| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 07/23/2003 | CN1431713A Semiconductor device and its mfg. method |
| 07/23/2003 | CN1431711A Mutually compensating metal oxide semiconductor thin film transistor and its mfg. method |
| 07/23/2003 | CN1431710A 半导体装置 Semiconductor device |
| 07/23/2003 | CN1431708A Wafer formed diffusion type capsulation structure and its mfg. methods |
| 07/23/2003 | CN1431705A Method for mfg. mask type ROM in high density planar unit mode |
| 07/23/2003 | CN1431704A Solving method for transient analysis of power source network based on equivalent circuit |
| 07/23/2003 | CN1431703A Method for lowering anomaly discharges happened on interconnected wires in plasma procedure |
| 07/23/2003 | CN1431702A Mfg. method for forming selective copper film on inset type connected conducting wire |
| 07/23/2003 | CN1431701A Method for forming graphical oxygen injection and separator with shallow grooves at same time |
| 07/23/2003 | CN1431700A Method for mfg. separator with shallow grooves |
| 07/23/2003 | CN1431699A Integrating method for silicon integrated MEMS parts |
| 07/23/2003 | CN1431698A Method for forming capacitor for metel-insulation-metal structure in process of insertting copper |
| 07/23/2003 | CN1431697A Method for mfg. polysilicon/polysilicon capacitance |
| 07/23/2003 | CN1431696A Method for mfg. polisilicon/polisilicon capacitance |
| 07/23/2003 | CN1431695A Method for verificating tube feet names of chips |
| 07/23/2003 | CN1431694A Probe structure of wafer class test card and its mfg. methods |
| 07/23/2003 | CN1431693A Wafer class probe card and its mfg. method |
| 07/23/2003 | CN1431692A Chip component feeder |
| 07/23/2003 | CN1431691A Throwing method and system used for mfg. capsulation parts of semi-conductor |
| 07/23/2003 | CN1431690A Field effect transistors with their source and drain electrodes being manufactured on insulator by selection extrapolation method |
| 07/23/2003 | CN1431689A Method for forming oxide film to resist corrosion of photo resistive removing liquor |
| 07/23/2003 | CN1431688A Method for forming layer of silicon oxynitride on silicon nitride layer |
| 07/23/2003 | CN1431687A Method for removing photoresistive layer in mfg. process of inserting metals |
| 07/23/2003 | CN1431686A Method of etching silicon in high ratio between depth and width |
| 07/23/2003 | CN1431685A Method by using wet etching with non-equivalence in directions to carry out even process |
| 07/23/2003 | CN1431684A Wafer dividing method using cleavage |
| 07/23/2003 | CN1431683A Chips and their mfg. methods |
| 07/23/2003 | CN1431682A Surface protective binding film for semiconductor wafer and semiconductor wafer processing method using same |
| 07/23/2003 | CN1431681A Method for encapsulation in chip level by use of electroplating mask of elastic body |
| 07/23/2003 | CN1431680A Method for forming structure of fine sizes |
| 07/23/2003 | CN1431679A Method for preparing silicon quantum wire of whole dielectric isolation by using isolation technique of injecting oxygen |
| 07/23/2003 | CN1431520A Automatic test system for laser diode |
| 07/23/2003 | CN1431518A Contactor for detecting small device and parts |
| 07/23/2003 | CN1431142A Multi-user oriented mechanical manufacturing method by linking-deep etching of releasing micro electrons |
| 07/23/2003 | CN1115945C Method and appts. for assembling interal circuit units |
| 07/23/2003 | CN1115730C Semiconductor device and its mfg. method |
| 07/23/2003 | CN1115729C Semiconductor device and method for mfg. same |
| 07/23/2003 | CN1115728C Monochip integrated circuit and method of fabricating monolithic integrated circuit |
| 07/23/2003 | CN1115727C Method for producing BiCMOS semiconductor device |
| 07/23/2003 | CN1115726C Semiconductor device and mfg. method therefor |
| 07/23/2003 | CN1115725C Process for forming multilevel interconnection structure |
| 07/23/2003 | CN1115724C Plug mfg. method |
| 07/23/2003 | CN1115723C Tungsten nitride (WNX) layer mfg. method and metal wiring mfg. method using same |
| 07/23/2003 | CN1115722C Mfg. method of thin film insulated grid field transistor |
| 07/23/2003 | CN1115720C Method for mfg. semiconductor integrated circuit device |
| 07/23/2003 | CN1115719C Alignment method |
| 07/23/2003 | CN1115718C Method for forming metal wiring of semiconductor devices |
| 07/23/2003 | CN1115717C Mfg. Process for semiconductor device |
| 07/23/2003 | CN1115716C Processing method of semiconductor substrate and semiconductor substrate |
| 07/23/2003 | CN1115715C Method of processing semiconductor film and semiconductor device produced by such method |
| 07/23/2003 | CN1115714C Device and method for jet-coating photoresit |
| 07/23/2003 | CN1115713C Laser processing method |
| 07/23/2003 | CN1115596C Light receiving member and its prodn. tech, electrophotographic appts. and electrophotographic method |
| 07/23/2003 | CN1115427C Process and appts. for producing polycrystalline semiconductor |
| 07/23/2003 | CN1115425C Gas injection system for semiconductor processing |
| 07/22/2003 | US6598217 Method of mounting fabrication-historical data for semiconductor device, and semiconductor device fabricated by such a method |
| 07/22/2003 | US6598210 Semiconductor inspecting system, method and computer |
| 07/22/2003 | US6598187 Semiconductor integrated circuit device with test circuit |
| 07/22/2003 | US6598185 Pattern data inspection method and storage medium |
| 07/22/2003 | US6597964 Thermocoupled lift pin system for etching chamber |
| 07/22/2003 | US6597963 System and method to recreate illumination conditions on integrated circuit bonders |
| 07/22/2003 | US6597952 Apparatus and method for setting the parameters of an alert window used for timing the delivery of ETC signals to a heart under varying cardiac conditions |
| 07/22/2003 | US6597601 Thin film magnetic memory device conducting data read operation without using a reference cell |
| 07/22/2003 | US6597599 Semiconductor memory |
| 07/22/2003 | US6597562 Electrically polar integrated capacitor and method of making same |
| 07/22/2003 | US6597550 High voltage integrated circuit with resistor connected between substrate and ground to limit current during negative voltage spike |
| 07/22/2003 | US6597511 Microlithographic illuminating system and microlithographic projection exposure arrangement incorporating said system |
| 07/22/2003 | US6597498 Optical system for the vacuum ultraviolet |
| 07/22/2003 | US6597448 Apparatus and method of inspecting foreign particle or defect on a sample |
| 07/22/2003 | US6597440 Wavefront measuring method and projection exposure apparatus |
| 07/22/2003 | US6597434 Lithographic apparatus, device manufacturing method, and device manufactured thereby |
| 07/22/2003 | US6597433 Multi-stage drive arrangements and their application in lithographic projection apparatuses |
| 07/22/2003 | US6597432 Board-stage for an aligner |
| 07/22/2003 | US6597431 Lithographic projection apparatus and device manufacturing method |
| 07/22/2003 | US6597429 Lithographic apparatus, device manufacturing method, and device manufactured thereby |
| 07/22/2003 | US6597415 Thin film transistor substrates for liquid crystal displays including thinner passivation layer on storage capacitor electrode than other regions |
| 07/22/2003 | US6597349 Semiconductor display device and method of driving the same |
| 07/22/2003 | US6597236 Potential detecting circuit for determining whether a detected potential has reached a prescribed level |
| 07/22/2003 | US6597231 Semiconductor switching circuit and semiconductor device using same |
| 07/22/2003 | US6597206 256 Meg dynamic random access memory |
| 07/22/2003 | US6597194 Difference frequency imaging and spectroscopy to measure dopants using an alternating current scanning tunneling microscope |
| 07/22/2003 | US6597192 Test method of semiconductor device |
| 07/22/2003 | US6597191 Semiconductor integrated circuit device |
| 07/22/2003 | US6597182 Detector for detecting contact resistance anomaly of cathode electrode in electroplating machine |
| 07/22/2003 | US6597117 Plasma coil |
| 07/22/2003 | US6597070 Semiconductor device and method of manufacturing the same |
| 07/22/2003 | US6597069 Flip chip metallization |
| 07/22/2003 | US6597068 Encapsulated metal structures for semiconductor devices and MIM capacitors including the same |
| 07/22/2003 | US6597066 Hermetic chip and method of manufacture |
| 07/22/2003 | US6597065 Thermally enhanced semiconductor chip having integrated bonds over active circuits |
| 07/22/2003 | US6597058 Method of forming defect-free ceramic structures using thermally depolymerizable surface layer |
| 07/22/2003 | US6597057 Epitaxial growth in a silicon-germanium semiconductor device with reduced contamination |
| 07/22/2003 | US6597053 Integrated circuit arrangement with a number of structural elements and method for the production thereof |
| 07/22/2003 | US6597052 Punch-through diode having an inverted structure |
| 07/22/2003 | US6597051 Thermoelectric infrared detector |
| 07/22/2003 | US6597049 Conductor structure for a magnetic memory |
| 07/22/2003 | US6597047 Method for fabricating a nonvolatile semiconductor device |
| 07/22/2003 | US6597046 Integrated circuit with multiple gate dielectric structures |
| 07/22/2003 | US6597045 Semiconductor raised source-drain structure |
| 07/22/2003 | US6597042 Contact with germanium layer |