| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/08/2006 | CN1743860A Magnetic sensor for detecting location of short circuit between lead wires of high-density micro-patterns |
| 03/08/2006 | CN1743859A Detection and suppression circuit and method of electrical arcing |
| 03/08/2006 | CN1743858A Method and apparatus for testing TFT array |
| 03/08/2006 | CN1743857A Test apparatus for evaluating electrical properties of liquid toner and test method for the same |
| 03/08/2006 | CN1743856A Method and device for measuring electromagnetic radiation source in electronic device |
| 03/08/2006 | CN1743851A Clamp for inspecting printed circuit board |
| 03/08/2006 | CN1743794A Projector for detecting plane displaying board and projecting method realized by same |
| 03/08/2006 | CN1244957C Wiring detection method for semiconductor packaged inner |
| 03/08/2006 | CN1244820C Semiconductor test system based on event |
| 03/08/2006 | CN1244819C On-line detector for insulation of cross-linked polythylene power cable sheath |
| 03/08/2006 | CN1244818C Test device |
| 03/08/2006 | CN1244815C Adapter for testing printed circuit boards and testing needle for such adapter |
| 03/07/2006 | US7010736 Address sequencer within BIST (Built-in-Self-Test) system |
| 03/07/2006 | US7010735 Stuck-at fault scan chain diagnostic method |
| 03/07/2006 | US7010734 Method for microprocessor test insertion reduction |
| 03/07/2006 | US7010733 Parametric testing for high pin count ASIC |
| 03/07/2006 | US7010732 Built-in test support for an integrated circuit |
| 03/07/2006 | US7010729 Timing generator and test apparatus |
| 03/07/2006 | US7010715 Redundant control architecture for a network device |
| 03/07/2006 | US7010631 Controller based hardware device and method for setting the same |
| 03/07/2006 | US7010595 Apparatus for multi-level loopback test in a community network system and method therefor |
| 03/07/2006 | US7010453 Methods and apparatus for optimizing lists of waveforms |
| 03/07/2006 | US7010452 Event pipeline and summing method and apparatus for event based test system |
| 03/07/2006 | US7010451 Dynamic creation and modification of wafer test maps during wafer testing |
| 03/07/2006 | US7010441 Method and system for improved single-ended loop make-up identification |
| 03/07/2006 | US7010437 Electric utility storm outage management |
| 03/07/2006 | US7010422 Limp home control method under disconnected state of battery power line |
| 03/07/2006 | US7009937 Transmission queue managing system capable of efficiently controlling traffic congestion |
| 03/07/2006 | US7009933 Traffic policing of packet transfer in a dual speed hub |
| 03/07/2006 | US7009879 Test terminal negation circuit for protecting data integrity |
| 03/07/2006 | US7009696 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 03/07/2006 | US7009625 Method of displaying an image of device test data |
| 03/07/2006 | US7009419 Method and apparatus for selecting an encryption integrated circuit operating mode |
| 03/07/2006 | US7009418 Inspecting method, semiconductor device, and display apparatus |
| 03/07/2006 | US7009417 Semiconductor module and methods for functionally testing and configuring a semiconductor module |
| 03/07/2006 | US7009416 Systems and methods for monitoring integrated circuit internal states |
| 03/07/2006 | US7009415 Probing method and probing apparatus |
| 03/07/2006 | US7009413 System and method for testing ball grid arrays |
| 03/07/2006 | US7009412 Massively parallel interface for electronic circuit |
| 03/07/2006 | US7009407 Delay lock circuit having self-calibrating loop |
| 03/07/2006 | US7009406 Arc fault detector and method |
| 03/07/2006 | US7009405 Method and apparatus for testing flat display apparatus |
| 03/07/2006 | US7009404 Method and device for testing the ESD resistance of a semiconductor component |
| 03/07/2006 | US7009403 Circuit arrangement for controlling and detecting the load current through a load |
| 03/07/2006 | US7009402 Estimating apparatus and method of input and output enabling powers for secondary cell |
| 03/07/2006 | US7009401 Battery apparatus and method for monitoring battery state of a secondary battery |
| 03/07/2006 | US7009383 Wafer probe station having environment control enclosure |
| 03/07/2006 | US7009382 System and method for test socket calibration |
| 03/07/2006 | US7009381 Adapter method and apparatus for interfacing a tester with a device under test |
| 03/07/2006 | US7009380 Interface device for product testing |
| 03/07/2006 | US7009378 Time division multiplexed optical measuring system |
| 03/07/2006 | US7009377 Cartridge system for a probing head for an electrical test probe |
| 03/07/2006 | US7009123 Breaking detector for shear pin |
| 03/07/2006 | US7008825 Leadframe strip having enhanced testability |
| 03/07/2006 | US7008818 Flip chip packaging process employing improved probe tip design |
| 03/07/2006 | US7008804 Methods for compensating for a test temperature deviation |
| 03/07/2006 | US7007408 Method and apparatus for removing and/or preventing surface contamination of a probe |
| 03/07/2006 | US7007380 TFI probe I/O wrap test method |
| 03/07/2006 | CA2147231C Method and device for protecting busbars |
| 03/02/2006 | WO2006024029A2 Battery monitor |
| 03/02/2006 | WO2006023744A2 Methods and apparatus for local outlier detection |
| 03/02/2006 | WO2006023741A2 Method to build a wirebond probe card in a many at a time fashion |
| 03/02/2006 | WO2006023380A1 A HIGHLY RESILIENT CANTILEVER SPRING PROBE FOR TESTING ICs |
| 03/02/2006 | WO2006022434A1 Inspecting apparatus, inspecting method and sensor for inspecting apparatus |
| 03/02/2006 | WO2006022339A1 Pulse generator, timing generator, and pulse width adjusting method |
| 03/02/2006 | WO2006022108A1 Test device and test method |
| 03/02/2006 | WO2006022088A1 Tester and testing method |
| 03/02/2006 | WO2006022087A1 Tester and testing method |
| 03/02/2006 | WO2006021649A1 Device and method for testing at least one conducting joint forming an electrical connection between an electric component and a printed circuit |
| 03/02/2006 | WO2006012503A9 Automatic analog test & compensation with built-in pattern generator & analyzer |
| 03/02/2006 | US20060048033 Accessing test modes using command sequences |
| 03/02/2006 | US20060048031 Built-in self test for memory arrays using error correction coding |
| 03/02/2006 | US20060048030 Eye width characterization mechanism |
| 03/02/2006 | US20060048029 Semiconductor integrated circuit |
| 03/02/2006 | US20060048028 Method and apparatus for selective scan chain diagnostics |
| 03/02/2006 | US20060048027 Semiconductor device |
| 03/02/2006 | US20060048026 Clustering-based approach for coverage-directed test generation |
| 03/02/2006 | US20060048025 Diagnostic data gathering apparatus and method |
| 03/02/2006 | US20060048024 Pattern types as constraints on generic type parameters |
| 03/02/2006 | US20060047460 Method for testing image processing circuit, particle image analyzer, and storage medium |
| 03/02/2006 | US20060046322 Integrated circuit cooling and insulating device and method |
| 03/02/2006 | US20060044005 System of simulating resistive loads |
| 03/02/2006 | US20060044004 Method and apparatus for measuring transfer characteristics of a semiconductor device |
| 03/02/2006 | US20060044003 Measuring bi-directional current through a field-effect transistor by virtue of drain-to-source voltage measurement |
| 03/02/2006 | US20060044002 Enhanced sampling methodology for semiconductor processing |
| 03/02/2006 | US20060044001 Semiconductor device testing |
| 03/02/2006 | US20060044000 Method and apparatus for evaluating semiconductor device |
| 03/02/2006 | US20060043999 Semiconductor circuit, method of monitoring semiconductor-circuit performance, method of testing semiconductor circuit, equipment for testing semiconductor circuit, and program for testing semiconductor circuit |
| 03/02/2006 | US20060043998 Method of increasing reliability of packaged semiconductor integrated circuit dice |
| 03/02/2006 | US20060043997 Enhanced sampling methodology for semiconductor processing |
| 03/02/2006 | US20060043996 Construction and use of dielectric plate for mating test equipment to a load board of a circuit tester |
| 03/02/2006 | US20060043995 Stacked tip cantilever electrical connector |
| 03/02/2006 | US20060043994 Test probe with thermally activated grip and release |
| 03/02/2006 | US20060043993 Test probe with side arm |
| 03/02/2006 | US20060043992 Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device |
| 03/02/2006 | US20060043991 Circuit board checker and circuit board checking method |
| 03/02/2006 | US20060043990 Method of mounting and demounting a semiconductor device, device for mounting and demounting a semiconductor device using the same, and socket for a semiconductor device |
| 03/02/2006 | US20060043989 Film-type testing jig and testing method |
| 03/02/2006 | US20060043988 Methods of making a resilient contact apparatus and resilient contact probes |
| 03/02/2006 | US20060043987 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |