088331A1 Cleaning process end point determination using throttle valve position
04/04/2001EP1088330A1 Cvd apparatus and process for depositing titanium films
04/04/2001EP1088329A1 Method and apparatus for stabilising a plasma
04/04/2001EP1088328A1 Method and device for correcting proximity effects
04/04/2001EP1088326A1 Pedestal insulator for a pre-clean chamber
04/04/2001EP1088316A1 Thin electret layer and corresponding production method
04/04/2001EP1088310A2 Radiation hardened six transistor random access memory and memory device
04/04/2001EP1088239A1 Device for measuring and analyzing electrical signals of an integrated circuit component
04/04/2001EP1087897A2 Substrate transfer shuttle having a magnetic drive
04/04/2001EP1087848A1 Methods of wet processing electronic components using process liquids with controlled levels of gases
04/04/2001EP0852628B1 Process chamber with inner support
04/04/2001EP0839217A4 A plasma enhanced chemical processing reactor and method
04/04/2001EP0734576B1 Anisotropic, electrically conductive adhesive film
04/04/2001CN2426213Y Attenuation phase-shift mask
04/04/2001CN1290403A Quasi-mesh gate structure including plugs connecting source regious with backside for lateral RF MOS devices
04/04/2001CN1290402A Stripping agent against resist residues
04/04/2001CN1290399A Device for producing excited/ionized particles in plasma
04/04/2001CN1290310A Plating apparatus and method
04/04/2001CN1290309A Organocuprous precursors for chemical vapor deposition of copper film
04/04/2001CN1290308A Plasma reactor with a deposition shield
04/04/2001CN1290044A Technology for making semiconductor
04/04/2001CN1290042A Electroluminescent display unit and electronic device
04/04/2001CN1290041A Electroluminescent display unit and electronic device
04/04/2001CN1290040A Field-effect transmistors and manufacture thereof
04/04/2001CN1290039A Semiconductor device and manufacture thereof
04/04/2001CN1290038A Piled capacitor memory units and manufacture thereof
04/04/2001CN1290037A 半导体器件 Semiconductor devices
04/04/2001CN1290036A Holder structure of IC package and its manufacture method
04/04/2001CN1290035A Method for generating contact between bit lines and performing ion implantation
04/04/2001CN1290034A Manufacture of semiconductor device and equipment therefor
04/04/2001CN1290032A Method for mounting semiconductor chips on basic board with circuit trace and its products
04/04/2001CN1290031A Technology for packing semiconductor chip and its products
04/04/2001CN1290030A Method for promoting releasement of semiconductor sheets
04/04/2001CN1290029A Ion implanting device and using method thereof
04/04/2001CN1290028A Technology for preparing semiconductor substrate
04/04/2001CN1289866A Process for growing gallium nitride and its compound film
04/04/2001CN1289865A Growth process for monocrystal of gadolinium nitride, substrates of gadolinium mitride monocrystal and manufacture thereof
04/04/2001CN1289860A Chemical vapor phase deposition apparatus, its purification and apparatus for manufacturing semiconductors
04/04/2001CN1289662A Ultrasonic leading wire welder with sensor for controlling combination force
04/04/2001CN1289659A Low-temp MEMS vacuum sealing technique for metals
04/04/2001CN1289628A Filter and using method thereof
04/04/2001CN1064196C Semiconductor integrated circuit with differential circuit
04/04/2001CN1064178C Semiconductor device with ESD protection circuit
04/04/2001CN1064177C High-speed deepth-variable etching method and apparatus thereof
04/03/2001US6212671 Mask pattern data producing apparatus, mask pattern data producing method and semiconductor integrated circuit device
04/03/2001US6212492 Apparatus and method for circuit simulation which accounts for parasitic elements
04/03/2001US6212487 Method and apparatus of establishing a region to be made amorphous
04/03/2001US6212482 Circuit and method for specifying performance parameters in integrated circuits
04/03/2001US6212252 X-ray mask provided with an alignment mark and method of manufacturing the same
04/03/2001US6212217 Smart laser with automated beam quality control
04/03/2001US6212110 Semiconductor memory device
04/03/2001US6212109 Dynamic memory array having write data applied to selected bit line sense amplifiers before sensing to write associated selected memory cells
04/03/2001US6212107 Charge pump circuit and a step-up circuit provided with same
04/03/2001US6212100 Nonvolatile memory cell and method for programming and/or verifying the same
04/03/2001US6212090 Semiconductor device including a repetitive pattern
04/03/2001US6212059 Capacitor including barium strontium titanate film
04/03/2001US6212012 Laser optical apparatus
04/03/2001US6211965 Photolithographic position measuring laser interferometer with relitively moving measuring intereometer
04/03/2001US6211961 Optical method for the characterization of the electrical properties of semiconductors and insulating films
04/03/2001US6211960 Method and apparatus for aligning and connecting semiconductor components to substrates
04/03/2001US6211959 Method of checking for the presence of connection balls
04/03/2001US6211947 Illuminance distribution measuring method, exposing method and device manufacturing method
04/03/2001US6211935 Alignment device for an IC-mounted structure
04/03/2001US6211928 Liquid crystal display and method for manufacturing the same
04/03/2001US6211769 System to minimize the temperature coefficient of resistance of passive resistors in an integrated circuit process flow
04/03/2001US6211706 Method and circuit for driving power transistors in a half bridge configuration allowing for excessive negative swing of the output node and integrated circuit incorporating the circuit
04/03/2001US6211689 Method for testing semiconductor device and semiconductor device with transistor circuit for marking
04/03/2001US6211688 Test area with automatic positioning of a microprobe and a method of producing such a test area
04/03/2001US6211686 Evaluation apparatus and fabrication system for semiconductor
04/03/2001US6211576 Semiconductor device
04/03/2001US6211574 Semiconductor package with wire protection and method therefor
04/03/2001US6211573 Semiconductor device with an improved lead-chip adhesion structure and lead frame to be used therefor
04/03/2001US6211571 Method and apparatus for testing chips
04/03/2001US6211570 Semiconductor device having a multilayer interconnection structure