| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/05/2006 | US20060005093 Comparator for circuit testing |
| 01/05/2006 | US20060005092 Cache based physical layer self test |
| 01/05/2006 | US20060005091 Error detecting circuit |
| 01/05/2006 | US20060005090 Compare, select, sort, and median-filter apparatus in programmable logic devices and associated methods |
| 01/05/2006 | US20060005089 Device and a process for the calibration of a semiconductor component test system, in particular of a probe card and/or of a semiconductor component test apparatus |
| 01/05/2006 | US20060005088 System and method for testing artificial memory |
| 01/05/2006 | US20060004859 Methods and apparatus that use contextual test number factors to assign test numbers |
| 01/05/2006 | US20060004536 System and method for remotely configuring semiconductor functional circuits |
| 01/05/2006 | US20060004533 MCU test device |
| 01/05/2006 | US20060003640 Universal binding post |
| 01/05/2006 | US20060002424 Multiple instances of the same type of processing module within a layered communication stack |
| 01/05/2006 | US20060002413 Control system for controlling turn-waiting queues of queue objects |
| 01/05/2006 | US20060002402 QoS and fault isolation in BGP traffic, address families and routing topologies |
| 01/05/2006 | US20060002308 Apparatus and method for managing information in multimedia service providing system |
| 01/05/2006 | US20060002305 Generation of stressed flow of packets |
| 01/05/2006 | US20060002299 Method and apparatus for detecting support for a protocol defining supplemental headers |
| 01/05/2006 | US20060002296 Controlling transmission rate of reverse traffic channel in wireless communication system |
| 01/05/2006 | US20060002294 Wideband provisioning |
| 01/05/2006 | US20060002289 Faults and status in virtual private networks |
| 01/05/2006 | US20060002212 Semiconductor device |
| 01/05/2006 | US20060002205 Semiconductor device having relief circuit for relieving defective portion |
| 01/05/2006 | US20060001441 Method for universally testing semiconductor devices with different pin arrangement |
| 01/05/2006 | US20060001440 Method and system for compensating thermally induced motion of probe cards |
| 01/05/2006 | US20060001439 Semiconductor test interconnect with variable flexure contacts having polymer material |
| 01/05/2006 | US20060001438 Cleaning system, device and method |
| 01/05/2006 | US20060001437 Double acting spring probe |
| 01/05/2006 | US20060001436 Apparatus and method for linked slot-level burn-in |
| 01/05/2006 | US20060001435 Automated test equipment with DIB mounted three dimensional tester electronics bricks |
| 01/05/2006 | US20060001434 Method of inspecting actual speed of semiconductor integrated circuit |
| 01/05/2006 | US20060001433 Electrical arcing protection circuit |
| 01/05/2006 | US20060001416 Test head positioner system |
| 01/05/2006 | DE102005026195A1 Komparator und Verfahren zum Verstärken eines Eingangsignals Comparator and method for amplifying an input signal |
| 01/05/2006 | DE102005001935A1 Lese-Schreib-Verarbeitungsvorrichtung für RFID-Tag Read-write device for processing RFID tag |
| 01/05/2006 | DE102004027860A1 Testverfahren und Testvorrichtung zum Testen einer integrierten Schaltung Test method and testing apparatus for testing an integrated circuit |
| 01/05/2006 | DE102004027675A1 Testing device for printed circuit boards has a supporting device for a printed circuit board, a hood to move in relation to the supporting device and a locking device |
| 01/05/2006 | DE102004020724B3 Verfahren zum Erkennen von Defekten in Blechsegmenten bei elektrischen Generatoren sowie Motoren A method for detecting defects in sheet metal segments for electric generators and motors |
| 01/04/2006 | EP1612891A1 Anisotropic electrically conductive film and method of producing the same |
| 01/04/2006 | EP1612635A1 Short-circuit detection with current-mirror |
| 01/04/2006 | EP1612573A2 Test circuit and semiconductor integrated circuit effectively carrying out verification of connection of nodes |
| 01/04/2006 | EP1612572A1 Test device and setting method |
| 01/04/2006 | EP1612571A1 Connection unit, test head, and test device |
| 01/04/2006 | EP1612570A2 Apparatus and method for detecting breakdown of a dielectric layer of a semiconductor wafer |
| 01/04/2006 | EP1612569A2 Method and apparatus for substrate surface inspection using multi-color light emission system |
| 01/04/2006 | EP1612567A2 A partial discharge sensing device for a gas insulated apparatus |
| 01/04/2006 | EP1611610A2 Thermal apparatus for engaging electronic device |
| 01/04/2006 | EP1611536A2 Field transmitter with diagnostic self-test mode |
| 01/04/2006 | EP1611449A1 System and method for measuring fuel cell voltage and high frequency resistance |
| 01/04/2006 | EP1611448A1 Performance monitor for a photovoltaic supply |
| 01/04/2006 | EP1611447A1 System and method for in-situ monitor and control of film thickness and trench depth |
| 01/04/2006 | EP1499906B1 Method and apparatus for secure scan testing |
| 01/04/2006 | EP1368671B1 Built-in-self-test circuitry for testing a phase locked loop circuit |
| 01/04/2006 | EP1210613B1 Method and apparatus for detecting a failed thyristor |
| 01/04/2006 | EP1200844B1 Method and apparatus for detecting slow and small changes of electrical signals including the sign of the changes |
| 01/04/2006 | EP0950192B1 Core test control |
| 01/04/2006 | EP0907185B1 Floating bitline test mode with digitally controllable bitline equalizers |
| 01/04/2006 | CN2750617Y Intelligent controller for whole network electrified periphery-blocking security protection electric network |
| 01/04/2006 | CN2750564Y Energy-saving burning device for AC/DC switching power supply |
| 01/04/2006 | CN1717589A System and method for keeping constant logic value scan test during constant working process |
| 01/04/2006 | CN1717588A Method and set of testing equipment for assessment of electric parameters of lightning protection systems |
| 01/04/2006 | CN1717155A Printed circuit assembly system and method |
| 01/04/2006 | CN1716907A Differential delay compensation and measurement in bonded systems |
| 01/04/2006 | CN1715944A Method for monitoring battery electricity,electronic device and circuit for said method |
| 01/04/2006 | CN1715943A Test switching circuit for a high speed data interface |
| 01/04/2006 | CN1715942A Detecting device and method for electronic product |
| 01/04/2006 | CN1715941A Chip needle detector |
| 01/04/2006 | CN1715940A IC detector suitable for different IC's |
| 01/04/2006 | CN1715939A Detecting sensor and detecting device and gas insulated electric apparatus with the same |
| 01/04/2006 | CN1715938A Method and system for identifying faulted phase |
| 01/04/2006 | CN1715937A Detecting device and its method for DC system earthing fault |
| 01/04/2006 | CN1715936A System level chip detecting method capable of avoiding heat point and uniformly distributing heat |
| 01/04/2006 | CN1715934A Double detection end test pen |
| 01/04/2006 | CN1715851A Method of testing motor torque integrity in a hybrid electric vehicle |
| 01/04/2006 | CN1715830A Amplifying camera equipment and metering checkout equipment |
| 01/04/2006 | CN1235318C Binding electronic interconnecting device for high-speed signal and data transmission |
| 01/04/2006 | CN1235279C Semiconductor device for making built-in drive small |
| 01/04/2006 | CN1235116C 监测电路 Monitoring circuit |
| 01/04/2006 | CN1235057C Testing device and method for printed boards |
| 01/04/2006 | CN1235056C Method and apparatus for circuit board continuity test, tool for continuity test |
| 01/04/2006 | CN1234501C Electronic test head positioner |
| 01/03/2006 | US6983441 Embedding a JTAG host controller into an FPGA design |
| 01/03/2006 | US6983407 Random pattern weight control by pseudo random bit pattern generator initialization |
| 01/03/2006 | US6983406 Method and system for partial-scan testing of integrated circuits |
| 01/03/2006 | US6983405 Method and apparatus for testing circuitry embedded within a field programmable gate array |
| 01/03/2006 | US6982954 Communications bus with redundant signal paths and method for compensating for signal path errors in a communications bus |
| 01/03/2006 | US6982950 System and method for connecting a call in a tandem architecture |
| 01/03/2006 | US6982904 Non-volatile semiconductor memory device and electric device with the same |
| 01/03/2006 | US6982819 Electro-optic array interface |
| 01/03/2006 | US6982569 Multiple testing bars for testing liquid crystal display and method thereof |
| 01/03/2006 | US6982568 Image display device having inspection terminal |
| 01/03/2006 | US6982567 Combination optical and electrical metrology apparatus |
| 01/03/2006 | US6982566 Method and apparatus for operating a burn-in board to achieve lower equilibrium temperature and to minimize thermal runaway |
| 01/03/2006 | US6982565 Test system and test method with interconnect having semiconductor spring contacts |
| 01/03/2006 | US6982564 Semiconductor test interconnect with variable flexure contacts |
| 01/03/2006 | US6982558 Electric circuit test device |
| 01/03/2006 | US6982557 Cable tester |
| 01/03/2006 | US6982556 System and method for classifying defects in and identifying process problems for an electrical circuit |
| 01/03/2006 | US6982555 Semiconductor device |
| 01/03/2006 | US6982551 Integrated circuit test device |
| 01/03/2006 | US6982550 Unbreakable micro-browser |
| 01/03/2006 | US6982544 System and method of battery capacity reporting |