Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2006
04/13/2006DE10249921B4 Verfahren zur Ermittlung des Verlustes an Speicherkapazität einer Bleibatterie und Überwachungseinrichtung Method for determining the loss of storage capacity of a lead battery and monitoring device
04/13/2006DE102004047632A1 ONE-HOT-kodiertes Befehlsregister für Boundary-Scan-Test-kompatible Geräte ONE-HOT-coded instruction register for boundary scan test-compatible devices
04/13/2006DE102004046855B3 Batteriepolklemmenanordnung Batteriepolklemmenanordnung
04/13/2006DE102004043050A1 Loop-back-Verfahren zur Vermessung des Interface-Timings von Halbleitervorrichtungen mit Hilfe von Signaturen und/oder Paritätsverfahren Loop-back method for measuring timing of the interface of semiconductor devices using signatures and / or parity method
04/13/2006DE10105251B4 Elektronisches Bauteil, Testkonfiguration und Verfahren zum Test von Anschlüssen elektronischer Bauteile auf einer Leiterplatte An electronic component test configuration and method for testing of terminals of electronic components on a circuit board
04/13/2006DE10041607B4 Elektrisches Arbeitsgerät sowie Verfahren zu dessen Betreiben Electrical work device and method of operation
04/13/2006DE10034308B4 Antennenkoppler für Antennensignalmessungen Antenna for antenna signal measurements
04/13/2006DE10018206B4 Verfahren und seine Verwendung zur Fehlersimulation in einer elektrischen Baugruppe The method and its use for fault simulation in an electrical assembly
04/13/2006CA2576916A1 Method and device for detecting electric arc phenomenon on at least one electric cable
04/12/2006EP1646101A2 Method of monitoring the operational state of a fuel cell stack
04/12/2006EP1645887A2 Instrument for detecting and analysing partial discharges in electrical machines
04/12/2006EP1645318A2 Gas-collecting unit, test head, and ic device testing apparatus
04/12/2006EP1644749A1 Sensor unit for an on-board network of a motor vehicle, and method for the production of a sensor unit
04/12/2006EP1644748A2 Signal integrity self-test architecture
04/12/2006EP1644747A1 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts
04/12/2006EP1479025A4 Methods and apparatus for semiconductor testing
04/12/2006EP1275969B1 Circuit for detecting leakage in power supply
04/12/2006EP1155519B1 Electro-optic interface system and method of operation
04/12/2006CN2771874Y Device for detecting cell combined cap
04/12/2006CN2771873Y Non-direct earthing system arc earthing failure point detecting device for three-phase power grid
04/12/2006CN2771872Y Safety unit on-line measuring control box
04/12/2006CN2771870Y Intelligent aluminium foil TV characteristic measuring instrument
04/12/2006CN1759325A Laminated core testing device
04/12/2006CN1759324A Method and apparatus for source device synchronization in a communication system
04/12/2006CN1759323A Method and apparatus for adaptive processing gain for multiple source devices in a communications system
04/12/2006CN1758067A Measuring system of fluorescent lamp high frequency standard and its method
04/12/2006CN1758066A Method for monitoring the operational state of a fuel cell stack
04/12/2006CN1758065A Semiconductor laser measuring device parameter
04/12/2006CN1758064A Method and apparatus for measuring transfer characteristics of a semiconductor device
04/12/2006CN1758063A Apparatus and method for detecting a short of a battery connector
04/12/2006CN1758062A Detecting device
04/12/2006CN1251402C Oscillator characteristics testing method
04/12/2006CN1251326C Method for verification circuit device and manufacturing method for integrated circuit device
04/12/2006CN1251320C Semiconductor circuit device and semiconductor device
04/12/2006CN1251319C Microelectronic component insert making method
04/12/2006CN1251244C Method for built-in self-test of electronic circuit
04/12/2006CN1251080C Method for calibrating semiconductor test instrument
04/12/2006CN1250980C Method and apparatus for automotive battery testing
04/12/2006CN1250979C Method for timing and interlinkage system for calibrating an integrated circuit tester
04/12/2006CN1250978C Passive earth detecting method for main circuit of ac-dc electric locomotive
04/12/2006CN1250977C Electric power on/off module
04/11/2006US7028279 Circuit verification
04/11/2006US7028240 Diagnostic mode for testing functionality of BIST (built-in-self-test) back-end state machine
04/11/2006US7028239 Microprocessor on-chip testing architecture and implementation
04/11/2006US7028238 Input/output characterization chain for an integrated circuit
04/11/2006US7028237 Internal bus testing device and method
04/11/2006US7028235 Test method and test circuit for electronic device
04/11/2006US7028146 Method of verifying a system in which a plurality of master devices share a storage region
04/11/2006US7028123 Microcomputer, has selection circuit to select either testing-purpose interrupt request signal or interrupt request selection signal based on delayed selection signal, where selected signals are sent to interrupt controller
04/11/2006US7028087 Network documentation system with electronic modules
04/11/2006US7027971 Centralized disablement of instrumentation events within a batch simulation farm network
04/11/2006US7027957 Current interrupter assembly
04/11/2006US7027948 Testing apparatus, method of controlling the same, and program for implementing the method
04/11/2006US7027947 Integrated circuit testing method, program, storing medium, and apparatus
04/11/2006US7027946 Broadside compare with retest on fail
04/11/2006US7027945 Method of self-calibration of pulse rise and fall times
04/11/2006US7027939 Method and circuit for detecting a fault of semiconductor circuit elements and use thereof in electronic regulators of braking force and of dynamics movement of vehicles
04/11/2006US7027938 Packaging for dynamoelectric machine diagnostic system
04/11/2006US7027937 Methods and systems for testing wire insulation
04/11/2006US7027731 User-constrained optical route flooding system and method
04/11/2006US7027637 Adaptive threshold determination for ball grid array component modeling
04/11/2006US7027450 Frame batching and compression for IP transmission
04/11/2006US7027449 Method for maintaining reservation state in a network router and resulting scalable integrated architectures for computer networks
04/11/2006US7027410 Method and apparatus for maintaining consistent per-hop forwarding behavior in a network using network-wide per-hop behavior definitions
04/11/2006US7027407 Method and device for robust fallback in data communication systems
04/11/2006US7027405 System and method for broadband analysis of telephone local loop
04/11/2006US7027401 Devices with window-time-space flow control (WTFC)
04/11/2006US7027393 TCP optimized single rate policer
04/11/2006US7027392 Method and apparatus for scheduling packet data transmissions in a wireless communication system
04/11/2006US7027387 Vehicle active network with data redundancy
04/11/2006US7026865 Analogue amplifier with multiplexing capability
04/11/2006US7026844 Sensor signal detection device
04/11/2006US7026838 Versatile system for accelerated stress characterization of semiconductor device structures
04/11/2006US7026837 Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer
04/11/2006US7026836 Method and apparatus for testing a wafer using a laser beam wavelength that does not generate photovoltage by excitation
04/11/2006US7026835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad
04/11/2006US7026834 Multiple two axis floating probe block assembly using split probe block
04/11/2006US7026833 Multiple-chip probe and universal tester contact assemblage
04/11/2006US7026832 Probe mark reading device and probe mark reading method
04/11/2006US7026831 Method and device for measuring the diffusion length of minority carriers in a semiconductor sample
04/11/2006US7026830 Method and apparatus for inspecting integrated circuit pattern
04/11/2006US7026825 Cable tester
04/11/2006US7026823 Magnetic head smear detecting method and device
04/11/2006US7026822 High voltage switching matrix for electrical safety compliance test equipment
04/11/2006US7026821 Testing MEM device array
04/11/2006US7026807 Power measurement system
04/11/2006US7026806 Apparatus for preventing cross talk and interference in semiconductor devices during test
04/11/2006US7026803 Hand-held, ergonomic capacitive amplifier and hand-held tone generator to be used in conjunction with the capacitive amplifier
04/11/2006US7026788 Battery leakage detection circuit for electric vehicle and leakage detection method for electric vehicle
04/11/2006US7026787 Method and device for determining the starting capability of a vehicle
04/11/2006US7026646 Isolation circuit
04/11/2006US7025600 Semiconductor device having external contact terminals and method for using the same
04/06/2006WO2006036494A2 Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer
04/06/2006WO2006035654A1 Power supply apparatus and testing apparatus
04/06/2006WO2006035647A1 Waveform shaping circuit and semiconductor testing apparatus having that waveform shaping circuit
04/06/2006WO2006035644A1 Electronic circuit testing apparatus
04/06/2006WO2006035604A1 Current consumption balance circuit, compensation current amount adjusting method, timing generator, and semiconductor testing apparatus
04/06/2006WO2006035365A2 Charging method and circuit using indirect current sensing
04/06/2006WO2006035330A2 Integrated circuit with input and/or output bolton pads with integrated logic.
04/06/2006WO2006034897A1 Battery pole terminal system