| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/02/2006 | US20060023731 Method and apparatus for processing data in a communication system |
| 02/02/2006 | US20060023632 System and method for detecting transient links in multi-hop wireless networks |
| 02/02/2006 | US20060023212 Spectrometer using diffraction grating |
| 02/02/2006 | US20060022699 Predictive, adaptive power supply for an integrated circuit under test |
| 02/02/2006 | US20060022698 Method of inspecting a leakage current characteristic of a dielectric layer and apparatus for performing the method |
| 02/02/2006 | US20060022697 Method for retesting semiconductor device |
| 02/02/2006 | US20060022696 Method and apparatus for non-contact electrical probe |
| 02/02/2006 | US20060022695 Defect monitor for semiconductor manufacturing capable of performing analog resistance measurements |
| 02/02/2006 | US20060022694 Large substrate test system |
| 02/02/2006 | US20060022693 Circuit and method for monitoring defects |
| 02/02/2006 | US20060022692 Backside attach probe, components thereof, and methods for making and using same |
| 02/02/2006 | US20060022691 Semiconductor device |
| 02/02/2006 | US20060022690 Method and apparatus for producing co-planar bonding pads on a substrate |
| 02/02/2006 | US20060022689 Method of electrical testing |
| 02/02/2006 | US20060022688 Probe card |
| 02/02/2006 | US20060022687 Disabling unused IO resources in platform-based integrated circuits |
| 02/02/2006 | US20060022686 Integrated circuit probe card |
| 02/02/2006 | US20060022685 Probe card assembly |
| 02/02/2006 | US20060022684 Lighting inspection device for plasma display panel and display panel producing method |
| 02/02/2006 | US20060022678 Test structures and method for interconnect impedance property extraction |
| 02/02/2006 | US20060022676 Battery capacity calculating method, battery capacity calculating apparatus and battery capacity calculating program |
| 02/02/2006 | US20060022664 Method and apparatus for electromagnetic interference shielding in an automated test system |
| 02/02/2006 | US20060022644 Remaining battery capacity indicating apparatus and remaining battery capacity indicating method |
| 02/02/2006 | US20060022295 Evaluation method and manufacturing method of semiconductor device |
| 02/02/2006 | US20060022207 Surface-emitting type wafer and method for manufacturing the same, and burn-in method for surface-emitting type wafers |
| 02/02/2006 | DE69634778T2 Vorrichtung zum parallelen prüfen von halbleiterschaltkreisen Apparatus for parallel check of semiconductor switching circuits |
| 02/02/2006 | DE69633713T2 Verfahren und Vorrichtung zur Prüfung von integrierten Schaltungen Method and device for testing of integrated circuits |
| 02/02/2006 | DE19752212B4 Störereigniszählvorrichtung Störereigniszählvorrichtung |
| 02/02/2006 | DE19730347B4 Statische Halbleitervorrichtung, die eine variable Stromversorgungsspannung, die an eine Speicherzelle angelegt wird, abhängig von dem Status im Gebrauch aufweist, und Verfahren zum Testen derselben Static semiconductor device, which, depending has a variable power supply voltage, which is applied to a memory cell from the state in use, and methods of testing same |
| 02/02/2006 | DE19718398B4 Handhabungsvorrichtung Handling device |
| 02/02/2006 | DE10394007T5 Vorrichtung und Verfahren zum Vorhersagen der verbleibenden Entladezeit einer Batterie Apparatus and method for predicting the remaining discharge a battery |
| 02/02/2006 | DE102005001702A1 Drehmelderfehlfuktionsdiagnoseschaltung Drehmelderfehlfuktionsdiagnoseschaltung |
| 02/02/2006 | DE102004032681A1 Transmitter state determining method for intelligent installation network (KNX) at proximal end of electrical circuit, involves damping electrical resonating circuit by transmitter, so that resonance amplitude between pulses decreases |
| 02/02/2006 | DE102004031386A1 Testing adapter unit for verifying programming of current limiting of power supply unit, has measuring resistor between contact devices, and comparator outlet to output signal when reference voltage exceeds measuring voltage |
| 02/02/2006 | CA2567607A1 Method for measuring electric current in a plurality of conductors |
| 02/01/2006 | EP1620741A1 Method and apparatus for determining cold cranking amperes value |
| 02/01/2006 | EP1620740A1 Data compression |
| 02/01/2006 | EP1620739A1 RECONFIGURABLE FABRIC FOR SOCs |
| 02/01/2006 | EP1620737A2 Circuitry for measuring mechanical stress impressed on a printed circuit board |
| 02/01/2006 | EP1509323A4 Fischer-tropsch catalyst prepared with a high purity iron precursor |
| 02/01/2006 | EP1259829B1 Vertical counter balanced test head manipulator |
| 02/01/2006 | EP1093574B1 Automatic defect classification with invariant core classes |
| 02/01/2006 | CN2755621Y Electric motor lock-testing table |
| 02/01/2006 | CN2755620Y Automatic current multiplaying power switch controller |
| 02/01/2006 | CN2755619Y Parameter extracting system of packed reliability model |
| 02/01/2006 | CN2755618Y Single-phase cable ground fault positioner of non-ground mid-point power supply system |
| 02/01/2006 | CN2755615Y Non-residual pressure on-line monitor |
| 02/01/2006 | CN1729402A Device and method for creating a signature |
| 02/01/2006 | CN1729401A Connecting multiple test access port controllers through a single test access port |
| 02/01/2006 | CN1729400A Semiconductor test instrument |
| 02/01/2006 | CN1728932A Method and apparatus for electromagnetic interference shielding in an automated test system |
| 02/01/2006 | CN1728692A Method and system for extended network access notification via a broadband access gateway |
| 02/01/2006 | CN1727909A Method for detecting internal resistance of accumulator through electromagnetic discharge |
| 02/01/2006 | CN1727908A Apparatus for partial discharge detection of turn to turn insulation in motor |
| 02/01/2006 | CN1240161C Connecting mechanism for coaxial of circuit substrate |
| 02/01/2006 | CN1240140C Method and apparatus for measuring parameters of electronic device |
| 02/01/2006 | CN1240119C Device and method for identifying working position of device conveying system in semiconductor device testing treatment machine |
| 02/01/2006 | CN1240118C Testing structure device and method of semiconductor storage element |
| 02/01/2006 | CN1239971C Output circuit for density grade control, its detector and detection method |
| 02/01/2006 | CN1239916C Gauge effect battery tester |
| 02/01/2006 | CN1239915C Full speed current test method for IC |
| 02/01/2006 | CN1239914C Cable fault monitoring system |
| 01/31/2006 | US6993736 Pending bug monitors for efficient processor development and debug |
| 01/31/2006 | US6993735 Method of generating a test pattern for simulating and/or testing the layout of an integrated circuit |
| 01/31/2006 | US6993696 Semiconductor memory device with built-in self test circuit operating at high rate |
| 01/31/2006 | US6993695 Method and apparatus for testing digital devices using transition timestamps |
| 01/31/2006 | US6993694 Deterministic bist architecture including MISR filter |
| 01/31/2006 | US6993693 Analogue/digital interface circuit |
| 01/31/2006 | US6993692 Method, system and apparatus for aggregating failures across multiple memories and applying a common defect repair solution to all of the multiple memories |
| 01/31/2006 | US6993691 Series connected TC unit type ferroelectric RAM and test method thereof |
| 01/31/2006 | US6993689 Data transmission apparatus and method |
| 01/31/2006 | US6993470 Method of evaluating test cases in a simulation environment by harvesting |
| 01/31/2006 | US6993447 System LSI |
| 01/31/2006 | US6993446 Method and apparatus for predicting the time to failure of electronic devices at high temperatures |
| 01/31/2006 | US6993439 Motor based condition monitoring |
| 01/31/2006 | US6993438 System and method for measuring essential power amplification functions |
| 01/31/2006 | US6993418 Method and apparatus for latent temperature control for a device under test |
| 01/31/2006 | US6992986 Integrated self-optimizing multi-parameter and multi-variable point to multipoint communication system |
| 01/31/2006 | US6992982 Communication device and method |
| 01/31/2006 | US6992980 System and method for enabling a full flow control down to the sub-ports of a switch fabric |
| 01/31/2006 | US6992872 Circuit breaker incorporating fault lockout protection |
| 01/31/2006 | US6992576 Test device and test module |
| 01/31/2006 | US6992500 Prober and probe testing method for temperature-controlling object to be tested |
| 01/31/2006 | US6992499 Test method and test apparatus for semiconductor device |
| 01/31/2006 | US6992498 Test apparatus for testing integrated modules and method for operating a test apparatus |
| 01/31/2006 | US6992497 LSI testing apparatus for testing an electronic device |
| 01/31/2006 | US6992496 Apparatus for interfacing electronic packages and test equipment |
| 01/31/2006 | US6992495 Shielded probe apparatus for probing semiconductor wafer |
| 01/31/2006 | US6992493 Device and method for substrate displacement detection |
| 01/31/2006 | US6992491 Cable tester |
| 01/31/2006 | US6992490 Ground fault detection device |
| 01/31/2006 | US6992489 Multiple voltage level detection circuit |
| 01/31/2006 | US6992475 Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit |
| 01/31/2006 | US6991948 Method of electrical characterization of a silicon-on-insulator (SOI) wafer |
| 01/31/2006 | US6990967 Potentiometer device for determination of valve positions |
| 01/30/2006 | CA2474182A1 Harmonic reflective load-pull tuner |
| 01/26/2006 | WO2006009282A1 Electronic component testing apparatus |
| 01/26/2006 | WO2006009253A1 Electronic component testing apparatus and method for configuring electronic component testing apparatus |
| 01/26/2006 | WO2006007812A1 Electronic test circuit for an integrated circuit and method for testing intensity and input sensitivity of a receiver of the integrated circuit |
| 01/26/2006 | WO2005114141A3 Decoding an alternator output signal |