| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/23/2006 | US7049156 System and method for in-situ monitor and control of film thickness and trench depth |
| 05/23/2006 | US7049155 Multi beam scanning with bright/dark field imaging |
| 05/23/2006 | US7047638 Method of making microelectronic spring contact array |
| 05/23/2006 | US7047634 Method of making a multilayer wiring board |
| 05/22/2006 | CA2527247A1 Integrity testing of isolation means in an uninterruptible power supply |
| 05/19/2006 | CA2527086A1 Method and device for the detection of fault current arcing in electric circuits |
| 05/18/2006 | WO2006052929A1 Adaptive memory calibration using bins |
| 05/18/2006 | WO2006052565A2 Method and apparatus for managing wireless communication network radio resources |
| 05/18/2006 | WO2006052486A1 In-situ wafer and probe desorption using closed loop heating |
| 05/18/2006 | WO2006052354A2 Battery fuel gauge using safety circuit |
| 05/18/2006 | WO2006051666A1 Test equipment and test method of semiconductor memory having a plurality of banks |
| 05/18/2006 | WO2006051643A1 Substrate inspection apparatus |
| 05/18/2006 | WO2006051550A2 Electrical measurements in samples |
| 05/18/2006 | WO2006051508A1 System and method for on-chip jitter injection |
| 05/18/2006 | WO2006051438A1 Testable integrated circuit |
| 05/18/2006 | WO2006051059A1 Method for diagnosing faults |
| 05/18/2006 | WO2006050985A1 Method and system for monitoring and improving the quality of interconnecting cabling systems |
| 05/18/2006 | WO2006039637B1 Assertion checking in integrated circuits |
| 05/18/2006 | WO2006002046A3 Mechanically reconfigurable vertical tester interface for ic probing |
| 05/18/2006 | WO2005070163A3 Cooling devices and methods of using them |
| 05/18/2006 | WO2005024588A3 Method and system for internet protocol provisioning of customer premises equipment |
| 05/18/2006 | WO2005017961A3 Plasma etching using dibromomethane addition |
| 05/18/2006 | WO2003093999A3 Inherently fail safe processing or control apparatus |
| 05/18/2006 | US20060107241 Evaluation device and circuit design method used for the same |
| 05/18/2006 | US20060107160 Method and apparatus for optimized parallel testing and access of electronic circuits |
| 05/18/2006 | US20060107159 Intelligent storage of device state in response to error condition |
| 05/18/2006 | US20060107158 Functional coverage driven test generation for validation of pipelined processors |
| 05/18/2006 | US20060107157 Method and apparatus of fault diagnosis for integrated logic circuits |
| 05/18/2006 | US20060107156 Hub for testing memory and methods thereof |
| 05/18/2006 | US20060107155 Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure |
| 05/18/2006 | US20060107154 Through-core self-test with multiple loopbacks |
| 05/18/2006 | US20060107153 Linear associative memory-based hardware architecture for fault tolerant ASIC/FPGA work-around |
| 05/18/2006 | US20060107152 Testing Using Policy-Based Processing of Test Results |
| 05/18/2006 | US20060107151 Automatic fault-testing of logic blocks using internal at-speed logic-BIST |
| 05/18/2006 | US20060107150 Semiconductor device and test method thereof |
| 05/18/2006 | US20060107149 Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit |
| 05/18/2006 | US20060107148 Automatic self-testing of an internal device in a closed system |
| 05/18/2006 | US20060107147 Semiconductor device with timing correction circuit |
| 05/18/2006 | US20060107146 Demultiplexing circuit, light emitting display using the same, and driving method thereof |
| 05/18/2006 | US20060107145 Combinatorial at-speed scan testing |
| 05/18/2006 | US20060107144 Power reduction in module-based scan testing |
| 05/18/2006 | US20060107143 Organic light emitting display |
| 05/18/2006 | US20060107142 Semiconductor integrated circuit |
| 05/18/2006 | US20060107141 Database mining system and method for coverage analysis of functional verification of integrated circuit designs |
| 05/18/2006 | US20060107140 Semiconductor device with termination resistor circuit |
| 05/18/2006 | US20060107139 Sequential control circuit |
| 05/18/2006 | US20060107138 Transceiver module |
| 05/18/2006 | US20060107137 Chip testing methods and chips |
| 05/18/2006 | US20060107120 Microprocessor design support for computer system and platform validation |
| 05/18/2006 | US20060106576 Diagnosis system for household electric appliances |
| 05/18/2006 | US20060106555 Method for using an alternate performance test to reduce test time and improve manufacturing yield |
| 05/18/2006 | US20060106553 Maximum and minimum power limit calculator for batteries and battery subpacks |
| 05/18/2006 | US20060105594 Method for package burn-in testing |
| 05/18/2006 | US20060105477 Device and method for manufacturing wafer-level package |
| 05/18/2006 | US20060105475 Fast localization of electrical failures on an integrated circuit system and method |
| 05/18/2006 | US20060104692 Electronic device handling apparatus and temperature application method in electronic device handling apparatus |
| 05/18/2006 | US20060104313 Method and apparatus for timeout reduction and improved wireless network performance by delay injection |
| 05/18/2006 | US20060103417 Current sensing in a two-phase motor |
| 05/18/2006 | US20060103416 Substrate inspecting method |
| 05/18/2006 | US20060103415 Array substrate inspecting method and array substrate inspecting device |
| 05/18/2006 | US20060103414 Method of inspecting array substrate |
| 05/18/2006 | US20060103413 Array substrate inspecting method |
| 05/18/2006 | US20060103412 Display device |
| 05/18/2006 | US20060103411 Method for measuring thin film transistor array of active matrix display panel |
| 05/18/2006 | US20060103410 Panel and test method for display device |
| 05/18/2006 | US20060103409 Current sensing method and current sensing device, power conversion device using this current sensing device, and vehicle using this power conversions device |
| 05/18/2006 | US20060103408 Semiconductor wafer and testing method therefor |
| 05/18/2006 | US20060103407 Method and an apparatus for testing transmitter and receiver |
| 05/18/2006 | US20060103406 Cantilever |
| 05/18/2006 | US20060103405 Method and apparatus for a wobble fixture probe for probing test access point structures |
| 05/18/2006 | US20060103404 System and method for testing dynamic resistance during thermal shock cycling |
| 05/18/2006 | US20060103403 System for evaluating probing networks |
| 05/18/2006 | US20060103402 Semiconductor apparatus |
| 05/18/2006 | US20060103401 Method for full wafer contact probing, wafer design and probe card device |
| 05/18/2006 | US20060103400 Method and apparatus for probe tip contact |
| 05/18/2006 | US20060103399 Apparatus and method for testing conductive bumps |
| 05/18/2006 | US20060103398 Systems and methods for etching and plating probe cards |
| 05/18/2006 | US20060103397 Method and apparatus for a twisting fixture probe for probing test access point structures |
| 05/18/2006 | US20060103396 Method and apparatus for non-contact testing of microcircuits |
| 05/18/2006 | US20060103395 Electrical measurements in samples |
| 05/18/2006 | US20060103391 Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections |
| 05/18/2006 | US20060103390 AFCI circuit test module |
| 05/18/2006 | US20060103371 Testing system for solar cells |
| 05/18/2006 | US20060103370 Apparatus for testing processing electronics |
| 05/18/2006 | US20060103369 Apparatus and method for making ground connection |
| 05/18/2006 | US20060103357 Method and system for battery protection |
| 05/18/2006 | DE60021129T2 Verfahren und Vorrichtung zur Prüfung einer elektronischen Vorrichtung Method and apparatus for testing an electronic device |
| 05/18/2006 | DE102005054695A1 Portable data carrier e.g. smart card, testing method for testing system, involves detecting data with respect to functionality of carrier, and testing data by state models having set of states and permitting transition between states |
| 05/18/2006 | DE102005004386A1 Verfahren und Vorrichtung zum Analysieren einer elektromagnetischen Welle, sowie Computererzeugnis Method and apparatus for analyzing an electromagnetic wave, and computer product |
| 05/18/2006 | DE102005001163B3 Semiconductor wafers` testing method, involves testing wafer by probes, and reducing heating energy with constant cooling efficiency, under consideration of detected increase of temperature of fluids flowing via tempered chuck device |
| 05/18/2006 | DE102004058957A1 Electric arc identifying device for motor vehicle, has evaluation unit to identify arc based on sensor signals and information, which is about condition of loads that are applied in electric circuit and input into device via interface |
| 05/18/2006 | DE102004049155B3 Diagnosis system for motor vehicle, has server and display equipment that acts as client and includes presentation logic and logic component, where equipment and server has software components, which are used corresponding to machine level |
| 05/18/2006 | DE10148904B4 Vorrichtung und Verfahren zur Steuerung der Abtastverstärkerfreigabe in einem Halbleiterspeicherbauelement Apparatus and method for controlling the Abtastverstärkerfreigabe in a semiconductor memory device |
| 05/18/2006 | DE10048447B4 Verfahren und Vorrichtung zum Testen von selbstleuchtenden optoelektronischen Komponenten A method and apparatus for testing self-luminous optoelectronic components |
| 05/18/2006 | CA2586537A1 Adaptive memory calibration using bins |
| 05/17/2006 | EP1657560A1 Apparatus and method for detecting a short of a battery connector |
| 05/17/2006 | EP1657559A1 Method of detecting arcing faults in a line conductor |
| 05/17/2006 | EP1657556A1 Voltage and phase tester |
| 05/17/2006 | EP1656566A1 Non-invasive electric-field-detection device and method |
| 05/17/2006 | EP1656565A1 Measuring or test device comprising interchangeable functional units |