| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/21/2006 | US7017074 System architecture providing redundant components to improve die yields and system reliability |
| 03/21/2006 | US7016997 Method for determining an interruption source |
| 03/21/2006 | US7016820 Semiconductor device analyzer, method for analyzing/manufacturing semiconductor device, and storage medium storing program for analyzing semiconductor device |
| 03/21/2006 | US7016811 Network-based system for configuring a programmable hardware element in a measurement system using hardware configuration programs generated based on a user specification |
| 03/21/2006 | US7016802 Photocontrol devices having flexible mounted photosensors and methods of calibrating the same |
| 03/21/2006 | US7016378 Method and system for automatically provisioning an overhead byte |
| 03/21/2006 | US7016369 Binding information for telecommunications network |
| 03/21/2006 | US7016304 Link level retry scheme |
| 03/21/2006 | US7016247 Semiconductor memory apparatus |
| 03/21/2006 | US7016242 Semiconductor memory apparatus and self-repair method |
| 03/21/2006 | US7015822 Battery capacity and usage system |
| 03/21/2006 | US7015740 Self-adjusting programmable on-chip clock aligner |
| 03/21/2006 | US7015716 Method for detecting a power load of a power supply module according to duty cycle detection, and related device |
| 03/21/2006 | US7015715 Hybrid gap measurement circuit |
| 03/21/2006 | US7015714 Testing device for printed circuit boards |
| 03/21/2006 | US7015713 Method and apparatus for evaluating a set of electronic components |
| 03/21/2006 | US7015712 Production line environmental stress screening system |
| 03/21/2006 | US7015711 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method |
| 03/21/2006 | US7015710 Contact probe and probe device |
| 03/21/2006 | US7015709 Ultra-broadband differential voltage probes |
| 03/21/2006 | US7015708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts |
| 03/21/2006 | US7015707 Micro probe |
| 03/21/2006 | US7015702 Method for evaluating a measuring signal and corresponding circuit arrangement |
| 03/21/2006 | US7015698 Sensor for detection of spark in igniter in gas turbine engine |
| 03/21/2006 | US7015685 Semiconductor tester |
| 03/21/2006 | US7015146 for die or wafer backside thinning prior to electrical probing and/or characterization of a site specific MOSFET device; using collimated ion plasma; avoids damaging or rupturing the gate film |
| 03/21/2006 | US7015051 Method for inspecting semiconductor device |
| 03/21/2006 | US7014527 Die level testing using machine grooved storage tray with vacuum channels |
| 03/21/2006 | US7013956 Heat pipe evaporator with porous valve |
| 03/21/2006 | US7013662 Staggered spray nozzle system |
| 03/21/2006 | US7013563 Method of testing spacings in pattern of openings in PCB conductive layer |
| 03/21/2006 | CA2320003C Control apparatus for hybrid vehicles |
| 03/21/2006 | CA2282663C Infrared screening and inspection system |
| 03/16/2006 | WO2006029386A2 Architecture enhancement for a broadband wireless router |
| 03/16/2006 | WO2006029340A2 Method and apparatus for remotely buffering test channels |
| 03/16/2006 | WO2006029284A2 Integrated circuit yield and quality analysis methods and systems |
| 03/16/2006 | WO2006028857A2 Ieee std.1149.4 compatible analog bist methodology |
| 03/16/2006 | WO2006028238A1 Test carrier |
| 03/16/2006 | WO2006027740A1 Testing of a system-on-chip integrated circuit |
| 03/16/2006 | WO2006027462A1 Equipment control device for providing information about an operating state of the equipment |
| 03/16/2006 | WO2006004754A3 Lockstep mechanism to ensure security in hardware at power-up |
| 03/16/2006 | WO2005060719A3 Resistive probe tips |
| 03/16/2006 | US20060059398 Generation of test mode signals in memory device with minimized wiring |
| 03/16/2006 | US20060059397 Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods |
| 03/16/2006 | US20060059396 Semiconductor integrated circuit having bonding optional function |
| 03/16/2006 | US20060059395 IEEE Std. 1149.4 compatible analog BIST methodology |
| 03/16/2006 | US20060059387 Processor condition sensing circuits, systems and methods |
| 03/16/2006 | US20060057890 AC power phase indicator |
| 03/16/2006 | US20060057875 Probe card covering system and method |
| 03/16/2006 | US20060056306 Communication device suitable for setting IP address of server connected to network, network parameter setting method and network parameter setting program product |
| 03/16/2006 | US20060056269 Timing generation circuit and semiconductor test device having the timing generation circuit |
| 03/16/2006 | US20060056216 Multi-chip card |
| 03/16/2006 | US20060055419 System and method for detecting motor coil-to-coil faults |
| 03/16/2006 | US20060055413 Circuit pattern inspection instrument and pattern inspection method |
| 03/16/2006 | US20060055395 Diagnosis method for an antenna connection |
| 03/16/2006 | US20060055374 Battery charged condition computing device and battery charged condition computing method |
| 03/16/2006 | US20060055373 Method for predicting the voltage of a battery |
| 03/16/2006 | DE69830521T2 Automatisches Schaltkreisprüfgerät für Halbleitervorrichtungen Automatic circuit tester for semiconductor devices |
| 03/16/2006 | DE112004000730T5 Messvorrichtung und Programm Measuring apparatus and program |
| 03/16/2006 | DE102005043320A1 Stromsensor und seine Montagestruktur Current sensor and its mounting structure |
| 03/16/2006 | DE102005020654A1 Aufbau und Verwendung einer dielektrischen Platte zum passenden Koppeln einer Testausrüstung mit einer Lastplatine eines Schaltungstesters Construction and use of a dielectric plate for coupling a suitable test equipment with a load board a circuit tester |
| 03/16/2006 | DE102004042072A1 Verfahren zum Testen einer zu testenden Schaltungseinheit und Testvorrichtung zur Durchführung des Verfahrens A method of testing a circuit under test unit and test device for carrying out the method |
| 03/16/2006 | DE102004041552A1 Testverfahren mit Optimierung der Testabdeckung und Testvorrichtung zur Durchführung des Testverfahrens Test method with optimization of test coverage and test device for performing the assay method |
| 03/16/2006 | DE102004038263A1 Electrical system for locating an interruption/high impedance threshold in all electrically conductive connections easily identifies a faulty segment through electrical testing/subjective sensing |
| 03/16/2006 | DE102004037680A1 Controllable switch gear, has load circuit monitoring switching voltage and switching delay of switch-on and switch-off areas, and control circuit arranged in galvanic disconnection in comparison with load circuit |
| 03/16/2006 | DE102004034940A1 In circuit test adapter for circuit boards uses mirrors to steer UV laser beam to ionise fine channels to test points |
| 03/16/2006 | DE102004007851B4 Anschlussvorrichtung für eine Batterie Connection device for a battery |
| 03/16/2006 | DE10082299B4 Wellenformgenerator und Verfahren zum Erzeugen einer Wellenform Waveform generator and method for generating a waveform |
| 03/16/2006 | DE10024809B4 Verfahren und Einrichtung zur Detektion von Schäden in der Isolation von elektrischen Leitungen und Kabelbäumen Method and apparatus for detecting defects in the insulation of electrical wiring and harnesses |
| 03/15/2006 | EP1635183A1 Device for monitoring quiescent current of an electronic device |
| 03/15/2006 | EP1634322A2 Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions |
| 03/15/2006 | EP1634091A1 Method and device for determining the performance of a charge accumulator |
| 03/15/2006 | EP1634090A1 Automatic test system with easily modified software |
| 03/15/2006 | EP1634089A1 Delay-fault testing method, related system and circuit |
| 03/15/2006 | EP1634088A2 A method and apparatus for measuring and analyzing electrical or electrochemical systems |
| 03/15/2006 | CN2765213Y Short circuit test instrument for LCD device |
| 03/15/2006 | CN2765197Y Electromagnetic field type non-contact partial discharge sensing device for generator |
| 03/15/2006 | CN2765196Y Time sequence discrimination selective leakage protection unit for low-voltage power network of mines |
| 03/15/2006 | CN2765195Y A power distribution network user fault location device |
| 03/15/2006 | CN2765194Y Insulated on-line detection device for DC power system |
| 03/15/2006 | CN2765193Y Antitheft and fault alarm device for electric power installation |
| 03/15/2006 | CN1748154A Testing of integrated circuits |
| 03/15/2006 | CN1748153A Boundary scan controller, semiconductor device, method for identifying semiconductor circuit chip of semiconductor device, and method for controlling semiconductor circuit chip of semiconductor device |
| 03/15/2006 | CN1748152A Harmonic diagnosing method for electric facility |
| 03/15/2006 | CN1748151A Apparatus and method for inspecting thin film transistor active matrix substrate |
| 03/15/2006 | CN1747618A Drive circuit for a fluorescent lamp with a diagnosis circuit, and method for diagnosis of a fluorescent lamp |
| 03/15/2006 | CN1747319A Electric steering control device |
| 03/15/2006 | CN1747223A Galvanic battery with detection unit |
| 03/15/2006 | CN1747170A Semiconductor device |
| 03/15/2006 | CN1747070A Semiconductor circuit device and a system for testing a semiconductor apparatus |
| 03/15/2006 | CN1746695A Fuel cell monolithic voltage monitor of vehicle |
| 03/15/2006 | CN1746694A Automatic tester and test thereof |
| 03/15/2006 | CN1746693A 半导体集成电路器件 The semiconductor integrated circuit device |
| 03/15/2006 | CN1746692A PCB on-line testing system and realization thereof |
| 03/15/2006 | CN1746691A Voltage breakdown indicator alarming device |
| 03/15/2006 | CN1746690A Zero-line and breakage detector of three-phase and four-line system |
| 03/15/2006 | CN1746689A Short-circuit detection system and method for liquid-crystal display screen |
| 03/15/2006 | CN1746688A Apparatus and method for detecting arc faults |
| 03/15/2006 | CN1746687A Apparatus for measuring picture and lifetime of display panel |
| 03/15/2006 | CN1746686A DC power amplifier for interference simulator of vehicle electronic apparatus |