| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/06/2006 | WO2006008732A3 Apparatus and method for interconnect verification |
| 04/06/2006 | US20060075318 Self verifying communications testing |
| 04/06/2006 | US20060075317 Methods and apparatus for programming and operating automated test equipment |
| 04/06/2006 | US20060075316 Methods and apparatus for providing scan patterns to an electronic device |
| 04/06/2006 | US20060075315 Method and process for manufacturing test generation |
| 04/06/2006 | US20060074617 Inductance modeling |
| 04/06/2006 | US20060072273 Power supply device, test apparatus, and power supply voltage stabilizing device |
| 04/06/2006 | US20060071777 Measuring method for deciding direction to a flickering source |
| 04/06/2006 | US20060071682 Current measurement device and test device |
| 04/06/2006 | US20060071681 Semiconductor device characteristics measurement apparatus and connection apparatus |
| 04/06/2006 | US20060071680 Tester interface module |
| 04/06/2006 | US20060071679 System and method for the probing of a wafer |
| 04/06/2006 | US20060071678 Apparatus and methods for self-heating burn-in processes |
| 04/06/2006 | US20060071677 Flexible circuit with micro-sized probe tips and a method of making the same |
| 04/06/2006 | US20060071676 Non-destructive evaluation of microstructure and interface roughness of electrically conducting lines in semiconductor integrated circuits in deep sub-micron regime |
| 04/06/2006 | US20060071675 Loop impedance meter |
| 04/06/2006 | US20060071668 3D acoustic imaging using sensor array, longitudinal wave and algebraic reconstruction |
| 04/06/2006 | US20060071667 Method and system for measuring partial discharge |
| 04/06/2006 | US20060071666 Detection of pump cavitation/blockage and seal failure via current signature analysis |
| 04/06/2006 | US20060071656 Insert block for testing semiconductor device |
| 04/06/2006 | US20060071653 Integrated circuit testing methods using well bias modification |
| 04/06/2006 | US20060071548 Method and system for early detecting the defects of an electrically controlled brake system |
| 04/06/2006 | US20060071209 Biopolymer resonant tunneling with a gate voltage source |
| 04/06/2006 | DE4200404B4 Vorrichtung zur elektrischen Prüfung und Verfahren Apparatus for electrical testing and procedure |
| 04/06/2006 | DE102004049153A1 Main conductor for a device like a battery sensor for detecting electric capacities routes a load current between a source of electric energy and electric consumers |
| 04/06/2006 | DE102004048004A1 Bewertungsgleichrichter für Pulsstörungen Review rectifier for pulse interference |
| 04/06/2006 | DE102004047511A1 Testvorrichtung und Verfahren zum Testen von Analog-Digital-Wandlern A test device and method for testing analog-to-digital converters |
| 04/06/2006 | DE102004046800A1 Verfahren zum Testen eines Kontaktbereichs eines Halbleitermoduls A method of testing a contact region of a semiconductor module |
| 04/06/2006 | DE102004045990A1 Testing screened cable involves applying alternating voltage applied between core and screen of cable, assessing measurement signal for cable damage |
| 04/06/2006 | DE102004040196B3 Logic circuit for simultaneous processing of functional data and test data in data group uses two identical signal state stores and data is transmitted over two separate paths |
| 04/05/2006 | EP1643509A1 Semiconductor test device and control method thereof |
| 04/05/2006 | EP1643397A1 Load current evaluation device, load current evaluation method, and recording medium containing load current evaluation program |
| 04/05/2006 | EP1643260A1 Charging rate estimating method, charging rate estimating unit and battery system |
| 04/05/2006 | EP1643259A1 Method and device for detecting touching points on rotating machines |
| 04/05/2006 | EP1643258A1 Pattern identification and bit level measurements on repetitive patterns |
| 04/05/2006 | EP1643257A1 Scan test design method, scan test circuit, scan test circuit insertion cad program, large-scale integrated circuit, and mobile digital device |
| 04/05/2006 | EP1642393A2 Autonomous data path verification in multi-module shelf configuration |
| 04/05/2006 | EP1642323A2 Wafer inspection device |
| 04/05/2006 | EP1642147A1 Device for monitoring and charging of a selected group of battery cells |
| 04/05/2006 | EP1642146A2 Method for predicting the residual service life of an electric energy accumulator |
| 04/05/2006 | EP1642145A2 Apparatus and method for electromechanical testing and validation of probe cards |
| 04/05/2006 | EP1642143A1 Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
| 04/05/2006 | EP1642142A1 Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
| 04/05/2006 | EP1088240B1 Method of and apparatus for measuring battery capacity |
| 04/05/2006 | CN2769900Y Accumulator battery on-line monitoring system |
| 04/05/2006 | CN2769899Y Portable battery tester |
| 04/05/2006 | CN2769898Y Portable battery tester |
| 04/05/2006 | CN2769897Y Pulse electronic loading tester |
| 04/05/2006 | CN2769896Y High-precision splitting registrating apparatus for infrared circuit fault detector |
| 04/05/2006 | CN2769895Y Automatic recording device for on-line industrial equipment operating data and fault data |
| 04/05/2006 | CN1757150A Method and device for treating signals for detection of stator and rotor errors in magnetic circuits in a synchronous machine |
| 04/05/2006 | CN1757139A Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 04/05/2006 | CN1756963A Apparatus and method for charging battery cells |
| 04/05/2006 | CN1756962A Automatically detecting and routing of test signals |
| 04/05/2006 | CN1756961A Apparatus and method for cooling optically probed integrated circuits |
| 04/05/2006 | CN1756960A Test device and test method |
| 04/05/2006 | CN1756082A Phase-locked-loop dither signal detection circuit device and its operating method |
| 04/05/2006 | CN1756018A Device and method for limiting energy in wiring faults and method for confirming electrical system safety |
| 04/05/2006 | CN1755977A Method for detecting state of secondary battery and device for detecting state of second battery |
| 04/05/2006 | CN1755910A Wafer measuring system |
| 04/05/2006 | CN1755834A Semiconductor memory device, test circuit and test method |
| 04/05/2006 | CN1755386A Circuit for detecting voltage and frequency of input power supply |
| 04/05/2006 | CN1755385A Overcharge/overdischarge detection apparatus, overcharge/overdischarge detection circuit, and semiconductor apparatus |
| 04/05/2006 | CN1755384A Method for detecting current of inverter of brushless DC motor |
| 04/05/2006 | CN1755383A Cross and sequent test interface device for low voltage differential signal |
| 04/05/2006 | CN1755382A Automobile tyre pressure monitoring display system with exciter and its constituent part |
| 04/05/2006 | CN1755381A Electronic apparatus aging method based on heat radiator |
| 04/05/2006 | CN1755380A Module recognition method and apparatus |
| 04/05/2006 | CN1755379A Method for burn-in test and measurement program for burn-in test |
| 04/05/2006 | CN1755378A Electronic device connectivity analysis methods and systems |
| 04/05/2006 | CN1755374A Circuit board testing jig |
| 04/05/2006 | CN1249447C Low cost CMOS tester with high channel density |
| 04/05/2006 | CN1249446C Display device comprising plurality of LEDs and measuring method thereof |
| 04/05/2006 | CN1249445C Weighted random pattern test using pre-stored weights |
| 04/05/2006 | CN1249398C Method for measuring tunnelling current between elongate conductors |
| 04/04/2006 | US7024642 Extraction method of defect density and size distributions |
| 04/04/2006 | US7024607 DVI link with parallel test data |
| 04/04/2006 | US7024606 Method of generating test pattern for integrated circuit |
| 04/04/2006 | US7024605 Flip-flop and scan path circuit |
| 04/04/2006 | US7024604 Process for manufacturing semiconductor device |
| 04/04/2006 | US7024602 Transmission format detection method |
| 04/04/2006 | US7024601 DVI link with circuit and method for test |
| 04/04/2006 | US7024600 Diagnosis of data transfer faults using constraints |
| 04/04/2006 | US7024596 Efficient address generation for interleaver and de-interleaver |
| 04/04/2006 | US7024589 Reducing the complexity of finite state machine test generation using combinatorial designs |
| 04/04/2006 | US7024347 Transaction conflict testing method and apparatus |
| 04/04/2006 | US7024330 Method and apparatus for decreasing automatic test equipment setup time |
| 04/04/2006 | US7024329 Method and apparatus for testing PCBA subcomponents |
| 04/04/2006 | US7024328 Systems and methods for non-intrusive testing of signals between circuits |
| 04/04/2006 | US7024327 Techniques for automatically generating tests for programmable circuits |
| 04/04/2006 | US7024322 Dynamic waveform resource management |
| 04/04/2006 | US7024321 Battery monitoring system with low power and end-of-life messaging and shutdown |
| 04/04/2006 | US7024320 Method and system for determining the position of a short circuit in a branched wiring system |
| 04/04/2006 | US7023817 Method and apparatus for source device synchronization in a communication system |
| 04/04/2006 | US7023810 Decoding using redundant packet selection information in wireless communications systems |
| 04/04/2006 | US7023809 Intelligent concentrator usage |
| 04/04/2006 | US7023803 Apparatus, and associated method, for selectably controlling packet data flow in a packet radio communication system |
| 04/04/2006 | US7023800 Congestion avoidance within aggregate channels |
| 04/04/2006 | US7023798 Adaptive call admission control for use in a wireless communication system |
| 04/04/2006 | US7023796 Method for identifying the current route of paths in telecommunications MS-SPRINGS |