Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/2006
02/14/2006US6998848 Method for producing a fault signal which indicates a short to ground
02/14/2006US6998847 Electronic battery tester with data bus for removable module
02/14/2006US6998837 Serial communication testing
02/14/2006US6998832 High-voltage indicating apparatus and method
02/14/2006US6998819 Current leakage detection in high voltage battery pack
02/14/2006US6998817 Charge control circuit and method of adjusting voltage for detecting full charge of secondary battery in same
02/14/2006US6998814 Method for measuring the electromotive force constant of motors
02/14/2006US6998688 Arrangement for protecting a chip and checking its authenticity
02/14/2006US6997277 Automotive passenger restraint and protection apparatus
02/13/2006CA2515618A1 Method and apparatus for detecting wear in components of high voltage electrical equipment
02/09/2006WO2006073622A2 Low-pressure removal of photoresist and etch residue
02/09/2006WO2006015157A2 Electron beam test system stage
02/09/2006WO2006015007A2 System and method for detecting transient links in multi-hop wireless networks
02/09/2006WO2006014850A2 Systems and methods for forming integrated circuit components having precise characteristics
02/09/2006WO2006014377A2 Electrical arcing protection circuit
02/09/2006WO2006013881A1 Nickel-hydride battery life determining method and life determining apparatus
02/09/2006WO2006013773A1 Contact load measuring apparatus and inspecting apparatus
02/09/2006WO2006013524A1 Testing of a circuit that has an asynchronous timing circuit
02/09/2006WO2006013351A1 Fuel tank system
02/09/2006WO2006013118A1 Method for detecting defects on an integrated circuit internal connections and corresponding device
02/09/2006WO2006013021A2 Method and device for functional checking of a field device before the commissioning thereof
02/09/2006WO2005085884A9 System and method for reducing temperature variation during burn in
02/09/2006WO2005060062A3 High level arc fault detector
02/09/2006US20060031768 Network-based system for selecting or purchasing software products
02/09/2006US20060031735 Method and circuit for correcting power amplifier distortion
02/09/2006US20060031733 Power-saving retention mode
02/09/2006US20060031732 Generating test patterns used in testing semiconductor integrated circuit
02/09/2006US20060031731 Generating test patterns used in testing semiconductor integrated circuit
02/09/2006US20060031730 Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability
02/09/2006US20060031729 Apparatus with self-test circuit
02/09/2006US20060031728 Method and apparatus for measuring digital timing paths by setting a scan mode of sequential storage elements
02/09/2006US20060031727 Segmented algorithmic pattern generator
02/09/2006US20060031068 Analysis method
02/09/2006US20060031036 Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
02/09/2006US20060030963 Sorting a group of integrated circuit devices for those devices requiring special testing
02/09/2006US20060030247 Cleaning sheet and method for a probe
02/09/2006US20060030160 Backside unlayering of MOSFET devices for electrical and physical characterization
02/09/2006US20060030060 Apparatus and method for testing defects
02/09/2006US20060030059 Apparatus and method for testing defects
02/09/2006US20060029210 Telephony distribution system
02/09/2006US20060028991 System and method for transferring data on a data network using multiple paths
02/09/2006US20060028885 Synchronous semiconductor memory device of fast random cycle system and test method thereof
02/09/2006US20060028649 Multi beam scanning with bright/dark field imaging
02/09/2006US20060028264 Method and apparatus to remotely sense the temperature of a power semiconductor
02/09/2006US20060028235 Preventive maintenance tapping and duty cycle monitor for voltage regulator
02/09/2006US20060028234 Methods and apparatus for testing power generators
02/09/2006US20060028233 Pixel testing method, method of correcting output voltage of pixel, defect pixel processing device, defect pixel processing program, defect pixel processing method, and recording medium having program
02/09/2006US20060028232 Testing method for LCD panels
02/09/2006US20060028231 System for manufacturing display panel, method to be used in same, and testing apparatus therefor
02/09/2006US20060028230 Method for testing pixels for LCD TFT displays
02/09/2006US20060028229 Method for test data-driven statistical detection of outlier semiconductor devices
02/09/2006US20060028228 Test pads for IC chip
02/09/2006US20060028227 Self-isolation semiconductor wafer and test method thereof
02/09/2006US20060028226 Methods and apparatus for testing circuit boards
02/09/2006US20060028225 Process and a device for the calibration of a semiconductor component test system
02/09/2006US20060028224 Self-cleaning lower contact
02/09/2006US20060028223 Test method of semiconductor devices
02/09/2006US20060028222 Interconnect for bumped semiconductor components
02/09/2006US20060028221 Method and apparatus for contact resistance measurement
02/09/2006US20060028220 Reinforced probes for testing semiconductor devices
02/09/2006US20060028219 Enhanced signal observability for circuit analysis
02/09/2006US20060028218 Inspection method and apparatus for circuit pattern
02/09/2006US20060028217 System of detection and repair and method thereof
02/09/2006US20060028212 System and method for graphically grouping electrical devices
02/09/2006US20060028211 Pointer type automatic tester with storage battery
02/09/2006US20060028200 Chuck for holding a device under test
02/09/2006US20060028199 Dynamic register with IDDQ testing capability
02/09/2006US20060028194 Electronic voltage polarity test probe
02/09/2006US20060028172 Self-diagnosis system for an energy storage device
02/09/2006US20060028126 Electrical device, a method for manufacturing an electrical device, test structure, a method for manufacturing such a test structure and a method for testing a display panel
02/09/2006DE19983213B4 Detektorvorrichtung zum Erfassen abnormaler Takte Detection means for detecting abnormal clocks
02/09/2006DE19857689B4 Strommeßschaltung für ein IC-Testgerät Current measuring circuit for an IC tester
02/09/2006DE19633922B4 Verfahren und Einrichtung zum Testen Digitalsignale verarbeitender integrierter Schaltungen Method and apparatus for testing digital signals-processing integrated circuits
02/09/2006DE112004000480T5 Automatisiertes Prüfaktuatorsystem für Schaltungsplatinen Automated Prüfaktuatorsystem for circuit boards
02/09/2006DE102005032520A1 Prober for electronic devices test system, has prober bar including two ends, and frame connection mechanism that allows for ready relocation of prober bar to frame at selected points
02/09/2006DE102005001104B3 Electrical method for non destructive testing of the bonding rigidity in semiconductor and other wafers measures expansion of unbonded region
02/09/2006DE102004034606A1 Elektronische Testschaltung für einen integrierten Schaltkreis sowie Verfahren zum Prüfen der Treiberstärke und zum Prüfen der Eingangsempfindlichkeit eines Empfängers des integrierten Schaltkreises Electronic Test circuit for an integrated circuit and method for testing the drive strength and to check the input sensitivity of a receiver of the integrated circuit
02/09/2006DE102004032585A1 Anordnung zum Steuern eines Personenschutzmittels eines Kraftfahrzeugs Arrangement for controlling an occupant protection means a motor vehicle
02/09/2006DE102004031601A1 Akkupack für Elektrohandwerkzeugmaschine Battery pack for electric power tool
02/09/2006DE10013013B4 Chemisch synthetisierte und aufgebaute elektronische Bauelemente Chemically synthesized and structured electronic components
02/09/2006CA2575903A1 Fuel tank system
02/09/2006CA2573858A1 Dynamic line rating system with real-time tracking of conductor creep to establish the maximum allowable conductor loading as limited by clearance
02/08/2006EP1624530A1 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument
02/08/2006EP1624308A1 Probe for testing electric conduction
02/08/2006EP1623449A2 Methods and systems for estimating reticle bias states
02/08/2006EP1623243A1 Fuel cell testing system
02/08/2006EP1623242A1 Method for testing empty printed circuit boards
02/08/2006EP1623241A2 Power control and scheduling in an ofdm system
02/08/2006EP1623240A2 Measuring device, and method for locating a partial discharge
02/08/2006EP1623239A2 Method and system for improved single-ended loop make-up identification
02/08/2006EP1623238A1 Coaxial probe interface
02/08/2006EP1456678A4 Automated test sequence editor and engine for transformer testing
02/08/2006EP1224738B1 Low jitter phase-locked loop with duty-cycle control
02/08/2006EP1222472B1 Partial discharge monitoring system for transformers
02/08/2006CN2757146Y Portable remained current protector detector
02/08/2006CN2757145Y Transistor detector
02/08/2006CN2757144Y Fault hidden trouble detector
02/08/2006CN2757143Y Arc light earthing point detector for power transport line
02/08/2006CN2757140Y Non-contact type DC small current detector
02/08/2006CN2757135Y Detector for circuit board