| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/26/2006 | WO2005107035A3 Power supply device |
| 01/26/2006 | WO2005029329A3 A system and method for testing and configuring semiconductor functional circuits |
| 01/26/2006 | US20060020867 Method for automated at-speed testing of high serial pin count multiple gigabit per second devices |
| 01/26/2006 | US20060020866 System and method for monitoring performance of network infrastructure and applications by automatically identifying system variables or components constructed from such variables that dominate variance of performance |
| 01/26/2006 | US20060020864 Method and system for blocking data in scan registers from being shifted out of a device |
| 01/26/2006 | US20060020863 Scanning latches using selecting array |
| 01/26/2006 | US20060020861 Method, system, and apparatus for loopback entry and exit |
| 01/26/2006 | US20060020860 Digital signature generation for hardware functional test |
| 01/26/2006 | US20060020577 Target value search circuit, taget value search method, and semiconductor test device using the same |
| 01/26/2006 | US20060020413 Methods and apparatus for providing automated test equipment with a means to jump and return in a test program |
| 01/26/2006 | US20060019419 Method of detecting a defect in a simiconductor device |
| 01/26/2006 | US20060019416 Manufacturing method for semiconductor devices, arrangement determination method and apparatus for semiconductor device formation regions, and program for determining arrangement of semiconductor device formation regions |
| 01/26/2006 | US20060019414 Wiring structure to minimize stress induced void formation |
| 01/26/2006 | US20060018532 Method and apparatus for inspecting a semiconductor device |
| 01/26/2006 | US20060018326 LSP path selection |
| 01/26/2006 | US20060018321 Datagram relaying apparatus with load distributing function |
| 01/26/2006 | US20060018261 Optimal communication path routing in a system employing interconnected integrated circuit technology |
| 01/26/2006 | US20060018257 Adaptive estimation method of multimedia data transmission rate in a data communication system |
| 01/26/2006 | US20060017630 Method and an apparatus for measuring the performance of antennas, mobile phones and other wireless terminals |
| 01/26/2006 | US20060017484 Timing vernier using a delay locked loop |
| 01/26/2006 | US20060017455 Defect diagnosis method and apparatus for semiconductor integrated circuit |
| 01/26/2006 | US20060017454 Packaged circuit module for improved installation and operation |
| 01/26/2006 | US20060017453 Parallel scan distributors and collectors and process of testing integrated circuits |
| 01/26/2006 | US20060017452 Substrate inspection device and substrate inspecting method |
| 01/26/2006 | US20060017451 Substrates including alignment fences |
| 01/26/2006 | US20060017450 Testing and display of electrical system impedance |
| 01/26/2006 | US20060017448 Bonding configuration structure for facilitating electrical testing in a bonding process and a testing method using the same |
| 01/26/2006 | US20060017447 Broad-band low-inductance cables for making kelvin connections to electrochemical cells and batteries |
| 01/26/2006 | US20060017446 Electrical hazard detection system |
| 01/26/2006 | US20060017445 Electrical supply network |
| 01/26/2006 | DE102005005586A1 Verfahren, Vorrichtung und Datenbank, die eine Karte von verbundenen Datenknoten zur Speicherung von Testzahlen verwenden A method, device and database, using a map of linked data nodes for storing test numbers |
| 01/26/2006 | DE102004031997A1 Gehäuse für ein Halbleiter-Bauelement und Halbleiter-Bauelement-Test-System zum Testen der Kontaktierung bei übereinander angeordneten Halbleiter-Bauelementen A housing for a semiconductor device and semiconductor device testing system for testing the contact in superposed semiconductor devices |
| 01/26/2006 | DE102004031426A1 Dockingantrieb, Verriegelungselement, Dockingsystem Docking drive, locking element docking system |
| 01/26/2006 | DE102004028632A1 Halbleiter-Chip Semiconductor chip |
| 01/25/2006 | EP1619924A1 Telephony distribution system |
| 01/25/2006 | EP1619748A1 Portable testing device using an antenna. |
| 01/25/2006 | EP1619512A2 Device and method for the determination of the internal resistance of a batterie |
| 01/25/2006 | EP1619511A2 Detecting the wear of a motor drive |
| 01/25/2006 | EP1619510A2 Method for detecting of the connection between an energy accumulator and a vehicle power grid |
| 01/25/2006 | EP1618638A1 Method and safety device for ground fault protection circuit |
| 01/25/2006 | EP1618637A1 Electronic circuit breaker |
| 01/25/2006 | EP1618398A1 Method and device for predicting the starting capacity of a vehicle |
| 01/25/2006 | EP1618397A2 Measurement circuit with improved accuracy |
| 01/25/2006 | EP1618396A1 Method and apparatus for measuring quality of service parameters of networks delivering real time mpeg video |
| 01/25/2006 | EP1618395A1 Measurement of the current distribution/heat distribution of an electrochemical electrode |
| 01/25/2006 | EP1618394A2 Test head positioning system and method |
| 01/25/2006 | EP0987633B1 Communication system |
| 01/25/2006 | CN2754107Y Needle-mounted carriage for electronic circuit board measuring machine |
| 01/25/2006 | CN2754106Y Simple high-power silicon controlled rectifier measuring instrument |
| 01/25/2006 | CN2754105Y Flow speed analogue signal generating device |
| 01/25/2006 | CN2754101Y Small-sized electronic circuit board detecting table |
| 01/25/2006 | CN1726399A Integrated circuit and associated packaged integrated circuit |
| 01/25/2006 | CN1726398A Inspection method and inspection equipment |
| 01/25/2006 | CN1726397A Voltage-application current measuring instrument and current buffer with switch used therefor |
| 01/25/2006 | CN1725926A Network intelligent precision monitoring system for urban streetlight |
| 01/25/2006 | CN1725925A Terminal for monitoring urban street light circuit |
| 01/25/2006 | CN1725028A Boundry scanning chain test method |
| 01/25/2006 | CN1725027A Method of realizing single board station testing and its system |
| 01/25/2006 | CN1725026A Measuring and testing method for gain compression point output power of amplifier |
| 01/25/2006 | CN1725025A Monitoring and prewarning method for power source internal resistance for vehicle and its device |
| 01/25/2006 | CN1238928C Socket connector and contact for use in socket connector |
| 01/25/2006 | CN1238858C Method for testing memory apparatus |
| 01/25/2006 | CN1238729C Integrated circuit and reset operation method for testing interated circuit |
| 01/25/2006 | CN1238728C Circuit board detection method |
| 01/25/2006 | CN1238727C Inspecting apparatus and inspecting method for circuit board |
| 01/25/2006 | CN1238726C Monitor of electric cable breaking and its method |
| 01/25/2006 | CN1238725C Device and method for inspection of circuit substrate |
| 01/25/2006 | CN1238724C Integrated intelligent testing system for large power convertor assembly |
| 01/24/2006 | US6990644 On chip timing adjustment in multi-channel fast data transfer |
| 01/24/2006 | US6990642 Design method for integrated circuit having scan function |
| 01/24/2006 | US6990620 Scanning a protocol signal into an IC for performing a circuit operation |
| 01/24/2006 | US6990619 System and method for automatically retargeting test vectors between different tester types |
| 01/24/2006 | US6990618 Boundary scan register for differential chip core |
| 01/24/2006 | US6990616 Analysis of network performance |
| 01/24/2006 | US6990614 Data storage apparatus and data measuring apparatus |
| 01/24/2006 | US6990613 Test apparatus |
| 01/24/2006 | US6990610 Combining commands to form a test command |
| 01/24/2006 | US6990423 Apparatus and method for testing non-deterministic device data |
| 01/24/2006 | US6990422 Method of analyzing the time-varying electrical response of a stimulated target substance |
| 01/24/2006 | US6990385 Defect detection using multiple sensors and parallel processing |
| 01/24/2006 | US6990115 Queue control method and system |
| 01/24/2006 | US6990076 Synchronous bi-directional data transfer having increased bandwidth and scan test features |
| 01/24/2006 | US6990068 Virtual path restoration scheme using fast dynamic mesh restoration in an optical network |
| 01/24/2006 | US6990067 Protection in a communication network |
| 01/24/2006 | US6990066 Method for using a pre-configured ATM switch and traffic discard to facilitate UPSR selection |
| 01/24/2006 | US6990065 System and method for service independent data routing |
| 01/24/2006 | US6990063 Distributing fault indications and maintaining and using a data structure indicating faults to route traffic in a packet switching system |
| 01/24/2006 | US6989685 Method and system for maintaining uniform module junction temperature during burn-in |
| 01/24/2006 | US6989684 System for and method of assessing chip acceptability and increasing yield |
| 01/24/2006 | US6989683 of wafers; circuit with a variable capacitor that sets the initial phase angle of the measurement circuit to about zero and alters the phase angle; improved detection under noisy conditions |
| 01/24/2006 | US6989682 Test key on a wafer |
| 01/24/2006 | US6989681 Socket for testing a semiconductor device and a connecting sheet used for the same |
| 01/24/2006 | US6989664 RF power sensor for measuring an RF signal power using capacitance |
| 01/24/2006 | US6989648 Load angle determination for electrical motors |
| 01/24/2006 | US6988693 Methods and apparatus for passive illumination of refueling hoses |
| 01/24/2006 | US6988609 Work measurement apparatus |
| 01/24/2006 | US6988543 Annular cold plate with reflexive channels |
| 01/19/2006 | WO2006007573A1 A sensor system for measuring an electric potential signal of an object |
| 01/19/2006 | WO2006007469A2 Qos and fault isolation in bgp traffic, address families and routing topologies |
| 01/19/2006 | WO2006007440A1 Electrical test probes, methods of making, and methods of using |