Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2002
04/17/2002CN1083153C Apparatus for cleaning semiconductor wafer
04/17/2002CN1083152C Method for mfg. of semiconductor device
04/17/2002CN1083116C Light control device in stepper exposure machine
04/17/2002CN1083077C Crucible fixing method and support base and base assembly equipment
04/17/2002CN1082868C Grinding and polishing machine tool and method and apparatus for grinding and polishing disk using the same
04/17/2002CN1082866C Wafer polishing apparatus and plishing method
04/16/2002US6374398 Efficient database for die-per-wafer computations
04/16/2002US6374397 Lot determination apparatus, lot determination method, and recording medium for storing the method
04/16/2002US6374391 Method for estimating parasitic capacitance coupled to signal line longer than critical length at high-speed
04/16/2002US6374199 Inspection and analyzing apparatus for semiconductor integrated circuit and inspection and analyzing method
04/16/2002US6374194 System and method of diagnosing particle formation
04/16/2002US6374150 Method and apparatus for monitoring and/or end point detecting a process
04/16/2002US6374149 System and method for determining the center of a wafer on a wafer table
04/16/2002US6374144 Method and apparatus for controlling a system using hierarchical state machines
04/16/2002US6373870 Laser irradiation apparatus and laser irradiation method
04/16/2002US6373776 Dynamic ram and semiconductor device
04/16/2002US6373773 Semiconductor device with DRAM and logic part integrated
04/16/2002US6373772 Semiconductor integrated circuit device having fuses and fuse latch circuits
04/16/2002US6373764 Semiconductor memory device allowing static-charge tolerance test between bit lines
04/16/2002US6373763 Semiconductor memory provided with data-line equalizing circuit
04/16/2002US6373760 Static type semiconductor memory device adopting a redundancy system
04/16/2002US6373753 Memory array having selected word lines driven to an internally-generated boosted voltage that is substantially independent of VDD
04/16/2002US6373747 Flash EEprom system
04/16/2002US6373746 Nonvolatile semiconductor memory having plural data storage portions for a bit line connected to memory cells
04/16/2002US6373717 Electronic package with high density interconnect layer
04/16/2002US6373681 Electrostatic chuck, and method of and apparatus for processing sample using the chuck
04/16/2002US6373679 Electrostatic or mechanical chuck assembly conferring improved temperature uniformity onto workpieces held thereby, workpiece processing technology and/or apparatus containing the same, and method(s) for holding and/or processing a workpiece with the same
04/16/2002US6373668 Semiconductor device
04/16/2002US6373619 Pattern generator with improved address resolution
04/16/2002US6373572 Method and apparatus for making and using an improved fiducial for an intergrated circuit
04/16/2002US6373555 Apparatus for projecting a mask pattern onto a wafer with reduced degradation of optical elements
04/16/2002US6373554 Optical system with improved durability for projection exposure apparatus and method for manufacturing optical system for projection exposure apparatus
04/16/2002US6373552 Optical correction plate, and its application in a lithographic projection apparatus
04/16/2002US6373546 Structure of a liquid crystal display and the method of manufacturing the same
04/16/2002US6373329 Bias circuit of a bipolar transistor for high frequency power amplification
04/16/2002US6373323 Semiconductor integrated circuit device with threshold control
04/16/2002US6373321 CMOS semiconductor device
04/16/2002US6373318 Electronic switching device having at least two semiconductor components
04/16/2002US6373291 Pass transistor logic circuit for reducing power consumption
04/16/2002US6373286 Integrated circuit with improved off chip drivers
04/16/2002US6373274 Characteristic evaluation apparatus for insulated gate type transistors
04/16/2002US6373267 Ball grid array-integrated circuit testing device
04/16/2002US6373260 Single cable, single point, stimulus and response probing system and method
04/16/2002US6373159 Substrate rotating apparatus
04/16/2002US6373142 Method of adding filler into a non-filled underfill system by using a highly filled fillet
04/16/2002US6373141 Bondable compliant pads for packaging of a semiconductor chip and method therefor
04/16/2002US6373140 Semiconductor device
04/16/2002US6373138 Integrated circuit with conductive lines disposed within isolation regions
04/16/2002US6373137 Copper interconnect for an integrated circuit and methods for its fabrication
04/16/2002US6373136 Damascene wiring structure and semiconductor device with damascene wirings
04/16/2002US6373135 Semiconductor structure and method of fabrication
04/16/2002US6373134 Semiconductor device and fabrication method introducing horizontal side-steps into vertical steps
04/16/2002US6373132 Semiconductor die with attached heat sink and transfer mold
04/16/2002US6373126 Method for reducing IC package delamination by use of internal baffles
04/16/2002US6373123 Semiconductor structure having more usable substrate area and method for forming same
04/16/2002US6373121 Silicon chip built-in inductor structure
04/16/2002US6373120 Semiconductor device for simultaneously achieving high reliability to laser light radiation and small occupation region and method of manufacturing it
04/16/2002US6373119 Semiconductor device and method of manufacturing the same
04/16/2002US6373116 Two-dimensional image detector
04/16/2002US6373114 Barrier in gate stack for improved gate dielectric integrity
04/16/2002US6373113 Nitrogenated gate structure for improved transistor performance and method for making same
04/16/2002US6373112 Polysilicon-germanium MOSFET gate electrodes
04/16/2002US6373111 Work function tuning for MOSFET gate electrodes
04/16/2002US6373110 Semiconductor device having high breakdown voltage
04/16/2002US6373109 Semiconductor device to more precisely reflect the claimed invention
04/16/2002US6373108 Semiconductor device having reduced sheet resistance of source/drain regions
04/16/2002US6373107 Semiconductor storage device having four-transistor memory cells
04/16/2002US6373106 Semiconductor device and method for fabricating the same
04/16/2002US6373104 Circuit method for reducing parasitic bipolar effects during electrostatic discharges
04/16/2002US6373102 Process for fabricating a channel region of a transistor device with ion implantation and the transistor device formed therefrom
04/16/2002US6373098 Trench-gated device having trench walls formed by selective epitaxial growth and process for forming device
04/16/2002US6373097 Field-effect-controllable, vertical semiconductor component, and monolithically integrated half bridge
04/16/2002US6373096 Method of manufacturing semiconductor device, nonvolatile semiconductor memory device and method of manufacturing the same
04/16/2002US6373095 NVRAM cell having increased coupling ratio between a control gate and floating gate without an increase in cell area
04/16/2002US6373094 EEPROM cell using conventional process steps
04/16/2002US6373093 Semiconductor memory device and method of manufacturing the same
04/16/2002US6373092 Staggered-edge capacitor electrode
04/16/2002US6373091 Vertical DRAM cell with TFT over trench capacitor
04/16/2002US6373090 Scheme of capacitor and bit-line at same level and its fabrication method for 8F2 DRAM cell with minimum bit-line coupling noise
04/16/2002US6373089 DRAM cell having storage capacitor contact self-aligned to bit lines and word lines
04/16/2002US6373088 Edge stress reduction by noncoincident layers
04/16/2002US6373087 Methods of fabricating a metal-oxide-metal capacitor and associated apparatuses
04/16/2002US6373086 Notched collar isolation for suppression of vertical parasitic MOSFET and the method of preparing the same
04/16/2002US6373085 Semiconductor memory cell having two epitaxial layers and its manufacturing method
04/16/2002US6373084 Shared length cell for improved capacitance
04/16/2002US6373082 Compound semiconductor field effect transistor
04/16/2002US6373081 Field effect transistor and method of fabricating the same
04/16/2002US6373080 Thin film transistor with electrode on one side of a trench
04/16/2002US6373077 Group III nitride photonic devices on silicon carbide substrates with conductive buffer interlayer structure
04/16/2002US6373076 Passivated silicon carbide devices with low leakage current and method of fabricating
04/16/2002US6373075 Semiconductor device comprising a semiconductor film having substantially no grain boundary
04/16/2002US6373072 Lithographic projection apparatus
04/16/2002US6373071 Real-time prediction of proximity resist heating and correction of raster scan electron beam lithography
04/16/2002US6373069 Method for evaluating an epitaxial wafer for a light emitting device, recording medium readable by a computer and epitaxial wafer for a light emitting device
04/16/2002US6373054 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same
04/16/2002US6373053 Analysis of CD-SEM signal to detect scummed/closed contact holes and lines
04/16/2002US6373033 Model-based predictive control of thermal processing
04/16/2002US6372981 Semiconductor substrate, solar cell using same, and fabrication methods thereof
04/16/2002US6372928 Layer forming material and wiring forming method
04/16/2002US6372859 Thermoresistance adhesive and semiconductor device using the same