| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/11/2006 | US20060100812 Low cost test for IC's or electrical modules using standard reconfigurable logic devices |
| 05/11/2006 | US20060100810 Testing of integrated circuits |
| 05/11/2006 | US20060100800 Method and system for accurately reporting battery capacity |
| 05/11/2006 | US20060099553 Automatic teaching method for printed circuit board inspection system |
| 05/11/2006 | US20060098572 Storage switch traffic bandwidth control |
| 05/11/2006 | US20060097840 High pressure resistance body element |
| 05/11/2006 | US20060097745 Thin film transistor tester and corresponding test method |
| 05/11/2006 | US20060097744 Apparatus and method for inspecting thin film transistor active matrix substrate |
| 05/11/2006 | US20060097743 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 05/11/2006 | US20060097742 Apparatus and method for single die backside probing of semiconductor devices |
| 05/11/2006 | US20060097741 Method of and apparatus for testing for integrated circuit contact defects |
| 05/11/2006 | US20060097740 In-situ wafer and probe desorption using closed loop heating |
| 05/11/2006 | US20060097739 Support for a receptacle block of a unit under test |
| 05/11/2006 | US20060097738 Universal test fixture |
| 05/11/2006 | US20060097737 Method and apparatus for manufacturing and probing printed circuit board test access point structures |
| 05/11/2006 | US20060097736 Rapid fire test board |
| 05/11/2006 | US20060097730 Time-frequency domain reflectometry apparatus and method |
| 05/11/2006 | US20060097729 Method for detecting defects that exhibit repetitive patterns |
| 05/11/2006 | US20060097728 Fault location using measurements of current and voltage from one end of a line |
| 05/11/2006 | US20060097727 Micromechanical positional state sensing apparatus method and system |
| 05/11/2006 | US20060097726 Detection of malfunctioning bulbs in decorative light strings |
| 05/11/2006 | US20060097714 Connector insertion apparatus for connecting a testing apparatus to a unit under test |
| 05/11/2006 | US20060097597 Method for monitoring electrical insulation on a rotor of an electrical machine |
| 05/11/2006 | US20060097332 Semiconductor device, carrier, card reader, methods of initializing and checking authenticity |
| 05/11/2006 | US20060096779 Multilayer type printed-wiring board and method of measuring impedance of multilayer type printed-wiring board |
| 05/11/2006 | DE69926126T2 Verfahren zur ruhestrombestimmung A method for closed-circuit specifications |
| 05/11/2006 | DE4122635B4 Einrichtung zur Defekterkennung bei Sensoren Means for defect detection in sensor |
| 05/11/2006 | DE10337064B4 Determination method for the high-current carrying capacity of a battery, wherein parameters of a model of the battery impedance are determined and from them its current carrying ability predicted |
| 05/11/2006 | DE10207878B4 Vorrichtung zum Erfassen, Haltern und Prüfen von elektronischen Baugruppen An apparatus for detecting, holding and testing electronic assemblies |
| 05/11/2006 | DE102005051623A1 Batterie-Erkennungssystem Battery detection system |
| 05/11/2006 | DE102005042546A1 Verfahren und Vorrichtung zum Herstellen und Sondieren von Gedruckte-Schaltungsplatine-Testzugriffspunktstrukturen Method and apparatus for producing and probing of printed circuit board test access point structures |
| 05/11/2006 | DE102005042534A1 Verfahren und Vorrichtung für eine Wobbelhalterungssonde zum Sondieren von Testzugriffspunktstrukturen Method and apparatus for a Wobbelhalterungssonde to probe test access point structures |
| 05/11/2006 | DE102005042521A1 Verfahren und Vorrichtung für eine sich verdrehende Halterungssonde zum sondieren von Testzugriffspunktstrukturen Method and apparatus for a-twist mount probe to probe test access point structures |
| 05/11/2006 | DE102004053977A1 Life duration forecasting method for battery, involves approximating discrete approximation so that intersection of approximation function extrapolation with value offers condition information |
| 05/11/2006 | DE102004053405A1 Device to distinguish between a rechargeable secondary cell and non rechargeable primary cell has electrode near cell casing and unit to determine cell characteristics |
| 05/11/2006 | DE102004051302A1 Vorrichtung zur Temperieren und Prüfen elektronischer und/oder elektromechanischer Bauteile A device for tempering and testing electronic and / or electromechanical components |
| 05/11/2006 | DE102004049906A1 LED short circuit diagnosis unit uses clock signal to switch feeding of diagnosis current to load and processes resulting voltage drop |
| 05/11/2006 | DE10034855B4 System zum Test von schnellen integrierten Digitalschaltungen und BOST-Halbleiterschaltungsbaustein als Testschaltkreis A system for fast test of integrated digital circuits and BOST semiconductor circuit block as the test circuit |
| 05/10/2006 | EP1655631A1 Inspection method, semiconductor device, and display device |
| 05/10/2006 | EP1655615A1 Method and system for reporting battery capacity |
| 05/10/2006 | EP1655614A1 Test device, correction value management method, and program |
| 05/10/2006 | EP1655591A1 Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit |
| 05/10/2006 | EP1654616A2 Method and apparatus for bandwidth guarantee and overload protection in a network switch |
| 05/10/2006 | EP1654551A1 Method and device for displaying the remaining useful life of a battery |
| 05/10/2006 | EP1654550A1 Testing radio frequency and analogue circuits |
| 05/10/2006 | EP1654547A1 Method and circuit arrangement for monitoring the mode of operation of one or more load circuits, especially of a domestic appliance |
| 05/10/2006 | EP1595154A4 Integrated circuit testing methods using well bias modification |
| 05/10/2006 | EP1567875B1 Diagnosis system for household electric appliances |
| 05/10/2006 | EP1567873B1 Method and apparatus for locating a discharge in a stator of an electrical machine |
| 05/10/2006 | EP1451973A4 Policy-based forward error correction in packet networks |
| 05/10/2006 | EP1336113B1 Method and apparatus for determining the state of charge of a lithium-ion battery |
| 05/10/2006 | EP0730340B1 Fault detector for voltage source self-commutated power converter |
| 05/10/2006 | CN2779419Y Pre-detection circuit for automobile load short circuit |
| 05/10/2006 | CN2779418Y Scan selection circuit for comprehensive test device for multi-core cable |
| 05/10/2006 | CN2779417Y Contact fault detector for AC contactor |
| 05/10/2006 | CN2779416Y Minitype tester for relaying protection experiment |
| 05/10/2006 | CN2779336Y Material receiving apparatus of board detecting machine |
| 05/10/2006 | CN1771663A Latching dynamic logic structure |
| 05/10/2006 | CN1771440A Device for determining constant of rotating machine |
| 05/10/2006 | CN1770414A Method for testing semiconductor packaging element |
| 05/10/2006 | CN1769920A Test system of solar energy battery |
| 05/10/2006 | CN1769919A Method and system for accurately reporting battery capacity |
| 05/10/2006 | CN1769918A Pattern identification and bit level measurements on repetive patterns |
| 05/10/2006 | CN1769917A Electronic system for testing key |
| 05/10/2006 | CN1769916A Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections |
| 05/10/2006 | CN1769886A Method for real-timely testing performance of multi-channel photovoltaic cell |
| 05/10/2006 | CN1255874C Contactor for semiconductor device |
| 05/10/2006 | CN1255869C Fault positioning method for scanning link of logic integrated circuit |
| 05/09/2006 | US7043704 Methods and apparatus for verifying circuit board design |
| 05/09/2006 | US7043683 Data transmission update technique in low power modes |
| 05/09/2006 | US7043675 Logic circuit test apparatus and logic circuit test method |
| 05/09/2006 | US7043674 Systems and methods for facilitating testing of pads of integrated circuits |
| 05/09/2006 | US7043628 Method and apparatus for preventing a microprocessor from erroneously entering into a test mode during initialization |
| 05/09/2006 | US7043399 Electro-magnetic analysis program of electric rotating machine |
| 05/09/2006 | US7043393 System and method for online specification of measurement hardware |
| 05/09/2006 | US7043392 Interpolator testing system |
| 05/09/2006 | US7043391 User interface for semiconductor evaluation device |
| 05/09/2006 | US7043390 Circuit testing with ring-connected test instruments modules |
| 05/09/2006 | US7043388 System and apparatus for testing packaged devices and related methods |
| 05/09/2006 | US7043387 Testing system for printing press circuit board controllers |
| 05/09/2006 | US7043384 Failure detection system, failure detection method, and computer program product |
| 05/09/2006 | US7043382 Low voltage swing bus analysis method using static timing analysis tool |
| 05/09/2006 | US7043379 Method for quantifying I/O chip/package resonance |
| 05/09/2006 | US7043343 Method for testing a missile time-space-position unit for missile |
| 05/09/2006 | US7043328 Method for manufacturing semiconductor device utilizing monitor wafers |
| 05/09/2006 | US7043089 Overflow error diffusion |
| 05/09/2006 | US7043070 Electronic assembly video inspection system |
| 05/09/2006 | US7042848 System and method for hierarchical policing of flows and subflows of a data stream |
| 05/09/2006 | US7042843 Algorithm for time based queuing in network traffic engineering |
| 05/09/2006 | US7042838 Method and apparatus for forwarding data in a data communications network |
| 05/09/2006 | US7042833 Modem transmission over packet networks |
| 05/09/2006 | US7042770 Memory devices with page buffer having dual registers and method of using the same |
| 05/09/2006 | US7042690 Power-line, differential, isolation loss detector |
| 05/09/2006 | US7042563 Optical coupling for testing integrated circuits |
| 05/09/2006 | US7042244 Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same |
| 05/09/2006 | US7042243 Device test apparatus and test method including control unit(s) between controller and test units |
| 05/09/2006 | US7042242 Built-in self test technique for programmable impedance drivers for RapidChip and ASIC drivers |
| 05/09/2006 | US7042241 Low-current pogo probe card |
| 05/09/2006 | US7042240 Burn-in testing apparatus and method |
| 05/09/2006 | US7042239 Arrangement for manual disengagement of a device interface board from a personal tester |