Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2002
04/10/2002CN1344133A Mfg. method of circuit device
04/10/2002CN1344065A Piezoelectric device and its mfg. method
04/10/2002CN1344037A Luminous element, substrate for mfg. same, and mfg. method for mfg. them
04/10/2002CN1344032A 半导体器件 Semiconductor devices
04/10/2002CN1344030A Light detector with built-in circuit and its prodn. method
04/10/2002CN1344029A Semiconductor memory and its mfg. method
04/10/2002CN1344024A Lead frame and semiconductor pack having same and mfg. method of semiconductor pack
04/10/2002CN1344021A Method for generating capacitor on substrate with automatically aligned contact window mechanism
04/10/2002CN1344019A Method for forming end face electrode
04/10/2002CN1344018A Packaging method of semiconductor chip and its package
04/10/2002CN1344017A Structure with several convex and blocks having insulating side walls and its making method
04/10/2002CN1344016A Method and appts. for installing semiconductor chip
04/10/2002CN1344015A Installing equipment for semiconductor chip
04/10/2002CN1344014A Semiconductor device and semiconductor assembly
04/10/2002CN1344001A Ferroelectric emitter body
04/10/2002CN1343986A Magnetic resistance memory modulus
04/10/2002CN1343984A Integrated circuit for controlling soft disk driver
04/10/2002CN1343900A 液晶显示器 LCD Monitor
04/10/2002CN1343752A Brightener compsn.
04/10/2002CN1343751A Brightener compsn.
04/10/2002CN1343750A Brightener compsn.
04/10/2002CN1343550A Grinding method and appts. and grinding carrier used by grinding method and appts.
04/10/2002CN1343535A Cleaning method, method of mfg. semiconductor device and method of mfg. active matrix type displaying device
04/10/2002CN1082725C 半导体集成电路器件 The semiconductor integrated circuit device
04/10/2002CN1082723C Read only memory structure and mfg. thereof
04/10/2002CN1082722C Method for forming cylindrical stacked capacitor in semiconductor device
04/10/2002CN1082721C Mfg. method of semiconductor device
04/10/2002CN1082720C Semiconductor Substrate and fabrication method for same
04/10/2002CN1082719C Method for mfg. semiconductor device
04/10/2002CN1082718C Semiconductor device and method for mfg. same
04/10/2002CN1082677C Method of adopting ion exchange resin in polar solvent for reducing metal ion content
04/10/2002CN1082572C Method for preparing molten silcon melt from polycrystalline silicon charge
04/10/2002CN1082425C Injection molding appts. and method
04/10/2002CN1082422C Process for mfg. resin-encapsulated electronic product
04/10/2002CN1082402C System for providing ultra-high-purity buffered-HF for semiconductor processing
04/09/2002USRE37627 Wafer centrifugal drying apparatus
04/09/2002US6370675 Semiconductor integrated circuit design and evaluation system using cycle base timing
04/09/2002US6370674 Process for evaluating the performance of very high scale integrated circuits
04/09/2002US6370663 Semiconductor integrated circuit
04/09/2002US6370441 Method and apparatus of correcting design-patterned data, method of electron beam and optical exposure, method of fabricating semiconductor and photomask devices
04/09/2002US6370440 Device and method for supporting system development and computer-readable medium
04/09/2002US6370174 Injection seeded F2 lithography laser
04/09/2002US6370081 Nonvolatile semiconductor memory
04/09/2002US6370062 NAND-type flash memory device and method of operating the same
04/09/2002US6370059 Nonvolatile semiconductor memory
04/09/2002US6370054 Dynamic RAM and semiconductor device
04/09/2002US6370032 Compliant microelectronic mounting device
04/09/2002US6370007 Electrostatic chuck
04/09/2002US6370006 Electrostatic chuck having a plurality of gas inlet channels
04/09/2002US6370005 Electrostatic sensing chuck using area matched electrodes
04/09/2002US6370004 Electrostatic chuck
04/09/2002US6369888 Method and apparatus for article inspection including speckle reduction
04/09/2002US6369884 Method of and apparatus for bonding light-emitting element
04/09/2002US6369876 Exposure apparatus and method, device manufacturing method, and discharge lamp
04/09/2002US6369874 Photoresist outgassing mitigation system method and apparatus for in-vacuum lithography
04/09/2002US6369736 Data converter with vertical resistor meander
04/09/2002US6369654 Semiconductor device
04/09/2002US6369646 Leakage current compensation circuit
04/09/2002US6369627 Delay circuit and semiconductor integrated circuit having same
04/09/2002US6369606 Mixed threshold voltage CMOS logic device and method of manufacture therefor
04/09/2002US6369603 Radio frequency coupling apparatus and method for measuring minority carrier lifetimes in semiconductor materials
04/09/2002US6369490 Base electrode is made of nicr and reduces orientation of the intermediate electrode and the intermediate electrode is made of one of al and an alloy including al.
04/09/2002US6369456 Semiconductor device and producing method thereof
04/09/2002US6369454 Semiconductor package and method for fabricating the same
04/09/2002US6369451 Solder balls and columns with stratified underfills on substrate for flip chip joining
04/09/2002US6369450 Method of producing mounting structure and mounting structure produced by the same
04/09/2002US6369449 Method and apparatus for injection molded flip chip encapsulation
04/09/2002US6369446 Multilayered semiconductor device
04/09/2002US6369445 Method and apparatus for edge connection between elements of an integrated circuit
04/09/2002US6369443 Semiconductor device with stacked vias
04/09/2002US6369441 Method of producing a semiconductor chip having an underplate metal layer
04/09/2002US6369440 Semiconductor substrate and manufacturing method thereof
04/09/2002US6369438 Semiconductor device and method for manufacturing the same
04/09/2002US6369434 Nitrogen co-implantation to form shallow junction-extensions of p-type metal oxide semiconductor field effect transistors
04/09/2002US6369433 High voltage transistor with low body effect and low leakage
04/09/2002US6369432 Enhanced capacitor shape
04/09/2002US6369431 Method for forming conductors in semiconductor devices
04/09/2002US6369430 Method of preventing two neighboring contacts from a short-circuit caused by a void between them and device having the same
04/09/2002US6369429 Low resistance composite contact structure utilizing a reaction barrier layer under a metal layer
04/09/2002US6369428 Polysilicon load for 4T SRAM operating at cold temperatures
04/09/2002US6369425 High-density power device
04/09/2002US6369423 Semiconductor device with a thin gate stack having a plurality of insulating layers
04/09/2002US6369422 Eeprom cell with asymmetric thin window
04/09/2002US6369421 EEPROM having stacked dielectric to increase programming speed
04/09/2002US6369420 Method of self-aligning a floating gate to a control gate and to an isolation in an electrically erasable and programmable memory cell, and a cell made thereby
04/09/2002US6369419 Self-aligned near surface strap for high density trench DRAMS
04/09/2002US6369418 Formation of a novel DRAM cell
04/09/2002US6369416 Semiconductor device with contacts having a sloped profile
04/09/2002US6369414 Charge coupled device having charge accumulating layer free from tow-dimensional effect under miniaturization and process for fabrication thereof
04/09/2002US6369412 Semiconductor integrated device comprising a plurality of basic cells
04/09/2002US6369410 Semiconductor device and method of manufacturing the semiconductor device
04/09/2002US6369409 Semiconductor device and method of manufacturing the same
04/09/2002US6369408 GaAs MOSFET having low capacitance and on-resistance and method of manufacturing the same
04/09/2002US6369407 Semiconductor device
04/09/2002US6369405 Silicon quantum wires
04/09/2002US6369363 Method of measuring electromagnetic radiation
04/09/2002US6369361 Thermal processing apparatus
04/09/2002US6369181 Copolymer resin, preparation thereof, and photoresist using the same
04/09/2002US6369008 For selectively removing contaminants from semiconductor substrates with respect to impurity doped dielectric layers
04/09/2002US6368988 Combined gate cap or digit line and spacer deposition using HDP