Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
---|
03/15/2006 | CN1746685A Modulation-adjustable chopper with big power for interference simulator of vehicle electronic apparatus |
03/15/2006 | CN1245766C Semiconductor device and its making method |
03/15/2006 | CN1245687C Method and device for testing USB port |
03/15/2006 | CN1245635C Method for correcting test arm of pick and place machine and regulator thereof |
03/15/2006 | CN1245634C Current transformer system |
03/15/2006 | CA2518877A1 Control device and procedure for a console |
03/14/2006 | US7013417 Dynamically reconfigurable precision signal delay test system for automatic test equipment |
03/14/2006 | US7013416 IC with expected data memory coupled to scan data register |
03/14/2006 | US7013415 IC with internal interface switch for testability |
03/14/2006 | US7013414 Test method and test system for semiconductor device |
03/14/2006 | US7013369 Memory control circuit outputting contents of a control register |
03/14/2006 | US7013236 Methods and apparatus for calculating routing arrangements for control cables |
03/14/2006 | US7013232 Network-based system for configuring a measurement system using configuration information generated based on a user specification |
03/14/2006 | US7013231 Method and program product to optimize manufacturing test time of electrical devices |
03/14/2006 | US7013230 Input-output circuit and a testing apparatus |
03/14/2006 | US7013222 Wafer edge inspection data gathering |
03/14/2006 | US7013192 Substrate contact analysis |
03/14/2006 | US7012912 Power control and scheduling in an OFDM system |
03/14/2006 | US7012890 Packet forwarding apparatus with packet controlling functions |
03/14/2006 | US7012888 High availability VoIP subsystem |
03/14/2006 | US7012887 Method for restoring diversely routed circuits |
03/14/2006 | US7012830 Semiconductor memory device |
03/14/2006 | US7012583 Apparatus and method for testing pixels of flat panel display |
03/14/2006 | US7012446 Device for detecting a motor drive current |
03/14/2006 | US7012445 Method for testing a TFT array |
03/14/2006 | US7012444 Semiconductor tester |
03/14/2006 | US7012443 System used to test plurality of DUTs in parallel and method thereof |
03/14/2006 | US7012442 Test signal distribution system for IC tester |
03/14/2006 | US7012441 High conducting thin-film nanoprobe card and its fabrication method |
03/14/2006 | US7012440 Wafer test apparatus including optical elements and method of using the test apparatus |
03/14/2006 | US7012439 Multiple directional scans of test structures on semiconductor integrated circuits |
03/14/2006 | US7012436 Cable tester |
03/14/2006 | US7012435 State detecting method and insulation resistance fall detector |
03/14/2006 | US7012434 Method for determining the amount of charge which can be drawn from a storage battery and monitoring device |
03/14/2006 | US7012433 Battery tester upgrade using software key |
03/14/2006 | US7011762 Metal bridging monitor for etch and CMP endpoint detection |
03/14/2006 | US7011614 Infrared thermopile detector system for semiconductor process monitoring and control |
03/14/2006 | US7010864 Terminal examination jig |
03/09/2006 | WO2006026733A2 A method of designing a probe card apparatus with desired compliance characteristics |
03/09/2006 | WO2006025529A1 Turning device for heavy object |
03/09/2006 | WO2006025285A1 Variable delay circuit, macro cell data, logic verifying method, testing method, and electronic device |
03/09/2006 | WO2006025140A1 Semiconductor integrated circuit device and method for inspecting the same, semiconductor wafer and burn-in inspection apparatus |
03/09/2006 | WO2006024802A1 Method for determining the state of an electrochemical battery and device for carrying out the same |
03/09/2006 | WO2006002163A3 Method and apparatus for magnetically achieving electrical continuity |
03/09/2006 | WO2005112576A3 Method of bumping die pads for wafer testing |
03/09/2006 | WO2005072406A3 Test system and method for reduced index time |
03/09/2006 | US20060053358 Method and apparatus for enabling and disabling a test mode of operation of an electronic memory device without additional interconnects or commands |
03/09/2006 | US20060053357 Integrated circuit yield and quality analysis methods and systems |
03/09/2006 | US20060053356 Integrated circuit |
03/09/2006 | US20060053355 Semiconductor integrated circuit device |
03/09/2006 | US20060052965 Event driven testing method, system and program product |
03/09/2006 | US20060052964 Test apparatus and testing method |
03/09/2006 | US20060052957 Method and apparatus for testing circuit boards |
03/09/2006 | US20060049844 Method for testing an electric circuit |
03/09/2006 | US20060049843 System and method using locally heated island for integrated circuit testing |
03/09/2006 | US20060049842 System and method for accurate negative bias temperature instability characterization |
03/09/2006 | US20060049841 Replaceable probe apparatus for probing semiconductor wafer |
03/09/2006 | US20060049840 Test probe and tester, method for manufacturing the test probe |
03/09/2006 | US20060049839 Dynamic signal injection microscopy |
03/09/2006 | US20060049832 Process for the connection of electrical loads to the terminals of an amplifier, and for detection of a possible defect of connection of these loads |
03/09/2006 | US20060049831 Detection and suppression of electrical arcing |
03/09/2006 | US20060049830 Magnetic sensor for detecting location of short circuit between lead wires of high-density micro-patterns |
03/09/2006 | US20060049820 Method and apparatus for remotely buffering test channels |
03/09/2006 | US20060049805 System and method of battery capacity reporting |
03/09/2006 | US20060049786 Circuit for fan motor |
03/09/2006 | DE60019255T2 Verfahren und Vorrichtung zur Trimmung von elektronischen Schaltungen Method and apparatus for trimming of electronic circuits |
03/09/2006 | DE202005017996U1 Arrangement for detecting and locating the positions of insulation faults in the heating rods of points heating systems, has means for applying an impulse voltage between the heating output lines and earth |
03/09/2006 | DE19820395B4 Verfahren und Vorrichtung zum Sicherstellen des Ladezustandes einer Fahrzeugbatterie A method and apparatus for ensuring the state of charge of a vehicle battery |
03/09/2006 | DE19812198B4 Testvorrichtung für Halbleiterspeicher Test device for semiconductor memories |
03/09/2006 | DE10341549B4 Verfahren und Schaltungsanordnung zur Bestimmung einer in einem Zeitraum verbrauchten Ladung bei Mobilgeräten Method and circuit for determining a period spent in a charge to mobile devices |
03/09/2006 | DE10309313B4 Schaltungsanordnung zur Detektion eines Fehlers in einer Schaltungslogik Circuit arrangement for detecting a fault in a logic circuit |
03/09/2006 | DE10249647B4 Pneumatischer Schwingungsisolator Pneumatic vibration isolator |
03/09/2006 | DE102005020835A1 Batteriezustandserkennung Battery state detection |
03/09/2006 | DE102004049071A1 Ultrahochfrequenz-Testeinrichtung für Transponder Ultra high-frequency test for the transponder device |
03/09/2006 | DE102004041898A1 Verfahren und Vorrichtung zur Diagnose bei Servicesystemen für technische Anlagen Method and apparatus for diagnosis in service systems for technical equipment |
03/09/2006 | CA2621196A1 Wireless portable automated harness scanner system and method therefor |
03/08/2006 | EP1632783A1 Magnetic sensor for detecting location of short circuit between lead wires of high-density micro-patterns |
03/08/2006 | EP1632782A1 Method and apparatus for battery monitoring |
03/08/2006 | EP1632781A1 Method and apparatus for battery capacity detection |
03/08/2006 | EP1632780A2 Monitoring control apparatus |
03/08/2006 | EP1632190A1 Foot switch and output system having foot switch |
03/08/2006 | EP1632020A2 Integrated circuit device for monitoring power supply |
03/08/2006 | EP1631890A2 A method and apparatus for detecting on-die voltage variations |
03/08/2006 | EP1344074B1 Battery capacity calibration |
03/08/2006 | CN2763814Y Insulation tube moving coil type power frequency series connected resonance test transformer |
03/08/2006 | CN2763804Y Non-destructive tester for fruit naturity |
03/08/2006 | CN1745502A An interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same |
03/08/2006 | CN1745312A Boundary scan circuit with integrated sensor for sensing physical operating parameters |
03/08/2006 | CN1745311A TCP handling device and positional deviation correcting method for the same |
03/08/2006 | CN1745310A Wrist joint for positioning a test head |
03/08/2006 | CN1745309A Composite motion probing |
03/08/2006 | CN1745308A Apparatus and method for limiting over travel in a probe card assembly |
03/08/2006 | CN1744771A Organic light emitting display with circuit measuring pad and method of fabricating the same |
03/08/2006 | CN1744371A Intelligent cell package and method for identifying cell type using same |
03/08/2006 | CN1744367A Real-time tracking alarm secondary cell partial volume method |
03/08/2006 | CN1743865A Plastic-casing circuit breaker instantaneous characteristic test device |
03/08/2006 | CN1743864A Semiconductor PN node diode device temperature rise measuring method and apparatus |
03/08/2006 | CN1743863A High-precision adjustable gap contactless trielectrode |
03/08/2006 | CN1743862A 电缆组件 Cable Assemblies |
03/08/2006 | CN1743861A Optical fiber combined overhead earth wire |