Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2003
12/25/2003US20030234430 Method and apparatus to make a semiconductor chip susceptible to radiation failure
12/25/2003US20030234428 Semiconductor circuit configuration and semiconductor memory device
12/25/2003US20030234427 Semiconductor device configured to allow well potential control in accordance with operation mode
12/25/2003US20030234424 Pixel thin film transistor (n-channel type TFT) in which an off current value is sufficiently low and the ratio of an on current value to the off current value is high
12/25/2003US20030234423 Trench fill process
12/25/2003US20030234422 Methods of fabricating a dielectric plug in mosfets to suppress short-channel effects
12/25/2003US20030234421 Structure of discrete nrom cell
12/25/2003US20030234419 Method for fabricating a memory structure having required scale spacers
12/25/2003US20030234418 Memory structure having required scale spacers
12/25/2003US20030234417 High-k dielectric layers in integrated circuits formed directly over oxidation-susceptible conductors such as silicon; leakage current paths between grains reduced
12/25/2003US20030234416 Capacitor for a semiconductor device and method for fabrication therefor
12/25/2003US20030234415 Scalable three-dimensional fringe capacitor with stacked via
12/25/2003US20030234414 Memory cell and method for forming the same
12/25/2003US20030234412 Semiconductor element
12/25/2003US20030234411 Ferroelectric capacitor in a ferroelectric memory
12/25/2003US20030234402 Transparent layer of a LED device and the method for growing the same
12/25/2003US20030234401 Method and system for magnetically assisted statistical assembly of wafers
12/25/2003US20030234400 Semiconductor device, semiconductor layer and production method thereof
12/25/2003US20030234399 Thin film transistor array panel
12/25/2003US20030234398 Device, method of manufacturing device, electro-optic device, and electronic equipment
12/25/2003US20030234395 Semiconductor device and method of manufacturing the same
12/25/2003US20030234387 Anti-reflective coating compositions for use with low k dielectric materials
12/25/2003US20030234363 Component of a radiation detector, radiation detector and radiation detection apparatus
12/25/2003US20030234348 Polarization state detecting system, light source, and exposure apparatus
12/25/2003US20030234277 Microelectronic device interconnects
12/25/2003US20030234275 Wire bonder for ball bonding insulated wire and method of using same
12/25/2003US20030234271 Device with electrodes for the formation of a ball at the end of a wire
12/25/2003US20030234248 Heating apparatus with electrostatic attraction function
12/25/2003US20030234238 Etching processing method
12/25/2003US20030234208 Container with magnifying identification lens
12/25/2003US20030234184 Method and composition for polishing a substrate
12/25/2003US20030234182 Providing strength to the low k dielectric layer by using a sacrificial conductive metal layer over it during the chemical mechanical polishing and planarization of the above barrier and copper layers; semiconductors; integrated circuits
12/25/2003US20030234175 Pre-sputtering method for improving utilization rate of sputter target
12/25/2003US20030234141 Vibration-dampening base for ball-type lead screw of load port transfer system
12/25/2003US20030234075 Method for cutting a block of material and forming a thin film
12/25/2003US20030234030 Substrate processing apparatus and control method of inert gas concentration
12/25/2003US20030234029 Cleaning and drying a substrate
12/25/2003US20030233975 Method for producing semi-insulating resistivity in high purity silicon carbide crystals
12/25/2003US20030233792 Supercritical fluid foaming agent is dissolved in thermoplastic polymer, rapid change in solubility and volume of foaming agent in polymer results in foaming of polymer; improved porosity
12/25/2003US20030233768 Method and device for the temperature control of surface temperatures of substrates in a CVD reactor
12/25/2003US20030233764 Method for drying a wafer and apparatus for performing the same
12/25/2003US20030233745 Method and apparatus for determining and assessing chamber inconsistency in a tool
12/24/2003WO2003107453A2 Material for a functional layer of an organic electronic component, method for the production thereof, and use thereof
12/24/2003WO2003107451A2 Electrodes for optoelectronic components and the use thereof
12/24/2003WO2003107445A1 Semiconductor device, semiconductor circuit and method for producing semiconductor device
12/24/2003WO2003107444A2 Light-emitting diode device geometry
12/24/2003WO2003107443A2 Bonding pad for gallium nitride-based light-emitting device
12/24/2003WO2003107442A2 Electrode for p-type gallium nitride-based semiconductors
12/24/2003WO2003107434A1 A method of forming a metal pattern and a method of fabricating tft array panel by using the same
12/24/2003WO2003107431A1 Semiconductor device having schottky junction electrode
12/24/2003WO2003107430A1 Enhanced structure and method for buried local interconnects
12/24/2003WO2003107429A1 Semiconductor device and method for fabricating the same
12/24/2003WO2003107428A1 Semiconductor device and method for fabricating the same
12/24/2003WO2003107425A2 Semiconductor device having ferroelectric film and manufacturing method thereof
12/24/2003WO2003107424A1 Magnetoresistive random-access memory device
12/24/2003WO2003107421A2 Semi-conductor component
12/24/2003WO2003107417A1 Packaging for semiconductor components and method for producing the same
12/24/2003WO2003107416A1 Method for the production of an nrom memory cell arrangement
12/24/2003WO2003107415A1 Method and device for measuring wafer potential or temperature
12/24/2003WO2003107414A1 Method for testing and adjusting a lamp heating installation
12/24/2003WO2003107413A2 Method and device for producing an electronic component having external contact surfaces
12/24/2003WO2003107411A2 Dielectric film
12/24/2003WO2003107410A2 Process for etching dielectric films with improved resist and/or etch profile characteristics
12/24/2003WO2003107408A1 Polisher
12/24/2003WO2003107407A1 Method of polishing organic insulating film of semiconductor integrated circuit
12/24/2003WO2003107406A1 Aerosol cleaning apparatus and method for control thereof
12/24/2003WO2003107405A1 Method for producing a spacer structure
12/24/2003WO2003107404A1 Vapor phase epitaxial apparatus and vapor phase epitaxial method
12/24/2003WO2003107403A1 Vapor phase epitaxy device
12/24/2003WO2003107402A1 Semiconductor wafer
12/24/2003WO2003107401A1 Micro-component comprising a planar inductance and method for production of such a micro-component
12/24/2003WO2003107400A2 Acid etching mixture having reduced water content
12/24/2003WO2003107396A2 Substrate processing apparatus and related systems and methods
12/24/2003WO2003107394A2 Organic electroluminescent device
12/24/2003WO2003107372A1 Micro-electromechanical switch having a deformable elastomeric conductive element
12/24/2003WO2003107351A1 A method for making a ferroelectric memory cell in a ferroelectric memory device, and a ferroelectric memory device
12/24/2003WO2003107350A2 Magnetoresistive random access memory with reduced switching field
12/24/2003WO2003107095A1 Device for positioning an optical element in a structure
12/24/2003WO2003106925A1 Semiconductor wafer shape evaluating method and shape evaluating device
12/24/2003WO2003106919A2 Interferometry systems involving a dynamic beam-steering assembly
12/24/2003WO2003106338A1 Reaction apparatus for producing silicon
12/24/2003WO2003106328A2 Micromechanical component and corresponding production method
12/24/2003WO2003106310A1 Universal reticle transfer system
12/24/2003WO2003106090A1 Electrolytic etching of metal layers
12/24/2003WO2003096765A3 Apparatus and methods for minimizing arcing in a plasma processing chamber
12/24/2003WO2003092041A3 Method for fabricating a soi substrate a high resistivity support substrate
12/24/2003WO2003085743B1 Structure and method for an emitter ballast resistor in an hbt
12/24/2003WO2003083919A3 Method of manufacturing nanowires and electronic device
12/24/2003WO2003081833A3 Floating-gate analog circuit
12/24/2003WO2003081715A3 Wave interrogated near field array system and method for detection of subwavelength scale anomalies
12/24/2003WO2003079412A3 Facilities connection bucket for pre-facilitation of wafer fabrication equipment
12/24/2003WO2003079404A3 An improved substrate holder for plasma processing
12/24/2003WO2003077029A9 Negative photoresists for short wavelength imaging
12/24/2003WO2003073482A3 Process for forming isolated integrated inductive circuits
12/24/2003WO2003070994A3 Lead-free tin-silver-copper alloy solder composition
12/24/2003WO2003067332A3 Sulfonate derivatives and the use therof as latent acids
12/24/2003WO2003063570A3 A method and system for magnetically assisted statistical assembly of wafers
12/24/2003WO2003060955A3 Barrier stack with improved barrier properties
12/24/2003WO2003056611A3 Resistless lithography method for producing fine structures
12/24/2003WO2003054942A3 Method of introducing nitrogen into semiconductor dielectric layers