Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2001
08/08/2001CN1307280A Graphic processor for lowering required storage size
08/08/2001CN1307248A Liquid crystal display, wiring substrate and making method thereof
08/08/2001CN1069446C 半导体器件 Semiconductor devices
08/08/2001CN1069439C Surface treatment method and system
08/07/2001USRE37311 Parallel type nonvolatile semiconductor memory device and method of using the same
08/07/2001USRE37309 Scanning exposure apparatus
08/07/2001US6272656 Semiconductor integrated circuit including test facilitation circuit and test method thereof
08/07/2001US6272393 Efficient tool utilization using previous scan data
08/07/2001US6272202 Exposure method and X-ray mask structure for use with the same
08/07/2001US6272069 LSI device with memory and logics mounted thereon
08/07/2001US6272061 Semiconductor integrated circuit device having fuses and fuse latch circuits
08/07/2001US6272055 Semiconductor memory device
08/07/2001US6272050 Method and apparatus for providing an embedded flash-EEPROM technology
08/07/2001US6272042 Nonvolatile semiconductor memory
08/07/2001US6272041 MTJ MRAM parallel-parallel architecture
08/07/2001US6272039 Temperature insensitive capacitor load memory cell
08/07/2001US6272002 Electrostatic holding apparatus and method of producing the same
08/07/2001US6271957 Methods involving direct write optical lithography
08/07/2001US6271955 Method of manufacturing spatial light modulator and electronic device employing it
08/07/2001US6271925 Apparatus and method for measuring two opposite surfaces of a body
08/07/2001US6271923 Interferometry system having a dynamic beam steering assembly for measuring angle and distance
08/07/2001US6271919 Semiconductor device and alignment apparatus and alignment method for same
08/07/2001US6271910 Projection exposure apparatus and method
08/07/2001US6271897 Process of producing a semiconductor device
08/07/2001US6271852 boundary processing of oblique overlapping graphics to achieve dimensionally accurate electron beam irradiation
08/07/2001US6271818 Semiconductor device
08/07/2001US6271717 Bias circuit for series connected decoupling capacitors
08/07/2001US6271705 Data output circuits having enhanced ESD resistance and related methods
08/07/2001US6271694 Monolithically integrated output stage
08/07/2001US6271692 Semiconductor integrated circuit
08/07/2001US6271679 I/O cell configuration for multiple I/O standards
08/07/2001US6271676 Spiral chuck
08/07/2001US6271640 Exposure apparatus having reaction frame
08/07/2001US6271601 Wire bonding method and apparatus and semiconductor device
08/07/2001US6271599 Wire interconnect structure for electrically and mechanically connecting an integrated circuit chip to a substrate
08/07/2001US6271598 Conductive epoxy flip-chip on chip
08/07/2001US6271597 Methods for forming electrically conductive interconnections and electrically interconnected substrates
08/07/2001US6271596 Damascene capacitors for integrated circuits
08/07/2001US6271595 In semiconductor devices provided with an intervening layer of germanium oxide, copper (wire), copper germanide and/or germanium nitride between the copper and dielectric layer of silicon oxide or nitride
08/07/2001US6271594 Semiconductor device and method of manufacturing the same
08/07/2001US6271593 Method for fabricating conductive components in microelectronic devices and substrate structures therefor
08/07/2001US6271592 Sputter deposited barrier layers
08/07/2001US6271591 Copper-aluminum metallization
08/07/2001US6271590 Graded layer for use in semiconductor circuits and method for making same
08/07/2001US6271588 Semiconductor device and manufacturing method thereof
08/07/2001US6271586 Integrated circuit chip and method for fabricating the same
08/07/2001US6271585 A composite formed by impregnating melted copper into a molybdenum green compact and rolled into a plate having the differences in thermal expansion coefficients of <8%; uniform distribution; semiconductors for electric cars
08/07/2001US6271584 Arrangement of electronic components on a bearer strip
08/07/2001US6271579 High-frequency passband microelectronics package
08/07/2001US6271578 Crack stops
08/07/2001US6271577 Transistor and method
08/07/2001US6271576 Laser synthesized ceramic sensors and method for making
08/07/2001US6271575 Method and mask structure for self-aligning ion implanting to form various device structures
08/07/2001US6271573 Semiconductor device with gate structure and method of manufacturing the same
08/07/2001US6271572 Multi-voltage level semiconductor device and its manufacture
08/07/2001US6271570 Trench-free buried contact
08/07/2001US6271569 Semiconductor device having memory cells and method of manufacturing the same
08/07/2001US6271566 Semiconductor device having a carbon containing insulation layer formed under the source/drain
08/07/2001US6271565 Asymmetrical field effect transistor
08/07/2001US6271564 Semiconductor device and method of manufacturing the same
08/07/2001US6271563 MOS transistor with high-K spacer designed for ultra-large-scale integration
08/07/2001US6271561 Method for fabricating floating gate semiconductor devices with trench isolation structures and self aligned floating gates
08/07/2001US6271559 Semiconductor memory with information storage capacitance including an electrode containing precious metal and an added element
08/07/2001US6271558 Capacitors and capacitor construction
08/07/2001US6271555 Borderless wordline for DRAM cell
08/07/2001US6271552 Lateral RF MOS device with improved breakdown voltage
08/07/2001US6271551 Si-Ge CMOS semiconductor device
08/07/2001US6271549 Process for fabricating a metal silicide layer of a semiconductor and apparatus
08/07/2001US6271548 Master slice LSI and layout method for the same
08/07/2001US6271547 Double recessed transistor with resistive layer
08/07/2001US6271543 Active matrix type display device and method of manufacturing the same
08/07/2001US6271541 Semiconductor device with high gettering capability to impurity present in semiconductor layer of SOI substrate
08/07/2001US6271540 Thin film transistor with silicon oxynitride film and silicon nitride channel passivation film for preventing a back channel effect and a method for fabricating the same
08/07/2001US6271539 Electrical diagnostic technique for silicon plasma-etch induced damage characterization
08/07/2001US6271531 Charged beam drawing apparatus and method thereof
08/07/2001US6271530 Apparatus for reducing distortion in fluid bearing surfaces
08/07/2001US6271529 Ion implantation with charge neutralization
08/07/2001US6271514 Multi-beam scanner including a dove prism array
08/07/2001US6271478 Multi-layer circuit board
08/07/2001US6271459 Heat management in wafer processing equipment using thermoelectric device
08/07/2001US6271273 Dispersion of organo polysilica dielectric material with dispersion of crosslinkable polymer, curing organopolysilica and crosslinking
08/07/2001US6271188 Semiconductor cleaning solution
08/07/2001US6271163 Controlling concentration
08/07/2001US6271154 Methods for treating a deep-UV resist mask prior to gate formation etch to improve gate profile
08/07/2001US6271153 Semiconductor processing method and trench isolation method
08/07/2001US6271152 Method for forming oxide using high pressure
08/07/2001US6271151 Method and apparatus for controlling the thickness of a gate oxide in a semiconductor manufacturing process
08/07/2001US6271150 Methods of raising reflow temperature of glass alloys by thermal treatment in steam, and microelectronic structures formed thereby
08/07/2001US6271149 Method of forming a thin film on a substrate of a semiconductor device
08/07/2001US6271148 Method for improved remote microwave plasma source for use with substrate processing system
08/07/2001US6271147 Methods of forming trench isolation regions using spin-on material
08/07/2001US6271146 Electron beam treatment of fluorinated silicate glass
08/07/2001US6271144 Anisotropic etching masked intermetallic; using gas mixture of chlorine, nitrogen and ammonia
08/07/2001US6271143 Method for preventing trench fill erosion
08/07/2001US6271142 Process for manufacture of trench DRAM capacitor buried plates
08/07/2001US6271141 Methods of forming materials over uneven surface topologies, and methods of forming insulative materials over and between conductive lines
08/07/2001US6271140 Coaxial dressing for chemical mechanical polishing
08/07/2001US6271138 Chemical mechanical polish (CMP) planarizing method with enhanced chemical mechanical polish (CMP) planarized layer planarity
08/07/2001US6271137 Method of producing an aluminum stacked contact/via for multilayer
08/07/2001US6271136 Vapor deposition using organometallic compounds