Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2001
09/19/2001CN1313634A Semiconductor device with multi-layer circuit structure and manufacture thereof
09/19/2001CN1313633A Substrate protecting device and exposoure device therewith
09/19/2001CN1313632A Manufacture of IC chips with protective layers
09/19/2001CN1313631A Method for combining overlay transistor part with wafer
09/19/2001CN1313630A Method for forming thin pattern on semiconductor device
09/19/2001CN1313479A Steam generator
09/19/2001CN1313409A Method for forming electric conductive region by ion implanation
09/19/2001CN1313371A Connecting material and mounting method for using it
09/19/2001CN1313165A Laser cutting laminated core carrier
09/19/2001CN1071496C Flash memory cell and method of making the same
09/19/2001CN1071494C 半导体器件 Semiconductor devices
09/19/2001CN1071493C Semiconductor apparatus
09/19/2001CN1071492C Leadframe structure
09/19/2001CN1071491C 半导体封装件 Semiconductor package
09/19/2001CN1071490C Method for forming tungsten plug
09/19/2001CN1071197C Electronic parts, thermal head, manufacturing method of the thermal head, and heat sensitive recording apparatus
09/19/2001CN1071172C Chemical mechanical polishing method and apparatus thereof
09/19/2001CN1071153C Process and apparatus for treatment of semiconductor wafers in fluid
09/18/2001US6292928 Line path determining method and delay estimating method
09/18/2001US6292708 Distributed control system for a semiconductor wafer processing machine
09/18/2001US6292583 Image information processing apparatus
09/18/2001US6292423 Nonvolatile semiconductor memory
09/18/2001US6292422 Read/write protected electrical fuse
09/18/2001US6292413 Semiconductor device, semiconductor memory device and semiconductor integrated circuit device
09/18/2001US6292411 Delay control circuit synchronous with clock signal
09/18/2001US6292389 Magnetic element with improved field response and fabricating method thereof
09/18/2001US6292387 Selective device coupling
09/18/2001US6292385 Ferroelectric random access memory
09/18/2001US6292369 Methods for customizing lid for improved thermal performance of modules using flip chips
09/18/2001US6292368 Electrical power component mounted by brazing on a support and corresponding mounting process
09/18/2001US6292352 Thin film capacitor
09/18/2001US6292346 Equipment for holding a semiconductor wafer, a method for manufacturing the same, and a method for using the same
09/18/2001US6292341 Bidirectional electronic switch
09/18/2001US6292265 Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects
09/18/2001US6292255 Dose correction for along scan linewidth variation
09/18/2001US6292254 Projection exposure method and apparatus
09/18/2001US6292250 Substrate process apparatus
09/18/2001US6292241 Reflective liquid crystal display apparatus with low manufacturing cost
09/18/2001US6292139 Electronic part and a method of manufacturing the same
09/18/2001US6292103 Alarm system for detecting waste liquid discharge blockage
09/18/2001US6292086 Lateral high-Q inductor for semiconductor devices
09/18/2001US6292043 Semiconductor integrated circuit device
09/18/2001US6292024 Integrated circuit with a serpentine conductor track for circuit selection
09/18/2001US6292011 Method for measuring collector and emitter breakdown voltage of bipolar transistor
09/18/2001US6292009 Reduced terminal testing system
09/18/2001US6292008 Circuit configuration for burn-in systems for testing modules by using a board
09/18/2001US6292005 Probe card for IC testing apparatus
09/18/2001US6291937 High frequency coupler, and plasma processing apparatus and method
09/18/2001US6291899 Method and apparatus for reducing BGA warpage caused by encapsulation
09/18/2001US6291898 Ball grid array package
09/18/2001US6291897 Carriers including projected contact structures for engaging bumped semiconductor devices
09/18/2001US6291895 Method of fabricating semiconductor having through hole
09/18/2001US6291891 Semiconductor device manufacturing method and semiconductor device
09/18/2001US6291890 Semiconductor device having a silicide structure
09/18/2001US6291889 High temperature resistant thin-film system
09/18/2001US6291888 Contact structure and process for formation
09/18/2001US6291887 Dual damascene arrangements for metal interconnection with low k dielectric constant materials and nitride middle etch stop layer
09/18/2001US6291886 Semiconductor device having wirings with reflection preventing film and method of manufacturing the same
09/18/2001US6291885 Thin metal barrier for electrical interconnections
09/18/2001US6291884 Chip-size semiconductor packages
09/18/2001US6291883 Static random-access memory device having a local interconnect structure
09/18/2001US6291882 Packaging process and structure of electronic device
09/18/2001US6291879 Integrated circuit chip with improved locations of overvoltage protection elements
09/18/2001US6291877 Flexible IC chip between flexible substrates
09/18/2001US6291876 Electronic devices with composite atomic barrier film and process for making same
09/18/2001US6291873 Semiconductor device having a resistive element connected to a transistor and substrate
09/18/2001US6291872 Three-dimensional type inductor for mixed mode radio frequency device
09/18/2001US6291870 Semiconductor device
09/18/2001US6291869 Semiconductor circuit device having hierarchical power supply structure
09/18/2001US6291868 Forming a conductive structure in a semiconductor device
09/18/2001US6291867 Semiconductor device; also contains single-crystal silicon semiconducting channel region; amorphous/polycrystalline dielectric; integrated circuits; stability
09/18/2001US6291866 Zirconium and/or hafnium oxynitride gate dielectric
09/18/2001US6291865 Semiconductor device having improved on-off current characteristics
09/18/2001US6291864 Gate structure having polysilicon layer with recessed side portions
09/18/2001US6291863 Thin film transistor having a multi-layer stacked channel and its manufacturing method
09/18/2001US6291861 Semiconductor device and method for producing the same
09/18/2001US6291860 Self-aligned contacts to source/drain silicon electrodes utilizing polysilicon and silicides
09/18/2001US6291859 Integrated circuits
09/18/2001US6291858 Multistack 3-dimensional high density semiconductor device and method for fabrication
09/18/2001US6291855 Cell of flash memory device
09/18/2001US6291854 Electrically erasable and programmable read only memory device and manufacturing therefor
09/18/2001US6291853 Nonvolatile semiconductor device having a memory cells each of which is constituted of a memory transistor and a selection transistor
09/18/2001US6291852 Semiconductor element and semiconductor memory device using the same
09/18/2001US6291851 Semiconductor device having oxide layers formed with different thicknesses
09/18/2001US6291850 Structure of cylindrical capacitor electrode with layer of hemispherical grain silicon
09/18/2001US6291849 Semiconductor structures and apparatus having separated polysilicon grains
09/18/2001US6291848 Integrated circuit capacitor including anchored plugs
09/18/2001US6291847 Semiconductor integrated circuit device and process for manufacturing the same
09/18/2001US6291846 DRAM semiconductor device including oblique area in active regions and its manufacture
09/18/2001US6291845 Fully-dielectric-isolated FET technology
09/18/2001US6291844 Semiconductor memory device with an improved layout of programmable fuses
09/18/2001US6291843 Semiconductor memory device
09/18/2001US6291842 Field effect transistor
09/18/2001US6291837 Substrate of semiconductor device and fabrication method thereof as well as semiconductor device and fabrication method thereof
09/18/2001US6291836 Method of operating a programmable, non-volatile memory device
09/18/2001US6291835 Semiconductor device
09/18/2001US6291834 Semiconductor device and testing method therefor
09/18/2001US6291833 Apparatus for mapping scratches in an oxide film
09/18/2001US6291832 Resonant tunneling diode latch
09/18/2001US6291816 System and method for measuring object features with coordinated two and three dimensional imaging