| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/22/2006 | CN1738020A Self-timed reliability and yield vehicle with gated data and clock |
| 02/22/2006 | CN1737601A Method for optimizing a pattern generation program, a program, and a signal generator |
| 02/22/2006 | CN1737600A Apparatus and method for automated test setup |
| 02/22/2006 | CN1737599A Low-power consumption sweep test method based on circuit division |
| 02/22/2006 | CN1737598A Method and apparatus for configuration of automated debug of in-circuit tests |
| 02/22/2006 | CN1737597A Power distribution network over-voltage on-line monitoring device and method thereof |
| 02/22/2006 | CN1737596A Low voltage replacement function detecting circuit |
| 02/22/2006 | CN1737595A Pure direct current high electric field dielectric constant metering circuit |
| 02/22/2006 | CN1737594A Crosslinking polyethylene cable insulation diagnosis circuit based on positive/negative polarity DC superposition method |
| 02/22/2006 | CN1737593A Display panel inspection apparatus and display panel inspection method |
| 02/22/2006 | CN1737592A Method for testing pixels for LCD TFT displays |
| 02/22/2006 | CN1737591A Prober and testing apparatus using same |
| 02/22/2006 | CN1737590A Single purpose LCD assessment apparatus for mobile terminal |
| 02/22/2006 | CN1737589A Testing method for radio-frequency product |
| 02/22/2006 | CN1737588A Mutual inductance circuit zero ordinal parameter live line measurement method and apparatus thereof |
| 02/22/2006 | CN1737584A Method for testing resistance of battery positive/negative plate and apparatus thereof |
| 02/22/2006 | CN1737581A Multiple crystal grain needle-detection instrument |
| 02/22/2006 | CN1243376C Device and method for parallel testing semiconductor device |
| 02/22/2006 | CN1243341C Speech test transition method |
| 02/22/2006 | CN1243252C Multiple testing end signal for testing system based on event |
| 02/22/2006 | CN1243251C Modular structure for testing momery in testing system based on event |
| 02/22/2006 | CN1243250C Data failure storage compression of semiconductor testing system |
| 02/21/2006 | US7003742 Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded cores |
| 02/21/2006 | US7003707 IC tap/scan test port access with tap lock circuitry |
| 02/21/2006 | US7003706 Method, system, and program for improved device blocking and suspension |
| 02/21/2006 | US7003705 Ethernet automatic protection switching |
| 02/21/2006 | US7003697 Apparatus having pattern scrambler for testing a semiconductor device and method for operating same |
| 02/21/2006 | US7003435 Arc fault detector with circuit interrupter |
| 02/21/2006 | US7003432 Method of and system for analyzing cells of a memory device |
| 02/21/2006 | US7003431 Battery management system and apparatus |
| 02/21/2006 | US7003422 Method for connecting test bench elements and shell device |
| 02/21/2006 | US7003421 VDD over and undervoltage measurement techniques using monitor cells |
| 02/21/2006 | US7003419 Card for testing functions of card interface |
| 02/21/2006 | US7003411 Electronic battery tester with network communication |
| 02/21/2006 | US7003262 Method and device for determining sideband ratio of superconduction mixer using comb generator |
| 02/21/2006 | US7003149 Method and device for optically monitoring fabrication processes of finely structured surfaces in a semiconductor production |
| 02/21/2006 | US7002925 Method and system for computer network link with undefined termination condition |
| 02/21/2006 | US7002923 Channel quality measurement in data transmission using hybrid arq |
| 02/21/2006 | US7002922 Communication network specific charging method and communication network specific charging apparatus |
| 02/21/2006 | US7002921 Network appliance combining asynchronous notification with interactive network transfer protocol server |
| 02/21/2006 | US7002920 Capacity enhancement for multi-code CDMA with integrated services through quality of service and admission control |
| 02/21/2006 | US7002918 Method and apparatus for real time scheduling in a satellite communications network |
| 02/21/2006 | US7002914 Congestion control in a network device having a buffer circuit |
| 02/21/2006 | US7002913 Packet loss compensation method using injection of spectrally shaped noise |
| 02/21/2006 | US7002377 Clock signal detection circuit and semiconductor integrated circuit using the same |
| 02/21/2006 | US7002374 Domino logic compatible scannable flip-flop |
| 02/21/2006 | US7002365 Method and an apparatus for testing transmitter and receiver |
| 02/21/2006 | US7002364 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same |
| 02/21/2006 | US7002363 Method and system for compensating thermally induced motion of probe cards |
| 02/21/2006 | US7002362 Test system for bumped semiconductor components |
| 02/21/2006 | US7002361 Film thickness measuring apparatus and a method for measuring a thickness of a film |
| 02/21/2006 | US7002360 System and method for measuring the thickness or temperature of a circuit in a printed circuit board |
| 02/21/2006 | US7002359 Apparatus and method for measuring EMI level of electronic device |
| 02/21/2006 | US7002358 Method and apparatus for measuring jitter |
| 02/21/2006 | US7002357 Method and apparatus for phase calculation from attenuation values using a Hilbert transform for FDR measurements |
| 02/21/2006 | US7002355 Apparatus and method for communications testing |
| 02/21/2006 | US7002354 Cable tester |
| 02/21/2006 | US7002353 Cable tester |
| 02/21/2006 | US7002352 Reference voltage diagnostic suitable for use in an automobile controller and method therefor |
| 02/21/2006 | US7002337 Testing circuits on substrates |
| 02/21/2006 | US7002334 Jitter measuring apparatus and a testing apparatus |
| 02/21/2006 | US7002265 Power supply methods and configurations |
| 02/21/2006 | US7002232 Semiconductor integrated circuit device and method of testing the same |
| 02/21/2006 | US7002225 Compliant component for supporting electrical interface component |
| 02/21/2006 | US7002177 Test region layout for shallow trench isolation |
| 02/21/2006 | US7001786 Semiconductor device and method for fabricating the same |
| 02/21/2006 | US7001530 Method for detecting the end point by using matrix |
| 02/21/2006 | US7000648 Device picker in handler |
| 02/21/2006 | US7000352 Backdoor system of vehicle having pressure sensor for detecting object pinched by backdoor |
| 02/21/2006 | CA2369858C Single ended measurement method and system for determining subscriber loop make up |
| 02/16/2006 | WO2006017078A2 Probe head having a membrane suspended probe |
| 02/16/2006 | US20060036985 Compacting circuit responses |
| 02/16/2006 | US20060036981 Validation of electrical performance of an electronic package prior to fabrication |
| 02/16/2006 | US20060036978 Board design aiding apparatus, board design aiding method and board design aiding program |
| 02/16/2006 | US20060036976 Method for designing an integrated circuit defect monitor |
| 02/16/2006 | US20060036921 Apparatus and method for dynamically repairing a semiconductor memory |
| 02/16/2006 | US20060036920 Built-in self-test (BIST) for high performance circuits |
| 02/16/2006 | US20060036919 Embedded logic analyzer |
| 02/16/2006 | US20060036411 Measuring apparatus and program |
| 02/16/2006 | US20060036389 Test apparatus and test method |
| 02/16/2006 | US20060035413 Thermal protection for electronic components during processing |
| 02/16/2006 | US20060035404 Method for manufacturing an electronic device having an electronically determined physical test member |
| 02/16/2006 | US20060034506 Machine vision analysis system and method |
| 02/16/2006 | US20060034402 System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system |
| 02/16/2006 | US20060034187 Method for measuring network performance parity |
| 02/16/2006 | US20060034145 Synchronous semiconductor memory device of fast random cycle system and test method thereof |
| 02/16/2006 | US20060033522 AC testing of leakage current in integrated circuits using RC time constant |
| 02/16/2006 | US20060033521 A Highly Resilient Cantilever Spring Probe Having Curved Surfaces for Testing ICs |
| 02/16/2006 | US20060033520 A highly resilient cantilever spring probe for testing ics |
| 02/16/2006 | US20060033519 Prober and probe testing method for temperature-controlling object to be tested |
| 02/16/2006 | US20060033518 Probe retention kit, and system and method for probing a pattern of points on a printed circuit board |
| 02/16/2006 | US20060033517 Probe for semiconductor devices |
| 02/16/2006 | US20060033516 Multiple-chip probe and universal tester contact assemblage |
| 02/16/2006 | US20060033515 Test fixture with movable pin contacts |
| 02/16/2006 | US20060033514 Incorporation of isolation resistor(s) into probes using probe tip spring pins |
| 02/16/2006 | US20060033513 Apparatus, method, and kit for probing a pattern of points on a printed circuit board |
| 02/16/2006 | US20060033512 Interposer probe and method for testing |
| 02/16/2006 | US20060033511 Interface comprising a thin pcb with protrusions for testing an integrated circuit |
| 02/16/2006 | US20060033510 Method and device for measuring intensity of electromagnetic field, method and device for measuring current-voltage distribution, and method for judging quality of electronic device, and electronic device therefor |
| 02/16/2006 | US20060033505 Testing input / output voltages in integrated circuits |