Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/2006
02/08/2006CN2757109Y Vacuum leakage detector for fuel cell film electrode
02/08/2006CN1732389A Battery capacity calculating method, battery capacity calculating apparatus, and battery capacity calculating program
02/08/2006CN1732388A Semiconductor test device
02/08/2006CN1731207A Passive isolation accumulator voltage monitoring circuit
02/08/2006CN1731206A A novel circuit for electric and electronic power module test and pulse control method thereof
02/08/2006CN1731205A Test circuit for panel display device
02/08/2006CN1731204A Mode extraction apparatus and mode extraction method for conductive interference noise
02/08/2006CN1731203A LCD panel inspection apparatus and inspection method thereof
02/08/2006CN1731202A Method of frequency impedance characteristic measurement during transformer changeover
02/08/2006CN1731192A Surge voltage generator
02/08/2006CN1241308C Method and system for diagnosing partial discharging in gas insulator
02/08/2006CN1241206C Memory equipment having page buffer with double-register and using method thereof
02/08/2006CN1241030C Method and system for determining and indicating remaining battery life and related auxiliary equipment
02/08/2006CN1241029C Test system for smart card and identification devices and the like
02/08/2006CN1241028C Direct earth detector and system connecting generating device using it
02/08/2006CN1241027C High precision online monitoring sensor for a.c. current leakage
02/08/2006CN1241024C Module of testing device for testing printed circuit boards
02/08/2006CN1241023C Probe cladding device of probe measuring and testing card
02/08/2006CN1240571C Diagnostic system for the wattage power regulator of a high-pressure gas discharge lamp in a vehicle
02/07/2006US6996791 Method for optimizing a set of scan diagnostic patterns
02/07/2006US6996761 IC with protocol selection memory coupled to serial scan path
02/07/2006US6996760 ASIC BIST employing stored indications of completion
02/07/2006US6996759 Delay fault test circuitry and related method
02/07/2006US6996758 Apparatus for testing an interconnecting logic fabric
02/07/2006US6996757 Test system rider board utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices
02/07/2006US6996755 Squence control circuit
02/07/2006US6996754 Integrated circuit device having an internal state monitoring function
02/07/2006US6996747 Program counter trace stack, access port, and serial scan path
02/07/2006US6996495 Capacitive motor sensor
02/07/2006US6996489 Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
02/07/2006US6996484 Sequential unique marking
02/07/2006US6996446 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process
02/07/2006US6996132 Method, apparatus and program for determining available bandwidth between multiple points in a communication system
02/07/2006US6996114 Method for rate matching to support incremental redundancy with flexible layer one
02/07/2006US6996070 TCP/IP offload device with reduced sequential processing
02/07/2006US6996068 Audio testing in a packet switched network
02/07/2006US6996066 Method to allocate commodity flow in a multi-dimensional commodity flow network
02/07/2006US6996065 Dynamic backup routing of network tunnel paths for local restoration in a packet network
02/07/2006US6996061 Dynamic scheduling for packet data network
02/07/2006US6996060 Closing a communications stream between terminals of a communications system
02/07/2006US6996032 BIST circuit for measuring path delay in an IC
02/07/2006US6996014 Memory devices with page buffer having dual registers and method of using the same
02/07/2006US6995980 Temperature control system which sprays liquid coolant droplets against an IC-module and directs radiation against the IC-module
02/07/2006US6995737 Method and system for adjusting precharge for consistent exposure voltage
02/07/2006US6995582 Testing device with a contact for connecting to a contact of a semiconductor component
02/07/2006US6995581 Apparatus and method for detecting and rejecting high impedance failures in chip interconnects
02/07/2006US6995580 Power detectors for measuring power coupling
02/07/2006US6995579 Low-current probe card
02/07/2006US6995578 Coupling unit, test head, and test apparatus
02/07/2006US6995577 Contact for semiconductor components
02/07/2006US6995576 Thin film transistor array inspection apparatus
02/07/2006US6995570 Method and apparatus for detecting conditions in paralleled DC power cables
02/07/2006US6995569 Device for electromagnetic characterisation of a tested structure
02/07/2006US6995568 Method for fault tracing in electronic measurement and test arrangements for electrochemical elements
02/07/2006US6995567 Failure detection system for electric power steering system
02/07/2006US6995566 Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium
02/07/2006US6995565 Thermographic wiring inspection
02/07/2006US6995564 Method and system for locating chip-level defects through emission imaging of a semiconductor device
02/07/2006US6995555 Apparatus and method for determining a current through a power semiconductor component
02/07/2006US6995552 Voltage modulator circuit to control light emission for non-invasive timing measurements
02/07/2006US6995551 Cable tester with insertion loss estimator
02/07/2006US6995550 Method and apparatus for determining properties of an electrophoretic display
02/07/2006US6995393 Apparatus and methods for semiconductor IC failure detection
02/07/2006US6995318 Method for testing integrity of electrical connection of a flat cable multiple connector assembly
02/07/2006US6995067 Megasonic cleaning efficiency using auto-tuning of an RF generator at constant maximum efficiency
02/07/2006US6995027 Integrated semiconductor structure for reliability tests of dielectrics
02/07/2006US6995026 Methods for coupling a flowable conductive material to microelectronic substrates
02/07/2006US6994544 Wafer scale thermal stress fixture and method
02/07/2006US6993922 Apparatus and method for controlling the temperature of an electronic device under test
02/02/2006WO2006012529A1 Apparatus and method for calibrating equipment for high frequency measurements
02/02/2006WO2006012503A2 Automatic analog test & compensation with built-in pattern generator & analyzer
02/02/2006WO2006012358A2 Systems and methods for testing radio frequency identification tags
02/02/2006WO2006012297A1 Method and apparatus for reducing aspect ratio dependent etching in time division multiplexed etch processes
02/02/2006WO2006012211A2 A system and method for adaptive rate selection for wireless networks
02/02/2006WO2006011500A1 Communication anomaly detecting device, and passenger detecting device
02/02/2006WO2006010659A1 State and parameter estimator comprising an integral or differential portion for electrical energy stores
02/02/2006US20060026482 Test apparatus
02/02/2006US20060026481 System and method for testing electronic device performance
02/02/2006US20060026480 Method and apparatus for generating test signals
02/02/2006US20060026479 Verification vector creating method, and electronic circuit verifying method using the former method
02/02/2006US20060026478 Built-in self-test emulator
02/02/2006US20060026477 Test clock generating apparatus
02/02/2006US20060026476 Integrated circuit device and testing device
02/02/2006US20060026475 Semiconductor circuit device and a system for testing a semiconductor apparatus
02/02/2006US20060026474 System and program product for displaying error handling information
02/02/2006US20060026473 Inversion of scan clock for scan cells
02/02/2006US20060026472 Designing Scan Chains With Specific Parameter Sensitivities to Identify Process Defects
02/02/2006US20060026471 Loop status monitoring apparatus
02/02/2006US20060026470 Processor debugging apparatus and processor debugging method
02/02/2006US20060025956 Semiconductor device fabrication method
02/02/2006US20060025942 Method and system for determining the position of a short circuit in a branched wiring system
02/02/2006US20060025940 Methods and systems for testing wire insulation
02/02/2006US20060025909 Method of diagnosing an electronic control unit
02/02/2006US20060025132 Remote configuration and control of local devices via a broadband access gateway
02/02/2006US20060024990 Universal measuring adapter system
02/02/2006US20060024989 Helical microelectronic contact and method for fabricating same
02/02/2006US20060024988 Interconnect assemblies and methods
02/02/2006US20060024850 Test structures and methods for monitoring or controlling a semiconductor fabrication process
02/02/2006US20060023907 Power-saving mode for hearing aids
02/02/2006US20060023745 Quality control scheme for Multiple-Input Multiple-Output (MIMO) Orthogonal Frequency Division Multiplexing (OFDM) systems