Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2005
12/28/2005EP1610132A2 Fabricating interconnects using sacrificial substrates
12/28/2005EP1608990A2 Apparatus and method for distance extension of fibre-channel over transport
12/28/2005EP1459080B1 Test circuit topology reconfiguration and utilization method
12/28/2005EP1328819B1 Method of selecting electrolytes for high capacity electric energy accumulators
12/28/2005EP1224487B1 Circuit and method for improved test and calibration in automated test equipment
12/28/2005EP0928424B1 Automatic fault location in cabling systems
12/28/2005CN2748928Y Ultraviolet and visible spectrum combination image detecting instrument
12/28/2005CN2748927Y Local discharging ultrahigh frequency online fault positioning device for gas insulation transformer station
12/28/2005CN1714489A Test by using independently controllable voltage islands
12/28/2005CN1714348A Integrated circuit having multiple modes of operation
12/28/2005CN1714299A Device and method for detecting stress migration properties
12/28/2005CN1714298A Device and methods for contacting objects to be tested
12/28/2005CN1714296A Application specific event based semiconductor memory test system
12/28/2005CN1714295A A method of and apparatus for testing for integrated circuit contact defects
12/28/2005CN1714294A Adapter for testing conductor arrangements
12/28/2005CN1713639A Information-processing device and method
12/28/2005CN1713638A Device and method of controlling and providing content over a network
12/28/2005CN1712980A Inserted card tester
12/28/2005CN1712979A Tester of ATA signal
12/28/2005CN1712978A Self-adaptable dicrimination for permanent fault of high-voltage electrical network
12/28/2005CN1712977A Device and method for testing fault relay
12/28/2005CN1712976A Electronic signal transmitter with fault detecting function
12/28/2005CN1234016C Method for testing synchronous motor operational state utilizing composite power-angle instrument
12/28/2005CN1234015C Power-supply current measuring unit for semiconductor testing system
12/28/2005CN1234014C Power cable local discharge on-line monitoring method and device
12/27/2005US6981199 Method for arranging data output by semiconductor testers to packet-based devices under test
12/27/2005US6981192 Deskewed differential detector employing analog-to-digital converter
12/27/2005US6981191 ASIC logic BIST employing registers seeded with differing primitive polynomials
12/27/2005US6981189 Interface circuit
12/27/2005US6981186 Loop diagnostic mode for ADSL modems
12/27/2005US6981179 Microcomputer having built-in nonvolatile memory and check system thereof and IC card packing microcomputer having built-in nonvolatile memory and check system thereof
12/27/2005US6981086 Instrumentation system including a backplane having a switched fabric bus and instrumentation lines
12/27/2005US6980975 Method and apparatus for rule-based random irritator for model stimulus
12/27/2005US6980943 Flow for vector capture
12/27/2005US6980917 Optimization of die yield in a silicon wafer “sweet spot”
12/27/2005US6980912 Method and apparatus for use with a portable power source
12/27/2005US6980910 Extensions to dynamically configurable process for diagnosing faults in rotating machines
12/27/2005US6980520 Method and apparatus for performing source-based flow control across multiple network devices
12/27/2005US6980475 Semiconductor memory device
12/27/2005US6980252 Electronic camera and battery voltage controlling method employed therein for successively, rather than simultaneously, operating camera portions during conditions of low battery voltage
12/27/2005US6980185 Driving module for a liquid crystal display panel and a liquid crystal display device having the same
12/27/2005US6980163 Signal leakage detector
12/27/2005US6980064 Slide-screw tuner with single corrugated slug
12/27/2005US6980063 Transmission line parasitic element discontinuity cancellation
12/27/2005US6980040 Delay adjusting apparatus providing different delay times by producing a plurality of delay control signals
12/27/2005US6980023 Dynamically adjustable signal detector
12/27/2005US6980016 Integrated circuit burn-in systems
12/27/2005US6980012 Wafer probe station for low-current measurements
12/27/2005US6980011 Method and apparatus for detecting electrical failures on a die through maximizing passive voltage contrast on its surface
12/27/2005US6980010 Method and apparatus for inspecting wire breaking of integrated circuit
12/27/2005US6980009 Structure for measurement of capacitance of ultra-thin dielectrics
12/27/2005US6980007 Cable tester with insertion loss and return loss estimators
12/27/2005US6980006 High speed envelope detector and method
12/27/2005US6980005 Circuit protection device with timed negative half-cycle self test
12/27/2005US6979997 Method of controlling the operation of a digital state machine from a master controller in an IC-chip testing system
12/27/2005US6979996 Apparatus and method for automatic elimination of round-trip delay errors induced by automatic test equipment calibration
12/27/2005US6979994 Power supply device for a component testing installation
12/27/2005US6979771 Photovoltaic module, photovoltaic module array, photovoltaic system, and method of detecting failure of photovoltaic module
12/27/2005US6979648 Method for BARC over-etch time adjust with real-time process feedback
12/27/2005US6979203 IC socket
12/22/2005WO2005122641A1 Heater power control circuit and burn-in apparatus using the same
12/22/2005WO2005122239A1 Failure analysis system and failure area displaying method
12/22/2005WO2005122238A1 Process for fabricating semiconductor integrated circuit device
12/22/2005WO2005122208A2 Charged particle beam device with retarding field analyzer
12/22/2005WO2005122181A1 Method and apparatus for interfacing between test system and embedded memory on test mode setting operation
12/22/2005WO2005122179A1 System and method for testing a data storage device without revealing memory content
12/22/2005WO2005121828A1 Test method and test device for testing an integrated circuit
12/22/2005WO2005121827A1 Timing generator and semiconductor testing apparatus
12/22/2005WO2005121826A1 Generating device, generating method, program and recording medium
12/22/2005WO2005121825A2 Test arrangement including anisotropic conductive film for testing power module
12/22/2005WO2005121824A2 Thermal optical chuck
12/22/2005WO2005121823A1 Method for diagnosing status of burn-in apparatus
12/22/2005WO2005121822A1 Burn-in apparatus
12/22/2005WO2005121821A1 A method and a device for determining the location of a partial discharge (pd)
12/22/2005WO2005121820A1 Method and apparatus to reduce jitter by adjusting vertical offset
12/22/2005WO2005121815A1 Apparatus for analyzing wideband signals, wideband period jitter, and wideband skew
12/22/2005WO2005121814A1 Logic analyzer and method of analyzing waveform data using the same
12/22/2005WO2005121773A1 Method for correcting the influence of signal transmission lines on changes of signal transit times when conducting ultrasonic measurements
12/22/2005WO2005121739A1 Image sensor test equipment
12/22/2005WO2005103738A3 Bi-directional three-dimensional microwave scanning and volumetric mapping of a whole roll or pallet of paper
12/22/2005WO2005084328A3 Burn-in testing apparatus and method
12/22/2005WO2005060718A3 Cap at resistors of electrical test probe
12/22/2005WO2005043594B1 Method for forming photo-defined micro electrical contacts
12/22/2005US20050283698 Method and apparatus for measuring switching noise in integrated circuits
12/22/2005US20050283697 Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices
12/22/2005US20050283696 Integrated circuit
12/22/2005US20050283695 Integrated circuit
12/22/2005US20050283694 Built-in-test diagnostic and maintenance support system and process
12/22/2005US20050283693 Multi-chip digital system signal identification method and apparatus
12/22/2005US20050283692 Direct scan access JTAG
12/22/2005US20050283691 Scan flip-flop circuit with reduced power consumption
12/22/2005US20050283690 Wrapper serial scan chain functional segmentation
12/22/2005US20050283335 Integrated circuit and methods of measurement and preparation of measurement structure
12/22/2005US20050283331 System for testing integrated circuits
12/22/2005US20050282366 Method for monitoring ion implant doses
12/22/2005US20050282300 Back-end-of-line metallization inspection and metrology microscopy system and method using x-ray fluorescence
12/22/2005US20050282299 Wafer inspection system and method thereof
12/22/2005US20050282297 Method and structure for defect monitoring of semiconductor devices using power bus wiring grids
12/22/2005US20050281202 Monitoring instructions queueing messages
12/22/2005US20050281201 Technique for capturing wide data buses
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