| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 04/04/2006 | US7023352 Voltage-detecting method and related circuits |
| 04/04/2006 | US7023234 Testing method for array substrate |
| 04/04/2006 | US7023233 Test apparatus and test method |
| 04/04/2006 | US7023232 Image display device, drive circuit device and defect detection method of light-emitting diode |
| 04/04/2006 | US7023231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereof |
| 04/04/2006 | US7023230 Method for testing IDD at multiple voltages |
| 04/04/2006 | US7023229 Dynamic burn-in equipment |
| 04/04/2006 | US7023228 Dynamic burn-in method and apparatus |
| 04/04/2006 | US7023227 Apparatus for socketing and testing integrated circuits and methods of operating the same |
| 04/04/2006 | US7023226 Probe pins zero-point detecting method, and prober |
| 04/04/2006 | US7023225 Wafer-mounted micro-probing platform |
| 04/04/2006 | US7023219 A/C generator rotor test apparatus |
| 04/04/2006 | US7023218 Method and apparatus for testing filter/protector units for fiber optic cables |
| 04/04/2006 | US7023217 Method and apparatus for determining wear of resistive and conductive elements |
| 04/04/2006 | US7023215 Field effect sensor two wire interconnect method and apparatus |
| 04/04/2006 | US7023198 Semiconductor device and method of inspecting the same |
| 04/04/2006 | US7023197 Semiconductor device loading apparatus for test handlers |
| 04/04/2006 | US7023196 High level arc fault detector |
| 04/04/2006 | US7023178 Voltage measuring apparatus |
| 04/04/2006 | US7022533 Substrate mapping |
| 04/04/2006 | US7022519 Process control; culture product |
| 04/04/2006 | US7021067 Dynamic thermal management spray system |
| 04/04/2006 | CA2304044C Diagnosing malfunctions in materials handling vehicles |
| 04/04/2006 | CA2248486C Apparatus for detecting arcing faults and ground faults in multiwire branch electric power circuits |
| 03/30/2006 | WO2006033880A1 Configuring redundancy in a supervisory process control system |
| 03/30/2006 | WO2006033357A1 Test simulator, test simulation program and recording medium |
| 03/30/2006 | WO2006033203A1 Delay lock loop circuit, phase lock loop circuit, timing generator, semiconductor tester and semiconductor integrated circuit |
| 03/30/2006 | WO2006032483A1 Method of testing a semiconductor device and a test system to test a semiconductor device |
| 03/30/2006 | WO2006016982A3 Rapid protocol failure detection |
| 03/30/2006 | WO2005109017A3 System and method for testing integrated circuits |
| 03/30/2006 | WO2005010932A3 Mask network design for scan-based integrated circuits |
| 03/30/2006 | WO2005003891A3 Data compaction and pin assignment |
| 03/30/2006 | WO2004114449A3 Fuel cell protection |
| 03/30/2006 | US20060069975 Format control circuit and semiconductor test device |
| 03/30/2006 | US20060069974 One-hot encoded instruction register for boundary scan test compliant devices |
| 03/30/2006 | US20060069973 Combinatorial at-speed scan testing |
| 03/30/2006 | US20060069972 Methods and computer program products for debugging clock-related scan testing failures of integrated circuits |
| 03/30/2006 | US20060069971 Method and apparatus for deferred decision signal quality analysis |
| 03/30/2006 | US20060069970 Method and system for computer based testing using an amalgamated resource file |
| 03/30/2006 | US20060069969 Inversion based stimulus generation for device testing |
| 03/30/2006 | US20060069968 Built-in self test circuitry for process monitor circuit for rapidchip and ASIC devices |
| 03/30/2006 | US20060069967 System for measuring characteristics of a digital signal |
| 03/30/2006 | US20060069958 Defect location identification for microdevice manufacturing and test |
| 03/30/2006 | US20060069951 System for testing digital components |
| 03/30/2006 | US20060068513 Film forming condition determination method, film forming method, and film structure manufacturing method |
| 03/30/2006 | US20060068512 Method and apparatus for detecting defects |
| 03/30/2006 | US20060067232 Mobile network system for dynamically controlling communication path and method thereof |
| 03/30/2006 | US20060067210 Technique for identifying backup path for shared mesh protection |
| 03/30/2006 | US20060067024 Monitoring method for an actuator and corresponding driver circuit |
| 03/30/2006 | US20060066347 Dynamically adjustable signal detector |
| 03/30/2006 | US20060066344 Pallet and method for transferring the same |
| 03/30/2006 | US20060066343 Semiconductor device characteristics measurement apparatus and connection apparatus |
| 03/30/2006 | US20060066342 Utilizing clock shield as defect monitor |
| 03/30/2006 | US20060066341 LSI testing apparatus |
| 03/30/2006 | US20060066340 Method for burn-in test and measurement program for burn-in test |
| 03/30/2006 | US20060066339 Determining and analyzing integrated circuit yield and quality |
| 03/30/2006 | US20060066338 Fault dictionaries for integrated circuit yield and quality analysis methods and systems |
| 03/30/2006 | US20060066337 Test semiconductor device and method for determining Joule heating effects in such a device |
| 03/30/2006 | US20060066336 Method for testing a contact region of a semiconductor module |
| 03/30/2006 | US20060066335 Semiconductor test device with heating circuit |
| 03/30/2006 | US20060066334 Fiducial alignment masks on microelectronic spring contacts |
| 03/30/2006 | US20060066333 System and method for aligning wafers |
| 03/30/2006 | US20060066332 High performance probe system |
| 03/30/2006 | US20060066331 Inspection unit |
| 03/30/2006 | US20060066330 Inspection unit |
| 03/30/2006 | US20060066329 Method and apparatus for providing PCB layout for probe card |
| 03/30/2006 | US20060066328 Buckling beam probe test assembly |
| 03/30/2006 | US20060066327 Method and structures for testing a semiconductor wafer prior to performing a flip chip bumping process |
| 03/30/2006 | US20060066326 Non-contact tester for electronic circuits |
| 03/30/2006 | US20060066325 Laser-induced critical parameter analysis of cmos devices |
| 03/30/2006 | US20060066324 Method for measuring impurity metal concentration |
| 03/30/2006 | US20060066323 Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer |
| 03/30/2006 | US20060066322 Semiconductor testing |
| 03/30/2006 | US20060066314 Capacitive monitors for detecting metal extrusion during electromigration |
| 03/30/2006 | US20060066293 Method for testing semiconductor devices and an apparatus therefor |
| 03/30/2006 | US20060065624 Irradiating the photoresist layer through a mask to generate a photoacid in the resist, heating to evaporate water from the resist; heating to deprotects the resist; immersion lithography for lowering the water variation in a resist |
| 03/30/2006 | DE4447814B4 Verfahren zum Prüfen von elektrischen Leiterplatten unter Verwendung eines Prüfadapters mit Prüfstiften und Vorrichtung zur Durchführung des Verfahrens A method for testing electrical printed circuit boards using a test adapter with test pins and apparatus for carrying out the method |
| 03/30/2006 | DE10206073B4 Vorrichtung zur Erfassung leistungsgeführter elektromagnetischer Pulse Apparatus for recording performance guided electromagnetic pulses |
| 03/30/2006 | DE102005041721A1 Verfahren zum Anschließen elektrischer Lasten an die Klemmen eines Verstärkers und zur Erkennung etwaiger fehlerhafter Anschlüsse dieser Lasten A method for connecting electrical loads to the terminals of an amplifier and to detect any faulty connections of these loads |
| 03/30/2006 | DE102004057330B3 Method and equipment for monitoring leakage from electrical supply network on board road vehicle to carbon-fiber bodywork involves several measuring points connected to monitoring circuit |
| 03/30/2006 | DE102004045204A1 Device for testing an electronic component with interface unit, test sample input and output memory, comparator, program output interface and control computer |
| 03/30/2006 | DE102004040527B3 Cold test chamber for electronic building blocks has fan in front of evaporator with heating coil and meandering channel connected to volume flow regulator and heater |
| 03/30/2006 | DE102004027919B3 Verfahren zur Korrektur des Einflusses von Signalübertragungsleitungen auf Signallaufzeitänderungen bei Ultraschallmessungen A method for correcting the influence of signal transmission lines on signal propagation time changes in ultrasonic measurements |
| 03/29/2006 | EP1641324A1 Inspection method and device for active matrix |
| 03/29/2006 | EP1640736A1 Testing device |
| 03/29/2006 | EP1640735A1 Pattern generator and test device |
| 03/29/2006 | EP1639705A2 Circuit for testing and fine tuning integrated circuit (switch control circuit) |
| 03/29/2006 | EP1639667A2 Fuel cell protection |
| 03/29/2006 | EP1639415A2 Method and apparatus for soft-sensor characterization of batteries |
| 03/29/2006 | EP1639380A1 Methods and apparatus for battery monitoring, characterisation and reserve time estimation |
| 03/29/2006 | EP1639379A1 Timing closure monitoring circuit and method |
| 03/29/2006 | EP1639378A1 Memory bus checking procedure |
| 03/29/2006 | EP1315975B1 Method and device for testing printed circuit boards with a parallel tester |
| 03/29/2006 | EP1203202B1 Enhancing voltmeter functionality |
| 03/29/2006 | CN2768018Y Fuel cell testing jig |
| 03/29/2006 | CN2768017Y Power cable high resistance and flashover fault testing device |
| 03/29/2006 | CN2768016Y Cable on-line monitoring instrument |
| 03/29/2006 | CN2768015Y Device for testing overload relay reliability |
| 03/29/2006 | CN2767073Y Multifunctional iron hammer of convenient combination |
| 03/29/2006 | CN1754332A Transmission path simulator and radio device evaluation method |