Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2003
12/31/2003CN1133207C Circuit board for screening detection and mfg. method of known qualified tube core
12/31/2003CN1133206C Integrated circuit chip, structure body, LCD device and electronic device
12/31/2003CN1133205C Process for preparing diode with ceramic substrate and crystal grain structure
12/31/2003CN1133204C 抛光铜膜后清洁处理半导体基材的方法和设备 Copper polishing a semiconductor substrate cleaning method and apparatus after the film
12/31/2003CN1133203C Method of forming selective metal layer and method of forming capacitor and filling contact hole using the same
12/31/2003CN1133202C Method for producing vias having variable sidewall profile
12/31/2003CN1133201C Method of manufacturing EB mask for electron beam image drawing and device for manufacturing EB mask
12/31/2003CN1133200C 输送系统 Delivery system
12/31/2003CN1133103C Equipment and method for automatically controlling semiconductor producing technology
12/31/2003CN1132970C Chip sawing machine
12/31/2003CN1132962C Deposited film forming system and method thereof
12/31/2003CN1132738C Packing material, base material for adhesive tape, or separator
12/31/2003CN1132712C Power source for welding digital array transistor
12/31/2003CA2489567A1 Ge photodetectors
12/31/2003CA2487486A1 Fluoropolymer interlayer dielectric by chemical vapor deposition
12/31/2003CA2485594A1 Method for producing semi-insulating resistivity in high purity silicon carbide crystals
12/30/2003USRE38370 Deposited tunneling oxide
12/30/2003US6671861 Manufacturing process evaluation method for semiconductor device and pattern shape evaluation apparatus using the evaluation method
12/30/2003US6671858 Method of designing hierarchical layout of semiconductor integrated circuit, and computer product
12/30/2003US6671576 Wafer carrier
12/30/2003US6671570 System and method for automated monitoring and assessment of fabrication facility
12/30/2003US6671398 Method and apparatus for inspection of patterned semiconductor wafers
12/30/2003US6671294 Laser spectral engineering for lithographic process
12/30/2003US6671217 Semiconductor device using high-speed sense amplifier
12/30/2003US6671213 Thin film magnetic memory device having redundancy repair function
12/30/2003US6671208 Nonvolatile semiconductor storage device with limited consumption current during erasure and erase method therefor
12/30/2003US6671205 Low voltage non-volatile memory cell
12/30/2003US6671198 Semiconductor device
12/30/2003US6671152 Power MOS transistor with overtemperature protection circuit
12/30/2003US6671059 Method and system for determining a thickness of a layer
12/30/2003US6671051 Apparatus and methods for detecting killer particles during chemical mechanical polishing
12/30/2003US6671048 Method for determining wafer misalignment using a pattern on a fine alignment target
12/30/2003US6671040 Programming methods and circuits for semiconductor memory cell and memory array using a breakdown phenomena in an ultra-thin dielectric
12/30/2003US6671036 Balanced positioning system for use in lithographic apparatus
12/30/2003US6671024 Connecting structure, liquid crystal device, electronic equipment, and anisotropic conductive adhesive agent and a manufacturing method thereof
12/30/2003US6670889 Immediate shutdown preventing damage
12/30/2003US6670846 Semiconductor integrated circuit including a filter with adjustable cut-off frequency
12/30/2003US6670842 Electromagnetic compatible regulator
12/30/2003US6670819 Methods of engaging electrically conductive pads on a semiconductor substrate
12/30/2003US6670818 Method for aligning and connecting semiconductor components to substrates
12/30/2003US6670807 Proximity sensor detecting loss of magnetic field complete
12/30/2003US6670802 Integrated circuit having a test operating mode and method for testing a multiplicity of such circuits
12/30/2003US6670741 Plasma processing apparatus with annular waveguide
12/30/2003US6670719 Microelectronic device package filled with liquid or pressurized gas and associated method of manufacture
12/30/2003US6670716 Silicon-on-insulator (SOI) semiconductor structure for implementing transistor source connections using buried dual rail distribution
12/30/2003US6670715 Nitrogen-doped bottom of minimum thickness and oxygen-doped top layers; high performance and reliability
12/30/2003US6670714 Semiconductor integrated circuit device having multilevel interconnection
12/30/2003US6670713 Method for forming conductors in semiconductor devices
12/30/2003US6670712 Semiconductor device
12/30/2003US6670711 Semiconductor device including low dielectric constant insulating film formed on upper and side surfaces of the gate electrode
12/30/2003US6670710 Semiconductor device having multi-layered wiring
12/30/2003US6670709 Semiconductor device and method of manufacturing the same
12/30/2003US6670708 Thin film transistor array panel and method for fabricating the same
12/30/2003US6670707 Integrated circuit chip
12/30/2003US6670706 Semiconductor device including a semiconductor pellet having bump electrodes connected to pad electrodes of an interconnect board and method for manufacturing same
12/30/2003US6670705 Protective layer for a semiconductor device
12/30/2003US6670703 Buried ground plane for high performance system modules
12/30/2003US6670697 Semiconductor device module frame and group thereof
12/30/2003US6670695 Method of manufacturing anti-reflection layer
12/30/2003US6670694 Semiconductor device
12/30/2003US6670693 Laser synthesized wide-bandgap semiconductor electronic devices and circuits
12/30/2003US6670691 Uniformly filling both wide and high aspect ratio narrow isolation trenches with minimal voids
12/30/2003US6670690 Method of making an improved field oxide isolation structure for semiconductor integrated circuits having higher field oxide threshold voltages
12/30/2003US6670689 Reduced leakage current between adjacent P-channel field effect transistors
12/30/2003US6670688 Semiconductor device including at least one schottky metal layer surrounding PN junction
12/30/2003US6670687 Semiconductor device having silicon carbide layer of predetermined conductivity type and module device having the same
12/30/2003US6670685 Method of manufacturing and structure of semiconductor device with floating ring structure
12/30/2003US6670684 Semiconductor device having line-and-space pattern group
12/30/2003US6670682 Multilayered doped conductor
12/30/2003US6670681 Preventing dopant diffusion
12/30/2003US6670680 Semiconductor device comprising a dual gate CMOS
12/30/2003US6670679 Semiconductor device having an ESD protective circuit
12/30/2003US6670678 Semiconductor device having ESD protective transistor
12/30/2003US6670677 SOI substrate having an etch stop layer and an SOI integrated circuit fabricated thereon
12/30/2003US6670675 Simplified but effective structure which does not require additional circuitry; conserves space
12/30/2003US6670672 Structure of discrete NROM cell
12/30/2003US6670671 Nonvolatile semiconductor memory device and manufacturing method thereof
12/30/2003US6670670 Single electron memory device comprising quantum dots between gate electrode and single electron storage element and method for manufacturing the same
12/30/2003US6670668 Microelectronic structure, method for fabricating it and its use in a memory cell
12/30/2003US6670667 Asymmetric gates for high density DRAM
12/30/2003US6670666 Nonvolatile semiconductor memory device and manufacturing method thereof
12/30/2003US6670665 Memory module with improved electrical properties
12/30/2003US6670664 Single transistor random access memory (1T-RAM) cell with dual threshold voltages
12/30/2003US6670663 DRAM cell capacitor and manufacturing method thereof
12/30/2003US6670662 Semiconductor storage component with storage cells, logic areas and filling structures
12/30/2003US6670661 Ferroelectric memory cell with diode structure to protect the ferroelectric during read operations
12/30/2003US6670660 Semiconductor memory device utilizing tunnel magneto resistive effects and method for manufacturing the same
12/30/2003US6670659 Ferroelectric data processing device
12/30/2003US6670658 Power semiconductor element capable of improving short circuit withstand capability while maintaining low on-voltage and method of fabricating the same
12/30/2003US6670654 Silicon germanium heterojunction bipolar transistor with carbon incorporation
12/30/2003US6670653 InP collector InGaAsSb base DHBT device and method of forming same
12/30/2003US6670652 Monolithically integrated E/D mode HEMT and method for fabricating the same
12/30/2003US6670651 Metal sulfide-oxide semiconductor transistor devices
12/30/2003US6670649 Triodic rectifier switch
12/30/2003US6670642 Semiconductor memory device using vertical-channel transistors
12/30/2003US6670641 Thin film transistor, method of manufacturing the same and thin film transistor liquid crystal display device
12/30/2003US6670640 Method for producing semiconductor device
12/30/2003US6670638 Liquid crystal display element and method of manufacturing the same
12/30/2003US6670637 Electronic device
12/30/2003US6670636 Substrate device, method of manufacturing the same, and electro-optical device
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