| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/03/2006 | US6982177 Method for in-line testing of flip-chip semiconductor assemblies |
| 01/03/2006 | CA2380280C Shaft voltage and current monitoring system |
| 12/29/2005 | WO2005125187A1 Signal readout system and test equipment |
| 12/29/2005 | WO2005125013A1 Optically reconfigurable gate array write state inspection method, write state inspection device, and optically reconfigurable gate array |
| 12/29/2005 | WO2005124966A2 Method and apparatus for detecting impedance |
| 12/29/2005 | WO2005124838A1 Low temperature epitaxial growth of silicon-containing films using uv radiation |
| 12/29/2005 | WO2005124652A2 Localizing a temperature of a device for testing |
| 12/29/2005 | WO2005124378A1 Test device and test method |
| 12/29/2005 | WO2005124377A1 Mosfet drive circuit, programmable power supply and semiconductor test apparatus |
| 12/29/2005 | WO2005124376A1 Method for detecting cable disconnection and apparatus thereof |
| 12/29/2005 | WO2005094405A3 Closed loop dynamic power management |
| 12/29/2005 | WO2005067453A3 Dynamic gamma for a liquid crystal display |
| 12/29/2005 | WO2005060568A3 Pulsed current generator circuit with charge booster |
| 12/29/2005 | WO2005055094A3 System and method for architecture verification |
| 12/29/2005 | WO2005050706A3 Die design with integrated assembly aid |
| 12/29/2005 | WO2005013332A3 Apparatus for planarizing a probe card and method using same |
| 12/29/2005 | US20050289497 Layout designing/characteristic analyzing apparatus for a wiring board |
| 12/29/2005 | US20050289428 Architecture and method for testing of an integrated circuit device |
| 12/29/2005 | US20050289427 Per-pin clock synthesis |
| 12/29/2005 | US20050289426 Functional pattern logic diagnostic method |
| 12/29/2005 | US20050289425 Test pattern generating method, test pattern generating apparatus and storing medium stored with test pattern generating program being readable by computer |
| 12/29/2005 | US20050289423 Built-in self test systems and methods for multiple memories |
| 12/29/2005 | US20050289422 Shift register and shift register set using the same |
| 12/29/2005 | US20050289421 Semiconductor chip |
| 12/29/2005 | US20050289420 Serial burn-in monitor |
| 12/29/2005 | US20050289419 Test pattern generator, test circuit tester, test pattern generating method, test circuit testing method, and computer product |
| 12/29/2005 | US20050289418 Methods and apparatus for monitoring internal signals in an integrated circuit |
| 12/29/2005 | US20050289417 Scan enabled storage device |
| 12/29/2005 | US20050289416 Method and apparatus for performing multi-site integrated circuit device testing |
| 12/29/2005 | US20050289415 Intelligent probe chips/heads |
| 12/29/2005 | US20050289414 Lossless recovery for computer systems with remotely dependent data recovery |
| 12/29/2005 | US20050289409 Parallel data bus |
| 12/29/2005 | US20050289408 System and method for characterizing a signal path using a sub-chip sampler |
| 12/29/2005 | US20050289405 Fast synchronization of a number of digital clocks |
| 12/29/2005 | US20050289355 Lockstep mechanism to ensure security in hardware at power-up |
| 12/29/2005 | US20050289287 Method and apparatus for interfacing between test system and embedded memory on test mode setting operation |
| 12/29/2005 | US20050289267 Linking addressable shadow port and protocol for serial bus networks |
| 12/29/2005 | US20050289251 Single chip device, and method and system for testing the same |
| 12/29/2005 | US20050288878 Reserve time calculator, method of calculating a reserve time and battery plant employing the same |
| 12/29/2005 | US20050287857 Device for detecting malfunctioned power cable in computer without using meter |
| 12/29/2005 | US20050287815 Method and apparatus for reducing aspect ratio dependent etching in time division multiplexed etch processes |
| 12/29/2005 | US20050287685 Localizing a temperature of a device for testing |
| 12/29/2005 | US20050287684 Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor wafer |
| 12/29/2005 | US20050287683 Method and apparatus for determining generation lifetime of product semiconductor wafers |
| 12/29/2005 | US20050286670 Method of measuring jitter frequency response |
| 12/29/2005 | US20050286627 System and method of obtaining random jitter estimates from measured signal data |
| 12/29/2005 | US20050286440 System and method for adaptive rate selection for wireless networks |
| 12/29/2005 | US20050286437 Information-processing device, information-processing method, and information-processing program product |
| 12/29/2005 | US20050286434 Methods and computer programs for generating data traffic matrices |
| 12/29/2005 | US20050286433 Built in self test |
| 12/29/2005 | US20050286425 Route determination with differential delay compensation for virtually-concatenated data traffic |
| 12/29/2005 | US20050286424 Differential delay compensation and measurement in bonded systems |
| 12/29/2005 | US20050286420 System and method of avoiding cell disposal in buffer |
| 12/29/2005 | US20050286417 Device and method of controlling and providing content over a network |
| 12/29/2005 | US20050286415 System and method for lightweight deadlock detection |
| 12/29/2005 | US20050286413 Handling link failures with re-tagging |
| 12/29/2005 | US20050286411 Method and apparatus for designing networks to support fast restoration |
| 12/29/2005 | US20050286274 Self-testing power supply apparatus, methods and computer program products |
| 12/29/2005 | US20050285640 Synchronization between low frequency and high frequency digital signals |
| 12/29/2005 | US20050285620 Leakage testing for differential signal transceiver |
| 12/29/2005 | US20050285619 System and method for detecting an operational fault condition in a power supply |
| 12/29/2005 | US20050285618 Method for analyzing organic light-emitting device |
| 12/29/2005 | US20050285617 System and method for inspecting an LCD panel |
| 12/29/2005 | US20050285616 Overvoltage detection apparatus, method, and system |
| 12/29/2005 | US20050285615 System lsi |
| 12/29/2005 | US20050285614 Wafer probecard interface |
| 12/29/2005 | US20050285613 Mechanism to stabilize power delivered to a device under test |
| 12/29/2005 | US20050285612 Apparatus for measuring DC parameters in a wafer burn-in system |
| 12/29/2005 | US20050285611 Utilizing clock shield as defect monitor |
| 12/29/2005 | US20050285610 Test circuitry wafer |
| 12/29/2005 | US20050285609 Probe unit and its manufacturing method |
| 12/29/2005 | US20050285606 Delay lock circuit having self-calibrating loop |
| 12/29/2005 | US20050285605 Delay lock circuit having self-calibrating loop |
| 12/29/2005 | US20050285604 Partial discharge detecting sensor and gas insulated electric apparatus provided with a partial discharge detecting sensor |
| 12/29/2005 | US20050285603 A/C generator rotor test apparatus |
| 12/29/2005 | US20050285602 Use of magnetic noise compensation in localization of defect in flat plate structure |
| 12/29/2005 | US20050285601 Physical quantity sensing device with bridge circuit and temperature compensating method |
| 12/29/2005 | US20050285600 Method and apparatus for implementing direct attenuation measurement through embedded structure excitation |
| 12/29/2005 | US20050285105 Pressure inspector and method for inspecting liquid crystal display panels |
| 12/29/2005 | US20050284241 Method and system for measuring wedge tightness |
| 12/29/2005 | DE60202593T2 Pneumatisch betriebenes andockmodul mit automatischem entkoppelungsmechanismus bei stromausfall The pneumatically powered docking module with automatic entkoppelungsmechanismus at power failure |
| 12/29/2005 | DE202005016796U1 Portable electric energy storage unit generally useful for temporary supply of electrical energy provides for current supply to end units at at least two different high voltages includes a lithium ion accumulator |
| 12/29/2005 | DE10246282B4 Prober zum Testen von Substraten bei tiefen Temperaturen Prober for testing of substrates at low temperatures |
| 12/29/2005 | DE102005025443A1 Kurzschluss-Erfassungsschaltung und Anomalieüberwachungssignal-Erzeugungsschaltung Short-circuit detecting circuit, and abnormality monitoring signal generating circuit |
| 12/29/2005 | DE102004046956A1 Messvorrichtung und Messverfahren zur Bestimmung von Batteriezellenspannungen Measuring apparatus and method for the measurement of battery cell voltages |
| 12/29/2005 | DE102004026971A1 Mikromechanischer Sensor mit Fehlererkennung Micromechanical sensor fault detection |
| 12/29/2005 | DE102004026248A1 Halbleiter-Bauelement-Test-Verfahren, insbesondere für ein System mit mehreren jeweils ein Daten-Zwischenspeicher-Bauelement aufweisenden Modulen, sowie Test-Modul zur Verwendung bei einem derartigen Verfahren A semiconductor device testing method, in particular for a system having a plurality each have a data latch device having modules, as well as test module for use in such a method |
| 12/29/2005 | DE10041670B4 Ortungsschleife für die Ermittlung des Fehlerortes eines fehlerbehafteten Kabels Tracking loop for the fault location of a faulty cable |
| 12/28/2005 | EP1610604A2 Printed circuit assembly system and method |
| 12/28/2005 | EP1610431A2 Method and system for identifying faulted phase |
| 12/28/2005 | EP1610375A2 Contact carriers for populating substrates with spring contacts |
| 12/28/2005 | EP1610373A2 Method and apparatus for determining generation lifetime of product semiconductor wafers |
| 12/28/2005 | EP1610204A1 Fast synchronization of a number of digital clocks |
| 12/28/2005 | EP1610141A1 Electric power unit and electronics device |
| 12/28/2005 | EP1610140A1 Apparatus and method for detecting fully charged condition, apparatus and method for detecting charged condition, and apparatus and method for determining degree of degradation |
| 12/28/2005 | EP1610139A1 Battery state monitoring device and its method, and dischargeable capacity detecting method |
| 12/28/2005 | EP1610138A1 Method and device for estimating battery's dischargeable capacity |
| 12/28/2005 | EP1610137A1 Per-pin clock synthesis |
| 12/28/2005 | EP1610136A1 Test emulation device, test module emulation device, and recording medium recorded with programs for the devices |
| 12/28/2005 | EP1610135A1 Test device and test method |