Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2001
09/05/2001CN1311707A ESRF coolant degassing process
09/05/2001CN1311559A Electric motor driving circuit, motor driving method and semiconductor integrated circuit
09/05/2001CN1311534A Semiconductor device and its mfg. method
09/05/2001CN1311533A Solid camera head
09/05/2001CN1311532A Write amplifier/read amplifier having vertical transistor used for DRAM memory
09/05/2001CN1311531A Semiconductor storage having ruthenium pole, and its mfg. method
09/05/2001CN1311530A Mixed medium structure used for improving stability of rear prodn. line structure
09/05/2001CN1311529A Method for mfg. polycrystal silicon capacitor using FET tube and bipolar base pole polycrystal silicon layer
09/05/2001CN1311528A Semiconductor device and its mfg. method, circuit plate and electronic device
09/05/2001CN1311527A Method for mfg. storage capacitor having strontium tantalate-bismuth base medium
09/05/2001CN1311526A Method for mfg. conductive seat used for electric connection and formed conductive seat therefor
09/05/2001CN1311525A Exposure mask and its mfg. method
09/05/2001CN1311524A Crystal silicon semiconductor device and its mfg. method
09/05/2001CN1311522A Displaying device and its mfg. method
09/05/2001CN1311511A Aeolotropic conductive adhering film
09/05/2001CN1311443A Band-gas voltage comparator used for low voltage testing circuit
09/05/2001CN1311351A Etching agent for ruthenium contg. metal, and its application method
09/05/2001CN1070642C Semiconductor memory device and its mfg. method
09/05/2001CN1070403C Work piece holder for rotary grinding machines for grinding semiconductor wafers, and method of positioning the workpiece holder
09/04/2001USRE37347 Substrate gripper device for spin drying
09/04/2001US6286126 Methods, apparatus and computer program products for performing post-layout verification of microelectronic circuits using best and worst case delay models for nets therein
09/04/2001US6286114 Enhanced embedded logic analyzer
09/04/2001US6285970 Computer simulation method of silicon oxidation
09/04/2001US6285855 Illumination system and exposure apparatus having the same
09/04/2001US6285783 Pattern data generating apparatus and method for inspecting defects in fine patterns in a photomask or semiconductor wafer
09/04/2001US6285696 Algainn pendeoepitaxy led and laser diode structures for pure blue or green emission
09/04/2001US6285623 Semiconductor memory
09/04/2001US6285622 Semiconductor device
09/04/2001US6285613 Semiconductor memory device
09/04/2001US6285610 Burn-in test circuit
09/04/2001US6285596 Multi-level type nonvolatile semiconductor memory device
09/04/2001US6285581 MRAM having semiconductor device integrated therein
09/04/2001US6285577 Non-volatile memory using ferroelectric capacitor
09/04/2001US6285576 Nonvolatile ferroelectric memory
09/04/2001US6285574 Symmetric segmented memory array architecture
09/04/2001US6285562 Method of contacting a chip
09/04/2001US6285553 Mounting structure for an LSI
09/04/2001US6285540 Semiconductor device having a fuse
09/04/2001US6285512 Lens barrel having deformed optical element, and projection including same
09/04/2001US6285497 Diffractive element in extreme-UV lithography condenser
09/04/2001US6285488 Pattern generator for avoiding stitching errors
09/04/2001US6285457 Exposure apparatus and device manufacturing method including measuring position and/or displacement of each of a base and a stage with respect to a support
09/04/2001US6285444 Positioning system and position measuring method for use in exposure apparatus
09/04/2001US6285442 Exposure apparatus and device manufacturing method using the exposure apparatus
09/04/2001US6285440 Illumination system and projection exposure apparatus using the same
09/04/2001US6285437 Method for controlling stages, apparatus therefor, and scanning type exposure apparatus
09/04/2001US6285269 High-frequency semiconductor device having microwave transmission line being formed by a gate electrode source electrode and a dielectric layer in between
09/04/2001US6285218 Method and apparatus for implementing logic using mask-programmable dynamic logic gates
09/04/2001US6285208 Activation speed of signal wiring line in semiconductor integrated circuit
09/04/2001US6285200 Apparatus and method for testing integrated circuit devices
09/04/2001US6285199 Device and method for optimally detecting a surface condition of wafers
09/04/2001US6285102 Drive mechanism having a gas bearing operable under a negative pressure environment
09/04/2001US6285086 Semiconductor device and substrate for semiconductor device
09/04/2001US6285085 Semiconductor device, method of fabricating the same and structure for mounting the same
09/04/2001US6285083 Comprising a metallic bump (nickel or copper) electrically connecting the electrode of the semiconductor to conductive pad, increasing melting point and fatigue resistance
09/04/2001US6285082 Soft metal conductor
09/04/2001US6285080 Planar metallized substrate with embedded camber control material and method thereof
09/04/2001US6285079 Semiconductor device employing grid array electrodes and compact chip-size package
09/04/2001US6285074 Semiconductor device
09/04/2001US6285073 Contact structure and method of formation
09/04/2001US6285072 Semiconductor device containing a porous structure and method of manufacturing the same
09/04/2001US6285071 Substrate-on-insulator semiconductor device with noise decoupling
09/04/2001US6285069 Semiconductor device having improved parasitic capacitance and mechanical strength
09/04/2001US6285068 Antifuses and method of fabricating the same
09/04/2001US6285066 Semiconductor device having field isolation
09/04/2001US6285061 Structure and method for fabricating a field effect transistor with a self-aligned anti-punchthrough implant channel
09/04/2001US6285059 Structure for laterally diffused metal-oxide semiconductor
09/04/2001US6285058 Insulated gate semiconductor device and method of manufacturing the same
09/04/2001US6285057 Semiconductor device combining a MOSFET structure and a vertical-channel trench-substrate field effect device
09/04/2001US6285056 Conductivity enhanced MOS-gated semiconductor devices
09/04/2001US6285055 Memory device and method of manufacturing the same, and integrated circuit and method of manufacturing semiconductor device
09/04/2001US6285054 Trenched gate non-volatile semiconductor device with the source/drain regions spaced from the trench by sidewall dopings
09/04/2001US6285053 Capacitor for a semiconductor memory device
09/04/2001US6285051 Semiconductor memory device and method for fabricating the same
09/04/2001US6285050 Decoupling capacitor structure distributed above an integrated circuit and method for making same
09/04/2001US6285049 Low loss composition of BaxSryCa1-x-yTiO3: Ba0.12-0.25Sr0.35-0.47Ca0.32-0.53TiO3
09/04/2001US6285048 Barium strontium titanate integrated circuit capacitors and process for making the same
09/04/2001US6285047 Linear image sensor device, IC assembling substrate and method for assembling the same
09/04/2001US6285046 Controllable semiconductor structure with improved switching properties
09/04/2001US6285045 Semiconductor device with self-aligned contact and its manufacture
09/04/2001US6285044 InP-based heterojunction bipolar transistor with reduced base-collector capacitance
09/04/2001US6285043 Application-specific optoelectronic integrated circuit
09/04/2001US6285042 Active Matry Display
09/04/2001US6285041 Thin-film transistor having a high resistance back channel region am) fabrication method thereof
09/04/2001US6285040 Internal-logic inspection circuit
09/04/2001US6285038 Integrated circuitry and DRAM integrated circuitry
09/04/2001US6285035 Apparatus for detecting an endpoint polishing layer of a semiconductor wafer having a wafer carrier with independent concentric sub-carriers and associated method
09/04/2001US6285033 Positional deviation detecting method and device manufacturing method using the same
09/04/2001US6285010 Method and device for high-temperature, high-pressure treatment of semiconductor wafer
09/04/2001US6285001 Method and apparatus for step and repeat exposures
09/04/2001US6284986 Method of determining the thickness of a layer on a silicon substrate
09/04/2001US6284984 Printed circuit board, for mounting BGA elements and a manufacturing method of a printed circuit board for mounting BGA elements
09/04/2001US6284721 Mixture of acid, nitrate and fluoride
09/04/2001US6284677 Method of forming fluorosilicate glass (FSG) layers with moisture-resistant capability
09/04/2001US6284676 Prewetting wafer with diacetone alcohol
09/04/2001US6284675 Method of forming integrated circuit dielectric by evaporating solvent to yield phase separation
09/04/2001US6284674 Plasma processing device and a method of plasma process
09/04/2001US6284673 Method for providing uniform gas delivery to substrates in CVD and PECVD processes
09/04/2001US6284672 Method of forming a super-shallow amorphous layer in silicon
09/04/2001US6284671 Selective electrochemical process for creating semiconductor nano-and micro-patterns