Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2002
04/18/2002US20020045319 A fast low voltage ballistic program, ultra-short channel, ultra- high density, dual-bit multi-level flash memory
04/18/2002US20020045317 Source/drain regions are formed with two regions of an epitaxial silicon film formed on the surface of the substrate and a region formed by ion implantation and thermal diffusion of impurities into the substrate
04/18/2002US20020045316 Method of manufacturing an integrated semiconductor device having a nonvolatile floating gate memiry, and related integrated device
04/18/2002US20020045315 Nonvolatile memory cell, method of programming the same and nonvolatile memory array
04/18/2002US20020045314 Method to form a corrugated structure for enhanced capacitance
04/18/2002US20020045313 Methods of forming capacitors, and methods of forming capacitor-over-bit line memory circuitry, and related integrated circuitry constructions
04/18/2002US20020045312 Method and structure for reducing leakage current in capacitors
04/18/2002US20020045311 Capacitor electrode and a wiring connected by a plug and a conductive layer formed below a capacitive element without using a plug that directly connects the capacitor upper electrode to the wiring via an interlayer insulating film
04/18/2002US20020045310 Semiconductor integrated circuit device and process for manufacturing the same
04/18/2002US20020045309 Semiconductor integrated circuit device and process for manufacturing the same
04/18/2002US20020045308 Semiconductor processing methods of forming a plurality of capacitors on a substrate, bit line contacts and method of forming bit line contacts
04/18/2002US20020045307 Method of forming a silicide layer using metallic impurities and pre-amorphization
04/18/2002US20020045306 Cmos type solid imaging device
04/18/2002US20020045305 Method for fabricating semiconductor device
04/18/2002US20020045304 Fabrication method and structure of flash memory device
04/18/2002US20020045303 Method of manufacturing a flash memory device
04/18/2002US20020045302 Manufacturing method of semiconductor integrated circuit
04/18/2002US20020045299 Method of forming a bottom-gate thin film transistor
04/18/2002US20020045298 Method for forming semiconductor device
04/18/2002US20020045297 Membrane 3D IC fabrication
04/18/2002US20020045296 Semiconductor device
04/18/2002US20020045294 A method for creating printed circuit board substrates having solder mask-free edges
04/18/2002US20020045293 Structure for mounting a bare chip using an interposer
04/18/2002US20020045290 Flip chip and conventional stack
04/18/2002US20020045288 Laser irradiation apparatus and laser irradiation method
04/18/2002US20020045287 Production of diaphragms
04/18/2002US20020045286 Semiconductor light-emitting device and method of manufacturing the same
04/18/2002US20020045285 Aspherical microstructure, and method of fabricating the same
04/18/2002US20020045284 Spatial averaging technique for ellipsometry and reflectometry
04/18/2002US20020045282 Characterizing the interface layer between a thin oxide film and a silicon substrate, especially using spectroscopic measurements.
04/18/2002US20020045280 System for and method of designing and manufacturing a semiconductor device
04/18/2002US20020045279 Methods for fabricating ferroelectric memory devices using pulsed-power plasma
04/18/2002US20020045272 Device for detecting particles in fluid
04/18/2002US20020045146 Batch-type heat treatment apparatus and control method for the batch-type heat treatment apparatus
04/18/2002US20020045134 Improve resolution of patterns; reduce size difference of patterns in the coarse region and fine region; improve size accuracy of patterns existing at the boundary of the coarse region and fine region.
04/18/2002US20020045133 Occurrence of defects in the patterned resist layer can be greatly suppressed resulting in increased reliability of the semiconductor devices and productivity thereof.
04/18/2002US20020045132 Pattern forming method and pattern forming apparatus
04/18/2002US20020045130 Positive-working photoresist composition and resist patterning method using same
04/18/2002US20020045122 Sulfonium salt compound and resist composition and pattern forming method using the same
04/18/2002US20020045110 Photomask fabrication method, photomask, and exposure method thereof
04/18/2002US20020045109 Mask for beam exposure having membrane structure and stencil structure and method for manufacturing the same
04/18/2002US20020045108 Reflection photomasks including buffer layer comprising group VIII metal, and methods of fabricating and using the same
04/18/2002US20020045107 Reticle for creating resist-filled vias in a dual damascene process
04/18/2002US20020045082 Fuel cell and power chip technology
04/18/2002US20020045036 Bga solder ball shear strength
04/18/2002US20020045011 Coating solution spread via rotary table; uniformly in small quantities; adhesive layer insulating film on semiconductor; regulating temperature
04/18/2002US20020045009 Method of chemically growing a thin film in a gas phase on a silicon semiconductor substrate
04/18/2002US20020045008 Cleaning semiconductor wafers; removal of photoresists with ozone and steam; pressurization with gas while feeding solvent vapor reduces contamination
04/18/2002US20020044864 Method of delivering target object to be processed, table mechanism of target object and probe apparatus
04/18/2002US20020044863 Handler for the transporting of flat substrates for application in the semi-conductor industry
04/18/2002US20020044860 Processing system
04/18/2002US20020044859 FOUP loading apparatus for FOUP opener
04/18/2002US20020044855 Automated semiconductor processing system
04/18/2002US20020044580 Light receiving element and semiconductor laser device
04/18/2002US20020044488 Dynamic random access memory (DRAM) having a structure for emplying a word line low voltage
04/18/2002US20020044482 MRAM configuration
04/18/2002US20020044481 Thin film magnetic memory device capable of easily controlling a data write current
04/18/2002US20020044480 Ferroelectric data processing device
04/18/2002US20020044479 Magnetoresistive element, and magnetic memory using the same
04/18/2002US20020044477 Ferroelectric memory device
04/18/2002US20020044475 Dynamic content addressable memory cell
04/18/2002US20020044424 Heat sinks for CPUs for use in personal computers
04/18/2002US20020044404 Electrostatic chuck
04/18/2002US20020044396 Tunnel magnetoresistance effect device, and a portable personal device
04/18/2002US20020044329 Electrooptical unit and electronic apparatus
04/18/2002US20020044287 Point diffraction interferometer, manufacturing method for reflecting mirror, and projection exposure apparatus
04/18/2002US20020044277 Image pickup apparatus and defect inspection system for photomask
04/18/2002US20020044268 Pattern forming apparatus and pattern forming method
04/18/2002US20020044267 Silica-based light-weight EUV lithography stages
04/18/2002US20020044260 Projection optical system, manufacturing method thereof, and projection exposure apparatus
04/18/2002US20020044228 Array substrate for a liquid crystal display and method for fabricating thereof
04/18/2002US20020044227 In-plane switching type liquid crystal display device and a method for manufacturing the same
04/18/2002US20020044174 Microactuator based on diamond
04/18/2002US20020044124 Display panel, display panel inspection method, and display panel manufacturing method
04/18/2002US20020044053 Semiconductor device and test method therefor
04/18/2002US20020044030 Radio frequency module parts including surface elastic wave elements and manufacturing method thereof
04/18/2002US20020044017 High frequency power amplifier module and wireless communication apparatus
04/18/2002US20020044012 Semiconductor integrated circuit having varactor devices
04/18/2002US20020044011 Method to reduce timing skews in i/o circuits and clock drivers caused by fabrication process tolerances
04/18/2002US20020044010 Semiconductor device provided with noise cut filter
04/18/2002US20020044001 Semiconductor device which can be set to predetermined capacitance value without increase of delay time
04/18/2002US20020043994 Resetting circuit and semiconductor device having the same
04/18/2002US20020043981 Wafer probe station for low-current measurements
04/18/2002US20020043980 Multiple-chip probe and universal tester contact assemblage
04/18/2002US20020043979 Semiconductor testing apparatus
04/18/2002US20020043970 Method for inspecting electrical properties of a wafer and apparatus therefor
04/18/2002US20020043937 Magnetron having a lowered oscillation frequency and processing equipment employing the same
04/18/2002US20020043923 Image display unit and production method thereof
04/18/2002US20020043750 Perimeter wafer lifting
04/18/2002US20020043728 Resin composition for sealing semiconductor, semiconductor device using the same, semiconductor wafer and mounted structure of semiconductor device
04/18/2002US20020043726 Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer
04/18/2002US20020043725 Manufacturing process for semiconductor device, photomask, and manufacturing apparatus for semiconductor device
04/18/2002US20020043724 Semiconductor device and method of fabricating same
04/18/2002US20020043723 Semiconductor device and manufacturing method thereof
04/18/2002US20020043722 Semiconductor device and method of manufacturing the same
04/18/2002US20020043721 Chip package with molded underfill
04/18/2002US20020043719 Semiconductor device
04/18/2002US20020043715 Semiconductor device with dummy wiring layers
04/18/2002US20020043714 Premold type semiconductor package and process for manufacturing same
04/18/2002US20020043713 COF-use tape carrier and COF-structured semiconductor device using the same