| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/29/2006 | CN1754326A Transmission path simulation method and transmission path simulator |
| 03/29/2006 | CN1754154A Semiconductor test system storing pin calibration data, commands and other data in non-volatile memory |
| 03/29/2006 | CN1754101A Method and apparatus for detecting an unused state in a semiconductor circuit |
| 03/29/2006 | CN1753509A Method of opposing electrostatic discharging and its device |
| 03/29/2006 | CN1753108A Flash fault display uniform voltage ring |
| 03/29/2006 | CN1753060A Electro-optical device substrate, electro-optical device, and testing method |
| 03/29/2006 | CN1752767A Detection method of quantity of electricity of voltage reducing type chargeable cell |
| 03/29/2006 | CN1752766A Measuring method used for distinguishing whether secondary ballery is over discharged |
| 03/29/2006 | CN1752765A Automatic testing device of semiconductor construction element |
| 03/29/2006 | CN1752764A Measuring device of deep energy level transient state spectrum having external magnetic field and measuring method |
| 03/29/2006 | CN1752763A Detecting method of charger connector safety |
| 03/29/2006 | CN1752762A Prediagnosis device of electric power equipment on line failure |
| 03/29/2006 | CN1752761A Testing method of liquid crystal module manufacturing line and switching flexible printed circuit board |
| 03/29/2006 | CN1752759A Integrated circuit testing card |
| 03/29/2006 | CN1752758A Integrated circuit plug socket having signal switching device and electron element testing method |
| 03/29/2006 | CN1248351C Battery having a built-in controller to extend service run time |
| 03/29/2006 | CN1248006C UPS cell on-line monitoring method and device |
| 03/29/2006 | CN1248005C Tap changer condition diagnosing |
| 03/29/2006 | CN1248004C Tap changer monitoring |
| 03/29/2006 | CN1248003C Calibrating single ended channels for differential performance |
| 03/29/2006 | CN1248002C Semiconductor chip and automatic test equipment using same |
| 03/29/2006 | CN1248001C Automatic test equipment and running method thereof |
| 03/29/2006 | CN1248000C Fault arc current detection circuit |
| 03/29/2006 | CN1247999C Inspection apparatus and inspection method |
| 03/28/2006 | US7020862 Circuits and methods for analyzing timing characteristics of sequential logic elements |
| 03/28/2006 | US7020852 Automation of the development, testing, and release of a flow framework and methodology to design integrated circuits |
| 03/28/2006 | US7020820 Instruction-based built-in self-test (BIST) of external memory |
| 03/28/2006 | US7020819 Semiconductor integrated circuit with local monitor circuits |
| 03/28/2006 | US7020818 Method and apparatus for PVT controller for programmable on die termination |
| 03/28/2006 | US7020817 Method for testing semiconductor chips and semiconductor device |
| 03/28/2006 | US7020814 Method and system for emulating a Fiber Channel link over a SONET/SDH path |
| 03/28/2006 | US7020813 On chip debugging method of microcontrollers |
| 03/28/2006 | US7020716 Method and system for verifying the hardware implementation of TCP/IP |
| 03/28/2006 | US7020582 Methods and apparatus for laser marking of integrated circuit faults |
| 03/28/2006 | US7020577 measuring layer density via buoyancy to determine dielectric constant; statistical process control |
| 03/28/2006 | US7020571 Automated test method |
| 03/28/2006 | US7020570 Accelerated test method and system |
| 03/28/2006 | US7020443 System for measuring a radio frequency signal in a wireless station and a wiring board switch |
| 03/28/2006 | US7020089 Information processing apparatus and method of controlling the information processing apparatus |
| 03/28/2006 | US7020085 Method of monitoring quality of communication for each flow |
| 03/28/2006 | US7020083 Method for improving TCP performance over wireless links |
| 03/28/2006 | US7020081 Stream distribution system |
| 03/28/2006 | US7020079 Bypassing protocol checksum computations in communications across a reliable network link |
| 03/28/2006 | US7020078 Communication network system and communication network node for use in the same communication network system |
| 03/28/2006 | US7020077 Cross-connect matrix task prioritizer |
| 03/28/2006 | US7020033 Semiconductor memory apparatus and self-repair method |
| 03/28/2006 | US7019720 Adaptive control boost current method and apparatus |
| 03/28/2006 | US7019719 Method and clamping apparatus for securing a minimum reference voltage in a video display boost regulator |
| 03/28/2006 | US7019659 Network system, managing server, electrical apparatus, battery status managing method, battery diagnosis method, and program thereof |
| 03/28/2006 | US7019550 Leakage testing for differential signal transceiver |
| 03/28/2006 | US7019549 Apparatus and method for electrical contact testing of substrates |
| 03/28/2006 | US7019548 Laser production and product qualification via accelerated life testing based on statistical modeling |
| 03/28/2006 | US7019547 Pin driver for AC and DC semiconductor device testing |
| 03/28/2006 | US7019546 Test head for integrated circuit tester |
| 03/28/2006 | US7019545 Method for monitoring quality of an insulation layer |
| 03/28/2006 | US7019542 Method and apparatus for battery testing |
| 03/28/2006 | US7019534 Detecting the status of an electrical fuse |
| 03/28/2006 | US7019533 Cable tester |
| 03/28/2006 | US7019532 Device and method for error diagnosis at digital outputs of a control module |
| 03/28/2006 | US7019531 Procedure and device for the evaluation of the quality of a cable |
| 03/28/2006 | US7019530 Method of surface preparation and imaging for integrated circuits |
| 03/28/2006 | US7019521 Fault isolation of circuit defects using comparative magnetic field imaging |
| 03/28/2006 | US7019513 Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions |
| 03/28/2006 | US7019512 Planarity diagnostic system, e.g., for microelectronic component test systems |
| 03/28/2006 | US7019511 Optical analysis of integrated circuits |
| 03/28/2006 | US7019311 Laser-based irradiation apparatus and methods for monitoring the dose-rate response of semiconductor devices |
| 03/28/2006 | US7019294 Inspection method and apparatus using charged particle beam |
| 03/28/2006 | US7018857 Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe |
| 03/28/2006 | US7018856 Calibration standards for dopants/impurities in silicon and preparation method |
| 03/28/2006 | US7018855 Process controls for improved wafer uniformity using integrated or standalone metrology |
| 03/28/2006 | US7018731 End-of-discharge control apparatus for a battery of rechargeable electrochemical cells |
| 03/28/2006 | US7018553 Optical monitoring and control system and method for plasma reactors |
| 03/28/2006 | US7017429 Continuous test flow method and apparatus |
| 03/28/2006 | US7017428 Test kit for semiconductor package and method for testing semiconductor package using the same |
| 03/28/2006 | US7017358 Apparatus and method for controlling the temperature of an electronic device |
| 03/27/2006 | CA2525795A1 A method and apparatus for deferred decision signal quality analysis |
| 03/27/2006 | CA2525779A1 A method and apparatus for measuring the input frequency response of a digital receiver |
| 03/27/2006 | CA2513026A1 Electrical characterization of interferometric modulators |
| 03/23/2006 | WO2006031646A2 Double sided probing structures |
| 03/23/2006 | WO2006031280A2 Probe arrays and method for making |
| 03/23/2006 | WO2006030919A1 Inverse characteristic measuring instrument, distortion compensator, method, program, and recording medium |
| 03/23/2006 | WO2006030185A1 Housings and devices for disk drives |
| 03/23/2006 | WO2006030060A1 Testing arrangement for rfid transponders |
| 03/23/2006 | WO2006007382A3 Qam signal analysis in a network |
| 03/23/2006 | US20060064678 Debugger of an electric circuit manufactured based on a program in harware description language |
| 03/23/2006 | US20060064620 Self test for the phase angle of the data read clock signal DQS |
| 03/23/2006 | US20060064619 Method and/or system for identifying information appliances |
| 03/23/2006 | US20060064618 Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification |
| 03/23/2006 | US20060064617 Internal clock generator |
| 03/23/2006 | US20060064616 Method and apparatus for at-speed testing of digital circuits |
| 03/23/2006 | US20060064615 On-chip service processor |
| 03/23/2006 | US20060064614 Method and apparatus for pipelined scan compression |
| 03/23/2006 | US20060064613 Dual mode test access port method and apparatus |
| 03/23/2006 | US20060064612 Integrated circuit arrangement, integrated circuit, matrix array of circuits and electronic device |
| 03/23/2006 | US20060064272 Semiconductor device having a test circuit for testing an output circuit |
| 03/23/2006 | US20060064268 Dynamic creation and modification of wafer test maps during wafer testing |
| 03/23/2006 | US20060063406 Retrofit kit for interconnect cabling system |
| 03/23/2006 | US20060061381 Multiple testing bars for testing liquid crystal display and method thereof |
| 03/23/2006 | US20060061380 Testing flat panel display plates using high frequency AC signals |
| 03/23/2006 | US20060061379 Semiconductor device testing method and testing equipment |