Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2004
01/07/2004CN1466171A Method for shortening analytic period of mfg. process
01/07/2004CN1466170A Repeatedly usable unpatterned wafer and forming method thereof
01/07/2004CN1466157A Method for forming MIM capacitor
01/07/2004CN1466148A Magneto-resistive device having magnetically soft reference
01/07/2004CN1466017A Etching method for making film transistor LCD
01/07/2004CN1466012A Method for preventing corrosion water washing in metal layer etching process
01/07/2004CN1465755A Method for crystallizing amorphous silicon using nanoparticles
01/07/2004CN1465741A Liquid material gasifying and supply device
01/07/2004CN1465687A Semiconductor process residue removal composition and process
01/07/2004CN1134105C Surface acoustic wave device suitable for installing flip-chip
01/07/2004CN1134074C Cutting method of sub group III nitride semiconductor light-emitting component
01/07/2004CN1134070C 半导体器件 Semiconductor devices
01/07/2004CN1134068C Semiconductor device and manufacturing methods thereof
01/07/2004CN1134067C Capacitor element and fabrication method thereof
01/07/2004CN1134066C Decoupling capacitor structure distributed in thin film layer above integrated circuit, and method for making same
01/07/2004CN1134061C Method for forming chip of IC
01/07/2004CN1134060C Ultra thin, single phase, diffusion barrier for metal conductors
01/07/2004CN1134059C Method for manufacturing semiconductor integrated circuit
01/07/2004CN1134058C Manufacturing method for groove-shape element separation structure
01/07/2004CN1134057C Semiconductor storage holder, operation method and production system
01/07/2004CN1134056C Device and method for producing chip-substrate connection
01/07/2004CN1134055C Method of andapparatus for aligning bonding head of bonder or pick and place machine
01/07/2004CN1134054C Nonvolatile semiconductor memory and fabricating method
01/07/2004CN1134053C Packaging method of semiconductor chip and its package
01/07/2004CN1134051C Method for generating extended super-shallow source-drain region by combining amorphous pre-injection of Gew ith low energy injection
01/07/2004CN1134050C Method for makings emiconductor chip suitable for using liquid conductive material
01/07/2004CN1134049C Plasma treatment for improving adhesiveness between inorganic material and copper
01/07/2004CN1134048C Method for forming self-alignment contact
01/07/2004CN1134047C Heterogeneous liquid-phase epitaxial growth process of magnetic semiconductor/semiconductor
01/07/2004CN1134046C Method for manufacturing semiconductor device
01/07/2004CN1134045C Auto-aligning method for Co to silicide
01/07/2004CN1134016C Dynamic memory
01/07/2004CN1134014C Memory cell system
01/07/2004CN1133901C Alkysulfonyloximes for high-resolution I-line hpotoresists of high sensitivity
01/07/2004CN1133889C Active matrix baseboard, photo-electric apparatus and method for producing active matrix base board
01/07/2004CN1133761C Open pipe tellurium cadmium mercury epitaxial material heat treatment method
01/07/2004CN1133758C Method of producing movable microstructure
01/07/2004CN1133705C Edge polishing composition
01/07/2004CN1133600C Selective etching of silicate
01/07/2004CN1133571C Pallet for semiconductor integrated circuit device
01/06/2004US6675369 Method of enhancing clear field phase shift masks by adding parallel line to phase 0 region
01/06/2004US6675368 Apparatus for and method of preparing pattern data of electronic part
01/06/2004US6675367 Semiconductor integrated circuits and method for designing the same
01/06/2004US6675155 Layout method arranging nodes corresponding to LSI elements having a connecting relationship
01/06/2004US6675137 Method of data compression using principal components analysis
01/06/2004US6675119 In-situ measurement method and apparatus in adverse environment
01/06/2004US6675118 System and method of determining the noise sensitivity characterization for an unknown circuit
01/06/2004US6675109 Systems and methods for forming data storage devices
01/06/2004US6675058 Method and apparatus for controlling the flow of wafers through a process flow
01/06/2004US6675057 Integrated circuit annealing methods and apparatus
01/06/2004US6674889 Pattern inspection method and pattern inspection apparatus
01/06/2004US6674888 Tuning method for a processing machine
01/06/2004US6674678 Sense amplifier control circuit of semiconductor memory device
01/06/2004US6674667 Programmable fuse and antifuse and method therefor
01/06/2004US6674664 Circuit selected joint magnetoresistive junction tunneling-giant magnetoresistive effects memory cells
01/06/2004US6674663 Nonvolatile storage device and operating method thereof
01/06/2004US6674662 Magnetoresistive random access memory and method for reading/writing digital information to such a memory
01/06/2004US6674661 Dense metal programmable ROM with the terminals of a programmed memory transistor being shorted together
01/06/2004US6674647 Low or no-force bump flattening structure and method
01/06/2004US6674633 Process for producing a strontium ruthenium oxide protective layer on a top electrode
01/06/2004US6674627 Needle-card adjusting device for planarizing needle sets on a needle card
01/06/2004US6674524 Arrangement for the visual inspection of substrates
01/06/2004US6674514 Illumination optical system in exposure apparatus
01/06/2004US6674512 Uses the known relative movement between interferometer support blocks and a reference member
01/06/2004US6674511 Evaluation mask, focus measuring method and aberration measuring method
01/06/2004US6674510 Off-axis levelling in lithographic projection apparatus
01/06/2004US6674509 Scanning exposure apparatus and method
01/06/2004US6674502 Thin film transistors; a surface treated with an oxygen plasma and a nitrogen plasma-treated layer formed over said surface; molybdenum nitride
01/06/2004US6674469 Driving method for solid-state image pickup device
01/06/2004US6674318 Semiconductor integrated circuit
01/06/2004US6674311 Electronic device having a CMOS circuit
01/06/2004US6674300 Method for testing a semiconductor integrated circuit when a difference between two consecutive current exceeds a threshold value
01/06/2004US6674291 Method and apparatus for determining and/or improving high power reliability in thin film resonator devices, and a thin film resonator device resultant therefrom
01/06/2004US6674178 Semiconductor device having dispersed filler between electrodes
01/06/2004US6674172 Flip-chip package with underfill having low density filler
01/06/2004US6674171 Semiconductor device with a low resistance wiring
01/06/2004US6674169 Semiconductor device with titanium silicon oxide layer
01/06/2004US6674168 Reworking beol (back end of a processing line) metallization levels of damascene metallurgy
01/06/2004US6674167 Multilevel copper interconnect with double passivation
01/06/2004US6674165 Mold for a semiconductor chip
01/06/2004US6674162 Semiconductor device and manufacturing method thereof
01/06/2004US6674161 Semiconductor stacked die devices
01/06/2004US6674155 Chip carrier film, method of manufacturing the chip carrier film and liquid crystal display using the chip carrier film
01/06/2004US6674154 Lead frame with multiple rows of external terminals
01/06/2004US6674153 Semiconductor device utilizing pad to pad wire interconnection for improving detection of failed region on the device
01/06/2004US6674151 Deuterium passivated semiconductor device having enhanced immunity to hot carrier effects
01/06/2004US6674150 Heterojunction bipolar transistor and method for fabricating the same
01/06/2004US6674149 Bipolar transistor device having phosphorous
01/06/2004US6674147 Semiconductor device having a bipolar transistor structure
01/06/2004US6674146 Composite dielectric layers
01/06/2004US6674145 Flash memory circuitry
01/06/2004US6674144 Process for forming damascene-type isolation structure for integrated circuit
01/06/2004US6674142 Semiconductor memory device utilizing tunnel magneto resistive effects and method for manufacturing the same
01/06/2004US6674140 Process for wafer level treatment to reduce stiction and passivate micromachined surfaces and compounds used therefor
01/06/2004US6674139 Inverse T-gate structure using damascene processing
01/06/2004US6674138 Use of high-k dielectric materials in modified ONO structure for semiconductor devices
01/06/2004US6674137 Semiconductor device and its manufacturing method
01/06/2004US6674136 Semiconductor device having driver circuit and pixel section provided over same substrate
01/06/2004US6674135 Semiconductor structure having elevated salicided source/drain regions and metal gate electrode on nitride/oxide dielectric
01/06/2004US6674134 Dynamic access memory (dram) metal oxide semiconductor field effect transistor (mosfet) which contains gate oxide regions having various oxide thicknesses