Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2006
05/09/2006US7042238 Socket for inspection
05/09/2006US7042237 Semiconductor test system having a tester and a prober and test method thereof
05/09/2006US7042236 Measuring probe for measuring high frequencies
05/09/2006US7042232 Cable and substrate compensating custom resistor
05/09/2006US7042229 System and method for on line monitoring of insulation condition for DC machines
05/09/2006US7042228 Transducer in-situ testing apparatus and method
05/09/2006US7042226 Method for determining the wear to a storage battery, and a monitoring device
05/09/2006US7042208 Voltage isolation buffer with AC coupled and DC coupled hall effect magnetic field sensors
05/09/2006US7041976 Automated focusing of electron image
05/09/2006US7041516 Multi chip module assembly
05/09/2006US7041515 Balancing planarization of layers and the effect of underlying structure on the metrology signal
05/09/2006US7041513 Methods for forming semiconductor devices so as to stabilize the same when positioned face-down over test substrates
05/09/2006US7040004 Method of making a data storage device having an actuator with a rail
05/05/2006CA2793006A1 Method and system for accurately reporting battery capacity
05/04/2006WO2006045372A1 Arrangement for monitoring patch fields at distribution points in data networks
05/04/2006WO2006024029A3 Battery monitor
05/04/2006WO2006014894A3 Method and apparatus for producing co-planar bonding pads on a substrate
05/04/2006WO2006004829A3 Precise time measurement apparatus and method
05/04/2006WO2005091893A3 System for high dynamic range analysis in flow cytometry
05/04/2006WO2005081000A8 Method and apparatus for inspecting a printed circuit board assembly
05/04/2006US20060095823 Test apparatus
05/04/2006US20060095822 Generation of test vectors for testing electronic circuits taking into account of defect probability
05/04/2006US20060095820 Method, system, and program product for boundary I/O testing employing a logic built-in self-test of an integrated circuit
05/04/2006US20060095819 Method and system for clock skew independent scan register chains
05/04/2006US20060095818 System and method for automatic masking of compressed scan chains with unbalanced lengths
05/04/2006US20060095816 Test clocking scheme
05/04/2006US20060095815 Root cause correlation in connectionless networks
05/04/2006US20060095228 Apparatus and method for investigating semiconductor wafers
05/04/2006US20060092848 Information processing apparatus and method of controlling the information processing apparatus
05/04/2006US20060092755 Semiconductor test apparatus and control method therefor
05/04/2006US20060091898 Unknown
05/04/2006US20060091897 Electronic apparatus with driving power having different voltage levels
05/04/2006US20060091848 Method and device for determining battery status
05/04/2006DE69634824T2 Integrierte schaltungstestanordnung mit paralleler ansteuerung Integrated circuit test arrangement with parallel control
05/04/2006DE202006002864U1 Charging and testing device for electrical battery, has unit for measuring and/or recording electrical parameter of electrical battery charger that is attached by connection
05/04/2006DE19727516B4 Verfahren zur Bestimmung des internen Rauschens digitaler Schaltkreise Method for determining the internal noise of digital circuits
05/04/2006DE10310131B4 Vorrichtung zum Erfassen eines von der Norm abweichenden Motorzustands An apparatus for detecting an abnormal engine condition
05/04/2006DE102005042518A1 Test access point structure implementing method for printed circuit board, involves connecting test access point with conductive path and presiding point by uncovered surface of printed circuit board to sound by test sensor
05/04/2006DE102004052977A1 Method of diagnosis to determine changes in a capacitor for energy storage in vehicles due to aging based on measurement of several age dependent parameters
05/04/2006DE102004052618A1 Safety sensor has processor in communication with memory, and two parallel circuits connected in series and each with switch and first resistance connected to switch in parallel
05/04/2006DE102004052502A1 Anordnung zur Überwachung von Patchfeldern an Verteilerpunkten in Datennetzwerken Arrangement for monitoring patch panels to distribution points in data networks
05/04/2006DE102004051594A1 Kabel, Verfahren zur Herstellung eines Kabels und Verfahren zur Ortung eines Kabels Cable, process for the preparation of a cable and method for location of a cable
05/04/2006DE102004000035A1 Diagnosis method of determining aging state of capacitor involves measuring aging-dependent parameters through different discharge processes, each parameter being associated with value of component of equivalent diagram of capacitor
05/04/2006DE10122252B4 Verfahren zum Simulieren einer zu verifizierenden Schaltungseinheit und Verzögerungsschalenvorrichtung A method for simulating a circuit unit to be verified and delay tray device
05/03/2006EP1653794A1 Technique for optical inspection system verification
05/03/2006EP1653650A1 Source synchronous sampling
05/03/2006EP1653241A1 System for determining the state of charge of electricity storage units of vehicles
05/03/2006EP1653240A1 Linear drive device
05/03/2006EP1653239A1 Test device
05/03/2006EP1653238A1 Method and apparatus to determine nominal transformer parameters
05/03/2006EP1652221A2 Failure analysis methods and systems
05/03/2006EP1652217A2 Method and apparatus for scrambling cell content in an integrated circuit
05/03/2006EP1651972A1 Apparatus, methods and computer program products for estimation of battery reserve life using adaptively modified state of health indicator-based reserve life models
05/03/2006EP1651971A2 Test standard interfaces and architectures
05/03/2006EP1651970A1 Performing compression of user datagram protocol packets
05/03/2006EP1651948A1 Scanning probe inspection apparatus
05/03/2006EP1593083A4 Methods and apparatus for data analysis
05/03/2006EP1579230B1 Device and method for creating a signature
05/03/2006EP1552471B1 Transponder and tool for reading and/or writing data in said transponder
05/03/2006EP1423300B1 Method and device for stabilizing the electric system of a vehicle
05/03/2006EP1255925B1 Apparatus and method for calibrating an engine management system
05/03/2006EP0745015B1 Multi-wavelength laser optic system for probe station and laser cutting
05/03/2006CN2777914Y Irreversible embedding keeper
05/03/2006CN2777819Y Lightning arrestor
05/03/2006CN2777776Y Cable power indicator
05/03/2006CN2777566Y Tester for circuit breaker performance of preventing error releasing
05/03/2006CN2777565Y Shutoff ring
05/03/2006CN2777564Y Shutoff ring
05/03/2006CN2777563Y Three-test head double table top positioning tester for touch panel
05/03/2006CN2777562Y Embedded voltage state quantity photoelectric isolation type detecting circuitboard
05/03/2006CN2777548Y Probe assembly for detector of electronic element, circuit and circuitboard
05/03/2006CN2777546Y Circuit board protector
05/03/2006CN2777518Y Automatic apparatus for LED measurer table
05/03/2006CN2777491Y Device for detecting access of magazine of wafer or liquid crystal panel
05/03/2006CN1768454A Anisotropic electrically conductive film and method of producing the same
05/03/2006CN1768330A A high reliability memory module with a fault tolerant address and command bus
05/03/2006CN1768275A Test emulation device, test module emulation device, and recording medium recorded with programs for the devices
05/03/2006CN1768274A Connection unit, test head, and test device
05/03/2006CN1768273A Performance monitor for a photovoltaic supply
05/03/2006CN1768271A Test head positioning system and method
05/03/2006CN1767335A 10/350 shock current system for air or vacuum CROWBAR switch
05/03/2006CN1767306A Photoelectricity triggering and detecting system for static reactive-load compensation equipment based on multi-mode optical fibre
05/03/2006CN1767124A Method for detecting vacuum tube cathode eccentricity
05/03/2006CN1766668A Circuit and method for measuring signal reflow density
05/03/2006CN1766667A Method for measuring switch time of multi-contact switch and switch time measuring circuit
05/03/2006CN1766666A Apparatus and method for testing reliability of hook switch
05/03/2006CN1766665A Resonant inverter circuit for reference electronic ballast
05/03/2006CN1766664A Failure detecting apparatus
05/03/2006CN1766663A Electric property detection device and method for portable terminal
05/03/2006CN1766661A Method for detecting polarity distribution of ferroelectric material in micro-scale by non-conductive probe
05/03/2006CN1766659A Zero automatic detection method of positive and negative busbar insulating detection sensor
05/03/2006CN1766656A Cell on-position detecting method for terminal device
05/03/2006CN1766652A Method and apparatus for a wobble fixture probe for probing test access point structures
05/03/2006CN1766651A Method and apparatus for a twisting fixture probe for probing test access point structures
05/03/2006CN1766650A Module for bullet connection capable of connecting multiple electrical contacts
05/03/2006CN1766649A Apparatus for detecting electronic element, circuit and circuit board
05/03/2006CN1254895C Aging for transmitter array adopting base substrate
05/03/2006CN1254690C Input/output continuity test mode circuit
05/03/2006CN1254689C Method for detecting missing element and fixing device therefor
05/03/2006CN1254688C Reference voltage generating apparatus and semiconductor integrated circuit, its checking device and method thereof