| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 04/19/2006 | CN1252483C BIST method for testing cut-off frequency of low-pass filters |
| 04/19/2006 | CN1252482C Method for testing internal capacitance of integrated circuit using CR circuit |
| 04/18/2006 | US7032202 System and method for implementing a flexible top level scan architecture using a partitioning algorithm to balance the scan chains |
| 04/18/2006 | US7032197 System and method for executing image computation associated with a target circuit |
| 04/18/2006 | US7032196 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 04/18/2006 | US7032151 Systems and methods for testing integrated circuits |
| 04/18/2006 | US7032150 Method and apparatus for measuring group delay of a device under test |
| 04/18/2006 | US7032149 Apparatus and method for adapting a level sensitive device to produce edge-triggered behavior |
| 04/18/2006 | US7032148 Mask network design for scan-based integrated circuits |
| 04/18/2006 | US7032147 Boundary scan circuit |
| 04/18/2006 | US7032146 Boundary scan apparatus and interconnect test method |
| 04/18/2006 | US7032145 System for dynamic re-allocation of test pattern data for parallel and serial test data patterns |
| 04/18/2006 | US7032144 Method and apparatus for testing multi-port memories |
| 04/18/2006 | US7032141 Semiconductor device including test-facilitating circuit using built-in self test circuit |
| 04/18/2006 | US7032134 Microprocessor design support for computer system and platform validation |
| 04/18/2006 | US7031882 Information collecting apparatus and information collecting/analyzing system |
| 04/18/2006 | US7031868 Method and apparatus for performing testing of interconnections |
| 04/18/2006 | US7031867 Methods and apparatus for identifying test number collisions |
| 04/18/2006 | US7031866 System and method for testing a memory |
| 04/18/2006 | US7031864 Semiconductor device having a mode of functional test |
| 04/18/2006 | US7031856 Automatic wire dielectric analyzer |
| 04/18/2006 | US7031853 Insulation verification system, insulation verification method, and storage medium |
| 04/18/2006 | US7031313 Packet transfer apparatus with the function of flow detection and flow management method |
| 04/18/2006 | US7031261 Method and apparatus for egress channel architecture that supports protection within SONET/SDH based networks |
| 04/18/2006 | US7031260 Central management apparatus and management system |
| 04/18/2006 | US7031258 Digital data system with link level message flow control |
| 04/18/2006 | US7031253 Method and apparatus for computing a path through specified elements in a network |
| 04/18/2006 | US7031210 Method of measuring threshold voltage for a NAND flash memory device |
| 04/18/2006 | US7031208 Semiconductor memory device |
| 04/18/2006 | US7031190 Structure for testing NAND flash memory and method of testing NAND flash memory |
| 04/18/2006 | US7030977 Non-contact optical system for production testing of electronic assemblies |
| 04/18/2006 | US7030642 Quick attachment fixture and power card for diode-based light devices |
| 04/18/2006 | US7030641 Programmable fuse state determination system and method |
| 04/18/2006 | US7030640 Integrated circuit (IC) test assembly including phase change material for stabilizing temperature during stress testing of integrated circuits and method thereof |
| 04/18/2006 | US7030639 Semiconductor apparatus including a switch element and resistance element connected in series |
| 04/18/2006 | US7030638 Method and device with variable resilience springs for testing integrated circuit packages |
| 04/18/2006 | US7030637 Semiconductor device for adjusting threshold value shift due to short channel effect |
| 04/18/2006 | US7030636 Low pin testing system |
| 04/18/2006 | US7030635 Device for measuring supply voltage and method thereof |
| 04/18/2006 | US7030634 Characteristic measuring apparatus for electronic components |
| 04/18/2006 | US7030633 Four-terminal methods for resistivity measurement of semiconducting materials |
| 04/18/2006 | US7030632 Compliant contract structures, contactor cards and test system including same |
| 04/18/2006 | US7030624 Electrical circuit tester |
| 04/18/2006 | US7030623 Electrical short tracing apparatus and method |
| 04/18/2006 | US7030622 Bonding configuration structure for facilitating electrical testing in a bonding process and a testing method using the same |
| 04/18/2006 | US7030621 Low current AC partial discharge diagnostic system for wiring diagnostics |
| 04/18/2006 | US7030618 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 04/18/2006 | US7030602 Testing of current transformers |
| 04/18/2006 | US7030601 Circuit configuration for a gradometric current sensor with a bridge circuit for measuring gradients of magnetic field strength and a sensor equipped with this circuit configuration |
| 04/18/2006 | US7030599 Hand held voltage detection probe |
| 04/18/2006 | US7030452 Atomic-scale contacts and gaps are useful as a variety of nanosensors including chemical sensors, biosensors, hydrogen ion sensors, heavy metal ion sensors, magnetoresistive sensors, and molecular switches |
| 04/18/2006 | US7030438 Semiconductor integrated circuit |
| 04/18/2006 | US7030394 Charged particle beam apparatus and automatic astigmatism adjustment method |
| 04/18/2006 | US7029933 Method for monitoring ion implant doses |
| 04/18/2006 | US7029594 Plasma processing method |
| 04/18/2006 | US7028398 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor |
| 04/18/2006 | CA2487096A1 Prioritized interrupt for waveform measurement |
| 04/18/2006 | CA2438240C Detecting a bridge tap or end-of-line of a telephone line using time-domain reflectometry |
| 04/13/2006 | WO2006039653A1 Tester interface module |
| 04/13/2006 | WO2006039637A1 Assertion checking in integrated circuits |
| 04/13/2006 | WO2006039581A2 Electrical safety cord |
| 04/13/2006 | WO2006039395A2 Method for testing semiconductor devices and an apparatus therefor |
| 04/13/2006 | WO2006037881A1 Method and installation for analyzing an integrated circuit |
| 04/13/2006 | WO2006037874A1 Method and device for detecting electric arc phenomenon on at least one electric cable |
| 04/13/2006 | WO2006018473A3 Arrangement in an electrical machine |
| 04/13/2006 | WO2006008337A8 Pressure testing apparatus and method for pressure testing |
| 04/13/2006 | WO2006000461A3 Docking drive, locking element, docking system |
| 04/13/2006 | WO2005122208A3 Charged particle beam device with retarding field analyzer |
| 04/13/2006 | WO2005117246A3 Method and device for determining the mechanical load of an alternating current synchronous electric motor with a permanent magnet rotor |
| 04/13/2006 | WO2005020297A3 Technique for evaluating a fabrication of a semiconductor component and wafer |
| 04/13/2006 | US20060080585 Systems and methods for circuit testing using LBIST |
| 04/13/2006 | US20060080584 Built-in self-test system and method for an integrated circuit |
| 04/13/2006 | US20060080583 Store scan data in trace arrays for on-board software access |
| 04/13/2006 | US20060080582 Semiconductor test management system and method |
| 04/13/2006 | US20060080058 Built-in self test for memory interconnect testing |
| 04/13/2006 | US20060079058 Method for inspecting semiconductor device |
| 04/13/2006 | US20060077397 Semiconductor fabricating apparatus with function of determining etching processing state |
| 04/13/2006 | US20060076973 Test apparatus and test method |
| 04/13/2006 | US20060076972 Reliability circuit for applying an AC stress signal or DC measurement to a transistor device |
| 04/13/2006 | US20060076971 System and method for accurate negative bias temperature instability characterization |
| 04/13/2006 | US20060076970 Test apparatus, test method, electronic device, and electronic device manufacturing method |
| 04/13/2006 | US20060076969 Current switch and method of driving the same |
| 04/13/2006 | US20060076968 Probe, printed circuit board testing device and printed circuit board testing method |
| 04/13/2006 | US20060076967 Membrane with bumps, method of manufacturing the same, and method of testing electrical circuit |
| 04/13/2006 | US20060076966 Probe card and contactor of the same |
| 04/13/2006 | US20060076965 Contact-free test system for semiconductor device |
| 04/13/2006 | US20060076961 Test fixture for assembled wireless devices |
| 04/13/2006 | US20060076960 Capacitive sensor measurement method for discrete time sampled system for in-circuit test |
| 04/13/2006 | US20060076959 Capacitive sensor measurement method for discrete time sampled system for in-circuit test |
| 04/13/2006 | US20060076958 Protective relay test device |
| 04/13/2006 | US20060076490 Inspection method and inspection apparatus using electron beam |
| 04/13/2006 | DE60203032T2 Integrierte Halbleiterschaltung A semiconductor integrated circuit |
| 04/13/2006 | DE4426538B4 Treiberschaltung und Verfahren zum Betreiben einer Treiberschaltung Driver circuit and method of operating a driver circuit |
| 04/13/2006 | DE4406674B4 Verfahren zum Prüfen einer Elektrodenplatte A method of testing an electrode plate |
| 04/13/2006 | DE4302482B4 Verfahren zur Prüfung eines elektronischen Steuergerätes mit Hilfe eines externen Diagnosegerätes A method for testing an electronic control device using an external diagnostic device |
| 04/13/2006 | DE19946738B4 Vorrichtung und Verfahren zum Prüfen von elektrischen Verbindungen an einer Schaltungsplatine Apparatus and method for inspecting electrical connections to a circuit board |
| 04/13/2006 | DE19719181B4 Programmierbare Sicherungsschaltung und Verwendung derselben Programmable fuse circuit and using the same |
| 04/13/2006 | DE19704763B4 Verfahren und Einrichtung zur Feststellung der Emission einer hochfrequenter elektromagnetischen Störstrahlung innerhalb des Innenraums einer für elektromagnetische Strahlung überwiegend schlecht durchlässigen Luftfahrzeughülle Method and apparatus for determining the emission of a high-frequency electromagnetic interference within the interior of electromagnetic radiation predominantly poorly drained aircraft shell |
| 04/13/2006 | DE10326086B4 Verfahren und Justiermarken zur Positionierung eines Messkopfes auf einer Leiterplatte A method for positioning and alignment of a measuring head on a printed board |
| 04/13/2006 | DE10297714T5 Prüfgerät für elektronische Bauelemente An electronic component tester |