Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2001
12/20/2001US20010053600 Barrier layers of metal nitride or oxynitrides decrease metal salt formation and areas of delamination
12/20/2001US20010053599 Method of manufacturing a metal wiring in a semiconductor device
12/20/2001US20010053598 Semiconductor device having bumps
12/20/2001US20010053597 Method of manufacturing semiconductor devices
12/20/2001US20010053596 Multilevel interconnects; sputtering a conformal titanium layer on an opening, covering it with an aluminum, silicon and copper alloy, which is then covered by an aluminum and copper alloy; integrated circuits
12/20/2001US20010053595 Method for forming a silicide gate stack for use in a self-aligned contact etch
12/20/2001US20010053594 High-k gate dielectric process with self aligned damascene contact to damascene gate and a low-k inter level dielectric
12/20/2001US20010053592 Method of manufacturing semiconductor device
12/20/2001US20010053591 Plasma treatment to enhance inorganic dielectric adhesion to copper
12/20/2001US20010053589 Method of manufacturing an integrated edge structure for high voltage semiconductor devices, and related integrated edge structure
12/20/2001US20010053586 Enhancing chemical vapor deposition of titanium nitride from tetrakis(dialkylamino)titanium and ammonia; removing hydro-carbon impurities; adding small amount of such as dipropyl-amine
12/20/2001US20010053585 Cleaning process for substrate surface
12/20/2001US20010053584 Method for fabricating a bipolar transistor of the self-aligned double-polysilicon type with a heterojunction base and corresponding transistor
12/20/2001US20010053583 Shallow trench isolation formation process using a sacrificial layer
12/20/2001US20010053582 Semiconductor device
12/20/2001US20010053581 Ldmos device with self-aligned resurf region and method of fabrication
12/20/2001US20010053580 Inverted MOSFET process
12/20/2001US20010053579 Manufacturing method of semiconductor device
12/20/2001US20010053578 Semiconductor device having high-density capacitor elements, and manufacturing method thereof
12/20/2001US20010053577 Method of fabricating a semiconductor-on-insulator memory cell with buried word and body lines
12/20/2001US20010053576 DRAM capacitor formulation using a double-sided electrode
12/20/2001US20010053575 Trench dram cell with vertical device and buried word lines
12/20/2001US20010053574 Method for fabricating a semiconductor component having a wiring which runs piecewise in the substrate, and also a semiconductor component which can be fabricated by this method
12/20/2001US20010053573 Semiconductor device manufacturing method for preventing electrical shorts between lower and upper interconnection layers
12/20/2001US20010053572 Semiconductor device having opening and method of fabricating the same
12/20/2001US20010053571 Method for forming a thin film
12/20/2001US20010053570 Infiltrating solution of organic solvent into film and reflowing, etching exposed region using film as mask
12/20/2001US20010053569 Process for fabricating a MOS transistor having two gates, one of which is buried and corresponding transistor
12/20/2001US20010053568 Method for manufacturing a semiconductor component
12/20/2001US20010053566 Leadframe alteration to direct compound flow into package
12/20/2001US20010053564 Method of manufacturing semiconductor device
12/20/2001US20010053562 Process for producing a substrate and plating apparatus
12/20/2001US20010053561 Insulated-gate semiconductor element and method for manufacturing the same
12/20/2001US20010053560 Transparent electrode, patterning method for same, and manufacturing method for semiconductor element using same
12/20/2001US20010053559 Method of fabricating display device
12/20/2001US20010053558 Oxidizing in the presence of an organometallic catalyst using chemical vapor deposition; for use in dynamic random access memory devices; integrated circuits; semiconductors
12/20/2001US20010053557 Inspection of defects on the circumference of semiconductor wafers
12/20/2001US20010053540 Forming biocompatible label; provide nucleotide sequences, denature, attach compound which prevents crystalization, monitor denatured nucleotide sequences
12/20/2001US20010053508 Substrate processing apparatus and substrate processing method
12/20/2001US20010053507 Heat processing apparatus of substrate
12/20/2001US20010053500 Semiconductor device fabrication system and method of forming semiconductor device pattern using the same and photoresist for manufacturing semiconductor devices thereby
12/20/2001US20010053496 Photoresist compositions and use of same
12/20/2001US20010053493 Comprising alkali-soluble resin, quinonediazide ester, 4,4'-bis(diethylamino)benzophenone; high sensitivity and definition and improved focal depth
12/20/2001US20010053486 Stacking plurality of photoresist films differing in sensitivity on film formed on semiconductor substrate, exposing, etching, embedding metal material in formed spacings to form plurality of wiring elements
12/20/2001US20010053446 Wafer planarization using a uniform layer of material and method and apparatus for forming uniform layer of material used in semiconductor processing
12/20/2001US20010053423 Improvement includes a second process gas distributor having a second process gas exit spaced apart from the substrate support, and an oxygen-supplying gas distributor have a third exit spaced above the substrate support
12/20/2001US20010053422 Diamond film depositing apparatus and method thereof
12/20/2001US20010053418 Substrate transportation container
12/20/2001US20010053411 A low pressure-high hydrogen flow rate process of cleaning a silicon wafer surface is described. the combination of process pressures below about 1 torr with hydrogen flow rates up to about 3 slm has been found to remove substantially all oxygen
12/20/2001US20010053324 By introducing carbon dioxide to the pulp suspension; for the production of paper or board
12/20/2001US20010053291 Exposure apparatus, substrate processing unit and lithographic system, and device manufacturing method
12/20/2001US20010053244 Clamp for pattern recognition
12/20/2001US20010053242 Image processor and image processing method
12/20/2001US20010053197 Method and apparatus for measuring a bump on a substrate
12/20/2001US20010053196 Weight compensation apparatus, stage apparatus using the same, and exposure apparatus
12/20/2001US20010053164 Laser imaging apparatus
12/20/2001US20010053099 Semiconductor integrated circuit device capable of ensuring reliability of transistor driving high voltage
12/20/2001US20010053086 Semiconductor memory device with memory test circuit
12/20/2001US20010053058 High dielectric capacitor and method of manufacturing the same
12/20/2001US20010053057 Capacitor with conductively doped Si-Ge alloy electrode
12/20/2001US20010053054 Electrostatic discharge protection circuit
12/20/2001US20010053030 Beam homogenizer, laser illumination apparatus and method, and semiconductor device
12/20/2001US20010053027 Efficient illumination system for color projection displays
12/20/2001US20010053017 Optical member for vacuum ultraviolet, and aligner and device manufacture method using same
12/20/2001US20010052976 Scanning optical detection system
12/20/2001US20010052975 Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination
12/20/2001US20010052970 Stage apparatus, exposure apparatus, and device manufacturing method
12/20/2001US20010052968 Exposure apparatus and device manufacturing method
12/20/2001US20010052967 Exposure apparatus, method of manufacturing semiconductor devices and plant therefor
12/20/2001US20010052966 Scanning exposure method and system
12/20/2001US20010052951 Liquid crystal display device
12/20/2001US20010052950 Semiconductor display device and manufacturing method thereof
12/20/2001US20010052949 Liquid crystal display apparatus and manufacturing method for the same
12/20/2001US20010052889 Liquid crystal display device and deficiency correcting method thereof
12/20/2001US20010052867 Digital-to-analog converter
12/20/2001US20010052820 High frequency power amplifier having a bipolar transistor
12/20/2001US20010052800 Semiconductor integrated circuit device
12/20/2001US20010052783 Device for measurement and analysis of electrical signals of an integrated circuit component
12/20/2001US20010052781 Method of inspecting pattern and inspecting instrument
12/20/2001US20010052676 Multi-channel rotary joint
12/20/2001US20010052653 Semiconductor device and method of producing the same
12/20/2001US20010052651 Driver circuits and methods for manufacturing driver circuits
12/20/2001US20010052650 Semiconductor device and method of manufacturing the same
12/20/2001US20010052649 Semiconductor device
12/20/2001US20010052648 Semiconductor device and method of manufacturing the same
12/20/2001US20010052647 Laminated integrated circuit package
12/20/2001US20010052644 Copper pad structure
12/20/2001US20010052643 Semiconductor device and method for manufacturing same
12/20/2001US20010052642 Semiconductor device package and method
12/20/2001US20010052635 Semiconductor integrated circuit device
12/20/2001US20010052634 Semiconductor device having the effect that the drop in the current gain is kept to the minimum, when the substrate density is amplified and that the variation in the collector current is improved
12/20/2001US20010052633 Semiconductor device
12/20/2001US20010052631 Semiconductor device having active area with angled portion
12/20/2001US20010052628 Semiconductor pressure sensor having strain gauge and circuit portion on semiconductor substrate
12/20/2001US20010052626 Method for fabricating dual-gate structure
12/20/2001US20010052625 Semiconductor memory device and manufacturing method therefor
12/20/2001US20010052623 Semiconductor integrated circuit
12/20/2001US20010052622 Microwave transistor subjected to burn-in testing
12/20/2001US20010052620 Semiconductor device, method of manufacturing the same and resistor
12/20/2001US20010052619 Semiconductor device, and operating device, signal converter, and signal processing system using the same semiconductor device