Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
07/2002
07/03/2002EP1220323A2 LDMOS with improved safe operating area
07/03/2002EP1220322A2 High breakdown-voltage semiconductor device
07/03/2002EP1220320A1 Sigec semiconductor crystal and production method thereof
07/03/2002EP1220319A1 Ultrahigh speed image pickup device
07/03/2002EP1220315A2 Semiconductor integrated circuit device, circuit design apparatus, and circuit design method
07/03/2002EP1220314A2 Power Semiconductor Modul
07/03/2002EP1220312A1 Integration process on a SOI substrate of a semiconductor device comprising at least a dielectrically isolated well
07/03/2002EP1220311A2 Electrostatic chuck and method of manufacturing the same
07/03/2002EP1220310A1 Semiconductor wafer with anisotropic conductor film, and method of manufacture thereof
07/03/2002EP1220309A1 Manufacturing method of an electronic device package
07/03/2002EP1220308A2 Etching method for ZnSe polycrystalline substrate
07/03/2002EP1220307A1 Method and apparatus for radiation-assisted electrochemical etching, and etched product
07/03/2002EP1220306A1 Method of manufacturing semiconductor device
07/03/2002EP1220304A2 Method for fabricating nitride semiconductor, method for fabricating nitride semiconductor device, and nitride semiconductor device
07/03/2002EP1220303A1 Hot plate unit
07/03/2002EP1220302A1 Ceramic heater for semiconductor manufacturing/testing apparatus
07/03/2002EP1220301A2 Die bonder and/or wire bonder with a device for holding down a substrate
07/03/2002EP1220300A2 Light irradiation part arrangement of a heating device
07/03/2002EP1220271A2 Ion source having replaceable and sputterable solid source material
07/03/2002EP1220187A1 Electric circuit board, tft array substrate using the same, and liquid crystal display
07/03/2002EP1220122A1 Fast converging method for timing performances optimisation
07/03/2002EP1220071A1 Semiconductor device
07/03/2002EP1220040A2 Exposure apparatus and method, device manufacturing method, and discharge lamp
07/03/2002EP1220037A2 Exposure apparatus and method of manufacturing an exposure apparatus
07/03/2002EP1220034A2 Photomask blank and photomask
07/03/2002EP1220012A2 Optical mount unit and oscillation damping system
07/03/2002EP1219994A2 Semiconductor device, optoelectronic board, and production methods therefor
07/03/2002EP1219725A1 Method for tungsten chemical vapor deposition on a semiconductor substrate
07/03/2002EP1219660A2 Process for direct substitution of high performance polymers with unsaturated ester groups
07/03/2002EP1219565A1 Process for manufacturing integrated devices having connections on separate wafers and stacking the same
07/03/2002EP1219397A1 Method and apparatus for loading, unloading and transferring semiconductor bars
07/03/2002EP1219394A2 Articulated robot
07/03/2002EP1219141A1 Multi-zone resistance heater
07/03/2002EP1218946A1 Apparatus for localizing production errors in a photovoltaic element
07/03/2002EP1218944A1 Superlattice fabrication for inas/gasb/alsb semiconductor structures
07/03/2002EP1218943A1 High-speed lateral bipolar device in soi process
07/03/2002EP1218942A1 Semiconductor device combining the advantages of massive and soi architecture, and method for making same
07/03/2002EP1218941A1 Non-volatile memory having high gate coupling capacitance
07/03/2002EP1218939A2 Lead frame laminate and method for manufacturing semiconductor parts
07/03/2002EP1218938A1 Method for providing a dopant level for polysilicon for flash memory devices
07/03/2002EP1218937A2 Novel chip interconnect and packaging deposition methods and structures
07/03/2002EP1218936A2 Methods and apparatuses for trench depth detection and control
07/03/2002EP1218935A2 Interferometric method for endpointing plasma etch processes
07/03/2002EP1218934A1 Method for determining the endpoint of etch process steps
07/03/2002EP1218933A1 Method and apparatus for performing run-to-run control in a batch manufacturing environment
07/03/2002EP1218932A1 Process for reducing waviness in semiconductor wafers
07/03/2002EP1218931A2 A method for cleaning and treating a semiconductor wafer after chemical mechanical polishing
07/03/2002EP1218930A1 Method of forming smooth morphologies in inp-based semiconductors
07/03/2002EP1218929A1 Cleaning solution for semiconductor surfaces following chemical-mechanical polishing
07/03/2002EP1218928A1 Integrated circuits with barrier layers and methods of fabricating same
07/03/2002EP1218927A1 A method and system for reducing photo-assisted corrosion in wafers during cleaning processes
07/03/2002EP1218926A1 Wafer atmospheric transport module having a controlled mini-environment
07/03/2002EP1218925A1 Method and apparatus to reduce contaminants from semiconductor wafers
07/03/2002EP1218918A2 Immersion lens with magnetic shield for charged particle beam system
07/03/2002EP1218917A2 High transmission, low energy beamline apparatus for ion implanter
07/03/2002EP1218916A1 Electron beam plasma formation for surface chemistry
07/03/2002EP1218888A2 A symmetric segmented memory array architecture
07/03/2002EP1218807A1 Real-time fault detection
07/03/2002EP1218806A1 Method and apparatus for monitoring controller performance using statistical process control
07/03/2002EP1218800A2 Ultra high resolution lithographic imaging and printing and defect reduction by exposure near the critical condition
07/03/2002EP1218799A1 Shielding against external excitations while measuring oscillatory semiconductor membranes
07/03/2002EP1218798A1 Method and apparatus for determining phase shifts and trim masks for an integrated circuit
07/03/2002EP1218796A1 Extreme ultraviolet soft x-ray projection lithographic method and mask devices
07/03/2002EP1218791A2 Multi-beam scanner including a dove prism array
07/03/2002EP1218765A2 Wafer-level burn-in and test cartridge and methods
07/03/2002EP1218763A1 Electron density measurement and control system using plasma-induced changes in the frequency of a microwave oscillator
07/03/2002EP1218729A2 Apparatus and method for texture analysis on semiconductor wafers
07/03/2002EP1218689A1 Method and apparatus for in-situ monitoring of plasma etch and deposition processes using a pulsed broadband light source
07/03/2002EP1218688A2 Method and apparatus for three dimensional inspection of electronic components
07/03/2002EP1218603A1 System and method for making wallboard or backerboard sheets including aerated concrete
07/03/2002EP1218573A1 Method and device for depositing materials with a large electronic energy gap and high binding energy
07/03/2002EP1218569A1 Galvanizing solution for the galvanic deposition of copper
07/03/2002EP1218466A1 Compositions for and methods of reducing/eliminating scratches and defects in silicon dioxide cmp process
07/03/2002EP1218465A1 Polishing system with stopping compound and method of its use
07/03/2002EP1218464A1 Chemical mechanical polishing systems and methods for their use
07/03/2002EP1218291A1 Method for producing high-purity hydrochloric acid
07/03/2002EP1218264A1 Transport module with latching door
07/03/2002EP1218202A1 Method and compositions for printing substrates
07/03/2002EP1218143A1 Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates with metal compound abrasives
07/03/2002EP1177631A4 Heterogeneous programmable gate array
07/03/2002EP1163379B1 Semiconductor wafer comprising a thin epitaxial silicon layer and method for producing same
07/03/2002EP1141960B1 Read/write architecture for a mram
07/03/2002EP1112159B1 Method for producing a hybrid frame or hybrid housing and corresponding hybrid frame or hybrid housing
07/03/2002EP1099221B1 Magnetoresistive memory with low current density
07/03/2002EP1066133B1 Polishing apparatus
07/03/2002EP1038047B1 Chemical deposition method using catalyst on surface
07/03/2002EP1025470B1 Process for determining possible configurations of machining plants
07/03/2002EP0973962B1 Low defect density, ideal oxygen precipitating silicon
07/03/2002EP0919012B1 Positive photoresist composition containing a 2,4-dinitro-1-naphthol
07/03/2002EP0902976B1 High frequency microelectronics package
07/03/2002EP0898703B1 Method and apparatus for analysing optical parameters
07/03/2002EP0891311B1 Tape cast silicon carbide dummy wafer
07/03/2002EP0838083B1 Support for wafer-shaped objects, in particular silicon wafers
07/03/2002CN2498740Y Structure for integrated circuit chip assembly
07/03/2002CN1357156A Method for producing semiconductor components
07/03/2002CN1357110A System, method and appts. available for actively selecting scan test
07/03/2002CN1356930A Wafer container washing appts.
07/03/2002CN1356921A Organic acid scrubber and methods
07/03/2002CN1356864A Multi-layer ceramic substrate and its preparing process
07/03/2002CN1356860A Ion generator for ion beam radiator