Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2001
08/16/2001DE10005312A1 Verfahren zum Auffinden der eigentlichen Ursache des Ausfalls eines fehlerhaften Chips A method for finding the root cause of the failure of a defective chip
08/16/2001DE10004984A1 Vertikales Halbleiterbauelement mit Source-Down-Design und entsprechendes Herstellungsverfahren Vertical semiconductor device having source-down design and method of manufacture
08/16/2001DE10004824A1 Production of substrates coated with a layer consisting of two different heavy elements comprises magnetron sputtering a target made of a compound of the two elements
08/16/2001DE10004410A1 Semiconductor device for discrete device with contacts on lower side - has second metallisation provided on second main side of chip, lying flush with surface, for carrying signals
08/16/2001DE10004394A1 Verfahren zur Grabenätzung in Halbleitermaterial Method for trench etching in semiconductor material
08/16/2001DE10004392A1 Feldeffekttransistor und Verfahren zum Herstellen eines mit Ladungsträgern injizierten Feldeffekttransistors Field effect transistor and method for manufacturing an injected charge carriers with the field effect transistor
08/16/2001DE10004391A1 Verfahren zur Durchführung eines Plasmaätzprozesses A method for performing a plasma etching process
08/16/2001DE10003999A1 Magazine for holding microcomponents has a stabilizing grid to ensure their correct location after magazine manufacture
08/16/2001CA2402138A1 Method and apparatus of immobilizing solder spheres
08/16/2001CA2400513A1 Semiconductor devices
08/16/2001CA2399588A1 Method for treating a diamond surface and corresponding diamond surface
08/16/2001CA2399417A1 Encapsulation for an electronic component and a process for its manufacture
08/16/2001CA2399394A1 A process for forming a semiconductor structure
08/16/2001CA2399031A1 Passive alignment using slanted wall pedestal
08/15/2001CN1308839A Method for producing interconnections with electrically conductive cross connectious between the top and the bottom part of a substrate and interconnections having such cross connections
08/15/2001CN1308774A Silicon carbide horizontal channel buffered gate semiconductor devices
08/15/2001CN1308772A ULSI MOS with high dielectric constant insulator
08/15/2001CN1308771A Method and apparatus for ionized physical vapor deposition
08/15/2001CN1308751A Semiconductor device having passivation
08/15/2001CN1308737A Composition for stripping photoresist and organic material from substrate surfaces
08/15/2001CN1308689A Method and apparatus for increasing wafer throughput between cleanings in semiconductor processing reactors
08/15/2001CN1308585A Intelligent wafer handling system and method
08/15/2001CN1308565A Automated semiconductor processing system
08/15/2001CN1308378A Buried metal contact structure and manufacture of semiconductor FET device
08/15/2001CN1308376A Capacitor and its manufacture process
08/15/2001CN1308375A Diffusion barrier and semiconductor device with diffusion barrier
08/15/2001CN1308374A Chip integrating rigid supporting ring
08/15/2001CN1308373A Heat dissipator for high-power semiconductor module
08/15/2001CN1308372A Breakdown barrier and oxygen barrier for integrated circuit of low dielectric constant dielectric
08/15/2001CN1308371A Method of forming copper wiring in semiconductor device
08/15/2001CN1308370A Method of forming copper wiring in semiconductor device
08/15/2001CN1308369A Design method, masks, manufacture and storage medium of integrated circuit
08/15/2001CN1308338A Integrated semiconductor memory with memory units of ferroelectric storage effect
08/15/2001CN1308317A Magnetoresistive element and magnetic memory device
08/15/2001CN1308256A Anticorrosive additive stripper, anticorrosive additive stripping liquid controlling method and semiconductor equipment
08/15/2001CN1308146A Manufacture of cladded hollow megnetron sputtering target
08/15/2001CN1308145A Gallium nitride film preparing technology and special equipment
08/15/2001CN1308089A Organic polymer for antireflective coating and its preparation
08/15/2001CN1069786C Semiconductor memory device with capacitor
08/15/2001CN1069675C Material for forming silica-base coated insulation film, process for producing the material, silica-base insulation film semiconductor device, and process for producing same
08/15/2001CN1069617C Large ceramic article and method of manufacturing
08/14/2001USRE37323 Method for sticking an insulating film to a lead frame
08/14/2001US6275972 Method for accurate channel-length extraction in MOSFETs
08/14/2001US6275784 Design method of routing signal lines between circuit blocks for equalizing characteristics of circuit blocks and semiconductor integrated circuit device designed therethrough
08/14/2001US6275748 Robot arm with specimen sensing and edge gripping end effector
08/14/2001US6275744 Substrate feed control
08/14/2001US6275742 Wafer aligner system
08/14/2001US6275604 Method and apparatus for generating semiconductor exposure data
08/14/2001US6275514 Laser repetition rate multiplier
08/14/2001US6275434 Semiconductor memory
08/14/2001US6275428 Memory-embedded semiconductor integrated circuit device and method for testing same
08/14/2001US6275414 Uniform bitline strapping of a non-volatile memory cell
08/14/2001US6275370 Electrical connections to dielectric materials
08/14/2001US6275367 Semiconductor circuit device with high electrostatic breakdown endurance
08/14/2001US6275293 Method for measurement of OSF density
08/14/2001US6275290 Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems
08/14/2001US6275275 Thin film transistor and fabricating method thereof an insulating layer having a pattern not being in contact with source or drain electrode
08/14/2001US6275060 Apparatus and method for measuring minority carrier lifetimes in semiconductor materials
08/14/2001US6275056 Prober device having a specific linear expansion coefficient and probe pitch and method of probing thereof
08/14/2001US6275055 Semiconductor integrated circuit
08/14/2001US6275051 Segmented architecture for wafer test and burn-in
08/14/2001US6274968 Electronic component
08/14/2001US6274940 Semiconductor wafer, a chemical-mechanical alignment mark, and an apparatus for improving alignment for metal masking in conjunction with oxide and tungsten CMP
08/14/2001US6274936 Method for forming a contact during the formation of a semiconductor device
08/14/2001US6274935 A laminated impurity film within the pad complexes with a nickel containing pad to prevent destructive interaction between nickel and copper; bonding to gold wires
08/14/2001US6274934 Semiconductor device and method of manufacturing thereof
08/14/2001US6274933 Integrated circuit device having a planar interlevel dielectric layer
08/14/2001US6274932 Semiconductor device having metal interconnection comprising metal silicide and four conductive layers
08/14/2001US6274931 Integrated circuit packaging systems and methods that use the same packaging substrates for integrated circuits of different data path widths
08/14/2001US6274929 Stacked double sided integrated circuit package
08/14/2001US6274926 Plate-shaped external storage device and method of producing the same
08/14/2001US6274923 Semiconductor device and method for making the same
08/14/2001US6274922 Fabrication of high power semiconductor device with a heat sink and integration with planar microstrip circuitry
08/14/2001US6274921 Semiconductor integrated circuit including protective transistor protecting another transistor during processing
08/14/2001US6274920 Integrated inductor device and method for fabricating the same
08/14/2001US6274919 Semiconductor device having a field-shield device isolation structure
08/14/2001US6274914 CMOS integrated circuits including source/drain plug
08/14/2001US6274913 Shielded channel transistor structure with embedded source/drain junctions
08/14/2001US6274908 Semiconductor device having input-output protection circuit
08/14/2001US6274907 Nonvolatile semiconductor memory device and its manufacture
08/14/2001US6274906 MOS transistor for high-speed and high-performance operation and manufacturing method thereof
08/14/2001US6274905 Trench structure substantially filled with high-conductivity material
08/14/2001US6274903 Memory device having a storage region is constructed with a plurality of dispersed particulates
08/14/2001US6274902 Nonvolatile floating gate memory with improved interpoly dielectric
08/14/2001US6274901 Nonvolatile semiconductor memory device and method for fabricating the same
08/14/2001US6274900 Semiconductor device architectures including UV transmissive nitride layers
08/14/2001US6274899 Capacitor electrode having conductive regions adjacent a dielectric post
08/14/2001US6274898 Triple-well EEPROM cell using P-well for tunneling across a channel
08/14/2001US6274897 Semiconductor structure having interconnects on a projecting region and substrate
08/14/2001US6274895 Semiconductor integrated circuit device
08/14/2001US6274894 Low-bandgap source and drain formation for short-channel MOS transistors
08/14/2001US6274893 Compound semiconductor device and method of manufacturing the same
08/14/2001US6274892 Devices formable by low temperature direct bonding
08/14/2001US6274889 Method for forming ohmic electrode, and semiconductor device
08/14/2001US6274888 Semiconductor device including a TFT having large-grain polycrystalline active layer, LCD employing the same and method of fabricating them
08/14/2001US6274887 Semiconductor device and manufacturing method therefor
08/14/2001US6274886 Thin-film-transistor-array substrate and liquid-crystal display device
08/14/2001US6274885 Active matrix display device with TFTs of different refractive index
08/14/2001US6274878 Wafer out-of-pocket detection method
08/14/2001US6274861 Active matrix display device having a common substrate and method of manufacturing the same