Patents
Patents for G03F 1 - Originals for photomechanical production of textured or patterned surfaces, e.g. masks, photo-masks or reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof (24,849)
03/1991
03/20/1991EP0417952A2 Shaping using area patterning mask
03/20/1991CN1049966A Laser shaping with area patterning mask
03/19/1991US5001764 Guardbands for pattern inspector
03/13/1991EP0416528A2 Amorphous fluoropolymer pellicle films
03/13/1991EP0416517A2 Non-glare pellicle
03/12/1991US4999511 Surface state inspecting device for inspecting the state of parallel first and second surfaces
03/12/1991US4999510 Apparatus for detecting foreign particles on a surface of a reticle or pellicle
03/12/1991US4999277 Computer aided design, dichroic parabolic radio frequency reflector
03/07/1991CA2024617A1 Non-glare pellicle
03/06/1991EP0415131A2 Forming a pattern on a substrate
03/06/1991CA2021110A1 Laser shaping with an area patterning mask
03/05/1991US4998267 X-ray lithography carbon mask and method of manufacturing the same
03/05/1991US4997733 Dry Dot Etching
02/1991
02/27/1991CN1049582A Apparatus and method for automatically tensioning and relaxing record material
02/26/1991US4996434 Electron-beam lithographic apparatus
02/26/1991US4996106 Used as dust-proof cover during exposure of photomask or reticle
02/21/1991WO1991002294A1 Dust-preventing film
02/21/1991DE3927162A1 Vorrichtung zum automatischen auf- und abspannen von aufzeichnungsmaterial und betriebsweise der vorrichtung Device for automatic up and wind down from record material and operation, the device
02/19/1991US4994141 Method of manufacturing a mask support of SiC for radiation lithography masks
02/18/1991WO1991003121A1 Device for automatically clamping and releasing data supports and its operation
02/18/1991CA2065363A1 Device for automatically clamping and releasing data supports and its operation
02/13/1991EP0412690A2 Device manufacture involving lithographic processing
02/13/1991EP0412301A1 Boron nitride membrane in wafer structure
02/12/1991US4992822 Optical printing system
02/12/1991US4992355 System for the production of dot-etched lithographic films
01/1991
01/30/1991EP0410269A1 Membrane consisting of silicon carbide and silicon nitride, method for the preparation thereof and mask for X-ray lithography utilizing the same
01/30/1991EP0410106A2 System for magnification correction of conductive x-ray lithography mask substrates
01/23/1991EP0409169A2 Exposing method
01/22/1991US4987048 Image forming material
01/22/1991US4986869 Method employing input and output staging chamber devices for reduced pressure lamination
01/22/1991US4986007 Reticle frame assembly
01/21/1991CA2021474A1 Exposure process
01/16/1991EP0408349A2 Mask for lithography
01/16/1991EP0408056A2 Method of reproducing images of plurality of copy pages on single plate
01/15/1991US4985319 Process for manufacturing a photomask
01/15/1991US4985116 Three dimensional plating or etching process and masks therefor
01/01/1991US4981771 Lithography, x-ray mask
01/01/1991US4981765 Photosensitive polymer
12/1990
12/27/1990EP0404742A2 Method of making and using a high resolution lithographic mask
12/27/1990EP0404040A1 Method of forming stable images on silicate glass articles
12/25/1990US4980536 Removal of particles from solid-state surfaces by laser bombardment
12/19/1990EP0403220A1 Producing exposure masks
12/19/1990EP0403080A2 Bonding devices
12/19/1990EP0402894A2 Photoresist
12/19/1990EP0402616A1 Emulsion printing plate relief coatings
12/19/1990EP0277982B1 Marking of articles with photochromic compounds
12/18/1990US4978421 Masking one side of a wafer, removal of undoped silicon to expose doped silicon membrane on the opposite side
12/13/1990DE4018135A1 Emulsion mask defect repair - by applying contoured UV beam of excimer laser
12/13/1990DE3917957A1 Printing method applying motifs to textiles, foil or paper - using VDU work-station for monitoring and modification of video images prior to computer controlled printing
12/12/1990EP0401795A2 Phase-shifting photomask for negative resist and process for forming isolated, negative resist pattern using the phaseshifting photomask
12/04/1990US4975860 Apparatus for Automatically drawing a dot pattern
12/04/1990CA1277432C Semiconductor device fabrication including a non- destructive method for examining lithographically defined features
11/1990
11/29/1990WO1990014219A1 Perfluoropolymer coated pellicles
11/28/1990EP0399998A2 Process for the fabrication of high definition silicon shadow masks
11/28/1990EP0399735A2 X-ray lithography mask and method for manufacturing such a mask
11/27/1990US4973543 System for the production of dot-etched lithographic films
11/22/1990EP0398566A2 Support apparatus for panels
11/22/1990EP0397988A2 Plasma processing with metal mask integration
11/20/1990US4972329 System for creating images, in particular dummies for printing advertising documents such as wrappers, labels or the like
11/20/1990US4971851 Multilayer x-ray membranes, masking, silicon with silicon dioxide coating, lithography
11/14/1990EP0397161A2 Methods for device transplantation
11/14/1990EP0396768A1 Pattern correction method
11/13/1990US4970099 Perfluoropolymer coated pellicles
11/07/1990EP0396259A2 Optical image forming apparatus
11/06/1990US4968390 Electrodeposition using scanning electrochemical microscope
11/01/1990WO1990013131A1 X-ray masks, their fabrication and use
11/01/1990WO1990012685A1 Index marking article for superposed sheets
10/1990
10/31/1990EP0395425A2 Mask, mask producing method and pattern forming method using mask
10/31/1990EP0394880A2 Handy-size electronic rule with built-in calculator
10/31/1990EP0394871A2 Apparatus for forming an image with a reversible thermosensitive medium
10/30/1990US4967229 Process for forming dicing lines on wafer
10/30/1990US4966813 Reflection-preventive pellicle film
10/30/1990US4966457 Inspecting apparatus for determining presence and location of foreign particles on reticles or pellicles
10/30/1990US4966428 Manufacture of integrated circuits using holographic techniques
10/16/1990US4964145 System for magnification correction of conductive X-ray lithography mask substrates
10/16/1990US4963924 Linewidth loss measurement
10/16/1990US4963921 Device for holding a mask
10/10/1990EP0391636A2 Method of correcting proximity effects
10/10/1990EP0391314A2 Method for patterning on a substrate
10/09/1990CA1274996A1 Composite optical membrane including anti-reflective coating
09/1990
09/26/1990EP0389259A2 X-ray exposure apparatus
09/26/1990EP0389198A2 Method of manufacturing an X-ray exposure mask and device for controlling the internal stress of thin films
09/20/1990DE4007069A1 Projection exposure system for photolithography - has coupled optic elements for direct magnification control
09/18/1990US4958083 Inspecting apparatus capable of accurately inspecting an object
09/18/1990US4958074 For X-ray or corpuscular beam lithography
09/18/1990US4957835 Masked electron beam lithography
09/18/1990US4957834 Molybdenum silicide film on quartz substrate, overcoated with a resist, plasma etched
09/18/1990US4956906 Method of preparing pre-distorted images for decorating a shaped blank
09/17/1990CA2012258A1 Image-forming material and process for forming images
09/12/1990EP0386786A2 X-ray mask structure, and x-ray exposure process
09/11/1990US4956649 Image recording apparatus forming photomasking pattern on photosensitive medium
09/11/1990US4956249 Multilayer lithography, plates, films, patterns,for electronics
09/11/1990CA1273783A1 Mounting preparation for optical membrane
09/05/1990EP0385480A2 Aperture pattern printing plate for shadow mask and method of manufacturing the same
09/05/1990EP0385013A1 Production of precision patterns on curved surfaces
09/05/1990CN1009522B Recording method of printing plate
09/04/1990US4954717 Pattern on transparent sustrate
08/1990
08/29/1990EP0384754A2 Localized vacuum apparatus and method
08/28/1990US4952421 Method for repairing a pattern
08/22/1990EP0383534A2 Exposure mask, method of manufacturing the same, and exposure method using the same