| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/25/2006 | US7032288 Methods for magnetically establishing an electrical connection with a contact of a semiconductor device component |
| 04/25/2006 | CA2398577C Apparatus and method for calibrating an engine management system |
| 04/20/2006 | WO2006041064A1 Test device, test method, electronic device, and device manufacturing method |
| 04/20/2006 | WO2006041063A1 Timing generator and testing apparatus |
| 04/20/2006 | WO2006041059A1 Test device, test method, and electronic device |
| 04/20/2006 | WO2006041052A1 Microcomputer and its lssd scan test method |
| 04/20/2006 | WO2006039913A1 Measuring device for analysis of memory effects in electronic components |
| 04/20/2006 | WO2006039902A1 Shielding housing and sealing device for the same |
| 04/20/2006 | WO2006039808A1 Non-intrusive or not very intrusive method for detecting stator defects by temperature measurements |
| 04/20/2006 | WO2005114241A3 Method and structure to develop a test program for semiconductor integrated circuits |
| 04/20/2006 | WO2005114235A3 Method and structure to develop a test program for semiconductor integrated circuits |
| 04/20/2006 | US20060085716 Cooperating test triggers |
| 04/20/2006 | US20060085714 Method and circuit for measuring capacitance and capacitance mismatch |
| 04/20/2006 | US20060085713 Apparatus, method, and signal-bearing medium embodying a program for verifying logic circuit design |
| 04/20/2006 | US20060085712 Program, test apparatus and testing method |
| 04/20/2006 | US20060085711 Memory test circuit and method |
| 04/20/2006 | US20060085710 Testing memories |
| 04/20/2006 | US20060085709 Flip flop circuit & same with scan function |
| 04/20/2006 | US20060085708 Transition fault detection register with extended shift mode |
| 04/20/2006 | US20060085707 High speed energy conserving scan architecture |
| 04/20/2006 | US20060085706 High speed on chip testing |
| 04/20/2006 | US20060085167 Performance monitor for a photovoltaic supply |
| 04/20/2006 | US20060085155 Methods and apparatus for local outlier detection |
| 04/20/2006 | US20060085146 Dynamic energy threshold calculation for high impedance fault detection |
| 04/20/2006 | US20060084290 Manual testing instrument |
| 04/20/2006 | US20060083517 Optical sub-assembly having a thermo-electric cooler and an optical transceiver using the optical sub-assembly |
| 04/20/2006 | US20060083086 Memory circuit with redundant memory cell array allowing simplified shipment tests and reduced power consumptions |
| 04/20/2006 | US20060083063 Memory devices with page buffer having dual registers and method of using the same |
| 04/20/2006 | US20060082446 Label applicator system |
| 04/20/2006 | US20060082380 Inspection probe, method for preparing the same, and method for inspecting elements |
| 04/20/2006 | US20060082379 Parallel, individually addressable probes for nanolithography |
| 04/20/2006 | US20060082378 Test system for device characterization |
| 04/20/2006 | US20060082377 Apparatus and method for communications testing |
| 04/20/2006 | US20060082376 Integrated fault detector circuit |
| 04/20/2006 | US20060082359 Precision measurement unit having voltage and/or current clamp power down upon setting reversal |
| 04/20/2006 | US20060082358 Interface apparatus for semiconductor device tester |
| 04/20/2006 | US20060081971 Signal transfer methods for integrated circuits |
| 04/20/2006 | US20060081701 Method and apparatus for verifying connectivity of an instrumentation system |
| 04/20/2006 | US20060081583 Method and process of contact to a heat softened solder ball array |
| 04/20/2006 | US20060081469 Battery pack of a mobile communication terminal to be capable of reading output of bio-sensors and self-diagnosis system |
| 04/20/2006 | DE202006002914U1 Electrical printed circuit board testing device, has testing circuit with DIAC that is attached to end of conductor path of board by light emitting diode, and another light emitting diode connected between DIAC and switching transistor |
| 04/20/2006 | DE19922082B4 Bauelementegeometrie-unabhängige Vorrichtung zum Testen elektronischer Bauelemente mit verschiebbarem Kontaktmittel Components geometry-independent device for testing electronic components with movable contact means |
| 04/20/2006 | DE19654995B4 Electromagnetic field strength calculation device - includes calculation unit for electric current distribution to obtain electric earthing current distribution of earthing layer |
| 04/20/2006 | DE19618897B4 Schaltungsanordnung zur Bestimmung des Isolationswiderstandes einer Akkumulatorenbatterie Circuit arrangement for determining the insulation resistance of a battery of accumulators |
| 04/20/2006 | DE19542989B4 Anordnung zum Erkennen von Drahtunterbrüchen und/oder von Drahtkurzschlüssen in einer Halbleiterschaltung Arrangement for detecting interruptions of wire and / or wire of short circuits in a semiconductor circuit |
| 04/20/2006 | DE19520825B4 Hochspannungskabelanlage mit ausgekreuzten Kabelmänteln High voltage cable system to be crossed cable sheaths |
| 04/20/2006 | DE19512144B4 Automatische Transportvorrichtung mit einem Anschlagmechanismus zum Positionieren von Prüftabletts Automatic transport device with a stop mechanism for positioning Prüftabletts |
| 04/20/2006 | DE10338678B4 Vorrichtung und Verfahren zum Testen von zu testenden Schaltungseinheiten Apparatus and method for testing the circuit under test units |
| 04/20/2006 | DE10330330B4 Verfahren und Vorrichtung zur Pfüfung der Isolierung eines strangförmigen Leiters Method and apparatus for the isolation of a Pfüfung strand-shaped conductor |
| 04/20/2006 | DE102005026403A1 Verfahren und Vorrichtungen zum Liefern von Abtastmustern zu einer elektronischen Vorrichtung Methods and apparatus for providing scanning patterns to an electronic device |
| 04/20/2006 | DE102005004608B3 Method of checking electrical contacts between output pins of power circuits of power circuit device and external node between device and load |
| 04/20/2006 | DE102004050463B3 Testsystem für Solarzellen Test system for solar cells |
| 04/20/2006 | DE102004047633A1 Auf Umkehrung basierte Stimuluserzeugnis für die Bauteilprüfung On reversal stimulus based product for component testing |
| 04/20/2006 | DE102004047153A1 Circuit arrangement for controlling antenna diversity system for motor vehicle detects value below threshold by measuring intermediate frequency line d.c. current, checking for status information reception to distinguish from open circuit |
| 04/20/2006 | DE102004033127B3 Test circuit for determining electrical parameter of accumulator battery has clamp engaging battery terminal and precision resistor between connectors connected to evaluation circuits |
| 04/20/2006 | CA2583281A1 Non-intrusive method for extrapolating an internal stator temperature |
| 04/19/2006 | EP1648048A2 Method for optimizing the cyclelife of traction batteries |
| 04/19/2006 | EP1647828A1 Automatic fault-testing of logic blocks using internal at-speed logic-BIST |
| 04/19/2006 | EP1647827A1 Test system for solar cells |
| 04/19/2006 | EP1646883A1 Ic with on-board characterization unit |
| 04/19/2006 | EP1646882A1 Integrated circuit with bit error test capability |
| 04/19/2006 | EP1646879A2 Apparatus and method for electrical cable identification |
| 04/19/2006 | EP1476765B1 Radio frequency power generation and power measurement |
| 04/19/2006 | CN2773711Y Multifunctional standard source automatic testing system |
| 04/19/2006 | CN2773710Y Big-current discharging detector of lithium ion battery set |
| 04/19/2006 | CN2773709Y Voltage inspecting and monitoring device for large-scale integrated fuel cell |
| 04/19/2006 | CN2773708Y Periodic inspection experimental device of gas relay |
| 04/19/2006 | CN2773707Y Small circuit breaker reliability experimental instrument |
| 04/19/2006 | CN2773706Y A/DC high-voltage insulator passive inspector |
| 04/19/2006 | CN2773705Y Antenna connecting line inspector |
| 04/19/2006 | CN2773704Y Overhead grounded short-circuit fault indicator |
| 04/19/2006 | CN2773703Y Power-off alarming device |
| 04/19/2006 | CN2773702Y Switch fault deteting controller of compensated capacitance |
| 04/19/2006 | CN2773701Y Ultra-low frequency high-voltage generator |
| 04/19/2006 | CN2773700Y Transformer experimental apparatus |
| 04/19/2006 | CN2773698Y Insulating resistance tester of 30 loop thin-membrane capacitor |
| 04/19/2006 | CN2773690Y Detector for display panel examination and experimental device thereof |
| 04/19/2006 | CN2773658Y Test-bed for speed adjuster |
| 04/19/2006 | CN2773653Y Vacuum leakage inspector for fuel battery flow-guiding polar plate |
| 04/19/2006 | CN2773627Y Shell of power transmission line on-line monitor |
| 04/19/2006 | CN1762051A Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 04/19/2006 | CN1761886A Calibration method for system performance validation of automatic test equipment |
| 04/19/2006 | CN1761885A Test device and setting method |
| 04/19/2006 | CN1761884A Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments |
| 04/19/2006 | CN1761883A Method for testing empty printed circuit boards |
| 04/19/2006 | CN1760691A Method of detecting state-of-charge of battery and power device |
| 04/19/2006 | CN1760690A Set for automatic generating signal of push button key |
| 04/19/2006 | CN1760689A Integrated circuit test device |
| 04/19/2006 | CN1760688A Automatic system and method for testing optical character of luminous element |
| 04/19/2006 | CN1760687A Test fixture in high frequency measuring chip of laser in structure of monocoplanar electrode |
| 04/19/2006 | CN1760686A Method for checking out phase handling unit (PHU) in site |
| 04/19/2006 | CN1760685A TFT measuring method |
| 04/19/2006 | CN1760684A Method for testing sound quantity of portable audio player |
| 04/19/2006 | CN1760679A Test desk for high frequency characteristics of semiconductor laser chip with noncoplanar electrode |
| 04/19/2006 | CN1760678A Clamp for device of testing electrical properties of faceplate |
| 04/19/2006 | CN1252966C Network testing instrument |
| 04/19/2006 | CN1252807C Apparatus for testing integrated module and method for operating the testing device |
| 04/19/2006 | CN1252730C Storage circuit with test compression function |
| 04/19/2006 | CN1252724C Self-detecting of magnetic-resistance memory array |
| 04/19/2006 | CN1252484C Integrated circuit |