| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/28/2006 | US7005872 System for removing debris from a test socket |
| 02/28/2006 | US7005871 Apparatus, system, and method for managing aging of an integrated circuit |
| 02/28/2006 | US7005870 Interconnect bump plate |
| 02/28/2006 | US7005869 Multi point contactor and blade construction |
| 02/28/2006 | US7005868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe |
| 02/28/2006 | US7005863 Monitoring system |
| 02/28/2006 | US7005862 Method and apparatus for measuring electric characteristics of cable assembly, and computer product |
| 02/28/2006 | US7005861 Cable tester |
| 02/28/2006 | US7005860 Insulation resistance drop detector and method of detecting state thereof |
| 02/28/2006 | US7005859 Circuit arrangement and method for monitoring a current circuit |
| 02/28/2006 | US7005856 Protective relay test device |
| 02/28/2006 | US7005845 Power measurement mechanism for a transformer coupled plasma source |
| 02/28/2006 | US7005842 Probe cartridge assembly and multi-probe assembly |
| 02/28/2006 | US7005307 Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer |
| 02/28/2006 | US7004776 ZIF connector and semiconductor-testing apparatus using the same |
| 02/28/2006 | US7004762 Socket for electrical parts |
| 02/27/2006 | CA2516625A1 System and method of sensing actuation and release voltages of an interferometric modulator |
| 02/23/2006 | WO2006020625A1 Interconnect assembly for a probe card |
| 02/23/2006 | WO2006020578A2 Self-cleaning lower contact |
| 02/23/2006 | WO2006020339A2 Quality control scheme for multiple-input multiple-output (mimo) orthogonal frequency division multiplexing (ofdm) systems |
| 02/23/2006 | WO2006019820A2 Method and system for determining cracks and broken components in armor |
| 02/23/2006 | WO2006019788A2 System and method for testing electronic device performance |
| 02/23/2006 | WO2006019738A2 Traveling wave based relay protection |
| 02/23/2006 | WO2006019433A2 Externally-loaded weighted random test pattern compression |
| 02/23/2006 | WO2006019164A1 Device and method for detecting partial discharge of rotary electric machine |
| 02/23/2006 | WO2006019082A1 Test device, configuration method, and device interface |
| 02/23/2006 | WO2006019081A1 Test emulator, emulation program, and semiconductor device manufacturing method |
| 02/23/2006 | WO2006019005A1 Dischargeable capacitance determining method |
| 02/23/2006 | WO2006018947A1 Test device and test method |
| 02/23/2006 | WO2006018691A1 Cable verification unit |
| 02/23/2006 | WO2006018473A2 Arrangement in an electrical machine |
| 02/23/2006 | WO2005070178A3 Test result marking of electronic packages |
| 02/23/2006 | US20060041850 Test method for unit re-modification |
| 02/23/2006 | US20060041814 Fault diagnosis of compressed test responses having one or more unknown states |
| 02/23/2006 | US20060041813 Adaptive fault diagnosis of compressed test responses |
| 02/23/2006 | US20060041812 Fault diagnosis of compressed test responses |
| 02/23/2006 | US20060041811 Circuit for testing power down reset function of an electronic device |
| 02/23/2006 | US20060041810 Generating test patterns used in testing semiconductor integrated circuit |
| 02/23/2006 | US20060041809 Method for optimizing a pattern generation program, a program, and a signal generator |
| 02/23/2006 | US20060041808 Test-pattern generation system, test-pattern analysis system, test-pattern generation method, test-pattern analysis method, and computer product |
| 02/23/2006 | US20060041807 Integrated circuit |
| 02/23/2006 | US20060041806 Testing method for semiconductor device and testing circuit for semiconductor device |
| 02/23/2006 | US20060041805 Array substrate, display device having the same, driving unit for driving the same and method of driving the same |
| 02/23/2006 | US20060041804 Apparatus and method for testing semiconductor memory device |
| 02/23/2006 | US20060041803 Apparatus and method for dynamic in-circuit probing of field programmable gate arrays |
| 02/23/2006 | US20060041802 Functional frequency testing of integrated circuits |
| 02/23/2006 | US20060041801 Acceleration of the programming of a memory module with the aid of a boundary scan (bscan) register |
| 02/23/2006 | US20060040540 Socket for electric component |
| 02/23/2006 | US20060040417 Method to build a wirebond probe card in a many at a time fashion |
| 02/23/2006 | US20060039287 Communication apparatus and data communication method |
| 02/23/2006 | US20060038692 Circuit health monitoring system and method |
| 02/23/2006 | US20060038598 Generation and measurement of timing delays by digital phase error compensation |
| 02/23/2006 | US20060038582 Electronic circuit with asynchronously operating components |
| 02/23/2006 | US20060038581 Display panel inspection apparatus and display panel inspection method |
| 02/23/2006 | US20060038580 Electro-optical device, electronic apparatus, and mounting structure |
| 02/23/2006 | US20060038579 Rf chip testing method and system |
| 02/23/2006 | US20060038578 Differential voltage measuring apparatus and semiconductor testing apparatus |
| 02/23/2006 | US20060038577 Methods and circuits for generating reference voltage |
| 02/23/2006 | US20060038576 Sort interface unit having probe capacitors |
| 02/23/2006 | US20060038575 Semiconductor device test probe |
| 02/23/2006 | US20060038574 Method of detecting an arcing event and a printing machine arranged with the same |
| 02/23/2006 | US20060038573 Low current ac partial discharge diagnostic system for wiring diagnostics |
| 02/23/2006 | US20060038554 Electron beam test system stage |
| 02/23/2006 | US20060038553 Method for detecting EPI induced buried layer shifts in semiconductor devices |
| 02/23/2006 | US20060038552 Current detection equipment and semiconductor device |
| 02/23/2006 | US20060038551 Ultrafast sampler with coaxial transition |
| 02/23/2006 | US20060038172 Apparatus and methods for wafer-level testing of the chip-scale semiconductor device packages |
| 02/23/2006 | US20060037182 Method and apparatus for the improvement of material/voltage contrast |
| 02/23/2006 | DE212005000004U1 Modulares Radiofrequenzstrahlungsdichtungsbauteil Modular radio frequency radiation sealing member |
| 02/23/2006 | DE19613611B4 Metallmagazineinheit zum Prüfen eines Halbleiterbauelements Metal magazine unit for testing a semiconductor device |
| 02/23/2006 | DE102005038452A1 Halbleiterwafer und Prüfverfahren Semiconductor wafer and test methods |
| 02/23/2006 | DE102005037348A1 Ein Maschinensichtanalysesystem und -verfahren A machine vision analysis system and method |
| 02/23/2006 | DE102005031146A1 Energieversorgungsvorrichtung für ein Fahrzeug The power supply apparatus for a vehicle |
| 02/23/2006 | DE102004038736A1 Verfahren zur Nebenschlusserkennung bei Sensoren A method for shunt detection in sensor |
| 02/23/2006 | DE102004037718A1 Electrically conductive or dielectric layer`s surface defect detecting method for e.g. absorber chamber, involves transforming scattering parameter from frequency domain to time domain and detecting surface defects from process in domains |
| 02/23/2006 | CA2583218A1 Interconnect assembly for a probe card |
| 02/23/2006 | CA2577402A1 Method and system for determining the soc of a rechargeable battery |
| 02/23/2006 | CA2575857A1 System and method for battery conservation in wireless stations |
| 02/23/2006 | CA2573523A1 Method and system for determining cracks and broken components in armor |
| 02/22/2006 | EP1628504A2 Energy saving mode in hearing aids |
| 02/22/2006 | EP1627487A2 Method and apparatus for determining a quality measure of a channel within a communication system |
| 02/22/2006 | EP1259165B1 Modelling and testing of an integrated circuit |
| 02/22/2006 | EP1061375B1 Semiconductor device including macros and its testing method |
| 02/22/2006 | CN2760773Y Fuel cell tester humidifier |
| 02/22/2006 | CN2760772Y Wireless battery managing device |
| 02/22/2006 | CN2760571Y Magnetor stator testing device |
| 02/22/2006 | CN2760570Y Circuit detecting device with lighting function |
| 02/22/2006 | CN2760569Y Grounding monitor |
| 02/22/2006 | CN2760568Y Circuit board debugging device using dual in-line package chip |
| 02/22/2006 | CN2760567Y Liquid crystal display module test bench with cam |
| 02/22/2006 | CN2760566Y Rapid turn ratio test convertor for transformer |
| 02/22/2006 | CN2760563Y Sampling circuit for detecting triphase or quadri-phase unbalance current and grounding current |
| 02/22/2006 | CN2760561Y Changeover panel with densely covered hole |
| 02/22/2006 | CN2760560Y Switching spring for wiring board test |
| 02/22/2006 | CN2760559Y Universal commutator device for wiring board special testing machine |
| 02/22/2006 | CN1739227A Condition diagnosing |
| 02/22/2006 | CN1739194A Probe apparatus with optical length-measuring unit and probe testing method |
| 02/22/2006 | CN1739034A Laser beam inspection equipment |
| 02/22/2006 | CN1739033A Universal measuring adapter system |
| 02/22/2006 | CN1738044A IC and opinion method for operation parameter |