Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2003
04/30/2003CN1413899A Reel for bonding wire, and method for processing winding drum using the reel
04/30/2003CN1413791A Calibration method for wire welder
04/30/2003CN1107375C 半导体器件 Semiconductor devices
04/30/2003CN1107351C Nonvolatile semiconductor memory and method of fabrication
04/30/2003CN1107350C Layout structure of semiconductor storage device
04/30/2003CN1107349C Semiconductor device lead frame and lead bonding
04/30/2003CN1107348C Method for producing dynamic RAM
04/30/2003CN1107347C Dynamic random-access storage device structure and mfg. method therefor
04/30/2003CN1107346C Method for manufacturing semiconductor device capable improving planarization
04/30/2003CN1107345C Manufacturing method of semiconductor device with capacity cell
04/30/2003CN1107344C Fabrication method of semiconductor device using selective epitaxial growth
04/30/2003CN1107342C Pattern forming method
04/30/2003CN1107341C Method for pattering insulator film by electron beam irradiation
04/30/2003CN1107340C Method for forming self-aligned contact in semiconductor device
04/30/2003CN1107339C Laminate for forming ohmic electrode and ohmic electrode
04/30/2003CN1107338C Device for producing semiconductor device and its producing method
04/30/2003CN1107336C Multi-layer circuit substrate and mfg. method thereof
04/30/2003CN1107322C Nonvolatile memory and its method of programming
04/30/2003CN1107320C Semiconductor storage device and electronic equipment using the same
04/30/2003CN1107232C Reusable chip carrier for pre-analog running and pre-analog running process
04/30/2003CN1107231C Method and apparatus for automated docking of test head to device handler
04/30/2003CN1107124C Modification of surfaces of polymers, polymers with modified surface
04/30/2003CN1107097C Chemicomechanically grinding composition and method
04/30/2003CN1107009C In/out port transfer mechanism
04/30/2003CN1107005C Transport box
04/29/2003USRE38097 In situ removal of deposits from gas apparatus; maintenance
04/29/2003US6557163 Method of photolithographic critical dimension control by using reticle measurements in a control algorithm
04/29/2003US6557162 Method for high yield reticle formation
04/29/2003US6557155 Layout design method
04/29/2003US6557152 Method of designing signal distribution circuit and system for supporting the same
04/29/2003US6557148 Circuit analysis tool and recording medium having recorded program for making the circuit analysis tool function
04/29/2003US6557143 Computer aided design system and computer-readable medium storing a program for designing clock gated logic circuits and gated clock circuit
04/29/2003US6557129 Method and apparatus for selectively compacting test responses
04/29/2003US6556962 Method for reducing network costs and its application to domino circuits
04/29/2003US6556959 Method and apparatus for updating a manufacturing model based upon fault data relating to processing of semiconductor wafers
04/29/2003US6556955 Method of determining lethality of defects in circuit pattern inspection, method of selecting defects to be reviewed, and inspection system of circuit patterns involved with the methods
04/29/2003US6556949 Semiconductor processing techniques
04/29/2003US6556947 Optical measurements of patterned structures
04/29/2003US6556938 Systems and methods for facilitating automated test equipment functionality within integrated circuits
04/29/2003US6556887 Method for determining a position of a robot
04/29/2003US6556882 Method and apparatus for generating real-time data from static files
04/29/2003US6556881 Method and apparatus for integrating near real-time fault detection in an APC framework
04/29/2003US6556876 Hybrid fuzzy closed-loop sub-micron critical dimension control in wafer manufacturing
04/29/2003US6556703 Scanning electron microscope system and method of manufacturing an integrated circuit
04/29/2003US6556702 Method and apparatus that determines charged particle beam shape codes
04/29/2003US6556658 Method for adding redundant vias on VLSI chips
04/29/2003US6556648 Lithographic apparatus, device manufacturing method, and device manufactured thereby
04/29/2003US6556479 Nonvolatile semiconductor memory device
04/29/2003US6556477 Integrated chip having SRAM, DRAM and flash memory and method for fabricating the same
04/29/2003US6556475 Non-volatile memory and semiconductor device
04/29/2003US6556473 Magnetic memory with reduced write current
04/29/2003US6556418 Micromechanical component and process for its fabrication
04/29/2003US6556414 Electrostatic and vacuum chucking holding apparatus
04/29/2003US6556409 Integrated circuit including ESD circuits for a multi-chip module and a method therefor
04/29/2003US6556364 Apparatus, system, and method for precision positioning and alignment of a lens in an optical system
04/29/2003US6556353 Projection optical system, projection exposure apparatus, and projection exposure method
04/29/2003US6556303 Scattered signal collection using strobed technique
04/29/2003US6556294 Method of and apparatus for article inspection including speckle reduction
04/29/2003US6556281 For supporting a substrate during lithographic processing, capable of flexing and thereby altering surface topography; semiconductors
04/29/2003US6556279 Motion compensation system and method for lithography
04/29/2003US6556264 Prevents lowering of contrast and diffused reflection of light; chemical mechanical polishing; electrooptics; efficiency; performance
04/29/2003US6556105 Surface wave device connected to a base with a conductive adhesive
04/29/2003US6556071 Semiconductor integrated circuit
04/29/2003US6556066 Boosting method and apparatus
04/29/2003US6556065 256 Meg dynamic random access memory
04/29/2003US6556044 Programmable logic device including multipliers and configurations thereof to reduce resource utilization
04/29/2003US6556037 Semiconductor integrated circuit and test board
04/29/2003US6556036 Semiconductor integrated circuit device
04/29/2003US6555936 Flatmotor device and exposure device
04/29/2003US6555925 Semiconductor device and producing method thereof
04/29/2003US6555924 Positioning flash preventing mechanism in front of entry of an air vent, then mounting semiconductor chip, then encapsulating with a mold which rapidly absorbs heat and has increased viscosity
04/29/2003US6555923 Semiconductor chip having pads with plural junctions for different assembly methods
04/29/2003US6555922 IC bonding pad combined with mark or monitor
04/29/2003US6555916 Integrated circuit prepared by selectively cleaning copper substrates, in-situ, to remove copper oxides
04/29/2003US6555915 Integrated circuit having interconnect to a substrate and method therefor
04/29/2003US6555914 Comprises reduced parasitic capacitance; constructed as electroconductive laminated layers
04/29/2003US6555912 Corrosion-resistant electrode structure for integrated circuit decoupling capacitors
04/29/2003US6555911 Semiconductor device and method of manufacturing interconnections thereof using copper and tungsten in predetermined ratios
04/29/2003US6555910 Use of small openings in large topography features to improve dielectric thickness control and a method of manufacture thereof
04/29/2003US6555908 Compliant, solderable input/output bump structures
04/29/2003US6555907 High-frequency integrated circuit and high-frequency circuit device using the same
04/29/2003US6555906 Microelectronic package having a bumpless laminated interconnection layer
04/29/2003US6555901 Semiconductor device including eutectic bonding portion and method for manufacturing the same
04/29/2003US6555900 Package, semiconductor device and method for fabricating the semiconductor device
04/29/2003US6555897 Assembly for attaching die to leads
04/29/2003US6555896 Made of silicon nitride with hydrogen incorporated therein by increasing ammonia flow or decreasing silane flow during a plasma enhanced chemical vapor deposition; use in silicon oxide dry fluorine etch; integrated circuits
04/29/2003US6555895 Devices and methods for addressing optical edge effects in connection with etched trenches
04/29/2003US6555894 Device with patterned wells and method for forming same
04/29/2003US6555893 Bar circuit for an integrated circuit
04/29/2003US6555892 Semiconductor device with reduced line-to-line capacitance and cross talk noise
04/29/2003US6555891 SOI hybrid structure with selective epitaxial growth of silicon
04/29/2003US6555888 Electrostatic discharge protection for sensors
04/29/2003US6555887 Semiconductor device with multi-layer interconnection
04/29/2003US6555886 Device having two perovskite crystalline layers that shows hysteresis and piezoelectric behavior
04/29/2003US6555885 Semiconductor device and method of manufacturing the same
04/29/2003US6555884 Semiconductor device for providing a noise shield
04/29/2003US6555882 Semiconductor element and semiconductor memory device using the same
04/29/2003US6555881 Mask ROM cell and method of fabricating the same
04/29/2003US6555880 Self-aligned silicide process utilizing ion implants for reduced silicon consumption and control of the silicide formation temperature and structure formed thereby
04/29/2003US6555879 SOI device with metal source/drain and method of fabrication