Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2003
05/07/2003CN1416175A Memory array self aligning method of forming floating grid memory unit and memory array
05/07/2003CN1416173A Ferroelectric condenser and semiconductor device
05/07/2003CN1416172A Semiconductor integrated circuit and standard unit configuration design method
05/07/2003CN1416170A Semiconductor device and mfg. method thereof
05/07/2003CN1416169A 树脂密封型的半导体装置 The resin sealing type semiconductor device
05/07/2003CN1416168A Method for preparing nano CMOS parts by using side wall and solid phase diffusion of polysilicon
05/07/2003CN1416167A Method for designing and allocating masks in procedure of making integrated circuit
05/07/2003CN1416166A Method of mfg. integrated circuit with shallow junction
05/07/2003CN1416165A Semiconductor device, its production technique and detction method
05/07/2003CN1416164A System, equipment and method for automatic testing IC complete device
05/07/2003CN1416163A System, equipment and method for automatic testing IC complete device
05/07/2003CN1416162A Control method for automatic testing IC complete device
05/07/2003CN1416161A Ic making appts.
05/07/2003CN1416160A Method for encapsulting semiconductor chip and its products
05/07/2003CN1416159A Epitaxial silicon mutually compensated metal oxide semiconductor on silicon germanium/insulator and its mfg. method
05/07/2003CN1416158A Dielectric film forming material, delectric film method of forming delectric film and semiconductor device
05/07/2003CN1416157A Method for preparing nano ordered microcrack on substrate of strontium titanate
05/07/2003CN1416156A Structure of grid medium with high dielectric and its preparation method
05/07/2003CN1416155A Mothod of forming resistance electrode
05/07/2003CN1416154A Technical process method for semiconductor grid electrode with multi layered structure
05/07/2003CN1416153A Combination of heating furnace and loading tool of semiconductor substrate and mfg. method of semiconductor devic
05/07/2003CN1416135A 半导体存储器 Semiconductor memory
05/07/2003CN1416131A Semiconductor storage device adapting to multiple packing forms
05/07/2003CN1416076A Fault diagnosis of prodn. appts. and fault diagnosis system
05/07/2003CN1416020A Double-bulb exposure device
05/07/2003CN1416019A 曝光方法和曝光装置 Exposure method and exposure apparatus
05/07/2003CN1415782A Precursor body for zirconia and Hf Oxide thin film deposition
05/07/2003CN1108088C Coating for structured prodn. of conductors on surface of electrically insulating substrates
05/07/2003CN1107981C SRAM cell and method for mfg. same
05/07/2003CN1107980C Static semiconductor storage device whose data wire is parallel to power wire
05/07/2003CN1107979C Electrode structure, forming method and mounting body for semiconductor device, and semiconductor device
05/07/2003CN1107978C Electronic package with thermally conductive support member
05/07/2003CN1107977C Semiconductor device
05/07/2003CN1107976C Process for fabricating semiconductor device without separation between silicide layer and insulating layer
05/07/2003CN1107975C Method for forming isolation region of semiconductor device
05/07/2003CN1107974C Equivalent circuit for simulating ferroelectric capacitance
05/07/2003CN1107973C IC discharging appts. for flip chip mounting facility
05/07/2003CN1107972C Mfg. method for semiconductor packed according to chip size
05/07/2003CN1107971C Etching method for layer in semiconductor device
05/07/2003CN1107970C Wet processing methods for mfg. electronic components
05/07/2003CN1107969C Method for fabricating contact of semiconductor device
05/07/2003CN1107968C Method of forming planarization medium layer on intermetal picture and multi-layer intermetal intermetal picture structure
05/07/2003CN1107955C Voltage boosting circuit of semiconductor memory device
05/07/2003CN1107890C Real time control method for semiconductor working appts.
05/07/2003CN1107889C Method for feedforward corrections for off-specification conditions
05/07/2003CN1107746C Process and appts. for prodn. of polycrystalline semiconductor crystal ingot
05/07/2003CN1107554C Cleaning mechanism of using high density compressed liquefied gases, cleaning appts, and cleaning method
05/06/2003US6560768 Circuit pattern design method, circuit pattern design system, and recording medium
05/06/2003US6560767 Process for making photomask pattern data and photomask
05/06/2003US6560765 Method for generating mask data, mask and computer readable recording media
05/06/2003US6560762 Semiconductor integrated circuit and wiring method
05/06/2003US6560760 Automatic cell placement method
05/06/2003US6560759 Semiconductor integrated circuit device, design method for the same and computer-readable recording where medium I/O cell library is recorded
05/06/2003US6560753 Integrated circuit having tap cells and a method for positioning tap cells in an integrated circuit
05/06/2003US6560735 Methods and apparatus for testing integrated circuits
05/06/2003US6560729 Automated determination and display of the physical location of a failed cell in an array of memory cells
05/06/2003US6560728 Layout for semiconductor memory device having a plurality of rows and columns of circuit cells divided into first and second planes that are not simultaneously active
05/06/2003US6560507 Module classification approach for moving semiconductor wafers in a wafer processing system
05/06/2003US6560506 Processing run of semiconductor devices, performing manufacturing environmental data analysis, implementing control parameter modification sequence in response to manufacturing environmental data analysis
05/06/2003US6560503 Method and apparatus for monitoring controller performance using statistical process control
05/06/2003US6560261 Semiconductor laser device having InGaAs compressive-strain active layer, GaAsP tensile-strain barrier layers, and InGaP optical waveguide layers
05/06/2003US6560164 Semiconductor integrated circuit device with internal clock generating circuit
05/06/2003US6560163 Semiconductor device including a repetitive pattern
05/06/2003US6560157 Semiconductor device
05/06/2003US6560147 Semiconductor device having scan test circuit that switches clock signal between shift mode and capture mode, and method of testing the semiconductor device
05/06/2003US6560135 Magnetic semiconductor memory apparatus and method of manufacturing the same
05/06/2003US6560134 Memory configuration with a central connection area
05/06/2003US6560122 Chip package with molded underfill
05/06/2003US6560108 Chip scale packaging on CTE matched printed wiring boards
05/06/2003US6560044 Illumination optical system in exposure apparatus
05/06/2003US6560031 Optical projection lens system
05/06/2003US6560018 Illumination system for transmissive light valve displays
05/06/2003US6559942 Monitoring substrate processing with optical emission and polarized reflected radiation
05/06/2003US6559937 Inspection apparatus and method
05/06/2003US6559927 Gap adjusting method in exposure apparatus
05/06/2003US6559926 Pattern forming apparatus and pattern forming method
05/06/2003US6559925 Projection exposure apparatus and method
05/06/2003US6559924 Alignment method, alignment apparatus, profiler, exposure apparatus, exposure apparatus maintenance method, semiconductor device manufacturing method, and semiconductor manufacturing factory
05/06/2003US6559922 Method and apparatus for a non-contact scavenging seal
05/06/2003US6559906 Liquid crystal display device having gate electrode with two conducting layers, one used for self-aligned formation of the TFT semiconductor regions
05/06/2003US6559905 Active matrix substrate and method of manufacturing the same
05/06/2003US6559821 Matrix substrate and liquid crystal display as well as projector using the same
05/06/2003US6559700 Semiconductor integrated circuit
05/06/2003US6559691 Voltage level converting circuit
05/06/2003US6559683 Resurf EDMOS transistor and high-voltage analog multiplexer circuit using the same
05/06/2003US6559672 Characteristic evaluation apparatus for insulated gate type transistors
05/06/2003US6559668 Low-current pogo probe card
05/06/2003US6559662 Semiconductor device tester and semiconductor device test method
05/06/2003US6559650 RF power probe head with a thermally conductive bushing
05/06/2003US6559594 Light-emitting device
05/06/2003US6559548 Wiring structure of semiconductor device
05/06/2003US6559547 Patterning of content areas in multilayer metalization configurations of semiconductor components
05/06/2003US6559546 Tin palladium activation with maximized nuclei density and uniformity on barrier material in interconnect structure
05/06/2003US6559545 Semiconductor devices and methods for manufacturing semiconductor devices
05/06/2003US6559544 Programmable interconnect for semiconductor devices
05/06/2003US6559542 Semiconductor device and method of manufacturing the same
05/06/2003US6559540 Flip-chip semiconductor device and method of forming the same
05/06/2003US6559537 Ball grid array packages with thermally conductive containers
05/06/2003US6559534 Thermal capacity for electronic component operating in long pulses
05/06/2003US6559527 Process for forming cone shaped solder for chip interconnection