Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
07/2002
07/03/2002CN1356774A High-frequency switching circuit device
07/03/2002CN1356729A 半导体器件 Semiconductor devices
07/03/2002CN1356728A Ferroelectric FET and its preparing process
07/03/2002CN1356726A Semiconductor memory and its preparing process
07/03/2002CN1356725A Low-noise high-frequency integrated circuit device and its making method
07/03/2002CN1356723A Semiconductor chip installed substrate, electro-optical evice, liquid crystal device, electroluminescent device and electronic machine
07/03/2002CN1356722A Semiconductor device with shallow-channel isolation structure and its preparing process
07/03/2002CN1356721A Chip carrier of chip welding equipment
07/03/2002CN1356720A Process for preparing silicon chip and silicon chip thereof
07/03/2002CN1356719A Method for manufacturing contacts of semiconductor device
07/03/2002CN1356718A Gasifier and gasifying supply equipment
07/03/2002CN1356680A Method for darkening pixels
07/03/2002CN1356594A Photoresist, chemically reinforced photoresist composition and method for generating pattern
07/03/2002CN1356579A Method for improving error of PCB and LCD with said PCB
07/03/2002CN1356369A Apparatus for preparing grinding liquid
07/03/2002CN1356368A Adhesive
07/03/2002CN1356356A Normal Photosensitive resin precursor composition and display using it
07/03/2002CN1356336A Selectively coating metal to nucleic acid by nano metal particles generated in-situ
07/03/2002CN1356249A Method and apparatus for shaping protecting band of belt convayer
07/03/2002CN1356184A Transfer apparatus and method for recovering solid substance
07/03/2002CN1087103C 半导体装置 Semiconductor device
07/03/2002CN1087102C Semiconductor appts.
07/03/2002CN1087101C 半导体检查装置 The semiconductor inspection apparatus
07/03/2002CN1087100C Constant temp chamber of handler for use with semiconductor device testing appts.
07/03/2002CN1087099C Simulation method in lithographic process
07/03/2002CN1087010C Method of mfg. high thermal conductivity integrated circuit aluminum nitride ceramic substrate by curtain coating process
07/02/2002US6415423 LSI design system
07/02/2002US6415419 Semiconductor integrated circuit device and circuit designing method therefor
07/02/2002US6415416 Method for improving the efficiency of designing a system-on-chip integrated circuit device
07/02/2002US6415198 Plasma etching of silicon using a chlorine chemistry augmented with sulfur dioxide
07/02/2002US6415192 Process flow preparation system and method
07/02/2002US6414975 Cladding, active materials; heat treatment
07/02/2002US6414883 Semiconductor memory device
07/02/2002US6414881 Semiconductor device capable of generating internal voltage effectively
07/02/2002US6414878 Data line disturbance free memory block divided flash memory and microcomputer having flash memory therein
07/02/2002US6414877 Nonvolatile semiconductor memory device
07/02/2002US6414876 Flash EEprom system
07/02/2002US6414834 Dielectric covered electrostatic chuck
07/02/2002US6414825 Multilayer; hard dielectric film
07/02/2002US6414783 Method of transferring semiconductors
07/02/2002US6414752 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool
07/02/2002US6414744 Mask handling apparatus for lithographic projection apparatus
07/02/2002US6414742 Stage apparatus, and exposure apparatus and device manufacturing method using the same
07/02/2002US6414738 Liquid crystal; titanium nitride film
07/02/2002US6414729 Liquid crystal display device having stocked pixel layers
07/02/2002US6414564 Distributed constant element using a magnetic thin film
07/02/2002US6414527 Semiconductor device replica circuit for monitoring critical path and construction method of the same
07/02/2002US6414510 Testing apparatus and method of IC devices
07/02/2002US6414509 Method and apparatus for in-situ testing of integrated circuit chips
07/02/2002US6414499 Method for monitoring the shape of the processed surfaces of semiconductor devices and equipment for manufacturing the semiconductor devices
07/02/2002US6414478 Transfer mechanism for use in exchange of probe card
07/02/2002US6414477 Method for optimizing probe card analysis and scrub mark analysis data
07/02/2002US6414438 Method of producing short-wave radiation from a gas-discharge plasma and device for implementing it
07/02/2002US6414415 Surface acoustic wave device and method for manufacturing the same
07/02/2002US6414397 Anisotropic conductive film, method of mounting semiconductor chip, and semiconductor device
07/02/2002US6414395 Semiconductor device capable of preventing disconnection in a through hole
07/02/2002US6414394 Semiconductor device
07/02/2002US6414393 Semiconductor device
07/02/2002US6414392 Integrated circuit contact
07/02/2002US6414387 Semiconductor device including a chip having high-frequency circuit blocks
07/02/2002US6414386 Method to reduce number of wire-bond loop heights versus the total quantity of power and signal rings
07/02/2002US6414380 Semiconductor device and method of making same
07/02/2002US6414379 Structure of disturbing plate having down set
07/02/2002US6414377 Low k dielectric materials with inherent copper ion migration barrier
07/02/2002US6414376 Method and apparatus for reducing isolation stress in integrated circuits
07/02/2002US6414375 Semiconductor device with metal silicide film on partial area of substrate surface and its manufacture method
07/02/2002US6414374 Semiconductor device including edge bond pads and methods
07/02/2002US6414373 Semiconductor device and method of fabricating the same
07/02/2002US6414372 Bipolar transistor having lightly doped epitaxial collector region constant in dopant impurity and process of fabrication thereof
07/02/2002US6414371 Process and structure for 50+ gigahertz transistor
07/02/2002US6414369 Thin film capacitor element
07/02/2002US6414364 Isolation structure and process therefor
07/02/2002US6414361 Buried shallow trench isolation and method for forming the same
07/02/2002US6414355 Silicon-on-insulator (SOI) chip having an active layer of non-uniform thickness
07/02/2002US6414354 Semiconductor device having a semiconductor layer with a channel region having a continuously increasing impurity concentration profile
07/02/2002US6414353 TFT with partially depleted body
07/02/2002US6414352 Semiconductor device having an electronically insulating layer including a nitride layer
07/02/2002US6414351 Mini FLASH process and circuit
07/02/2002US6414350 EPROM cell having a gate structure with dual side-wall spacers of differential composition
07/02/2002US6414348 Nitriding substrate; overcoating with tantalum oxide
07/02/2002US6414347 Vertical MOSFET
07/02/2002US6414346 Semiconductor memory and manufacturing method thereof
07/02/2002US6414345 Semiconductor device including active matrix circuit
07/02/2002US6414344 Semiconductor device for use in a memory cell and method for the manufacture thereof
07/02/2002US6414340 Multilayer structures
07/02/2002US6414338 n-Type diamond and method for producing same
07/02/2002US6414336 Semiconductor device capable of improving manufacturing
07/02/2002US6414334 Semi-conductor device with test element group for evaluation of interlayer dielectric and process for producing the same
07/02/2002US6414329 Method and system for microwave excitation of plasma in an ion beam guide
07/02/2002US6414328 Method and apparatus for the conveying and positioning of ion implantation targets
07/02/2002US6414325 Charged particle beam exposure apparatus and exposure method capable of highly accurate exposure in the presence of partial unevenness on the surface of exposed specimen
07/02/2002US6414313 Multiple numerical aperture electron beam projection lithography system
07/02/2002US6414300 Circuit with a sensor and non-volatile memory having a ferroelectric dielectric capacitor
07/02/2002US6414280 Heat treatment method and heat treatment apparatus
07/02/2002US6414279 Heat treatment device of the light irradiation type
07/02/2002US6414277 Ultra-high-temperature heat treatment apparatus
07/02/2002US6414276 Method for substrate thermal management
07/02/2002US6414271 Contact heating device
07/02/2002US6413923 Non-corrosive cleaning composition for removing plasma etching residues
07/02/2002US6413896 Sintering dielectric ceramic