| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/26/2006 | EP1570280B1 Self-marking device for an integrated circuit, and associated housed integrated circuit |
| 04/26/2006 | EP1370879A4 System and method for fault isolation for dsl loop extenders |
| 04/26/2006 | EP1330333A4 Method of retrofitting a probe station |
| 04/26/2006 | CN2775673Y On-line diagnostic and intelligent activating device for accumulator |
| 04/26/2006 | CN2775672Y IEEE-1394 detecting module |
| 04/26/2006 | CN2775671Y Device for detecting high strength discharge lamp electric arc parameter |
| 04/26/2006 | CN2775670Y Three dimension detector for sea cable |
| 04/26/2006 | CN2775667Y Magnetic meter pen |
| 04/26/2006 | CN2775663Y Improved detector for real mounting board |
| 04/26/2006 | CN2775654Y Weldability detector |
| 04/26/2006 | CN2774729Y Automatic detecting and stopping device for broken needle of bamboo particle punching machine |
| 04/26/2006 | CN1764903A Diagnostic data capture within an integrated circuit |
| 04/26/2006 | CN1764847A Communication interface for diagnostic circuits of an integrated circuit |
| 04/26/2006 | CN1764846A Test apparatus |
| 04/26/2006 | CN1764845A Circuit for inspecting semiconductor device and inspecting method |
| 04/26/2006 | CN1764844A Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resis |
| 04/26/2006 | CN1764058A Method and device for producing electric motor arbitrary mechanical characteristic based on PWM technique |
| 04/26/2006 | CN1763556A Automatic connecting system for JTAG chain and implementing method thereof |
| 04/26/2006 | CN1763555A Semiconductor integrated circuit |
| 04/26/2006 | CN1763554A Method for measuring carrier mobility of organic semiconductor in frequency domain |
| 04/26/2006 | CN1763553A Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips |
| 04/26/2006 | CN1763551A Method for measuring internal resistance of storage battery |
| 04/26/2006 | CN1254004C Method and device for testing fault on stator winding of an AC motor |
| 04/26/2006 | CN1253933C Test equipment for packed semiconductor elements |
| 04/26/2006 | CN1253794C Logic cluster fault testing method for non-boundary scanning device |
| 04/26/2006 | CN1253724C Circuit arrangement for detecting malfunction |
| 04/26/2006 | CN1253723C Device for indicating capacity and method for measuring capacity |
| 04/26/2006 | CN1253722C Ferroelectric thin film material dielectric performance multi-frequency automatic testing method and device |
| 04/26/2006 | CN1253721C Device for measuring impulse current of non-linear metal oxide resistor disc |
| 04/26/2006 | CN1253720C Measuring vibration circuit based on sample data string obtained by ideal period signal |
| 04/26/2006 | CN1253718C Mechanism for fixing probe card |
| 04/25/2006 | US7036099 Integrated circuit capable of locating failure process layers |
| 04/25/2006 | US7036098 On-chip signal state duration measurement and adjustment |
| 04/25/2006 | US7036064 Synchronization point across different memory BIST controllers |
| 04/25/2006 | US7036063 Generalized fault model for defects and circuit marginalities |
| 04/25/2006 | US7036062 Single board DFT integrated circuit tester |
| 04/25/2006 | US7036061 Structural input levels testing using on-die levels generators |
| 04/25/2006 | US7036060 Semiconductor integrated circuit and its analyzing method |
| 04/25/2006 | US7036059 Techniques for mitigating, detecting and correcting single event upset effects in systems using SRAM-based field programmable gate arrays |
| 04/25/2006 | US7036058 Semiconductor device having integrally sealed integrated circuit chips arranged for improved testing |
| 04/25/2006 | US7036056 Semiconductor memory device having time reduced in testing of memory cell data reading or writing, or testing of sense amplifier performance |
| 04/25/2006 | US7036055 Arrangements for self-measurement of I/O specifications |
| 04/25/2006 | US7036054 Memory bus checking procedure |
| 04/25/2006 | US7036053 Two dimensional data eye centering for source synchronous data transfers |
| 04/25/2006 | US7036050 Highly reliable distributed system |
| 04/25/2006 | US7036046 PLD debugging hub |
| 04/25/2006 | US7035959 Adapter for controlling a measuring device, a measuring device, a controller for a measuring device, a method for processing measurement and a recording medium |
| 04/25/2006 | US7035947 Communication system, information processing apparatus, output apparatus, control method, and memory medium |
| 04/25/2006 | US7035946 Method for setting system working frequency wherein an ASIC is utilized for modulating through the voltage value of a jumper |
| 04/25/2006 | US7035894 Method for retransmitting data efficiently in mobile communication system |
| 04/25/2006 | US7035887 Apparatus and method for data shifting |
| 04/25/2006 | US7035755 Circuit testing with ring-connected test instrument modules |
| 04/25/2006 | US7035753 Method and apparatus for placing an integrated circuit into a default mode of operation |
| 04/25/2006 | US7035752 Semiconductor test data analysis system |
| 04/25/2006 | US7035751 Nonvolatile memory microcomputer chip, and a method for testing the nonvolatile memory microcomputer chip |
| 04/25/2006 | US7035750 On-chip test mechanism for transceiver power amplifier and oscillator frequency |
| 04/25/2006 | US7035749 Test machine for testing an integrated circuit with a comparator |
| 04/25/2006 | US7035228 Multi-rate, multi-port, gigabit Serdes transceiver |
| 04/25/2006 | US7035217 Router-assisted multicast congestion control |
| 04/25/2006 | US7035211 Broadband switching network |
| 04/25/2006 | US7035206 Automatic isolation in loops |
| 04/25/2006 | US7035205 Method and system for processing telecommunication signals |
| 04/25/2006 | US7035203 Interconnection between telecommunication MS-SPRING and SNCP ring networks |
| 04/25/2006 | US7035067 Apparatus for detecting coil failure in an actuating solenoid of an electrical power switch |
| 04/25/2006 | US7034787 Output circuit for gray scale control, testing apparatus thereof, and method for testing output circuit for gray scale control |
| 04/25/2006 | US7034723 Timing comparator, data sampling apparatus, and testing apparatus |
| 04/25/2006 | US7034598 Switching point detection circuit and semiconductor device using the same |
| 04/25/2006 | US7034581 Voltage detecting circuit |
| 04/25/2006 | US7034564 Method for universally testing semiconductor devices with different pin arrangement |
| 04/25/2006 | US7034563 Apparatus for measuring of thin dielectric layer properties on semiconductor wafers with contact self aligning electrodes |
| 04/25/2006 | US7034562 Oscillation detecting apparatus and test apparatus |
| 04/25/2006 | US7034561 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 04/25/2006 | US7034560 Device and method for testing integrated circuit dice in an integrated circuit module |
| 04/25/2006 | US7034559 Integrated test circuit in an integrated circuit |
| 04/25/2006 | US7034558 Test system for device and method thereof |
| 04/25/2006 | US7034557 Inspecting apparatus having a radiator to radiate heat from a semiconductor device |
| 04/25/2006 | US7034556 Pulsed thermal monitor |
| 04/25/2006 | US7034555 Grounded test contactor for electromagnetic shielding |
| 04/25/2006 | US7034554 Method and apparatus for measuring impedance across pressure joints in a power distribution system |
| 04/25/2006 | US7034547 Method of diagnosing a fault on a transformer winding |
| 04/25/2006 | US7034546 Method and apparatus for measuring insertion loss of a conductor |
| 04/25/2006 | US7034545 Apparatus and method for monitoring transmission systems using off-frequency signals |
| 04/25/2006 | US7034544 Methods for minimizing the impedance discontinuity between a conductive trace and a component and structures formed thereby |
| 04/25/2006 | US7034543 Method of predicting a lifetime of filament in ion source and ion source device |
| 04/25/2006 | US7034541 Query based electronic battery tester |
| 04/25/2006 | US7034540 Voltage detection circuit for storage devices |
| 04/25/2006 | US7034520 Integrated circuit tester |
| 04/25/2006 | US7034519 High frequency measurement for current-in-plane-tunneling |
| 04/25/2006 | US7034518 Timing generator and semiconductor test apparatus |
| 04/25/2006 | US7034504 Battery status monitoring apparatus which monitors internal battery resistance, saturation polarization detecting method and dischargeable capacity detecting method |
| 04/25/2006 | US7034297 Method and system for use in the monitoring of samples with a charged particle beam |
| 04/25/2006 | US7033910 Method of fabricating multi layer MEMS and microfluidic devices |
| 04/25/2006 | US7033873 Methods of controlling gate electrode doping, and systems for accomplishing same |
| 04/25/2006 | US7033847 Determining the maximum number of dies fitting on a semiconductor wafer |
| 04/25/2006 | US7033846 Method for manufacturing semiconductor devices by monitoring nitrogen bearing species in gate oxide layer |
| 04/25/2006 | US7033844 Wafer including an In-containing-compound semiconductor surface layer, and method for profiling its carrier concentration |
| 04/25/2006 | US7033843 Semiconductor manufacturing method and semiconductor manufacturing apparatus |
| 04/25/2006 | US7033518 Method and system for processing multi-layer films |
| 04/25/2006 | US7033196 Connector, electronic component fixing device, and tester |
| 04/25/2006 | US7032403 Method of controlling spray distances in a spray unit |