| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/23/2006 | US20060061378 Semiconductor device with test circuit disconnected from power supply connection |
| 03/23/2006 | US20060061377 Pin electronics implemented system and method for reduced index time |
| 03/23/2006 | US20060061376 Electronic circuit with test unit |
| 03/23/2006 | US20060061375 Probe card |
| 03/23/2006 | US20060061374 Inspection method and inspection equipment |
| 03/23/2006 | US20060061373 Method for calculating frequency-dependent impedance in an integrated circuit |
| 03/23/2006 | US20060061369 Information handling system integrated cable tester |
| 03/23/2006 | US20060061368 Device and method for detecting anomolies in a wire and related sensing methods |
| 03/23/2006 | US20060061367 Test light/circuit tester |
| 03/23/2006 | US20060061348 High frequency oscilloscope probe with unitized probe tips |
| 03/23/2006 | US20060061330 Rapid charging battery charging system |
| 03/23/2006 | US20060060843 Resistor structures to electrically measure unidirectional misalignment of stitched masks |
| 03/23/2006 | US20060060007 Device for telemonitoring the state of aerial power lines(variants) |
| 03/23/2006 | US20060059681 Method of making and using an extended test switch |
| 03/23/2006 | DE19713495B4 Verfahren zum rationellen Prüfen und Schaltungsanordnung zur Durchführung des Verfahrens A method for efficient testing and circuit arrangement for performing the method |
| 03/23/2006 | DE10324080B4 Verfahren zum Testen von zu testenden Schaltungseinheiten in einer Testvorrichtung A method of testing of circuit units to be tested in a test device |
| 03/23/2006 | DE10305662B4 Verfahren zur Serieninnenwiderstandsmessung von photovoltaischen Zellen und Modulen (PV-Modulen) Process for the series resistance measurement of photovoltaic cells and modules (PV modules) |
| 03/23/2006 | DE10255378B4 Teststruktur zum Bestimmen der Stabilität elektronischer Vorrichtungen die miteinander verbundene Substrate umfassen For determining the stability of electronic devices include test structure, the substrates interconnected |
| 03/23/2006 | DE102005039671A1 Kombinierte Testinstrumentensonde und Spannungsdetektor Combined test instrument probe and voltage detector |
| 03/23/2006 | DE102005018113A1 Signalisolierender Blindgegenstückverbinder Signal Insulating Blind counterpart connector |
| 03/23/2006 | DE102004045570A1 Verfahren für eine Keilriemenfehlfunktionserkennung Method for a V-belt failure detection |
| 03/23/2006 | DE102004045216A1 Circuit for monitoring energy storage device, especially capacitor for safety-critical vehicle system, has arithmetic unit for determining storage device capacity by evaluating comparison circuit output signal, controlling discharge circuit |
| 03/23/2006 | DE102004044813A1 Verfahren zum Testen eines integrierten Schaltkreises A method for testing an integrated circuit |
| 03/23/2006 | DE102004043461A1 Signalaufbereitungsanordnung und Verfahren zum Aufbereiten eines Signals Signal processing arrangement and method for processing a signal |
| 03/23/2006 | DE102004043063A1 Semiconductor device e.g. ROM, operating method, involves operating pin of device in normal operation mode as application-function-pin, where pin is operated in two test operating modes as test pin and application-function pin, respectively |
| 03/23/2006 | DE102004037193A1 Vehicle's power device for recognizing electric arcs in a current circuit like a motor vehicle's power system has noise sensors, evaluatory devices and current sensors |
| 03/23/2006 | DE102004036291A1 Switching arrangement for controlling vehicle safety device, has two control units that are designed to analyze input signals from independent sensors for controlling switching equipments of safety device |
| 03/23/2006 | DE102004036252A1 Relay-based electrical switching system has a control arrangement that is designed or programmed to detect particular disruption effects and trigger corresponding reaction measures, e.g. predefined switching plans |
| 03/23/2006 | DE102004036145A1 Halbleiterschaltungseinrichtung und System zum Testen einer Halbleitervorrichtung Semiconductor circuit device and system for testing a semiconductor device |
| 03/23/2006 | DE102004026437A1 Voltage method for characterizing the insulation status of operating devices operates measurement of return/recovery voltage |
| 03/23/2006 | DE10116123B4 Prüfeinrichtung für Schaltschränke Test equipment for cabinets |
| 03/22/2006 | EP1638244A1 Transmission system, receiver, test equipment and test head |
| 03/22/2006 | EP1638183A1 System for detecting motor coil-to-coil faults |
| 03/22/2006 | EP1638182A2 Method for operating an electronic overcurrent relay in a circuit-breaker. |
| 03/22/2006 | EP1638159A2 Fuel cell system |
| 03/22/2006 | EP1637897A2 Method for determining the identity of a battery pack |
| 03/22/2006 | EP1637896A2 Diagnosis of an electrical engine by monitoring the magnetic flux of the engine by means of a flux sensitive coating |
| 03/22/2006 | EP1637895A1 Method for testing of an integrated circuit |
| 03/22/2006 | EP1637894A2 Boundary scan chain routing |
| 03/22/2006 | EP1637893A1 Method and apparatus for testing electrical characteristics of object under test |
| 03/22/2006 | EP1637892A1 Electronic component handling device, and method for temperature application in electronic component handling device |
| 03/22/2006 | EP1637890A1 Method for contactless determination of the speed of electric motors |
| 03/22/2006 | EP1636979A2 Method for reducing the cost of handling incoming/outgoing phone calls |
| 03/22/2006 | EP1636974A1 Portable battery driven apparatus |
| 03/22/2006 | EP1636867A2 Fuel cell device condition detection |
| 03/22/2006 | EP1636677A2 Data compaction and pin assignment |
| 03/22/2006 | EP1636602A2 Method and apparatus for judging deterioration of battery |
| 03/22/2006 | EP1636601A2 System and method for optimizing link throughput in response to non-congestion-related packet loss |
| 03/22/2006 | EP1636598A2 Apparatus and method for sensing emulator cable orientation while providing signal drive capability |
| 03/22/2006 | EP1604341A4 In-use unambiguously determining the near-end-of-life state of a combustion engine battery |
| 03/22/2006 | EP1461629A4 Remote battery monitoring systems and sensors |
| 03/22/2006 | EP1377981A4 Method and system to optimize test cost and disable defects for scan and bist memories |
| 03/22/2006 | EP1309842B1 Water monitoring system and water monitoring method for high voltage cables |
| 03/22/2006 | EP1266204A4 Beam delivery and imaging for optical probing of a device operating under electrical test |
| 03/22/2006 | EP1223430B1 Leak sensor |
| 03/22/2006 | EP1214605B1 Charge-based frequency measurement bist |
| 03/22/2006 | EP1139108B1 Scan interface with TDM feature for permitting signal overlay |
| 03/22/2006 | CN2766249Y Automatic detecting device for knob |
| 03/22/2006 | CN2766248Y Bridge phase detecting device |
| 03/22/2006 | CN2766245Y Multifunctional current detecting device |
| 03/22/2006 | CN2766230Y Resistance liquid cooling apparatus for water resistance test control cubicle for generator |
| 03/22/2006 | CN1751545A Circuit board checker and circuit board checking method |
| 03/22/2006 | CN1751539A Method of programming a hearing aid by a programming device |
| 03/22/2006 | CN1751355A Multi-chip card |
| 03/22/2006 | CN1751246A Method and system for electrical length matching |
| 03/22/2006 | CN1751245A Testing of electronic circuits |
| 03/22/2006 | CN1751244A Chip-mounting tape inspecting method and probe unit used for inspection |
| 03/22/2006 | CN1751243A Method and apparatus for transmitting information within a communication system |
| 03/22/2006 | CN1751242A Cable testing system |
| 03/22/2006 | CN1751219A Conductor inspecting device and conductor inspecting method |
| 03/22/2006 | CN1750688A Method and device for displaying cell voltage margin of cell phone |
| 03/22/2006 | CN1750264A Semiconductor device |
| 03/22/2006 | CN1750101A Source driver of built-in detecting circuit and its detecting method |
| 03/22/2006 | CN1749901A Movable operating device and method of controlling the movable operating device |
| 03/22/2006 | CN1749769A Invariant checking |
| 03/22/2006 | CN1749768A Device for detecting linear array charge coupling device functionality |
| 03/22/2006 | CN1749767A Method and device for detecting ferro-electric film microwave dielectric property |
| 03/22/2006 | CN1749766A Detector of Radar peak value field strength |
| 03/22/2006 | CN1749765A Virtual detector for variable frequency speed regulator |
| 03/22/2006 | CN1749764A High voltage electrode device for space charge measuring system by electroacoustic pulse method |
| 03/22/2006 | CN1246932C Anisotropic conductive connector, its mfg. method and probe member |
| 03/22/2006 | CN1246893C Contact structure member and production method thereof, and probe contact assembly using said contact structure member |
| 03/22/2006 | CN1246705C Multi-accumulator group instantaneous monitor equipment |
| 03/22/2006 | CN1246704C Method for estimating residual capacity of storage battery for electric vehicle |
| 03/22/2006 | CN1246703C Method and device for detecting multi-layer electronic parts by optical mode |
| 03/22/2006 | CN1246702C IC test processing machine for high-frequency IC test |
| 03/22/2006 | CN1246699C High resolution analytical probe station |
| 03/21/2006 | US7017135 Method of designing semiconductor integrated circuit utilizing a scan test function |
| 03/21/2006 | US7017098 Built-in self-test for multi-channel transceivers without data alignment |
| 03/21/2006 | US7017097 Simultaneously driving a hardware device and a software model during a test |
| 03/21/2006 | US7017096 Sequential test pattern generation using clock-control design for testability structures |
| 03/21/2006 | US7017095 Functional pattern logic diagnostic method |
| 03/21/2006 | US7017094 Performance built-in self test system for a device and a method of use |
| 03/21/2006 | US7017093 Circuit and/or method for automated use of unallocated resources for a trace buffer application |
| 03/21/2006 | US7017092 On-chip design for monitor |
| 03/21/2006 | US7017091 Test system formatters configurable for multiple data rates |
| 03/21/2006 | US7017090 Semiconductor module including semiconductor memory device shiftable to test mode as well as semiconductor memory device used therein |
| 03/21/2006 | US7017087 Enhanced loopback testing of serial devices |
| 03/21/2006 | US7017086 Round-robin updating for high speed I/O parallel interfaces |
| 03/21/2006 | US7017081 Methods and systems for remotely controlling a test access port of a target device |