| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/03/2006 | CN1254667C Testing apparatus with environmentally-controlled vibrator compartment |
| 05/02/2006 | US7039888 Modeling process for integrated circuit film resistors |
| 05/02/2006 | US7039886 Systems and methods for generating test vectors to analyze cells of electronic gates |
| 05/02/2006 | US7039884 Method of extracting circuit timing parameters using picosecond-scale photon timing measurements |
| 05/02/2006 | US7039845 Method and apparatus for deriving a bounded set of path delay test patterns covering all transition faults |
| 05/02/2006 | US7039844 Integrated circuit with self-testing circuit |
| 05/02/2006 | US7039843 Modeling custom scan flops in level sensitive scan design |
| 05/02/2006 | US7039842 Measuring propagation delays of programmable logic devices |
| 05/02/2006 | US7039841 Tester system having multiple instruction memories |
| 05/02/2006 | US7039840 Method and apparatus for high update rate integrated circuit boundary scan |
| 05/02/2006 | US7039839 Method and apparatus for enhanced parallel port JTAG interface |
| 05/02/2006 | US7039838 Method for testing a circuit unit to be tested and test apparatus |
| 05/02/2006 | US7039566 Method of estimating a lifetime of hot carrier of MOS transistor, and simulation of hot carrier degradation |
| 05/02/2006 | US7039545 Apparatus, system and/or method for converting a serial test to a parallel test |
| 05/02/2006 | US7039544 Method for testing circuit units to be tested and test apparatus |
| 05/02/2006 | US7039542 Method of measuring motor constant for induction motor |
| 05/02/2006 | US7039536 Method and apparatus for analyzing a source current waveform in a semiconductor integrated circuit |
| 05/02/2006 | US7039534 Charging monitoring systems |
| 05/02/2006 | US7039533 Battery test module |
| 05/02/2006 | US7039312 Distributed intelligence wavelength division multiplexed network |
| 05/02/2006 | US7039033 System, device and computer readable medium for providing a managed wireless network using short-range radio signals |
| 05/02/2006 | US7039014 Network-wide connection-based debug mechanism |
| 05/02/2006 | US7039010 Optimized data path structure for multi-channel management information base (MIB) event generation |
| 05/02/2006 | US7039006 Board duplexing apparatus for asynchronous transfer mode switch and method of controlling the same |
| 05/02/2006 | US7039005 Protection switching in a communications network employing label switching |
| 05/02/2006 | US7038956 Apparatus and method for reading out defect information items from an integrated chip |
| 05/02/2006 | US7038955 Semiconductor device and testing apparatus for semiconductor device |
| 05/02/2006 | US7038897 Arc fault detection system |
| 05/02/2006 | US7038895 Apparatus for detecting abnormality of relay |
| 05/02/2006 | US7038517 Timing vernier using a delay locked loop |
| 05/02/2006 | US7038494 Scan chain element and associated method |
| 05/02/2006 | US7038484 Display device |
| 05/02/2006 | US7038483 System and method for measuring transistor leakage current with a ring oscillator |
| 05/02/2006 | US7038482 Circuit and method for automatic measurement and compensation of transistor threshold voltage mismatch |
| 05/02/2006 | US7038481 Method and apparatus for determining burn-in reliability from wafer level burn-in |
| 05/02/2006 | US7038480 Method for detection and quantification of on-die voltage noise in microcircuits |
| 05/02/2006 | US7038479 Method and apparatus to provide a burn-in board with increased monitoring capacity |
| 05/02/2006 | US7038478 Stress relieved contact array |
| 05/02/2006 | US7038477 Contactor having conductive particles in a hole as a contact electrode |
| 05/02/2006 | US7038476 Electrical signal taking-out device |
| 05/02/2006 | US7038475 Test method for semiconductor components using conductive polymer contact system |
| 05/02/2006 | US7038474 Laser-induced critical parameter analysis of CMOS devices |
| 05/02/2006 | US7038471 Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board |
| 05/02/2006 | US7038469 Method of determining localized electron tunneling in a capacitive structure |
| 05/02/2006 | US7038466 Measurement of circuit delay |
| 05/02/2006 | US7038463 Method and apparatus for battery reconfiguration for radio control application |
| 05/02/2006 | US7038462 Method and apparatus for electrical commoning of circuits |
| 05/02/2006 | US7038461 Bleed air valve test set |
| 05/02/2006 | US7038442 Apparatus and method for detecting photon emissions from transistors |
| 05/02/2006 | US7038441 Test apparatus with loading device |
| 05/02/2006 | US7038425 Method of measuring and displaying actual quantity of electricity of rechargeable battery being charged by external power source via charger |
| 05/02/2006 | US7038279 Process parameter event monitoring system and method for process |
| 05/02/2006 | US7038224 Contact opening metrology |
| 05/02/2006 | US7038222 System and method for using areas near photo global alignment marks or unpatterned areas of a semiconductor wafer to create structures for SIMS or E-Beam or XRD testing |
| 05/02/2006 | US7037735 Apparatus and method for testing defects |
| 05/02/2006 | US7037734 Method and apparatus for determining generation lifetime of product semiconductor wafers |
| 04/27/2006 | WO2006044354A1 Dynamic energy threshold calculation for high impedance fault detection |
| 04/27/2006 | WO2006044009A2 Interface apparatus for semiconductor device tester and test method therefor |
| 04/27/2006 | WO2006043607A1 Contact unit and inspection system |
| 04/27/2006 | WO2006042660A1 Device for testing and regulating the temperature of electronic and/or electromechanical components |
| 04/27/2006 | WO2006013524B1 Testing of a circuit that has an asynchronous timing circuit |
| 04/27/2006 | US20060090113 Design for test of analog module systems |
| 04/27/2006 | US20060090112 Memory device verification of multiple write operations |
| 04/27/2006 | US20060090111 Circuit for recursively calculating data |
| 04/27/2006 | US20060090110 Connecting multiple test access port controllers on a single test access port |
| 04/27/2006 | US20060090109 On the fly configuration of electronic device with attachable sub-modules |
| 04/27/2006 | US20060087337 Method and apparatus for layout independent test point placement on a printed circuit board |
| 04/27/2006 | US20060087336 Semiconductor device including chips with electrically-isolated test elements and its manufacturing method |
| 04/27/2006 | US20060087335 Curved spring structure with elongated section located under cantilevered section |
| 04/27/2006 | US20060087334 Dual tip probe |
| 04/27/2006 | US20060087333 Electrical test device having isolation slot |
| 04/27/2006 | US20060087332 Using an interposer to facilate capacitive communication between face-to-face chips |
| 04/27/2006 | US20060087331 System and method for a multisite, integrated, combination probe card and spider card |
| 04/27/2006 | US20060087330 Defect inspecting apparatus |
| 04/27/2006 | US20060087327 Probe device and display substrate testing apparatus using same |
| 04/27/2006 | US20060087323 Apparatus and method for testing a signal path from an injection point |
| 04/27/2006 | US20060087322 Method and apparatus for a remote electric power line conductor faulted circuit current, conductor temperature, conductor potential and conductor strain monitoring and alarm system. |
| 04/27/2006 | US20060087312 Handler for testing semiconductor device |
| 04/27/2006 | US20060087311 Manual actuator for loading leadless microcircuit packages in a circuit tester |
| 04/27/2006 | US20060087310 Electric apparatus having plural electric parts |
| 04/27/2006 | US20060087309 Programmable power personality card |
| 04/27/2006 | US20060087307 Single pin multilevel integrated circuit test interface |
| 04/27/2006 | DE69925628T2 Fir-filterstruktur mit geringer latenzzeit, zur andwendung bei gigabit-ethernet Fir filter structure with low latency time for gigabit ethernet with USAGE |
| 04/27/2006 | DE20221536U1 Evaluating digital signaling system e.g. for memory system using same circuits actually involved in normal operation of signaling system |
| 04/27/2006 | DE102005048420A1 Verfahren zum Erfassen des Ladezustandes einer Batterie und ein Stromversorgungsgerät A method for detecting the state of charge of a battery and a power supply |
| 04/27/2006 | DE102004051754A1 Electrical energy store e.g. battery, load condition determination method, for vehicle board network, involves effecting coherence between current and voltage, during regenerative braking phase and/or recuperation phase |
| 04/27/2006 | DE102004050615A1 Vorrichtung zum Prüfen einer Verarbeitungselektronik An apparatus for testing an electronic processing |
| 04/27/2006 | DE102004042079B3 Verfahren zur Messung einer Laufzeit einer Digitalschaltung und entsprechende Vorrichtung A method for measuring a transit time of a digital circuit and corresponding device |
| 04/26/2006 | EP1650837A1 Socket, and testing device |
| 04/26/2006 | EP1650575A1 Method for judging deterioration of accumulator, method for measuring secondary cell internal impedance, device for measuring secondary cell internal impedance, device for judging deterioration of secondary cell, and power source system |
| 04/26/2006 | EP1650573A2 Counter balanced vertical docking motion in a driven vertical test head manipulator |
| 04/26/2006 | EP1649622A2 Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit |
| 04/26/2006 | EP1649538A1 Battery float management |
| 04/26/2006 | EP1649474A2 System, apparatus and method for detection of electrical faults |
| 04/26/2006 | EP1649435A2 Circuit arrangement comprising a multi-wire line for supplying current and emitting signals |
| 04/26/2006 | EP1649299A2 System and method for optimized test and configuration throughput of electronic circuits |
| 04/26/2006 | EP1649298A1 Method for the diagnosis of driver outputs and diagnosis pulse manager |
| 04/26/2006 | EP1649297A1 High frequency circuit analyser |
| 04/26/2006 | EP1649296A2 Hand mounted testing meter |
| 04/26/2006 | EP1648770A1 Methods and apparatus for passive illumination of refueling hoses |