Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
07/2003
07/17/2003US20030132525 Semiconductor device and its manufacturing method
07/17/2003US20030132524 Permanent adherence of the back end of a wafer to an electrical component or sub-assembly
07/17/2003US20030132523 Wiring line and manufacture process thereof and semiconductor device and manufacturing process thereof
07/17/2003US20030132521 Method for electrical interconnection employing salicide bridge
07/17/2003US20030132519 Array structure of solder balls able to control collapse
07/17/2003US20030132516 Semiconductor device and manufacturing method thereof
07/17/2003US20030132513 Semiconductor package device and method
07/17/2003US20030132512 Lead frame for semiconductor device
07/17/2003US20030132510 Advanced BEOL interconnect structures with low-k PE CVD cap layer and method thereof
07/17/2003US20030132509 High dielectric constant materials
07/17/2003US20030132506 CMOS semiconductor device and method of manufacturing the same
07/17/2003US20030132505 Semiconductor film and method of forming the same, and semiconductor device and display apparatus using the semiconductor film
07/17/2003US20030132504 Structures and methods of anti-fuse formation in SOI
07/17/2003US20030132502 Method for filling gaps and integrated circuitry
07/17/2003US20030132500 Integration of two memory types on the same integrated circuit
07/17/2003US20030132498 Suitable for manufacturing using the diffusion of impurities; number of heat treatment processes is reduced by forming a diffusion layer having an inverted pattern of the impurity diffusion protecting layer
07/17/2003US20030132497 Microelectronic fabrication with corrosion inhibited bond pad
07/17/2003US20030132496 Compound semiconductor device, method for producing thereof and high frequency module using thereof
07/17/2003US20030132494 Magnetic shield for integrated circuit packaging
07/17/2003US20030132492 Process for passivating the semiconductor-dielectric interface of a mos device and mos device formed thereby
07/17/2003US20030132491 Highly reliable amorphous high-K gate dielectric ZrOxNy
07/17/2003US20030132490 Static semiconductor memory device
07/17/2003US20030132489 Determination of whether integrated circuit is acceptable or not in wafer-level burn-in test
07/17/2003US20030132488 Non-volatile memory and fabrication thereof
07/17/2003US20030132487 Self-aligned silicide process utilizing ion implants for reduced silicon consumption and control of the silicide formation temperature and structure formed thereby
07/17/2003US20030132486 Semiconductor device structure
07/17/2003US20030132485 Semiconductor structures
07/17/2003US20030132484 Vertical mos transistor with buried gate and method for making same
07/17/2003US20030132483 Hybrid circuit and electronic device using same
07/17/2003US20030132482 Semiconductor device and method for producing the same
07/17/2003US20030132481 Manufacturing method of semiconductor device and semiconductor chip using soi substrate
07/17/2003US20030132480 Self-aligned trench mosfets and methods for making the same
07/17/2003US20030132479 Semiconductor integrated circuit device and method of manufacturing the same
07/17/2003US20030132478 Multi-state operation of dual floating gate array
07/17/2003US20030132477 Substrate for electronic device, method for manufacturing substrate for electronic device, and electronic device
07/17/2003US20030132476 Semiconductor integrated circuit device and the method of producing the same
07/17/2003US20030132475 Semiconductor device and method for manufacturing semiconductor device
07/17/2003US20030132474 Capacitor for semiconductor memory device and method of manufacturing the same
07/17/2003US20030132473 Semiconductor device and manufacturing method
07/17/2003US20030132472 Semiconductor device with a ferroelectric memory provided on a semiconductor substrate
07/17/2003US20030132471 Semiconductor device and method of manufacturing the same
07/17/2003US20030132470 Stacked memory cell having diffusion barriers
07/17/2003US20030132469 Barrier stack with improved barrier properties
07/17/2003US20030132468 Resistive memory elements with reduced roughness
07/17/2003US20030132466 Field effect transistors having gate and sub-gate electrodes that utilize different work function materials and methods of forming same
07/17/2003US20030132465 Semiconductor integrated circuit device and method of manufacturing the same
07/17/2003US20030132464 Semiconductor device and method for fabricating the same
07/17/2003US20030132463 Schottky gate field effect transistor
07/17/2003US20030132462 Semiconductor integrated circuit device and method of manufacturing the same
07/17/2003US20030132461 Field-effect transistor, circuit configuration and method of fabricating a field-effect transistor
07/17/2003US20030132460 Semiconductor device and semiconductor device manufacturing method
07/17/2003US20030132458 Memory structure and method making
07/17/2003US20030132457 Scalable hierarchical I/O line structure for a semiconductor memory device
07/17/2003US20030132456 Method of forming cross point type DRAM cell
07/17/2003US20030132453 Method to fabricate SiGe HBTs with controlled current gain and improved breakdown voltage characteristics
07/17/2003US20030132452 Semiconductor device and method of producing the same
07/17/2003US20030132450 Inexpensive semiconductor device of which power loss is small and of which size of chip is small
07/17/2003US20030132449 Light emitting diode and semiconductor laser
07/17/2003US20030132443 Method for manufacturing a thin film transistor for a crystal display
07/17/2003US20030132442 Comprises a substrate, a p-type gallium nitride layer, a p-type indium gallium nitride layer forming an excellent interface with low ohmic contact resistance
07/17/2003US20030132439 Thin film semiconductor device having arrayed configuration of semiconductor crystals and a method for producing it
07/17/2003US20030132438 Increased semiconductor integration
07/17/2003US20030132437 Electronic apparatus
07/17/2003US20030132436 Having a pixel portion or having this pixel portion and its driving circuit on the same insulator surface; can be suitably used in a display unit in which a liquid crystal material is provided between electrodes; prevents crosstalk
07/17/2003US20030132435 Semiconductor device, and method of fabricating the same
07/17/2003US20030132433 Semiconductor structures including a gallium nitride material component and a silicon germanium component
07/17/2003US20030132431 Including an active layer of a quantum well structure having a plurality of quantum well layers and barrier layers in which each of the quantum well layers is doped with a p-type impurity
07/17/2003US20030132429 Semiconductor memory device and method for manufacturing the same
07/17/2003US20030132428 Transistor structure having reduced transistor leakage attributes
07/17/2003US20030132420 Blending first and second fluid precursors, vaporizing, transforming into powder
07/17/2003US20030132417 Method and apparatus for preparing slurry for CMP apparatus
07/17/2003US20030132400 Lithographic apparatus and device manufacturing method
07/17/2003US20030132397 Method of and apparatus for ensuring proper orientation of an object for ion implantion
07/17/2003US20030132382 System and method for inspecting a mask
07/17/2003US20030132302 IC card
07/17/2003US20030132232 Wafer carrier door and spring biased latching mechanism
07/17/2003US20030132218 Ceramic heater and supporting pin
07/17/2003US20030132217 Semiconductor production device ceramic plate
07/17/2003US20030132213 Apparatus and method for uniform substrate heating and contaminate collection
07/17/2003US20030132209 Method and device for laser annealing
07/17/2003US20030132207 Method for fabricating chemical mechanical polshing pad using laser
07/17/2003US20030132205 Laser processing method and laser processing apparatus
07/17/2003US20030132199 Wafer protection device
07/17/2003US20030132198 Method and apparatus for treating surface of semiconductor
07/17/2003US20030132197 Reducing photoresist shrinkage via plasma treatment
07/17/2003US20030132195 Plasma processing method and apparatus using dynamic sensing of a plasma environment
07/17/2003US20030132194 Organic insulation film formation method
07/17/2003US20030132193 Substrate processing apparatus and substrate processing method
07/17/2003US20030132177 Jig for adjusting curvature of substrate
07/17/2003US20030132176 Frame for housing plate materials
07/17/2003US20030132168 Method and apparatus for preparing slurry for CMP apparatus
07/17/2003US20030132136 Wafer carrier door and latching mechanism withhourglass shaped key slot
07/17/2003US20030132135 Protective wafer storage system, device, and method
07/17/2003US20030132133 Wafer carrier with wafer retaining system
07/17/2003US20030132120 Method and apparatus for the electrochemical deposition and planarization of a material on a workpiece surface
07/17/2003US20030132118 Electroplating of semiconductor wafers
07/17/2003US20030132104 Hydrogen-dissolved water production apparatus
07/17/2003US20030132103 Electrolytic processing device and substrate processing apparatus
07/17/2003US20030132099 Contacting crude octafluorocyclobutane containing impurities with impurity decomposing agent under elevated temperature and then with an adsorbent
07/17/2003US20030132090 Push/pull actuator for microstructures
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