| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/17/2006 | EP1656563A2 Calibration of tester and testboard by golden sample |
| 05/17/2006 | EP1567871A4 Probe station with low inductance path |
| 05/17/2006 | EP1558939A4 Apparatus and method for simultaneously detecting the power state of a plurality of circuit breaker switches |
| 05/17/2006 | EP1537425A4 Method and apparatus for detecting wear in components of high voltage electrical equipment |
| 05/17/2006 | EP1499903A4 Method and system for monitoring winding insulation resistance |
| 05/17/2006 | EP1057233B1 Zone arc fault detection |
| 05/17/2006 | CN2781629Y Control circuit of indicator light in charger |
| 05/17/2006 | CN2781392Y Avalanche photodiode temp bias voltage tester |
| 05/17/2006 | CN2781391Y Continuous testing apparatus for leakage of AC ground wire |
| 05/17/2006 | CN2781390Y Vehicle loading short circuit, open circuit predetection circuit |
| 05/17/2006 | CN2781389Y Pollution flashing point indicator for transmission line insulator |
| 05/17/2006 | CN2781388Y Welding current detecting device of electronic mash welder |
| 05/17/2006 | CN2781383Y Miniature circuit detecting instrument |
| 05/17/2006 | CN1774943A Method and arrangement of testing device in mobile station |
| 05/17/2006 | CN1774700A Data pickup processing method for logic analyzer and apparatus thereof |
| 05/17/2006 | CN1774643A Method and device for predicting the starting capacity of a vehicle |
| 05/17/2006 | CN1774642A Method and apparatus for testing integrated circuits |
| 05/17/2006 | CN1774641A Test apparatus |
| 05/17/2006 | CN1774640A Event based test method for debugging timing related failures in integrated circuits |
| 05/17/2006 | CN1774639A System and method for in-situ monitor and control of film thickness and trench depth |
| 05/17/2006 | CN1774104A Prompting service control method for mobile communication terminal |
| 05/17/2006 | CN1773767A Battery pack |
| 05/17/2006 | CN1773306A Apparatus for testing electronic instrument |
| 05/17/2006 | CN1773305A Method and apparatus for testing battery safety performance |
| 05/17/2006 | CN1773304A Method for correcting battery dump volume |
| 05/17/2006 | CN1773302A Method for observing and controlling colour picture tube light-spot, convergence and grating |
| 05/17/2006 | CN1773301A Inspection apparatus for display panel and method for testing the same apparatus for the same display panel assembly |
| 05/17/2006 | CN1773300A TFT tester and corresponding test method |
| 05/17/2006 | CN1773294A Test apparatus for electronic device connection interface |
| 05/17/2006 | CN1256786C Battery pack |
| 05/17/2006 | CN1256761C Contact component and its manufacture and probe contact assembly using the contact component |
| 05/17/2006 | CN1256733C IC test software system for mapping logical functional data of logic integrated circuits to physical representation |
| 05/17/2006 | CN1256673C PDA mainboard production testing process |
| 05/17/2006 | CN1256595C Apparatus for displaying charge state of accumulator connected in electric appliance |
| 05/17/2006 | CN1256594C Receiver used in electronic testing equipment of printed circuit board |
| 05/17/2006 | CN1256593C Method and apparatus for identifying failure in radiation electric network and use of the same method |
| 05/16/2006 | US7047471 Voltage margin testing of bladed servers |
| 05/16/2006 | US7047470 Flexible and extensible implementation of sharing test pins in ASIC |
| 05/16/2006 | US7047469 Method for automatically searching for and sorting failure signatures of wafers |
| 05/16/2006 | US7047468 Method and apparatus for low overhead circuit scan |
| 05/16/2006 | US7047467 Structure and method for verifying data in a non-JTAG device from a JTAG device with microcontroller |
| 05/16/2006 | US7047466 Apparatus and method for programmable fuse repair to support dynamic relocate and improved cache testing |
| 05/16/2006 | US7047465 Methods for using defective programmable logic devices by customizing designs based on recorded defects |
| 05/16/2006 | US7047464 Method and system for use of a field programmable function within an application specific integrated circuit (ASIC) to access internal signals for external observation and control |
| 05/16/2006 | US7047463 Method and system for automatically determining a testing order when executing a test flow |
| 05/16/2006 | US7047462 Method and apparatus for providing JTAG functionality in a remote server management controller |
| 05/16/2006 | US7047461 Semiconductor integrated circuit device with test data output nodes for parallel test results output |
| 05/16/2006 | US7047459 Method and system for isolation of a fault location in a communications network |
| 05/16/2006 | US7047458 Testing methodology and apparatus for interconnects |
| 05/16/2006 | US7047457 Testing of a multi-gigabit transceiver |
| 05/16/2006 | US7047456 Error correction for regional and dynamic factors in communications |
| 05/16/2006 | US7047450 Storage system and a method for diagnosing failure of the storage system |
| 05/16/2006 | US7047442 Electronic test program that can distinguish results |
| 05/16/2006 | US7047174 Method for producing test patterns for testing an integrated circuit |
| 05/16/2006 | US7047172 Electric network simulating method, simulating apparatus, and medium for storing simulation program |
| 05/16/2006 | US7047148 Indirect techniques for measuring 1/f noise |
| 05/16/2006 | US7047145 Compensation method of resolver detected position |
| 05/16/2006 | US7046633 Router implemented with a gamma graph interconnection network |
| 05/16/2006 | US7046623 Fault recovery system and method for inverse multiplexed digital subscriber lines |
| 05/16/2006 | US7046555 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 05/16/2006 | US7046341 Method and apparatus for forming pattern on thin substrate or the like |
| 05/16/2006 | US7046157 Short circuit detector for shield conductor in a fieldbus network |
| 05/16/2006 | US7046035 Programmable driver for an I/O pin of an integrated circuit |
| 05/16/2006 | US7046032 Electrical connection plug for remote monitoring of high voltage motors |
| 05/16/2006 | US7046031 Method for monitoring at least two switching paths and a switching circuit for safely connecting/disconnecting a load |
| 05/16/2006 | US7046030 Method and apparatus for testing liquid crystal display device |
| 05/16/2006 | US7046029 Conductive material for integrated circuit fabrication |
| 05/16/2006 | US7046028 Method of inspecting a semiconductor dynamic quantity sensor |
| 05/16/2006 | US7046027 Interface apparatus for semiconductor device tester |
| 05/16/2006 | US7046026 Testing vias and contracts in integrated circuit |
| 05/16/2006 | US7046025 Test apparatus for testing substrates at low temperatures |
| 05/16/2006 | US7046023 Probe for combined signals |
| 05/16/2006 | US7046022 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 05/16/2006 | US7046021 Double acting spring probe |
| 05/16/2006 | US7046020 Probes with perpendicularly disposed spring pins, and methods of making and using same |
| 05/16/2006 | US7046019 Direct non contact measurement |
| 05/16/2006 | US7046014 ATE measurement technique for comparator threshold voltage |
| 05/16/2006 | US7046013 Open-circuit failure detection circuit |
| 05/16/2006 | US7045929 Wear-premonitory carbon brush holder |
| 05/16/2006 | US7045371 Foreign material removing method for capacitance type dynamic quantity sensor |
| 05/16/2006 | US7044003 Torque measuring device for electric motors |
| 05/16/2006 | US7043959 Method for calibrating semiconductor test instrument |
| 05/16/2006 | CA2216079C Detection of suface amomalies in elongate conductive members by pulse propagation analysis |
| 05/11/2006 | WO2006050288A2 Low cost test for ic's or electrical modules using standard reconfigurable logic devices |
| 05/11/2006 | WO2006049871A1 Apparatus for non-contact testing of microcircuits |
| 05/11/2006 | WO2006049507A1 Method, device and system for sterile determination of the operability of medical equipment in a sterile zone. |
| 05/11/2006 | WO2006049017A1 Electronic device test box |
| 05/11/2006 | WO2006048838A1 Wireless battery status management for medical devices |
| 05/11/2006 | WO2006048625A1 Kelvin connector including temperature sensor |
| 05/11/2006 | WO2006048512A1 Characterization of electric circuit of electric device |
| 05/11/2006 | WO2006048470A1 Squirrel-cage asynchronous motor and fault-detection method therefor |
| 05/11/2006 | WO2006048125A1 Monitoring system for on-board supply network, for production and service |
| 05/11/2006 | WO2006035330A3 Integrated circuit with input and/or output bolton pads with integrated logic. |
| 05/11/2006 | WO2006003596A3 Circuit arrangement and method of testing an application circuit provided in said circuit arrangement |
| 05/11/2006 | WO2005059578A3 Integrated circuit with debug support interface |
| 05/11/2006 | US20060101316 Test output compaction using response shaper |
| 05/11/2006 | US20060101315 Leakage current reduction system and method |
| 05/11/2006 | US20060100822 Recycable electric junction box applicable to automotive vehicles |
| 05/11/2006 | US20060100814 Automated circuit board test actuator system |
| 05/11/2006 | US20060100813 Automated circuit board test actuator system |