| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/16/2006 | US20060033504 Non-destructive monitoring of material integrity |
| 02/16/2006 | US20060033503 Sensitive test structure for assessing pattern anomalies |
| 02/16/2006 | US20060033459 Method and switching apparatus for recording the current in an electrical device |
| 02/16/2006 | US20060033100 Anisotropically conductive connector and production process thereof, and probe member |
| 02/16/2006 | DE4417838B4 Verfahren zum Charakterisieren eines nicht-reflektierenden Ereignisses in einem durch optische Zeitbereichs-Reflektometrie erhaltenen Digitaldaten-Signalzug A method for characterizing a non-reflecting event in a digital data signal train obtained by means of optical time domain reflectometry |
| 02/16/2006 | DE19781328B4 Speichertestgerät Memory tester |
| 02/16/2006 | DE19743632B4 Verfahren zur Ermittlung vorgeschädigter Leistungshalbleiterschalter in Stromrichterschaltungen Procedure for the determination of damaged power semiconductor switches in inverter circuits |
| 02/16/2006 | DE19710687B4 Simulationsvorrichtung und Simulationsverfahren für die Intensität eines elektromagnetischen Feldes mit Hilfe der Momentenmethode Simulation apparatus and simulation method for the intensity of an electromagnetic field using the method of moments |
| 02/16/2006 | DE19639972B4 Hochgeschwindigkeitstestschaltkreis für eine Halbleiterspeichervorrichtung High-speed test circuit for a semiconductor memory device |
| 02/16/2006 | DE112004000614T5 System und Methode für die Kalibrierung von Testgerät unter Verwendung von Bauelement-Photoemission System and method for the calibration of test equipment using component-photoemission |
| 02/16/2006 | DE10357524B4 Strommesseinrichtung Current measuring device |
| 02/16/2006 | DE10320717B4 Plausibilisierung der Funktion eines Analog-Digital-Wandlers Validation of the function of an analog-to-digital converter |
| 02/16/2006 | DE102005032507A1 Ultrakondensator-Nutzlebensdauer-Vorhersage Ultracapacitor service life prediction |
| 02/16/2006 | DE102005025744A1 Test instrument setting method for field programmable gate array, involves configuring test instrument with output pins, and displaying list of output pins and input lines, to associate each pin with input line |
| 02/16/2006 | DE102005024198A1 Batterieleck-Erkennungsschaltung für ein Elektrofahrzeug und Leckerkennungsverfahren für ein Elektrofahrzeug Battery leakage detection circuit for an electric vehicle and leak detection method for an electric vehicle |
| 02/16/2006 | DE102004035858A1 Zustands- und Parameterschätzer mit Integral- und Differentialanteil für elektrische Energiespeicher State and parameter estimator with integral and differential component for electrical energy storage |
| 02/16/2006 | DE102004035318A1 Erfassung des Verschleisses einer Motoransteuerung Detection of wear of a motor drive |
| 02/16/2006 | DE102004033999A1 Testing method for functionality of electronic switching elements on a printed circuit board (PCB) fastens a PCB to be tested on a first area of an adapter PCB with a removal option |
| 02/16/2006 | DE102004033838A1 Batteriesensor und Verfahren zum Betreiben eines Batteriesensors Battery sensor and method of operating a battery sensor |
| 02/16/2006 | DE102004033302A1 Populated circuit board test unit has needle bed adapter with overlapping metallised connector holes containing test pin holders |
| 02/16/2006 | CA2570886A1 Probe head having a membrane suspended probe |
| 02/15/2006 | EP1626488A2 Method and circuit arrangement for measuring current in an electric device |
| 02/15/2006 | EP1626361A1 Arrangement for the identification and the localisation of objects |
| 02/15/2006 | EP1626268A2 Method and apparatus for detecting wear in components of high voltage electrical equipment |
| 02/15/2006 | EP1625411A2 Test circuit for input-to output speed measurement |
| 02/15/2006 | EP1625410A2 Method and testing equipment for checking the operation of a lightning arrester |
| 02/15/2006 | EP1625409A2 Planarizing and testing of bga packages |
| 02/15/2006 | EP1625406A2 Device probing using a matching device |
| 02/15/2006 | EP1127280B1 Electronic monitoring device for a multipart electrical energy storage unit |
| 02/15/2006 | CN2758788Y Charging and discharging device for testing secondary battery |
| 02/15/2006 | CN2758787Y Multifunction programmable resistance load |
| 02/15/2006 | CN2758786Y Capacitor for testing electric characteristics of blade |
| 02/15/2006 | CN2758785Y Grounding fault measuring mechanism |
| 02/15/2006 | CN2758784Y Cable tester |
| 02/15/2006 | CN2758783Y Ground wire detector and terminal plate for detecting ground wire condition |
| 02/15/2006 | CN2758782Y Non-contact electric generator local discharge on-line monitoring direction sensing apparatus |
| 02/15/2006 | CN2758781Y Measurer for electric horn durability |
| 02/15/2006 | CN2758780Y On-line monitoring device for early latent fault of transformer |
| 02/15/2006 | CN1735812A Method and device for determining the charge that can be drawn from an energy accumulator |
| 02/15/2006 | CN1735811A Diagnosis system for household electric appliances |
| 02/15/2006 | CN1734855A Electrical source socket |
| 02/15/2006 | CN1734827A Network type replacing method for battery of electric vehicle and apparatus therefor |
| 02/15/2006 | CN1734826A Method for improving battery availability factor |
| 02/15/2006 | CN1734281A 电子设备系统和电子照相机系统 The electronic equipment system and an electronic camera system |
| 02/15/2006 | CN1734280A Time sequence test method |
| 02/15/2006 | CN1734279A Positioning method for detecting flip-chip substrate |
| 02/15/2006 | CN1734278A System and method for testing system fault on integrated circuit board |
| 02/15/2006 | CN1734277A Quick characterization method for charge density of buried oxide layer of SOI |
| 02/15/2006 | CN1734276A LED screen dead pixel detection method and circuit therefor |
| 02/15/2006 | CN1734275A Test system and method for printed circuit board |
| 02/15/2006 | CN1734274A Method and apparatus for detecting line signal disappearance |
| 02/15/2006 | CN1734273A Method and apparatus for a TFT array |
| 02/15/2006 | CN1734272A Online detector for partial discharge of gas-insulated substation and noise reduction method |
| 02/15/2006 | CN1734271A TPS protection plate detection method |
| 02/15/2006 | CN1734228A Machine vision analysis system and method |
| 02/15/2006 | CN1242563C Method for compensating XDSL up-power |
| 02/15/2006 | CN1242464C Multiple semiconductor die testing system with automatic identifying function |
| 02/15/2006 | CN1242329C Automatic insert method for semiconductor integrated circuit and simplified circuit test |
| 02/15/2006 | CN1242273C Method and device for detecting semiconductor circuit |
| 02/15/2006 | CN1241766C Device for detecting electric supply at working status |
| 02/14/2006 | US7000165 Configurable memory design for masked programmable logic |
| 02/14/2006 | US7000164 Method for scan testing and clocking dynamic domino circuits in VLSI systems using level sensitive latches and edge triggered flip flops |
| 02/14/2006 | US7000163 Optimized buffering for JTAG boundary scan nets |
| 02/14/2006 | US7000162 Integrated circuit phase partitioned power distribution for stress power reduction |
| 02/14/2006 | US7000161 Reconfigurable programmable logic system with configuration recovery mode |
| 02/14/2006 | US7000160 Semiconductor integrated circuit and a method of testing the same |
| 02/14/2006 | US7000157 Data transmitting apparatus, data transmitting method, data transmitting program and recording medium stored the same |
| 02/14/2006 | US7000156 Devices for storing and accumulating defect information, semiconductor device and device for testing the same |
| 02/14/2006 | US6999891 Independent deskew lane |
| 02/14/2006 | US6999889 Semiconductor device having a test circuit for testing an output circuit |
| 02/14/2006 | US6999888 Automated circuit board test actuator system |
| 02/14/2006 | US6999727 Method to implement a performance monitoring function on the ground of the retrieved data through FEC (Forward Error Correction) in a telecom network |
| 02/14/2006 | US6999415 Switching device and method for controlling the routing of data packets |
| 02/14/2006 | US6999413 Packet switching apparatus |
| 02/14/2006 | US6999410 Apparatus for the transmission and/or reception of data, and method for controlling this apparatus |
| 02/14/2006 | US6999408 Failure tolerant high density dial router |
| 02/14/2006 | US6999357 Memory circuit with redundant memory cell array allowing simplified shipment tests and reduced power consumptions |
| 02/14/2006 | US6999356 Semiconductor device capable of readjusting a reference potential during the reliabilty test |
| 02/14/2006 | US6999347 Non-volatile semiconductor memory device with expected value comparison capability |
| 02/14/2006 | US6999287 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 02/14/2006 | US6999153 Liquid crystal display for testing defects of wiring in panel |
| 02/14/2006 | US6998899 Method and apparatus to remotely sense the temperature of a power semiconductor |
| 02/14/2006 | US6998869 Semiconductor device characteristics measurement apparatus and connection apparatus |
| 02/14/2006 | US6998868 Test key for bridge and continuity testing |
| 02/14/2006 | US6998867 Enhanced sampling methodology for semiconductor processing |
| 02/14/2006 | US6998866 Circuit and method for monitoring defects |
| 02/14/2006 | US6998865 Semiconductor device test arrangement with reassignable probe pads |
| 02/14/2006 | US6998864 Structures for testing circuits and methods for fabricating the structures |
| 02/14/2006 | US6998863 Arrangement for providing electrical connections to pin electronics cards in test head |
| 02/14/2006 | US6998862 Test socket for semiconductor components having serviceable nest |
| 02/14/2006 | US6998861 Wiring board and soldering method therefor |
| 02/14/2006 | US6998860 Method for burn-in testing semiconductor dice |
| 02/14/2006 | US6998859 Test probe with side arm |
| 02/14/2006 | US6998858 Probe head, its assembly method and probe card |
| 02/14/2006 | US6998857 Probe unit and its manufacture |
| 02/14/2006 | US6998853 Patchcord length measurement for LAN testers |
| 02/14/2006 | US6998852 Method and apparatus for implementing direct attenuation measurement through embedded structure excitation |
| 02/14/2006 | US6998851 Apparatus and method for determining the performance of micromachined or microelectromechanical devices (MEMS) |
| 02/14/2006 | US6998850 Systems and methods for measuring picoampere current levels |
| 02/14/2006 | US6998849 Capacitive sensor measurement method for discrete time sampled system for in-circuit test |