| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/11/2006 | EP1613971A1 Communication interface for diagnostic circuits of an integrated circuit |
| 01/11/2006 | EP1613970A2 Method of restoring encapsulated integrated circuit devices |
| 01/11/2006 | EP1613374A1 System and method for monitoring power source longevity of an implantable medical device |
| 01/11/2006 | EP1579205A4 Battery monitoring system and method |
| 01/11/2006 | EP1417864B1 Illuminated sign for traffic control and method for functional monitoring of such a sign |
| 01/11/2006 | EP1162471B1 Measuring instrument with multiple signal terminals shared in multiple operation modes |
| 01/11/2006 | EP1047575B1 Diagnostic system for the wattage power regulator of a high-pressure gas-discharge lamp in a vehicle |
| 01/11/2006 | EP0839321B1 Contact tip structures for microelectronic interconnection elements and methods of making same |
| 01/11/2006 | CN2751312Y Electric wire alarm device |
| 01/11/2006 | CN2751311Y Electrode clamping device for lighting full screen of organic luminophor screen |
| 01/11/2006 | CN2751310Y Low-voltage high-current load device |
| 01/11/2006 | CN1720462A Battery charged condition computing device and battery charged condition computing method |
| 01/11/2006 | CN1720461A Secondary battery replacement method |
| 01/11/2006 | CN1720460A Pressing member and electronic component handling device |
| 01/11/2006 | CN1720459A Active network defense system and method |
| 01/11/2006 | CN1720458A Circuit pattern inspection device and circuit pattern inspection method |
| 01/11/2006 | CN1720457A Circuit pattern inspection instrument and pattern inspecting method |
| 01/11/2006 | CN1719592A Method for remeasuring semiconductor elements |
| 01/11/2006 | CN1719309A Displaying and testing device of liquid crystal display |
| 01/11/2006 | CN1719273A Determination method of battery usability |
| 01/11/2006 | CN1719272A Fast detection device and method of thermal stability sintered neodymium iron boron material for electric machine |
| 01/11/2006 | CN1719271A Cable failure prefixed point detection method and detection device |
| 01/11/2006 | CN1719270A Resolver malfunction diagnostic circuit |
| 01/11/2006 | CN1719269A Insulator charged detection instrument and its implement method |
| 01/11/2006 | CN1719268A No partial discharge frequency conversion resonance experiment system |
| 01/11/2006 | CN1719267A Transformer cannula test device and its test method |
| 01/11/2006 | CN1719265A Measuring circuit of electric rheological liquid high electric field strength dielectric constant |
| 01/11/2006 | CN1719264A Contact resistance, contact power consumption on line detection and short message alarming device |
| 01/11/2006 | CN1236483C Detector device |
| 01/11/2006 | CN1236482C Device for checking semiconductor device |
| 01/11/2006 | CN1236323C Device for monitoring operating voltage of each cell in fuel cells and making safety alarming as well as its method |
| 01/11/2006 | CN1236322C Automatic test equipment with narrow output pulses |
| 01/11/2006 | CN1236319C Voltage detecting circuit |
| 01/11/2006 | CN1236317C Test head actuation system with positioning and compliant modes |
| 01/10/2006 | US6986114 Feedback cycle detection across non-scan memory elements |
| 01/10/2006 | US6986112 Method of mapping logic failures in an integrated circuit die |
| 01/10/2006 | US6986111 Self-diagnostic circuit of I/O circuit system |
| 01/10/2006 | US6986091 Method and apparatus for testing a high speed data receiver for jitter tolerance |
| 01/10/2006 | US6986090 Method for reducing switching activity during a scan operation with limited impact on the test coverage of an integrated circuit |
| 01/10/2006 | US6986089 Power reduction in scannable D-flip-flop with synchronous preset or clear |
| 01/10/2006 | US6986088 Method and apparatus for reducing the current consumption of an electronic circuit |
| 01/10/2006 | US6986087 Method and apparatus for improving testability of I/O driver/receivers |
| 01/10/2006 | US6986086 Method and device for simultaneous testing of a plurality of integrated circuits |
| 01/10/2006 | US6986085 Systems and methods for facilitating testing of pad drivers of integrated circuits |
| 01/10/2006 | US6986084 Apparatus and method for reducing test resources in testing DRAMS |
| 01/10/2006 | US6986082 Testing system for semiconductor memory device |
| 01/10/2006 | US6985826 System and method for testing a component in a computer system using voltage margining |
| 01/10/2006 | US6985821 Apparatus for calculating an effective voltage |
| 01/10/2006 | US6985820 Conductor arrangement for reduced noise differential signalling |
| 01/10/2006 | US6985802 Method of diagnosing an electronic control unit |
| 01/10/2006 | US6985446 Intelligent network services in packet-switched network |
| 01/10/2006 | US6985435 Method for expanding the switching network of a communications system without interrupting operation |
| 01/10/2006 | US6985396 Semiconductor integrated circuit |
| 01/10/2006 | US6985344 Polling loop short and overload isolator (VSOI) |
| 01/10/2006 | US6985229 Overlay metrology using scatterometry profiling |
| 01/10/2006 | US6985219 Optical coupling for testing integrated circuits |
| 01/10/2006 | US6985003 Circuit and method for testing a flat panel display |
| 01/10/2006 | US6985002 System and method for input/output induced latch up detection |
| 01/10/2006 | US6985001 Testing ICs with distributor, collector, and parallel scan paths |
| 01/10/2006 | US6985000 Thermal control of a DUT using a thermal control substrate |
| 01/10/2006 | US6984999 Probe system and method for operating a probe system |
| 01/10/2006 | US6984998 Multi-function probe card |
| 01/10/2006 | US6984997 Method and system for testing multi-chip integrated circuit modules |
| 01/10/2006 | US6984996 Wafer probing that conditions devices for flip-chip bonding |
| 01/10/2006 | US6984991 Initialization of a bidirectional, self-timed parallel interface with automatic testing of AC differential wire pairs |
| 01/10/2006 | US6984989 Current sensor and overload current protective device therewith |
| 01/10/2006 | US6984988 Ground-fault detecting device and insulation resistance measuring device |
| 01/10/2006 | US6984987 Electro-kinetic air transporter and conditioner devices with enhanced arching detection and suppression features |
| 01/10/2006 | US6984984 Repair device for decorative light shunt |
| 01/10/2006 | US6984974 Independently-adjustable circuit board carrier |
| 01/10/2006 | US6984973 Part transfer apparatus, control method for part transfer apparatus, IC test method, IC handler, and IC test apparatus |
| 01/10/2006 | US6984972 Carrier transporting apparatus, method of transporting a carrier and transporting apparatus |
| 01/10/2006 | US6984971 Low power, low maintenance, electric-field meter |
| 01/10/2006 | US6984534 Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal |
| 01/10/2006 | US6984532 Method of judging residual film by optical measurement |
| 01/10/2006 | US6984198 Experiment management system, method and medium |
| 01/10/2006 | US6984142 Socket for electrical parts |
| 01/10/2006 | US6983536 Method and apparatus for manufacturing known good semiconductor die |
| 01/10/2006 | US6983532 In-line program system for assembly printed circuit board |
| 01/09/2006 | CA2471900A1 Interferometric impedance load-pull tuner |
| 01/08/2006 | CA2511717A1 Method and apparatus for automatically testing a railroad interlocking |
| 01/05/2006 | WO2006002401A1 System and method for measuring time dependent dielectric breakdown |
| 01/05/2006 | WO2006002400A1 System and method for measuring negative bias thermal instability |
| 01/05/2006 | WO2006002374A1 Synchronization between low frequency and high frequency digital signals |
| 01/05/2006 | WO2006002334A2 Intelligent probe chips/heads |
| 01/05/2006 | WO2006002309A2 Flexible m:n redundancy mechanism for packet inspection engine |
| 01/05/2006 | WO2006002163A2 Method and apparatus for magnetically achieving electrical continuity |
| 01/05/2006 | WO2006002046A2 Mechanically reconfigurable vertical tester interface for ic probing |
| 01/05/2006 | WO2006000723A1 Method and device for controlling the operation of an electric element of a motor vehicle |
| 01/05/2006 | WO2006000461A2 Docking drive, locking element, docking system |
| 01/05/2006 | WO2006000252A1 Improved jitter generation |
| 01/05/2006 | WO2005065258A3 Active wafer probe |
| 01/05/2006 | WO2005048311A3 Bump-on-lead flip chip interconnection |
| 01/05/2006 | WO2005022171A3 Method and apparatus for measuring impedance of electrical component under high interference conditions |
| 01/05/2006 | WO2005010945A3 Failure analysis methods and systems |
| 01/05/2006 | US20060005103 System and scanout circuits with error resilience circuit |
| 01/05/2006 | US20060005097 Information processing apparatus, information processing method, and computer program |
| 01/05/2006 | US20060005096 Scan stream sequencing for testing integrated circuits |
| 01/05/2006 | US20060005095 Semiconductor integrated circuit and memory test method |
| 01/05/2006 | US20060005094 Test pattern generating apparatus, method for automatically generating test patterns and computer program product for executing an application for a test pattern generating apparatus |