Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2006
01/18/2006CN1237663C IC test socket
01/18/2006CN1237653C Method for replacing secondary cell
01/18/2006CN1237596C High temperature reliability measuring device and method for integrated semiconductor module
01/18/2006CN1237449C Method and apparatus for utilizing mux scan flip-flops to test speed related defects
01/18/2006CN1237348C Electronic conductivity testing method and manufacturing device of joint distributing comobination
01/18/2006CN1237264C An engine management system
01/17/2006US6988232 Method and apparatus for optimized parallel testing and access of electronic circuits
01/17/2006US6988231 On-chip method and apparatus for testing semiconductor circuits
01/17/2006US6988230 Test arrangement for assemblages of intergrated circuit blocks
01/17/2006US6988229 Method and apparatus for monitoring and controlling boundary scan enabled devices
01/17/2006US6988228 Configurable scan path structure
01/17/2006US6988207 Scan insertion testing of ASICs
01/17/2006US6988061 Operational verification for product safety testers
01/17/2006US6988053 Combined off-board device and starter/charging/battery system tester
01/17/2006US6988046 Test method of memory IC function on device board with dynamic competing cycle
01/17/2006US6988042 Method for detecting line-to-line fault location in power network
01/17/2006US6987894 Appearance inspection apparatus and method in which plural threads are processed in parallel
01/17/2006US6987771 Route optimization method and agent apparatus
01/17/2006US6987736 Router polling system and method
01/17/2006US6987732 Apparatus and methods for scheduling packets in a broadband data stream
01/17/2006US6987410 Clock recovery circuit and communication device
01/17/2006US6987400 Testing flat panel display plates using high frequency AC signals
01/17/2006US6987399 Systems and method for testing and recording temperatures of a CPU
01/17/2006US6987398 System for evaluating probing networks
01/17/2006US6987397 Method and probe structure for implementing a single probe location for multiple signals
01/17/2006US6987390 Method for testing a transformer and corresponding test device
01/17/2006US6987388 Digital measuring head
01/17/2006US6987387 Measurement value output device, measurement value monitoring device, current value output device and current monitoring device
01/17/2006US6987383 Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same
01/17/2006US6987382 System with functional and selector circuits connected by mode lead
01/17/2006US6987377 State-of-charge detector, program, method and charge-discharge control device utilizing rate of change of internal resistance
01/12/2006WO2006004829A2 Precise time measurement apparatus and method
01/12/2006WO2006004754A2 Lockstep mechanism to ensure security in hardware at power-up
01/12/2006WO2006004625A1 Method of detecting defects in tft-arrays and a tft-array testing system incorporating the same
01/12/2006WO2006003332A1 System for monitoring a group of electrochemical cells and device therefor
01/12/2006WO2006003287A1 Method for managing a rechargeable battery storage
01/12/2006WO2006003095A1 Arrangement for controlling a passenger protection means of a motor vehicle
01/12/2006US20060010360 Semiconductor testing apparatus and method of testing semiconductor
01/12/2006US20060009945 System and method for online specification of a system
01/12/2006US20060009944 Network-based system for selecting or purchasing hardware products
01/12/2006US20060009932 Harmonic diagnosing method for electric facility
01/12/2006US20060009931 Automated calibration of I/O over a multi-variable eye window
01/12/2006US20060008929 Method and apparatus for the improvement of material/voltage contrast
01/12/2006US20060008226 Fiber optic wafer probe
01/12/2006US20060008102 Method of programming a hearing aid by a programming device
01/12/2006US20060008063 System for providing flexible charging in a network
01/12/2006US20060007927 Transmission frame structure for control communication network of distributed control system for nuclear power plant
01/12/2006US20060007871 Systems, processes and integrated circuits for improved packet scheduling of media over packet
01/12/2006US20060007870 Collection of data at target wireless devices using data collection profiles
01/12/2006US20060007868 Access management method and access management server
01/12/2006US20060007867 Domain configuration in an ethernet OAM network having multiple levels
01/12/2006US20060007863 Signal propagation delay routing
01/12/2006US20060007862 Method and apparatus for managing packet data loss in a wireless network
01/12/2006US20060007861 Mechanism to support high speed circuit switched data services via an iu interface
01/12/2006US20060007860 Packet filtering methods and systems
01/12/2006US20060007858 Network traffic analyzer
01/12/2006US20060007853 Bus systems, apparatuses, and methods of operating a bus
01/12/2006US20060007852 Method for permanent redundant transmission of data messages in communication systems
01/12/2006US20060007828 Optical information device, optical storage medium, optical storage medium inspection device, and optical storage inspection method
01/12/2006US20060007739 Semiconductor device and test method thereof
01/12/2006US20060007606 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system
01/12/2006US20060007226 Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
01/12/2006US20060006899 Current sensing in a two-phase motor
01/12/2006US20060006898 Semiconductor device having a connection inspecting circuit for inspecting connection of power source terminals and grounding terminals, and inspection method for the same
01/12/2006US20060006897 Multiple two axis floating probe block assembly using split probe block
01/12/2006US20060006896 Parallel calibration system for a test device
01/12/2006US20060006895 "2-Step contact" clamping fixture for the flexible print circuit on a head gimbal assembly
01/12/2006US20060006894 Socket connection test modules and methods of using the same
01/12/2006US20060006893 Socket connection test modules and methods of using the same
01/12/2006US20060006892 Flexible test head internal interface
01/12/2006US20060006891 Method for testing non-componented circuit boards
01/12/2006US20060006890 Interconnect structure that controls spacing between a probe card and a contact substrate
01/12/2006US20060006889 Probe head having a membrane suspended probe
01/12/2006US20060006888 Electrochemically fabricated microprobes
01/12/2006US20060006887 Cantilever probe with dual plane fixture and probe apparatus therewith
01/12/2006US20060006886 Method and apparatus for diagnosing fault in semiconductor device
01/12/2006US20060006885 System and method for validating radio frequency identification tags
01/12/2006US20060006884 Anisotropic, conductive sheet and impedance measuring probe
01/12/2006US20060006879 Method of diagnosing a broken bar fault in an induction motor
01/12/2006US20060006878 Printed circuit card
01/12/2006US20060006876 Wireless battery tester/charger
01/12/2006US20060006859 Signal detection contactor and signal calibration system
01/12/2006US20060006419 Method of testing a memory module and hub of the memory module
01/12/2006US20060006383 Single and double-gate pseudo-FET devices for semiconductor materials evaluation
01/12/2006US20060006341 Stage apparatus
01/12/2006US20060005377 Fixing tool for quickly setting up a secure device
01/12/2006DE4221865B4 Sensor zum Auskoppeln von Teilentladungsimpulsen aus einer hochspannungsführenden elektrischen Anlage Sensor for extracting partial discharge pulses from a high-voltage electrical system
01/12/2006DE202005017817U1 Sprung contact pin with jacket sleeve, in which is contact element slidable axially against spring force, whose contact section protrudes from sleeve
01/12/2006DE19951214B4 Schaltungsanordnung zur Überwachung von Schmelzsicherungen in einer Schaltanlage sowie zugehöriges Anzeigegerät Circuit arrangement for monitoring fuses in switchgear and associated display device
01/12/2006DE19614506B4 Aufbau und Verfahren zur Auswertung von Signalzuständen in einem Sondenmeßnetzwerk Structure and method for evaluation of signal states in a Sondenmeßnetzwerk
01/12/2006DE112004000274T5 Erfassungsvorrichtung, Erfassungsverfahren und Programm Detection device, detection method and program
01/12/2006DE10312504B4 Verfahren zum Abschätzen des Lichtbogenabbrandes von Schaltkontakten A method for estimating the Lichtbogenabbrandes of switch contacts
01/12/2006DE10220172B4 Verfahren und Vorrichtung zur Überwachung des Betriebszustands einer elektrochemischen Vorrichtung Method and apparatus for monitoring the operating state of an electrochemical device
01/12/2006DE10024640B4 Verzögerungssignal-Erzeugungsvorrichtung und Halbleiterprüfvorrichtung Delay signal generating apparatus and semiconductor testing
01/12/2006CA2568266A1 System for monitoring a group of electrochemical cells and device therefor
01/11/2006EP1615043A1 Battery status monitoring apparatus and method
01/11/2006EP1615042A1 Checking method for cables of at least an electric motor
01/11/2006EP1614091A1 Control system and control method for checking the function of liquid crystal displays
01/11/2006EP1614043A2 Diagnostic data capture within an integrated circuit
01/11/2006EP1613972A1 Alarm recovery system and method for fuel cell testing systems