| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/02/2006 | US20060043986 Pin-in elastomer electrical contactor and methods and processes for making and using the same |
| 03/02/2006 | US20060043985 Method of designing a probe card apparatus with desired compliance characteristics |
| 03/02/2006 | US20060043984 Bottom side stiffener probe card |
| 03/02/2006 | US20060043983 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 03/02/2006 | US20060043982 Method and apparatus for inspecting integrated circuit pattern |
| 03/02/2006 | US20060043979 Emi measuring method and its system |
| 03/02/2006 | US20060043977 Method and device for detecting touching points on rotating machines |
| 03/02/2006 | US20060043976 Wireless portable automated harness scanner system and method therefor |
| 03/02/2006 | US20060043974 Repair device for decorative light shunt |
| 03/02/2006 | US20060043962 Double sided probing structures |
| 03/02/2006 | US20060043959 Combined test instrument probe and voltage detector |
| 03/02/2006 | DE202005018741U1 Isolation error locating device for alternating voltage system, has current transformers implemented with bias by injecting bias alternating voltage into measuring circuit, where voltage in measuring circuit increases inductive resistance |
| 03/02/2006 | DE19729163B4 System und Verfahren zur Abtaststeuerung einer programmierbaren Sicherungsschaltung in einer integrierten Schaltung System and method for scanning control of a programmable fuse circuit in an integrated circuit |
| 03/02/2006 | DE19513441B4 Verfahren zur Erzeugung einer Prüfspannung für die Prüfung elektrischer Betriebsmittel sowie Schaltungsanordnung zur Ausführung des Verfahrens A method for generating a test voltage for testing of electrical equipment and circuit arrangement for carrying out the method |
| 03/02/2006 | DE10255890B4 Motoranormalitäts-Detektionsgerät und elektrisches Servolenksteuersystem Motoranormalitäts detection device and electric power steering control system |
| 03/02/2006 | DE102005038648A1 Flurförderzeug und Verfahren zum Betrieb eines Flurförderzeugs mit mindestens einer Batterie Truck and method for operating a truck with at least one battery |
| 03/02/2006 | DE102004041428A1 Systemintegrationsprüfstand für vernetzte mechatronische Gesamtsysteme System integration test bench for networked mechatronic systems |
| 03/02/2006 | DE102004040859A1 Electrical terminal block has groove starting at upper level of terminal housing so tip of contact pin can be plugged through groove and recess as far as lower current bar so lower current bar can be contacted by test plug |
| 03/02/2006 | DE102004040504A1 Testing appliance for molecular components of e.g. semiconductor memories with testing structure using chemical amplification of resist lines process and testing structure for molecular components |
| 03/02/2006 | CA2578060A1 Semiconductor test system |
| 03/02/2006 | CA2577425A1 Methods and apparatus for transmitting group communication signals |
| 03/01/2006 | EP1630830A1 High pressure resistance body element |
| 03/01/2006 | EP1630567A1 System and method for monitoring and testing a semiconductor circuit |
| 03/01/2006 | EP1630566A2 Monitoring control apparatus |
| 03/01/2006 | EP1630565A1 A method of detecting an arcing event and a printing machine using said method |
| 03/01/2006 | EP1630563A1 Method of manufacturing a probe card |
| 03/01/2006 | EP1629562A1 Insulating mount structure, insulation monitoring system, and insulation monitoring method for fuel cells |
| 03/01/2006 | EP1629447A2 Input voltage sense circuit in a line powered network element |
| 03/01/2006 | EP1629388A1 A network analyzing method and a network analyzing apparatus |
| 03/01/2006 | EP1629291A1 Automatic test pattern generation |
| 03/01/2006 | EP1629290A1 Automatic test pattern generation |
| 03/01/2006 | EP1629289A1 Tester architecture for testing semiconductor integrated circuits |
| 03/01/2006 | EP1629228A2 Systems and methods for non-destructively testing conductive members employing electromagnetic back scattering |
| 03/01/2006 | EP1388041B1 Measuring apparatus with value editor and corresponding method |
| 03/01/2006 | EP1344072B1 System and method for pre-programming an electronic device's memory |
| 03/01/2006 | EP1285408B1 Method and device for examining a pre-determined area of a printed circuit board |
| 03/01/2006 | EP1196789B1 Use of converging beams for transmitting electromagnetic energy to power devices for die testing |
| 03/01/2006 | EP1120662B1 Method for testing an integrated circuit having confidential software or hardware elements |
| 03/01/2006 | EP0993695B1 Method and system for detecting short-circuits in low-voltage mains |
| 03/01/2006 | CN2762331Y Earth fault circuit breaker with earth fault detection mechanism |
| 03/01/2006 | CN2762151Y Simple electronic testing device |
| 03/01/2006 | CN2762150Y Sulfur hexafluoride sealed combination electrical equipment on-line monitor |
| 03/01/2006 | CN2762149Y Testing device for printed board |
| 03/01/2006 | CN1742358A Method and system for fabricating multi layer devices on a substrate |
| 03/01/2006 | CN1742210A Probe device and display substrate testing apparatus using same |
| 03/01/2006 | CN1742209A Integrated circuit testing methods using trap bias modification |
| 03/01/2006 | CN1742208A Measuring method for deciding direction to a flickering source |
| 03/01/2006 | CN1741705A Printed circuit board and inspection method therefor |
| 03/01/2006 | CN1741265A Method for generating identification code of semiconductor device, method for identifying semiconductor device and semiconductor device |
| 03/01/2006 | CN1741260A Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device |
| 03/01/2006 | CN1741196A Test method for nonvolatile memory |
| 03/01/2006 | CN1740803A Electric resistance loading system |
| 03/01/2006 | CN1740802A Apparatus for measuring clock signal generation |
| 03/01/2006 | CN1740801A Three-phase lightning protector early fault on-line monitoring method and apparatus thereof |
| 03/01/2006 | CN1740800A Random response signal measuring and analyzing method |
| 03/01/2006 | CN1740798A Non-suction head type apparatus for taking and putting measured electronic elements |
| 03/01/2006 | CN1740797A Method and apparatus for taking and putting electronic elements waiting for measurement |
| 03/01/2006 | CN1244263C Socket of semiconductor package |
| 03/01/2006 | CN1244147C Socket for semiconductor package |
| 03/01/2006 | CN1244123C Teletron modulating characteristics sampling testing instrument |
| 03/01/2006 | CN1244052C Non-volatile memory chip for computer and test method thereof |
| 03/01/2006 | CN1243987C Method for measuring leakage current and resistance, its monitoring device and monitoring system |
| 03/01/2006 | CN1243985C Constant current constant voltage method for testing convertor driven by pulses in quasi-sinusoidal power under room temperature |
| 02/28/2006 | US7007263 Design flow method for integrated circuits |
| 02/28/2006 | US7007252 Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit |
| 02/28/2006 | US7007251 Database mining system and method for coverage analysis of functional verification of integrated circuit designs |
| 02/28/2006 | US7007250 Application-specific methods useful for testing look up tables in programmable logic devices |
| 02/28/2006 | US7007215 Test circuit capable of testing embedded memory with reliability |
| 02/28/2006 | US7007214 Diagnosable scan chain |
| 02/28/2006 | US7007213 Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test |
| 02/28/2006 | US7007212 Transmission device, reception device, test circuit, and test method |
| 02/28/2006 | US7007209 System of testing the upstream cable modem channel |
| 02/28/2006 | US7007208 Systems and methods for data unit modification |
| 02/28/2006 | US7007207 Scheduling of transactions in system-level test program generation |
| 02/28/2006 | US7006939 Method and apparatus for low cost signature testing for analog and RF circuits |
| 02/28/2006 | US7006936 Pulse width measuring device with automatic range setting function |
| 02/28/2006 | US7006935 Synchronous vector measuring device |
| 02/28/2006 | US7006933 Semiconductor module for outputting power loss |
| 02/28/2006 | US7006932 Technique for determining performance characteristics of electronic devices and systems |
| 02/28/2006 | US7006931 System and method for efficient analysis of transmission lines |
| 02/28/2006 | US7006594 Method and apparatus for reconstruction calibration of detector position and source motion based on a multi-pin phantom |
| 02/28/2006 | US7006448 System and method for measuring network round trip time by monitoring fast-response operations |
| 02/28/2006 | US7006445 Device and method for determining characteristics of a digital subscriber line |
| 02/28/2006 | US7006437 Scheduling mechanisms for use in mobile ad hoc wireless networks for achieving a differentiated services per-hop behavior |
| 02/28/2006 | US7006432 ATM network management system |
| 02/28/2006 | US7006395 Semiconductor integrated circuit |
| 02/28/2006 | US7006180 Method for producing a reflection liquid crystal display |
| 02/28/2006 | US7005995 System and method for remotely detecting and locating damaged conductors in a power system |
| 02/28/2006 | US7005884 Monitoring apparatus for monitoring electrical drive current for an electric motor |
| 02/28/2006 | US7005883 Battery ground fault detecting circuit |
| 02/28/2006 | US7005882 Method and apparatus for determining the switching state of a transistor |
| 02/28/2006 | US7005881 Current sensing for power MOSFET operable in linear and saturated regions |
| 02/28/2006 | US7005880 Method of testing electronic wafers having lead-free solder contacts |
| 02/28/2006 | US7005879 Device for probe card power bus noise reduction |
| 02/28/2006 | US7005878 Method for in-line testing of flip-chip semiconductor assemblies |
| 02/28/2006 | US7005877 Burn-in adapter |
| 02/28/2006 | US7005876 Wafer-level tester with magnet to test latching micro-magnetic switches |
| 02/28/2006 | US7005875 Built-in self-test circuitry for integrated circuits |
| 02/28/2006 | US7005874 Utilizing clock shield as defect monitor |
| 02/28/2006 | US7005873 Built-in self-test hierarchy for an integrated circuit |