Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
07/2003
07/17/2003US20030134485 Well-drive anneal technique using preplacement of nitride films for enhanced field isolation
07/17/2003US20030134484 Method for forming capacitor of semiconductor device
07/17/2003US20030134482 Ion-implantation and shallow etching to produce effective edge termination in high-voltage heterojunction bipolar transistors
07/17/2003US20030134481 Power integrated circuit with vertical current flow and related manufacturing process
07/17/2003US20030134480 Semiconductor device reducing junction leakage current and narrow width effect
07/17/2003US20030134479 Eliminating substrate noise by an electrically isolated high-voltage I/O transistor
07/17/2003US20030134478 Non-volatile memory and fabrication thereof
07/17/2003US20030134477 Memory structure and method for manufacturing the same
07/17/2003US20030134476 Oxide-nitride-oxide structure
07/17/2003US20030134475 Method for manufacturing a multi-bit memory cell
07/17/2003US20030134474 Low voltage programmable and erasable flash EEPROM
07/17/2003US20030134473 Novel process for flash memory cell
07/17/2003US20030134472 Method of manufacturing a flash memory cell
07/17/2003US20030134471 Method for eliminating polysilicon residue
07/17/2003US20030134470 Layer structure having contact hole, fin-shaped capacitor using the layer structure, method of producing the fin-shaped capacitor, and dynamic random access memory having the fin-shaped capacitor
07/17/2003US20030134469 Semiconductor device with selectively diffused regions
07/17/2003US20030134468 Aggressive capacitor array cell layout for narrow diameter DRAM trench capacitor structures via SOI technology
07/17/2003US20030134467 Semiconductor memory device and method of manufacturing same
07/17/2003US20030134466 Methods of forming nitrogen-containing masses, silicon nitride layers, and capacitor constructions
07/17/2003US20030134465 Solutions of metal-comprising materials
07/17/2003US20030134464 Semiconductor device and method for the manufacture thereof
07/17/2003US20030134463 Method for fabricating a high voltage device
07/17/2003US20030134462 Method for fabricating a non-volatile memory
07/17/2003US20030134461 Method for reducing oxidation encroachment of stacked gate layer
07/17/2003US20030134460 Active matrix thin film transistor array backplane
07/17/2003US20030134459 Semiconductor device and manufacturing method thereof
07/17/2003US20030134458 TFT-LCD formed with four masking steps
07/17/2003US20030134457 Semiconductor device capable of preventing moisture absorption of fuse area thereof and method for manufacturing the fuse area
07/17/2003US20030134452 Method for manufacturing semiconductor device packages
07/17/2003US20030134450 Elimination of RDL using tape base flip chip on flex for die stacking
07/17/2003US20030134447 Group III nitride compound semiconductor device
07/17/2003US20030134446 Production method of III nitride compound semiconductor and III nitride compound semiconductor element
07/17/2003US20030134445 Systems and methods for thermal isolation of a silicon structure
07/17/2003US20030134443 Methods Of Forming A Field Emission Device
07/17/2003US20030134442 Test structure and method for flash memory tunnel oxide quality
07/17/2003US20030134441 Micro probing tip made by micro machine method
07/17/2003US20030134440 Method of accurately measuring compositions of thin film shape memory alloys
07/17/2003US20030134439 Methods of Forming Capacitor Constructions
07/17/2003US20030134438 Rare earth metal oxide memory element based on charge storage and method for manufacturing same
07/17/2003US20030134437 Method of fabricating a thin and fine ball-grid array package with embedded heat spreader
07/17/2003US20030134436 Method for enhancing electrode surface area in DRAM cell capacitors
07/17/2003US20030134435 Multiple etch method for fabricating split gate field effect transistor (FET) device
07/17/2003US20030134391 Highly-expressed and highly active recombinant silicatein enzyme, silicatein isolated from natural source after gene induction
07/17/2003US20030134234 Photoresist stripping solution and a method of stripping photoresists using the same
07/17/2003US20030134233 Protecting a semiconductor process wafer surface from contacting thermally degraded photoresist comprising the steps of: providing a semiconductor process wafer having a process surface; forming protective layer over selected areas
07/17/2003US20030134232 Radiation-sensitive composition and method for forming patterns and fabricating semiconductor devices
07/17/2003US20030134227 New photoacid generator compounds ("PAGs") are provided and photoresist compositions that comprise such compounds. In particular, cyclic sulfonium and sulfoxonium PAGs are provided. PAGs of the invention are particularly useful as
07/17/2003US20030134225 Positive resist composition
07/17/2003US20030134223 Positive photoresist composition and method of patterning resist thin film for use in inclined implantation process
07/17/2003US20030134222 Photoresist composition and method of forming pattern using the same
07/17/2003US20030134221 Positive resist composition
07/17/2003US20030134208 Method for producing a semiconductor device
07/17/2003US20030134207 Alternating phase shift mask
07/17/2003US20030134136 Varying the infrared spectrum of a silicon dioxide thin film derived from a silsesquioxane resin comprising directing a beam of infrared radiation to a metal-film-metal device and monitoring the variation in current applied; switches; panes
07/17/2003US20030134096 Magnetic element with insulating veils and fabricating method thereof
07/17/2003US20030134044 Film forming apparatus, film forming method and tray for substrate
07/17/2003US20030134039 Reduction of dielectric constant of chemical vapor deposited films which are useful for production of microelectronic devices
07/17/2003US20030134038 Depositing material on substrate by atomic layer processing including injecting series of gases sequentially into reactant chamber without purging one gas from chamber prior to injection of another gas
07/17/2003US20030133864 Method and apparatus for supplying carbon dioxide to a plurality of applications, as in the processing of integrated circuits
07/17/2003US20030133854 System for supplying a gas and method of supplying a gas
07/17/2003US20030133853 Silicon halide is split into silicion and halide ions in inductively coupled plasma and silicon ions are condensed to form molten silicon metal that can be vacuum cast into polysilicon ingots
07/17/2003US20030133851 First mode is used when cleaning substrates not-resistant to vibration, and the second mode is used when cleaning substrates resistant to vibration
07/17/2003US20030133780 Robot arm edge gripping device for handling substrates
07/17/2003US20030133778 Picking apparatus for semiconductor device test handler
07/17/2003US20030133776 End effector with tapered fingertips
07/17/2003US20030133773 Semiconductor wafer preheating
07/17/2003US20030133762 Semiconductor wafer transport method and semiconductor wafer transport apparatus using the same
07/17/2003US20030133683 Three-dimensional photonic crystal waveguide structure and method
07/17/2003US20030133353 Nonvolatile semiconductor memory
07/17/2003US20030133349 High-voltage detection circuit for a semiconductor memory
07/17/2003US20030133335 Semiconductor memory device
07/17/2003US20030133334 Thin film magnetic memory device having redundancy repair function
07/17/2003US20030133274 Integrated circuit package and method of manufacture
07/17/2003US20030133250 Ferro-electric capacitor and method of fabrication of the ferro-electric capacitor
07/17/2003US20030133249 Electronic component and method for manufacturing the same
07/17/2003US20030133125 Alignment stage, exposure apparatus, and semiconductor device manufacturing method
07/17/2003US20030133114 System for processing semiconductor products
07/17/2003US20030133104 System and method for characterizing macro-grating test patterns in advanced lithography and etch processes
07/17/2003US20030133087 Scanning exposure apparatus, manufacturing method thereof, and device manufacturing method
07/17/2003US20030133086 Substrate processing apparatus and substrate processing method
07/17/2003US20030133067 Thin film transistor array panel
07/17/2003US20030132927 Active matrix type display
07/17/2003US20030132900 Electronic device and electronic apparatus
07/17/2003US20030132896 Active matrix substrate, electro-optical device, and electronic device
07/17/2003US20030132821 Electronic device
07/17/2003US20030132818 Manufacturing method of semiconductor device
07/17/2003US20030132806 Voltage controlled oscillator with reference current generator
07/17/2003US20030132777 Apparatus for protecting an integrated circuit formed in a substrate and method for protecting the circuit against reverse engineering
07/17/2003US20030132769 Probe card for high speed testing
07/17/2003US20030132766 Wire-bond process flow for copper metal-six, structures achieved thereby, and testing method
07/17/2003US20030132746 Proximity sensor
07/17/2003US20030132735 Adaptive threshold voltage control with positive body bias for N and P-channel transistors
07/17/2003US20030132692 Flash emitting device and radiant heating apparatus
07/17/2003US20030132544 Method for manufacturing electronic component and apparatus for manufacturing the same
07/17/2003US20030132534 Semiconductor device having a reduced leakage current and a fabrication process thereof
07/17/2003US20030132533 Semiconductor device, method of manufacturing semiconductor device and a method of manufacturing lead frame
07/17/2003US20030132532 Semiconductor device having a wire laid between pads
07/17/2003US20030132528 Method and apparatus for flip chip device assembly by radiant heating
07/17/2003US20030132527 Method and system to manufacture stacked chip devices
07/17/2003US20030132526 Semiconductor device having a contact window and fabrication method thereof
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