| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 01/19/2006 | WO2006007415A2 Nonlinear adaptive control of resource-distribution dynamics |
| 01/19/2006 | WO2006007382A2 Qam signal analysis in a network |
| 01/19/2006 | WO2006007198A1 Method and apparatus for testing uniterruptible power supply |
| 01/19/2006 | WO2006007164A1 System and method for detecting an operational fault condition in a power supply |
| 01/19/2006 | WO2006006700A1 Semiconductor integrated circuit, inspecting apparatus and semiconductor integrated circuit inspecting method |
| 01/19/2006 | WO2006006132A1 Title: testing a pipeline in an ic |
| 01/19/2006 | WO2005103745A3 Method and arrangement for determining operating parameters of an electrochemical storage battery |
| 01/19/2006 | WO2004057501A3 Method and system for implementing circuit simulators |
| 01/19/2006 | US20060015833 System and method for verifying trace lengths and trace spaces in a circuit |
| 01/19/2006 | US20060015788 Semiconductor device |
| 01/19/2006 | US20060015787 Externally-loaded weighted random test pattern compression |
| 01/19/2006 | US20060015786 System and shadow bistable circuits coupled to output joining circuit |
| 01/19/2006 | US20060015785 Test apparatus for mixed-signal semiconductor device |
| 01/19/2006 | US20060015783 Data transmission apparatus and method |
| 01/19/2006 | US20060015782 System and method for transparent electronic data transfer using error correction to facilitate bandwidth-efficient data recovery |
| 01/19/2006 | US20060015640 Device and method for regulating a transmission moment of a continuous transmission signal |
| 01/19/2006 | US20060015600 System and method for providing channels in application servers and transaction-based systems |
| 01/19/2006 | US20060015285 Network-based specification and delivery of a measurement system |
| 01/19/2006 | US20060015272 Inspecting method and apparatus for a led matrix display |
| 01/19/2006 | US20060014309 Temporary chip attach method using reworkable conductive adhesive interconnections |
| 01/19/2006 | US20060014308 Procedure for arranging chips of a first substrate on a second substrate |
| 01/19/2006 | US20060013148 Method and apparatus for executing a communication session between two terminals |
| 01/19/2006 | US20060013141 Loop frame detecting device and method for detecting loop frame |
| 01/19/2006 | US20060013139 Traffic management for a passive optical network terminal |
| 01/19/2006 | US20060013138 Method and apparatus for dynamic bandwidth allocation in an ethernet passive optical network |
| 01/19/2006 | US20060013137 Network interface unit |
| 01/19/2006 | US20060013135 Flow control in a switch |
| 01/19/2006 | US20060013134 System and method for performing capacity planning for enterprise applications |
| 01/19/2006 | US20060013132 Nonlinear adaptive control of resource-distribution dynamics |
| 01/19/2006 | US20060013131 Selecting downloading site of data element in telecommunications system |
| 01/19/2006 | US20060013130 Apparatus, methods and computer program products for transmission of data over an adjustable synchronous radio channel |
| 01/19/2006 | US20060013123 Method and apparatus for processing transmission error in DMB system |
| 01/19/2006 | US20060012391 CMOS leakage current meter |
| 01/19/2006 | US20060012390 Burn-in adapter |
| 01/19/2006 | US20060012389 Test socket, test system and test method for semiconductor components with serviceable nest |
| 01/19/2006 | US20060012388 System and method for testing wireless devices |
| 01/19/2006 | US20060012387 Systems and methods for testing radio frequency identification tags |
| 01/19/2006 | US20060012386 System for measuring an electromagnetic field, a control system using the measuring system, and an electronic circuit designed for the measuring system |
| 01/19/2006 | US20060012385 Integration of photon emission microscope and focused ion beam |
| 01/19/2006 | US20060012384 Semiconductor substrate and test pattern for the same |
| 01/19/2006 | US20060012383 Semiconductor substrate and test pattern for the same |
| 01/19/2006 | US20060012378 Ultracapacitor useful life prediction |
| 01/19/2006 | US20060012377 Turbo engine |
| 01/19/2006 | US20060012376 Method and apparatus for characterizing a signal path carrying an operational signal |
| 01/19/2006 | US20060012375 Method and system for determining cracks and broken components in armor |
| 01/19/2006 | US20060012374 Traveling wave based relay protection |
| 01/19/2006 | US20060012372 Power control unit |
| 01/19/2006 | US20060012360 System, method, and apparatus for handling and testing individual sliders in a row-like format in single slider processing systems |
| 01/19/2006 | US20060012330 Secondary battery replacement method |
| 01/19/2006 | US20060011799 Fixing means for cards and components |
| 01/19/2006 | US20060011583 Materials and gas chemistries for processing systems |
| 01/19/2006 | DE202005018398U1 Lamella fuse tester for use in fuse box of motor vehicle, has LEDs arranged parallel to test probes and to clamp, respectively and connected to test circuit for illuminating fuse to be tested and fuse to be changed |
| 01/19/2006 | DE202004020714U1 Measurement sensor for measurement arrangement, e.g. Hall sensor mounted near railway vehicle wheel, has at least one sensor component and stimulation coil with connections for common supply voltage |
| 01/19/2006 | DE202004020713U1 Measurement sensor for measurement arrangement, e.g. Hall sensor mounted near railway vehicle wheel, has at least one sensor component and stimulation coil with connections for common supply voltage |
| 01/19/2006 | DE112004000227T5 System und Verfahren zum Messen eines inneren Widerstands elektrochemischer Vorrichtungen System and method for measuring an internal resistance of electrochemical devices |
| 01/19/2006 | DE10323413B4 Prüfverfahren, Prüfsockel und Prüfanordnung für Hochgeschwindigkeits- Halbleiterspeichereinrichtungen Test methods, test socket, and setup for high-speed semiconductor memory devices |
| 01/19/2006 | DE102005027243A1 Halbleiter-Testvorrichtung zum gleichzeitigen Testen einer Vielzahl von Halbleiter Vorrichtungen A semiconductor test device for simultaneously testing a plurality of semiconductor devices |
| 01/19/2006 | DE102005008307A1 Vorrichtung zum Messen von Jitter, Verfahren zum Messen von Jitter und computerlesbares Medium, das ein Programm hiervon Steuert Apparatus for measuring jitter, method for measuring jitter and computer-readable medium containing a program thereof Controls |
| 01/19/2006 | DE102004030602A1 Paralleler Datenbus Parallel data bus |
| 01/19/2006 | DE102004027854A1 Testvorrichtung und Verfahren zum Testen von zu testenden Schaltungseinheiten A test device and method for testing the circuit under test units |
| 01/19/2006 | DE10125798B4 Abbildungssystem zur Positionierung einer Messspitze auf einen Kontaktbereich eines Mikrochips und ein Verfahren zur Darstellung An imaging system for positioning a probe tip on a contact area of a microchip and a method for displaying |
| 01/19/2006 | CA2561568A1 Qam signal analysis in a network |
| 01/18/2006 | EP1617468A1 Probe apparatus with optical length-measuring unit and probe testing method |
| 01/18/2006 | EP1617373A1 Optical surface inspection |
| 01/18/2006 | EP1617229A1 Voltage measurement device |
| 01/18/2006 | EP1616387A2 Input stage of a processing unit |
| 01/18/2006 | EP1616352A1 Helical microelectronic contact and method for fabricating same |
| 01/18/2006 | EP1616198A1 Method for identifying electrolyte stratification in a battery |
| 01/18/2006 | EP1218765B1 Wafer-level burn-in and test cartridge |
| 01/18/2006 | EP1125141B1 Device for and method of preventing bus contention |
| 01/18/2006 | EP1029249A4 Test head structure for integrated circuit tester |
| 01/18/2006 | CN2753097Y Control circuit for charging socket back light turning-on and turning-off |
| 01/18/2006 | CN2752809Y Bus layout structure for testing machine |
| 01/18/2006 | CN2752785Y Lithium ion cell safe testing device |
| 01/18/2006 | CN2752784Y Electric magnet coil magnetic force comprehensive parameter testing instrument |
| 01/18/2006 | CN2752783Y Grounding trouble tester for high-voltage electric line |
| 01/18/2006 | CN2752782Y DC electric machine rotor comprehensive testing instrument |
| 01/18/2006 | CN2752781Y Full-closed high voltage swith cubicle live line detactor |
| 01/18/2006 | CN2752775Y Signal generator of picture-tube screen quality inspection machine |
| 01/18/2006 | CN1723641A Integrated circuit comprising a transmission channel with an integrated independent tester. |
| 01/18/2006 | CN1723604A IC apparatus for monitoring power supply |
| 01/18/2006 | CN1723544A Fast localization of electrical failures on an integrated circuit system and method |
| 01/18/2006 | CN1723442A A logic analyzer and method thereof |
| 01/18/2006 | CN1723419A Resistor structures to electrically measure unidirectional misalignment of stitched masks |
| 01/18/2006 | CN1722948A Semiconductor apparatus and method of manufacturing semiconductor apparatus |
| 01/18/2006 | CN1722655A Cdr-based clock synthesis |
| 01/18/2006 | CN1722545A Socket for semiconductor device |
| 01/18/2006 | CN1722532A Contact tip structure for microelectronic interconnection elements |
| 01/18/2006 | CN1722402A Reversible integrated circuit disc and method using it |
| 01/18/2006 | CN1722307A Memory test circuit and method |
| 01/18/2006 | CN1722306A Method of testing a memory module and hub of the memory module |
| 01/18/2006 | CN1721869A Method and device for oriental insulating barrier in isolated offground AC network |
| 01/18/2006 | CN1721868A Substrate inspection device and substrate inspecting method |
| 01/18/2006 | CN1721867A Configurable prober for TFT LCD array test |
| 01/18/2006 | CN1721866A Ultracapacitor useful life prediction |
| 01/18/2006 | CN1721865A System for manufacturing display panel, method to be used in same, and testing apparatus therefor |
| 01/18/2006 | CN1721864A Display device testing system and method |
| 01/18/2006 | CN1721861A Probe apparatus manufacturing method thereof and substrate inspecting method using the same |
| 01/18/2006 | CN1721090A Electronic component handler |
| 01/18/2006 | CN1237853C 基板检测装置 Substrate detection apparatus |